An automated sample loading method for a side-mounted sample stage in an electron microscope
The automatic sample loading system with a side-insertion sample stage for electron microscopy solves the problems of instability and mechanical damage in transmission electron microscope sample rod loading technology, and achieves multi-model compatibility and efficient and safe automated sample loading.
Patent Information
- Application Number
- CN202610133756.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-30
- Publication Date
- 2026-04-03
- Estimated Expiration
- 2046-01-30
AI Technical Summary
Existing transmission electron microscope sample rod loading techniques suffer from problems such as operational instability due to reliance on personal experience, easy damage to mechanical structures, and vacuum fluctuations, which affect imaging quality and safety.
An automated sample loading system with a side-insertion sample stage for electron microscopy is adopted. Through a robotic arm, fixtures, mechanical sensing unit, and vacuum signal acquisition module, combined with multi-source data fusion, the system realizes automated insertion and removal control of the sample rod, advances in stages, and combines vacuum status monitoring to ensure accurate sample loading.
It has enabled automated sample introduction for multiple types of transmission electron microscopes, improving sample introduction consistency, safety and efficiency, and reducing mechanical damage and vacuum fluctuations.