A super junction IGBT device and a manufacturing method thereof
By introducing an electron injection enhancement structure and a hole extraction path into the superjunction IGBT device, the problems of insufficient short-circuit withstand time and switching oscillation are solved, improving the conduction performance and stability of the device, making it suitable for high-power power electronic systems.
Patent Information
- Application Number
- CN202311860768.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-31
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2043-12-31
AI Technical Summary
Existing superjunction IGBT devices suffer from insufficient short-circuit withstand time, severe switching oscillation, and impaired conductance modulation effect, resulting in inadequate equipment reliability and stability.
In superjunction IGBT devices, an electron injection enhancement structure and hole extraction path are introduced. An electron injection enhancement region is formed through a deep P+ injection region and a Pbody region, and a hole release path is introduced on the front side to optimize the conduction performance and turn-off speed.
It significantly improves the short-circuit withstand time and turn-off speed of superjunction IGBTs, reduces switching oscillation, optimizes the conductivity modulation effect, and enhances the conduction performance and robustness of the device.