Material Analysis Using Wave/Particle Radiation TRIZ Cases

A multi-hole collimator and pulsed x-ray tube generate undersampled radiation data, enabling submillisievert scanning while maintaining image quality.

Dynamic tube current adjustment adapts to patient anatomy using scanogram data.

Offset collimator aperture blocks central cone beam to reduce radiation exposure on sensitive components during X-ray laminography inspection.

Synchronizing a precessing electron beam with simultaneous data acquisition resolves inaccuracies caused by object displacement during analysis.

A visible light alignment assembly projects a focused beam along the X-ray path to enable rapid component positioning.

A scanning electron microscope device measures secondary electron emission coefficients using collecting plates and a Faraday cup.

Multiple crossovers in the objective lens separate primary and secondary electron trajectories, eliminating detection holes at low energies.

Heavy metal ion-hematein complexes provide homogeneous staining for computed tomography scanning of biological samples.

A computer tomography method selects surface measurement points using specifiable rules to determine geometry features without requiring a CAD model.

Segmented roller bearing supports rotating base with independent components, eliminating overturn moments and reducing maintenance costs.

A thermal maturity index integrates porosity values and organic matter content to model subterranean regions.

Scanning charged particle microscope images evaluation points to determine overlay positions on semiconductor wafers.

Determines spatial and angular dispersion functions through calibration object movement, resolving measurement precision tradeoffs in non-homogeneous analysis.

A bright-field dark-field detector integrates a central opening and segmented rings to route secondary electrons toward an energy spectrometer.

Grazing-incidence small-angle X-ray scattering reconstructs reciprocal images from surface-scattered intensity to determine overlay defects.

An objective lens array assembly uses a control lens array to pre-focus sub-beams before they reach the sample.

A CD-SEM measurement method using electron beam simulation to generate a library of SEM waveforms for pattern shape estimation.

Adjustable collimator diaphragm matches x-ray beam expansion to detector dimensions at every tomosynthesis angle, preventing overexposure.

A counting time calculation unit determines optimal measurement durations for each spectral line using quantitative-value-to-intensity change ratios.

A grain size analysis method calculates mineral content from particle distribution data.

Removing fringe scanning from phase contrast X-ray imaging boosts spatial resolution for detecting small lesions while cutting measurement time.

Quantum dot scintillators replace traditional materials to resolve low light conversion efficiency and slow response speed in radiation imaging.

X-ray diffraction measures in-plane and out-of-plane strains to calculate elastic constants.

A control unit coordinates focused ion beam exposure with electron beam observation to form images only when target layers are detected.

A scanning speed setting unit adjusts beam velocity at target positions to stabilize irradiation amount delivery.

A charged particle beam apparatus compares real-time images with stored structure data to automate sample fabrication.

A method for adjusting the primary side of an X-ray diffractometer using mechanical measurement to set source and optic positions.

Rotatable neutron shield and energy-selective detection isolate 10.83 MeV nitrogen signals, suppressing silicon interference to locate hidden explosives.

Non-collinear acoustic receiver arrays map bin surfaces to estimate content volume, overcoming measurement inaccuracies caused by dust and coning phenomena.

A charged particle microscope iteratively adjusts focus and stigmator settings using a sharpness measure derived from image intensity gradients.

Automated charged particle beam inspection identifies overlay shift defects through pattern averaging and width estimation.

An adjustable phantom moves through a medical scanner to simulate contrast agent presence and physical characteristics.

X-ray fluorescence quantifies protein modifications without radioactive reagents, eliminating hazardous waste generation.

A multi-modal particle detector combines ion mobility spectrometry and surface-enhanced Raman spectroscopy in separate chambers.

Radio-opaque markers attached to patients track motion during scanning, correcting artifacts in reconstructed 3D images.

A multi-tracer kinetic model separates overlapping positron emission tomography signals from combined data.

An AI engine automates x-ray inspection programming by identifying sample locations and classifying defects, eliminating manual setup errors.

Silicon oxide hard mask film improves dimensional accuracy by reducing side etching during dry processing.

Simultaneous secondary electron and light detection enables rapid protein localization in biological samples.

Inspection apparatus creates area maps of figure patterns to validate electric charge amounts in pattern writing data before lithography execution.

Rotating the aperture member removes contamination risks and simplifies vacuum mode switching.

Depositing material during ion beam milling reinforces structural integrity, preventing bending and curtaining artifacts in ultra-thin TEM samples.

Scanning sample areas with partial overlap and applying statistical processing to detection results improves position resolution in X-ray fluorescence analysis.

Adjusts rotational speed of X-ray source and detector during scanning to optimize data acquisition across varying view angles.

Plating by rubbing joins a rigid semiconductor standard to a carrier layer, eliminating bonding agents that distort thin layer measurements.

Segmented support plates reduce beam hardening and structural distortion while enabling precise calibration across diverse instrument geometries.

An intermediate electrode biases between spherical sectors to reduce energy and correct focusing effects in charged particle beams.