X-ray Detector Shielding Non-Detection Area Light Scattering
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Solution Overview
Problem
Current X-ray detectors suffer from reduced reproducibility of fine image portions due to light scattering factors affecting the modulation transfer function (MTF), which degrades image resolution and contrast.
Innovation Solution
The X-ray detector design includes a substrate divided into light detection and non-detection areas with a photodiode, thin film transistor, insulating layers, a scintillator layer, and shielding parts, such as acryl-based organic materials or black matrices, to prevent light scattering and improve image clarity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional X-ray detector structure is used, then the device can detect X-rays, but light scattering occurs on the path of light incident on the photodiode, causing deterioration of fine image portion reproducibility
Solution Approach 1:
The substrate is divided into a light detection area and a non-detection area, with the non-detection area containing circuit elements and wires that are shielded from light. This segmentation allows light to reach the photodiode without scattering off circuit components, improving fine image portion reproducibility while maintaining device functionality.
Solution Approach 2:
A shielding part is introduced as an intermediary element between the scintillator layer and the non-detection area to block scattered light from reaching the photodiode. This shielding structure acts as a mediator that prevents harmful light scattering while allowing necessary light transmission to the detection area.
2Reliability
If the non-detection area is left exposed, then circuit elements can be accessed, but light scattering from this area degrades the modulation transfer function (MTF)
Solution Approach 1:
The substrate is divided into a light detection area and a non-detection area, with the non-detection area containing circuit elements and wires that are shielded from light. This segmentation allows light to reach the photodiode without scattering off circuit components, improving fine image portion reproducibility while maintaining device functionality.
Solution Approach 2:
The shielding part is selectively positioned only over the non-detection area containing circuit elements, while the light detection area remains exposed. This localized shielding approach maintains high MTF by preventing light scattering from circuits without adding unnecessary complexity to the overall device structure.
3Manufacturing precision
If shielding parts are added to prevent light scattering, then image resolution improves, but device complexity increases
Solution Approach 1:
The substrate is divided into a light detection area and a non-detection area, with the non-detection area containing circuit elements and wires that are shielded from light. This segmentation allows light to reach the photodiode without scattering off circuit components, improving fine image portion reproducibility while maintaining device functionality.
Solution Approach 2:
The shielding part is selectively positioned only over the non-detection area containing circuit elements, while the light detection area remains exposed. This localized shielding approach maintains high MTF by preventing light scattering from circuits without adding unnecessary complexity to the overall device structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances the modulation transfer function (MTF) values, resulting in higher image resolution and contrast, effectively addressing the issue of light scattering and improving the reproducibility of fine image details.
Implementation Method 1
An X-ray detector generates a signal current according to light incident on a photosensitive diode, such as a photodiode
Implementation Method 2
a scintillator layer disposed on the at least one insulating layer over an entire surface of the substrate
Data Source
AI summary
An X-ray detector including: a substrate that is divided into a light detection area and a non-detection area and includes a plurality of pixels; a photodiode disposed on the light detection area; a thin film transistor that is disposed on the non-detection area and is electrically connected to a lower portion of the photodiode; a plurality of wires that are electrically connected to the thin film transistor and are positioned on the non-detection area; at least one insulating layer disposed so as to cover at least the thin film transistor and the plurality of wires; a scintillator layer disposed on the at least one insulating layer over an entire surface of the substrate; and a shielding part disposed between the at least one insulating layer and the scintillator layer to shield the non-detection area.