X-ray Filter with Arc Slits for Diffraction Pattern Isolation
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Solution Overview
Problem
In x-ray powder diffraction, the diffraction patterns from samples with multiple materials, such as a battery encased in steel, are often obscured by scattering from the container material, making it difficult to detect the desired diffraction pattern of the material within the container.
Innovation Solution
The use of a system comprising two stacks of plates with arc-shaped slits in a spider web design, where each stack includes alternating plates with x-ray absorbing materials, to filter and separate the diffraction cone, allowing only specific x-rays from the region of interest to reach the area detector, thereby isolating the diffraction pattern of the material of interest.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional diffraction detection is used without filtering, then the detection process is simple, but the diffraction pattern is obscured by scattering from container material
Solution Approach 1:
The filtering system is segmented into multiple plates (first plate with first slits, second plate with second slits) arranged in sequence. Each plate independently filters specific portions of the diffraction cone, allowing the system to achieve high precision by dividing the filtering function across multiple components rather than using a single complex filter.
Solution Approach 2:
The arc-shaped slits in the filtering plates act as intermediaries that selectively transmit desired diffraction signals while blocking scattered radiation from container materials. These slits mediate between the raw diffraction cone and the detector, enabling precise detection by filtering out harmful background scattering.
2Object-affected harmful factors
If filtering plates are added to isolate diffraction patterns, then background scattering is reduced, but the device structure becomes more complex
Solution Approach 1:
The filtering function is segmented across multiple plates with different slit configurations. The first plate filters initial scattered radiation, and the second plate further refines the filtering. This segmentation allows effective reduction of background scattering while keeping each individual plate relatively simple in structure.
Solution Approach 2:
The filtering approach moves from a single-plane filter to a multi-plane three-dimensional filtering system. By arranging filtering plates at different positions and orientations along the diffraction cone path, the system effectively reduces background scattering from multiple angles and directions, adding spatial dimensionality to the filtering process.
3Measurement precision
If multiple filtering plates are used to enhance resolution, then diffraction pattern clarity improves, but the system becomes more complex
Solution Approach 1:
The high-resolution filtering is achieved by segmenting the diffraction cone into multiple angular regions, with each filtering plate responsible for specific angular ranges. The first plate handles broader filtering, while the second plate provides finer angular resolution. This segmentation enables high measurement precision through coordinated action of multiple simpler components.
Solution Approach 2:
The arc-shaped slits in the filtering plates follow curved geometries that match the angular distribution of the diffraction cone. This curved design allows the slits to effectively sample different angular regions of the diffraction pattern, enhancing resolution by naturally adapting to the spherical geometry of x-ray diffraction while maintaining manufacturing simplicity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This system enhances the resolution of diffraction cones, allowing for more accurate analysis by filtering out background scattering from container materials, enabling the detection of diffraction patterns from specific gauge volumes over a wider angular range, and reducing background noise from sample containers.
Implementation Method 1
The first plate may include an x-ray absorbing material and walls defining first slits. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material
Implementation Method 2
x-rays are directed at a polycrystalline sample and the diffracted x-rays are collected. The diffracted x-rays may form a diffraction pattern produced from coherently scattered x-rays by periodically spaced atoms in the sample, as described by Bragg's law of diffraction
Data Source
AI summary
Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and walls defining second slits. The second slits may include arc shaped openings through the second plate. The walls of the second plate may be configured to absorb at least some of second x-rays and to output third x-rays.