Electron beam information detection method and system and regulation and control method of electron emission device
By controlling the electron beam pulse with a preset changing magnetic field, the problem of narrow detection range in traditional methods is solved, enabling effective detection on time scales of nanoseconds and above, and expanding the detection resolution.
CN121364484APending Publication Date: 2026-01-20WUHAN UNITED IMAGING HEALTHCARE CO LTD
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Patent Information
- Application Number
- CN202410980306.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-19
- Publication Date
- 2026-01-20
AI Technical Summary
Technical Problem
Traditional electron beam detection methods based on microwave deflection cavities have a narrow detection range and cannot effectively detect timescales of nanoseconds and above.
Method used
By controlling the electron beam pulse under test through a preset changing magnetic field, adjusting the magnetic field strength and direction, the deflection of the electron beam pulse can be achieved, and its stability information at different time scales can be detected.
Benefits of technology
It expands the detection resolution range of electron beam information, enabling effective detection on time scales such as nanoseconds, microseconds, and milliseconds, thus solving the problem of narrow detection range in traditional methods.
✦ Generated by Eureka AI based on patent content.
Abstract
The invention provides an electron beam information detection method and system and a regulation and control method of an electron emission device, and belongs to the technical field of electron beam detection.The method comprises the steps that to-be-detected electron beam pulses are emitted, and the to-be-detected electron beam pulses pass through a preset changing magnetic field; the time scale of the preset variable magnetic field is set to correspond to the pulse width time scale of the to-be-measured electron beam pulse; and detecting the pulse performance of the to-be-detected electron beam pulse passing through the preset variable magnetic field, wherein the pulse performance is used for determining the stability information of the electron beam under the pulse width time scale of the to-be-detected electron beam pulse. Through the electron beam information detection method provided by the invention, the detection resolution range of the electron beam information is expanded, the method is not limited to the application of femtosecond-order time scale any more, and the technical problem that the detection range of a traditional measurement method based on a microwave deflection cavity is narrow is solved.
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