X-ray Fluorescence Detection Overlapping Scan Resolution
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The existing X-ray fluorescence analyzers face limitations in achieving high position resolution for in-plane element distribution detection due to the constraints of primary X-ray irradiation range and detector size, leading to reduced X-ray detection quantity and longer detection times.
Innovation Solution
A detection method and device that involves scanning the sample multiple times with overlapping analysis areas and performing statistical processing on the detection results to enhance position resolution, allowing for more precise calculation of characteristic values distributed in the sample plane.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the primary X-ray irradiation range is narrowed to improve position resolution, then position resolution is improved, but the quantity of X-rays detected is reduced and detection time increases
Solution Approach 1:
The patent divides the analysis area into multiple scanning regions that are scanned separately and then combined. By segmenting the measurement process into multiple passes with overlapping regions, the system achieves high position resolution without requiring an excessively narrow primary X-ray beam, thereby maintaining adequate X-ray quantity and reducing detection time compared to using a narrowly focused beam for the entire analysis area.
Solution Approach 2:
The patent employs partial overlapping of scanning regions, where adjacent scanning areas overlap by a certain margin. This excessive coverage in overlapping zones allows for statistical processing that enhances position resolution while maintaining efficient detection speed, avoiding the need to scan every point with maximum precision individually.
2Measurement precision
If the primary X-ray irradiation range is narrowed using a special capillary, then position resolution is improved, but the quantity of X-rays detected is reduced
Solution Approach 1:
Instead of using a special capillary to narrow the X-ray beam for the entire analysis area, the patent segments the analysis into multiple scanning regions. Each region is scanned with a standard capillary, and the results are combined through statistical processing. This approach maintains adequate X-ray quantity in each scan while achieving high position resolution through the segmented measurement strategy.
Solution Approach 2:
The patent uses partial overlapping of scanning regions to achieve high position resolution without requiring a narrowly focused X-ray beam. The overlapping areas provide redundant measurements that enhance resolution through statistical processing, while the majority of the analysis area is covered with sufficient X-ray intensity, avoiding the need for special capillaries that would reduce X-ray quantity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly improves position resolution by averaging detection results from overlapping regions, enabling more accurate detection of element content distribution with reduced detection time and increased precision.
Implementation Method 1
an analysis of elements contained in a sample is performed by detecting the fluorescence X-rays incident on a detector among fluorescence X-rays generated from a range of the sample irradiated with primary fluorescence X-rays
Data Source
AI summary
A detection method and a detection device capable of increasing position resolution when detecting a characteristic value distributed in a plane of a sample are provided. The detection method is configured to detect the characteristic value distributed in the plane of the sample by scanning the sample for each analysis area. The detection method includes the steps of: detecting the characteristic value of the sample a plurality of times while moving the analysis area in the plane of the sample so that the partial region of the analysis area overlaps; and calculating the characteristic value distributed in the plane of the sample in a unit of an overlapping region by performing statistical processing on detection results including the same region.