A method for nondestructively monitoring grain boundary relaxation strengthening of nanometals and a method for determining process parameters

By monitoring the nanometal grain boundary relaxation process through X-ray diffraction technology, the problem of the inability to accurately monitor grain boundary relaxation strengthening in existing technologies is solved, and efficient and simple performance improvement of nanometal materials is achieved.

CN115326853BActive Publication Date: 2025-09-26SHANGHAI JIAOTONG UNIV
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Patent Information

Application Number
CN202210990911.8
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-08-18
Publication Date
2025-09-26
Estimated Expiration
2042-08-18

AI Technical Summary

Technical Problem

Existing technologies are unable to establish accurate nanostructure-mechanical property correlations, making it difficult to realize practical engineering applications of grain boundary relaxation-strengthened nanometals.

Method used

X-ray diffraction technology is used to in-situ monitor the interplanar spacing and average lattice strain during the grain boundary relaxation process of nanometals. The optimal heat treatment process parameters are determined by calculating the average lattice strain peak value, thereby achieving non-destructive monitoring of grain boundary relaxation strengthening.

Benefits of technology

Accurately reflect the degree of non-equilibrium grain boundary relaxation, determine the optimal heat treatment process parameters, obtain high-strength nano-metal materials, and provide process guidance and quality assurance.

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Abstract

The present invention discloses a method for non-destructively monitoring grain boundary relaxation strengthening of nanometals and a method for determining process parameters. The monitoring method comprises the following steps: (1) using an X-ray diffractometer to obtain diffraction patterns of at least two diffraction crystal planes during the nanometal grain boundary relaxation process; (2) calculating the interplanar spacing of each diffraction crystal plane during the nanometal grain boundary relaxation process; and (3) calculating the lattice strain of each diffraction crystal plane during the nanometal grain boundary relaxation process. The present invention proposes for the first time the use of X-ray diffraction technology to in-situ monitor the change in interplanar spacing during grain boundary relaxation (low-temperature heat treatment), using average lattice strain as a microstructural characteristic indicator that accurately reflects the degree of grain boundary relaxation. This effectively solves the problems of difficulty in determining heat treatment process parameters and ensuring the grain boundary relaxation strengthening effect, and provides process guidance and quality assurance for the preparation of high-performance nanometal materials using high-efficiency, low-energy heat treatment designs.
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