X-Ray Detector Window Layer and Bar Structure for Low-Energy Sensitivity

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Solution Overview

Problem

Existing radiation detectors for X-rays face challenges in achieving high sensitivity in the low-energy range while maintaining radiation hardness.

Innovation Solution

A radiation detector comprising a semiconductor body with a radiation entrance side, an ultra-thin electrically conductive window layer made of materials like graphene or borophene, and an electrically conductive bar structure in electrical contact with the window layer, which together form part of an additional electrode.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional radiation transmission window is used, then the detector structure is complete and functional, but the sensitivity in the low-energy range deteriorates and radiation hardness is reduced

Engineering Contradiction:
Improveradiation hardnessVSAvoiddetection sensitivity
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent removes the conventional radiation transmission window entirely and replaces it with an ultra-thin window layer (at most 20 nm, preferably at most 5 nm) made of low-Z materials such as boron, carbon, graphene, or borophene. This extraction of the traditional window structure eliminates the trade-off between window thickness and low-energy X-ray transmission, as the ultra-thin layer provides sufficient mechanical support while allowing excellent transmission of low-energy radiation.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent fundamentally changes the thickness parameter of the window layer from conventional dimensions (micrometers) to ultra-thin dimensions (nanometers, at most 20 nm, preferably at most 5 nm). This parameter change enables both high transmission of low-energy X-rays and maintenance of structural integrity, simultaneously improving detection sensitivity and radiation hardness.

Inventive Principle:
Principle #35Parameter changes

2Strength

If the window layer thickness is increased to improve mechanical stability, then structural integrity is improved, but low-energy X-ray transmission deteriorates

Engineering Contradiction:
Improvemechanical stabilityVSAvoidlow-energy X-ray detection
Core Design Contradiction:
StrengthVSMeasurement precision

Solution Approach 1:

The patent employs composite material structures where an ultra-thin window layer (at most 20 nm) of low-Z material is combined with a bar structure made of radiation-hard material. This composite approach allows the ultra-thin window layer to provide excellent low-energy X-ray transmission while the bar structure provides the necessary mechanical support and electrical conductivity, eliminating the need for thick window layers.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The bar structure acts as an intermediary element that provides mechanical support and electrical conductivity without requiring the window layer to be thick. The bar structure is in electrical contact with the window layer and extends through the semiconductor body, allowing the window layer to remain ultra-thin for optimal X-ray transmission while the bar structure handles the mechanical and electrical support functions.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If a thick window layer is used to ensure electrical conductivity and mechanical support, then electrical and mechanical properties are satisfied, but low-energy X-ray absorption increases

Engineering Contradiction:
Improveelectrical conductivityVSAvoidlow-energy X-ray absorption
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent extracts the electrical conductivity function from the window layer itself and transfers it to the bar structure. The window layer is reduced to an ultra-thin layer (at most 20 nm) that provides only X-ray transmission and basic electrical contact, while the bar structure provides the primary electrical conductivity path. This separation of functions allows the window layer to be extremely thin without compromising electrical performance.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent applies different material properties to different parts of the window structure: the window layer uses low-Z materials (boron, carbon, graphene, borophene) optimized for X-ray transmission, while the bar structure uses radiation-hard materials optimized for electrical conductivity and mechanical support. This local differentiation of material qualities allows each component to optimize its specific function without compromising the other.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enhances the detection sensitivity for low-energy X-rays and improves radiation hardness by optimizing the window layer and bar structure configuration, allowing for effective detection of X-rays across a wide energy range.

Implementation Method 1

the semiconductor body comprises a semiconductor region provided for absorbing the X-ray radiation to be detected

Methodology Applied
Scientific EffectX-ray absorption: Absorption (EM radiation)

Implementation Method 2

an electrically conductive bar structure on the window layer and in electrical contact with the window layer

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS12320932B2X-ray radiation detector having a semiconductor body, an electrically conductive window layer, and an electrically conductive bar structure, and operation method
Publication Date: 2025.06.03 KETEK GMBH HALBLEITER & REINRAUMTECHNIK
  • US12320932B2 patent drawing
  • US12320932B2 patent drawing
  • US12320932B2 patent drawing

AI summary

In an embodiment a radiation detector includes a semiconductor body configured to detect X-rays having a radiation entrance side, an electrically conductive window layer areally arranged to the radiation entrance side, the window layer having boron and/or carbon and having a thickness of at most 20 nm and an electrically conductive bar structure on the window layer and in electrical contact with the window layer.