X-ray Diffractometer Primary Side Adjustment
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Solution Overview
Problem
The adjustment of the primary side of an X-ray diffractometer is time-consuming and labor-intensive, requiring numerous individual steps and often necessitating specialized personnel, especially when initial misorientation results in no X-ray intensity passing through the collimator, complicating the process due to many degrees of freedom and safety regulations.
Innovation Solution
A method that directly sets predefined positions and orientations of the X-ray source and optics relative to the basic structure using iterative measurement steps, allowing for quick adjustment without requiring X-ray measurements, using an auxiliary body for indirect measurement and allowing components to be adjusted while measuring, thereby simplifying and accelerating the process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If iterative adjustment steps with X-ray measurements are used to maximize beam intensity, then the precision of component positioning is improved, but the adjustment time and complexity increase significantly
Solution Approach 1:
The patent applies preliminary action by pre-adjusting the X-ray source and optics to predefined positions and orientations relative to the basic structure before actual X-ray measurements are taken. This initial positioning is done using mechanical measurement methods, which eliminates the need for time-consuming iterative X-ray measurement steps while still achieving the required precision for subsequent beam intensity optimization.
Solution Approach 2:
The patent replaces the X-ray measurement-based adjustment system with a mechanical measurement system. By using mechanical measurement methods to determine positions and orientations of components relative to the basic structure, the invention substitutes the complex, time-consuming X-ray iterative process with simpler, faster mechanical measurements, thereby reducing adjustment time while maintaining positioning precision.
2Manufacturing precision
If multiple individual adjustment steps are performed to maximize beam intensity, then the positioning accuracy is improved, but the number of required operations and personnel expertise increase
Solution Approach 1:
The patent performs preliminary positioning of the X-ray source and optics to predefined positions and orientations using mechanical measurement methods. This preliminary action establishes a good initial state that requires minimal iterative refinement, thereby simplifying the overall adjustment process and reducing the number of individual steps needed while maintaining the ability to achieve high beam intensity optimization.
Solution Approach 2:
The patent enables the adjustment system to be more self-service by establishing predefined target positions and orientations relative to the basic structure. The components can be adjusted to these predetermined targets using mechanical measurements without requiring complex iterative procedures, reducing the need for specialized personnel and simplifying operation while still achieving precise beam intensity optimization.
3Manufacturing precision
If X-ray measurements are required for adjustment, then the beam intensity can be maximized, but safety regulations require the housing to be closed, increasing adjustment effort
Solution Approach 1:
The patent replaces X-ray measurement-based adjustment with mechanical measurement methods. By using mechanical measurement to determine positions and orientations of components relative to the basic structure, the invention eliminates the need to close the safety housing for X-ray measurements during adjustment, thereby reducing procedural complexity and safety constraints while maintaining the capability to achieve beam intensity maximization through subsequent fine-tuning.
Solution Approach 2:
The patent introduces mechanical measurement methods as an intermediary between the components and the final beam intensity optimization goal. This intermediary approach allows initial positioning to be performed without X-rays (avoiding safety housing requirements), while still enabling subsequent X-ray-based fine-tuning to achieve maximum beam intensity, thereby decoupling the safety constraint from the optimization goal.
4Ease of manufacture
If no X-ray intensity passes the collimator due to major misorientation, then the initial setup is simpler, but the adjustment becomes unclear and time-consuming to find the correct positions
Solution Approach 1:
The patent applies preliminary action by pre-establishing the correct positions and orientations of the X-ray source and optics relative to the basic structure using mechanical measurement methods before X-ray operation begins. This preliminary positioning ensures that X-ray intensity will pass through the collimator from the start, eliminating the problem of major misorientation and making the subsequent adjustment process straightforward and detectable.
Solution Approach 2:
The patent establishes a feedback mechanism where the predefined positions and orientations serve as target values for verification. By having predetermined correct positions relative to the basic structure, the system provides clear feedback on whether components are correctly positioned, making it easy to detect and measure adjustment status without the confusion of major misorientation, while maintaining simple initial setup procedures.
Data Source
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AI summary
A method for adjusting the primary side (2) of an X-ray diffractometer (1), wherein the primary side (2) comprises a collimator (5), an X-ray optic (4) and an X-ray source (3), in particular an X-ray tube (15), wherein the collimator (5), the X-ray optic (4) and the X-ray source (3) are attached directly or indirectly to a base structure (12), and wherein the orientation and position of the X-ray optic (4) and the position of the X-ray source (3) relative to the base structure (12) are adjusted, is characterized in that the orientation and position of the X-ray optic (4) and the position of the X-ray source (3) relative to the base structure (12) are measured and adjusted to predetermined setpoints, so that at the set setpoints, X-ray radiation (6) emanating from the X-ray source (3) and conditioned by the X-ray optic (4) is detectable on the output side of the collimator (5).