Distributed storage system testing method and device, equipment and storage medium

By creating a test scenario library and generating random test parameters, dynamically adjusting the weights and parameters of the test scenarios, the problem that existing testing methods are difficult to fully cover complex business scenarios is solved, and efficient, comprehensive and automated distributed storage system testing is achieved, improving testing efficiency and accuracy.

CN119806933APending Publication Date: 2025-04-11INSPUR SUZHOU INTELLIGENT TECH CO LTD
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Patent Information

Application Number
CN202411980821.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-31
Publication Date
2025-04-11

AI Technical Summary

Technical Problem

The existing distributed storage system testing methods are difficult to fully cover complex and changeable business scenarios and abnormal situations, making it difficult to detect some hidden problems in a timely manner. In addition, traditional manual writing and execution of test cases increases testing costs and reduces testing efficiency.

Method used

By creating a test scenario library and generating random test parameters based on the business model, dynamically adjusting the weights and parameters of the test scenarios, efficient and comprehensive testing of distributed storage systems is achieved.

Benefits of technology

This method can cover more possible business scenarios and abnormal situations, improve the comprehensiveness and effectiveness of tests, reduce manual intervention, improve test efficiency and accuracy, and continuously improve the depth and breadth of tests through iterative optimization of test cases.

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Abstract

The invention relates to a distributed storage system testing method and device, computer equipment and a storage medium. The method comprises the following steps: creating a test scene library according to a business model of the distributed storage system; determining a target test scene from the test scene library based on the current weight of each test scene, and generating a target test parameter according to a preset parameter range of the target test scene; generating a test case according to the target test parameter, and executing the test case on the distributed storage system to obtain a test result; and in response to the condition that the test result does not meet a preset condition, updating a current parameter value and a current weight value of the target test scene in the test scene library according to the target test parameter, and performing an iterative test on the updated test scene library until a termination condition is met. By adopting the method, more possible business scenes and abnormal conditions can be covered, and more test opportunities can be obtained in test scenes in which potential problem points possibly exist.
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