Capacitance measuring device and capacitance measuring method
By using an automatic test machine and a specially designed measurement circuit board, combined with sinusoidal signals and amplification circuits, the problems of low efficiency and poor accuracy in batch testing of chip capacitance parameters are solved, and automated and high-precision capacitance parameter measurement is achieved.
CN114879009BActive Publication Date: 2025-09-09SINO IC TECH CO LTD
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Patent Information
- Application Number
- CN202210485515.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-05-06
- Publication Date
- 2025-09-09
- Estimated Expiration
- 2042-05-06
AI Technical Summary
Technical Problem
The existing technology for measuring chip capacitance parameters has the problems of low batch testing efficiency and poor measurement accuracy, mainly because manual operation is required and prone to human errors.
Method used
Using an automatic test machine and a specially designed measurement circuit board, batch testing is performed using sine or cosine signals. Combined with reference capacitors and amplifier circuits, the chip capacitance parameters are determined by adjusting the signal amplitude, and a robot is used to automatically load and unload chips.
Benefits of technology
It achieves efficient and accurate measurement of chip capacitance parameters, improves batch testing efficiency and accuracy, and avoids human errors.
✦ Generated by Eureka AI based on patent content.
Abstract
A capacitance measuring device and capacitance measuring method are configured to batch test the capacitance parameters of chips. The capacitance measuring device includes: a measurement circuit board, including: a test station configured to install the chip to be tested; and a reference capacitor, wherein a first end of the reference capacitor is electrically connected to a first pin of the chip to be tested installed at the test station at a first node, a second end of the reference capacitor is configured to receive a first measurement signal, and a second pin of the chip to be tested installed at the test station is configured to receive a second measurement signal; and an automatic tester is electrically connected to the measurement circuit board and configured to provide the first measurement signal and the second measurement signal, and determine the capacitance parameters of the chip to be tested based on the signal at the first node, wherein the first measurement signal and the second measurement signal are both sine signals or cosine signals, and the phase difference between the first measurement signal and the second measurement signal is (2n+1)π, where n is an integer.
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