X-ray Fluorescence Spectrometer Counting Time Calculation

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Solution Overview

Problem

X-ray fluorescence spectrometers face challenges in determining suitable counting times and quantification precisions, especially when analyzing high-content elements like Cr in stainless steel or thin film samples, due to non-linear calibration curves and interdependencies between component quantifications.

Innovation Solution

An X-ray fluorescence spectrometer with a counting time calculation unit that measures standard samples to determine calibration curve constants and correction coefficients, calculates quantitative-value-to-intensity change ratios, and adjusts counting times for each measurement line to achieve specified quantification precisions, regardless of sample type or calculation method.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If a conventional counting time calculation method based on intensity relative precision is used, then the measurement can be performed in a suitable counting time, but the quantification precision is inaccurate for high-content elements like Cr in stainless steel or thin film samples

Engineering Contradiction:
Improvecounting timeVSAvoidquantification precision
Core Design Contradiction:
Loss of timeVSMeasurement precision

Solution Approach 1:

The patent changes the fundamental parameter used for counting time calculation from intensity relative precision to quantitative-value-to-intensity change ratio. This parameter transformation allows accurate counting time determination for high-content elements and thin film samples by using the actual quantitative relationship between intensity changes and composition changes, rather than assuming direct proportionality.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements a feedback mechanism by calculating quantitative-value-to-intensity change ratios through repeated determination of quantitative values with varied intensities. This feedback loop enables the system to adapt the counting time calculation to the specific sample characteristics and calibration curve properties, ensuring accurate quantification precision for different sample types.

Inventive Principle:
Principle #23Feedback

2Ease of operation

If the calibration curve method is used for high-content elements, then the measurement process is simplified, but the assumption of direct proportionality between intensity and content becomes invalid

Engineering Contradiction:
Improvemeasurement process simplicityVSAvoidquantification precision
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent transforms the calculation approach by introducing quantitative-value-to-intensity change ratios that capture the actual non-linear relationship in calibration curves. This parameter change allows the system to maintain the simplicity of the calibration curve method while correcting for non-proportionality effects through the ratio calculation.

Inventive Principle:
Principle #35Parameter changes

3Ease of operation

If a fixed counting time is used for all measurement lines, then the device operation is simplified, but the quantification precision cannot be optimized for each specific measurement line

Engineering Contradiction:
Improvedevice operation simplicityVSAvoidquantification precision
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent segments the counting time determination process by calculating optimal counting times for each measurement line individually based on its specific quantitative-value-to-intensity change ratio. This segmentation allows each measurement line to have its counting time optimized independently while maintaining overall system simplicity through automated calculation.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables measurements in suitable counting times and with precise quantification, correcting for discrepancies in intensity relative precision and ensuring accurate quantification of component contents and thicknesses across various samples and methods.

Implementation Method 1

In X-ray fluorescence spectrometry, a quantification precision depends on a counting time as well as on a content of a component in a sample and/or a peak intensity and a background intensity of fluorescent X-rays

Methodology Applied
Scientific EffectX-ray fluorescence: Fluorescence

Data Source

PatentEP3951370B1X-ray fluorescence spectrometer
Publication Date: 2023.11.01 RIGAKU CORP
  • EP3951370B1 patent drawingFigure 1
  • EP3951370B1 patent drawingFigure 2
  • EP3951370B1 patent drawingFigure 3~4

AI summary

An X-ray fluorescence spectrometer of the present invention includes a counting time calculation unit (13) configured to: by a predetermined quantitative calculation method, determine each of quantitative values by using reference intensities of one standard sample and repeatedly perform a procedure of determining each of the quantitative values in a case where only a measured intensity of one of measurement lines is changed by a predetermined value, to calculate a ratio of a change in each of the quantitative values to the predetermined value as a quantitative-value-to-intensity change ratio, the one of the measurement lines having the measured intensity to be changed being different on each repetition of the procedure; and use quantitative-value-to-intensity change ratios calculated thereby for all the measurement lines to calculate a counting time for each of the measurement lines from a quantification precision specified for each of the quantitative values.