Multi-acupoint magnetic sensing device and method for narrow space

Abstract

This invention discloses a multi-aperture magnetic induction testing device and method for use in confined spaces. The device includes a product-carrying unit, an upper probe unit and a lower probe unit correspondingly disposed on both sides of the product, and a magnetic field generating unit integrated on the lower probe unit. The magnetic field generating unit contains multiple permanent magnets. An electric slide can drive the permanent magnets to reciprocate along a direction perpendicular to the surface of the product under test, allowing the permanent magnets to synchronously approach or move away from the product, thereby achieving switching between magnetic and non-magnetic testing environments. This invention solves the problems of large size, complex circuitry, and poor synchronization of multi-aperture magnetic fields in existing technologies. It enables parallel magnetic induction testing of multiple products and multiple acupoints in confined spaces, significantly improving testing efficiency and result stability while reducing equipment costs.

Description

Technical Field

[0001] This invention relates to the field of magnetic induction testing technology, and in particular to a multi-aperture magnetic induction testing device and method for use in confined spaces. Background Technology

[0002] Currently, conventional magnetic induction testing modules adopt a structure with electromagnets fixedly installed. During testing, the electromagnets are energized and de-energized to provide magnetic and non-magnetic testing environments for the product under test, thereby completing the magnetic performance test of the product.

[0003] This testing method has many drawbacks: First, the magnetic field strength depends on the magnitude of the input current, which is easily affected by various factors such as power supply voltage fluctuations, coil heating, and changes in line impedance, resulting in unstable magnetic field strength that is difficult to control precisely, directly affecting the accuracy and consistency of the test results. Most notably, the physical size of the electromagnet and its matching coil is relatively large. When multiple acupoints on a product need to be tested, arranging multiple electromagnets side by side will occupy a large amount of horizontal and vertical space, making it impossible to install a sufficient number of electromagnets in a small testing station. This makes it impossible to test multiple acupoints simultaneously, and only acupoints can be tested one by one. This results in a long testing cycle, low efficiency, and an inability to meet the production capacity requirements of modern industrial mass production.

[0004] In summary, existing electromagnet-type magnetic induction testing modules have drawbacks such as poor magnetic field stability, low control accuracy, large size, low space utilization, inability to perform parallel testing of multiple acupoints in confined spaces, and low testing efficiency. Summary of the Invention

[0005] The purpose of this invention is to provide a multi-aperture magnetic induction testing device and method for confined spaces, thereby solving the aforementioned technical problems in the prior art. The specific technical solution is as follows: A multi-aperture magnetic induction testing device for confined spaces includes a product carrier unit for carrying multiple products to be tested, an upper probe unit and a lower probe unit correspondingly arranged on both sides of the product carrier unit, and an electric slide table arranged on the lower probe unit. A magnetic field generating unit is arranged on one end of the electric slide table near the product carrier unit. The magnetic field generating unit includes multiple permanent magnets corresponding to the products to be tested. The electric slide table can drive the multiple permanent magnets to reciprocate in a direction perpendicular to the surface of the products to be tested, so that the multiple permanent magnets synchronously approach or move away from the products to be tested.

[0006] Furthermore, the magnetic field generating unit also includes a fixed plate and multiple fixed parts arranged in a vertical array on the fixed plate, with each permanent magnet correspondingly positioned on the top of a fixed part.

[0007] Furthermore, the product carrier unit is provided with at least two independent product placement positions, and each product placement position is provided with multiple test acupoints; the number of permanent magnets and the test acupoints of the product placement positions are equal and their positions correspond one-to-one; multiple cavities are formed on the top surface of the fixing plate, and the bottom of the fixing part is correspondingly placed in the cavity; the side of the fixing plate is provided with adjusting screws corresponding to the bottom of the fixing part, and the adjusting screws are used to independently adjust the horizontal position of each permanent magnet relative to the corresponding test acupoint.

[0008] Furthermore, a bushing is provided on the product carrier unit, and the upper probe unit includes an upper mold fixing component, a pressing component and a first cylinder provided on one side of the upper mold fixing component, a first adapter plate on the end of the pressing component near the product carrier unit, and an upper mold adapter plate provided on the first adapter plate. Multiple upper needle molds are provided on the upper mold adapter plate, and a first guide post extending downward is provided on the first adapter plate. The first guide post is correspondingly provided with the bushing.

[0009] Furthermore, the lower probe unit includes a lower mold fixing assembly, a lifting assembly and a second cylinder disposed on one side of the lower mold fixing assembly, a second adapter plate disposed on the lifting assembly near the product carrying unit, and a lower mold adapter plate disposed on the second adapter plate. The lower mold adapter plate is provided with multiple lower needle molds, and the second adapter plate is provided with an upwardly extending second guide post, which is correspondingly disposed with the bushing.

[0010] Furthermore, it also includes a slide plate fixed on the side of the lifting assembly and the lower mold fixing assembly, and a frame connecting the lifting assembly and the second transfer plate. An electric slide is set on the slide plate, and a permanent magnet plate is set on the electric slide. The fixing plate of the magnetic field generating unit is connected to the top of the permanent magnet plate.

[0011] Furthermore, the frame is vertically continuous to form a first channel through which the fixing plate can pass. The second transition fixing plate and the lower mold transition plate are both provided with through holes to form a second channel through which the fixing part can pass.

[0012] Furthermore, each product placement position on the product carrier unit is provided with a product limiting groove, the shape of which matches the shape of the product to be tested.

[0013] Furthermore, it also includes a vacuum hole on the side of the product carrier unit, and an external vacuum generator connected to the vacuum hole. The vacuum hole is connected to the product limiting groove, and the external vacuum generator is used to adsorb and fix the product to be tested placed in the product limiting groove.

[0014] A multi-aperture magnetic induction testing method for confined spaces is implemented using the aforementioned magnetic induction testing device. The method includes placing the product under test at the testing station, arranging multiple permanent magnets in a one-to-one correspondence with the positions of multiple test acupoints on the product under test to form a permanent magnet array, electrically connecting the product under test with test probes to form a test circuit, and driving the permanent magnet array to perform linear reciprocating motion along a direction perpendicular to the surface of the product under test, so that the permanent magnet array approaches or moves away from the product under test, thereby achieving switching between a magnetic testing environment and a non-magnetic testing environment at all test acupoints on the product under test.

[0015] The multi-aperture magnetic induction testing device and method for confined spaces of the present invention have the following advantages: 1. By integrating the magnetic field generating unit onto the lower probe unit and using an electric slide to drive the permanent magnet to perform vertical reciprocating motion, the drawbacks of electromagnets being bulky and having complex circuit control are eliminated. Taking advantage of the small size and stable magnetic field of the permanent magnet, the magnetic field of multiple test points can be switched synchronously in an extremely small space, ensuring the consistency of the magnetic field state of all test points and improving the efficiency and reliability of multi-point magnetic induction testing.

[0016] 2. By using a fixed plate and independent fixing parts to mount the permanent magnets, a stable mounting reference is provided for each permanent magnet, effectively limiting the radial displacement of the permanent magnet during high-speed reciprocating motion and avoiding test errors caused by magnetic field position deviation. At the same time, the design of the independent fixing parts significantly increases the effective travel of the permanent magnets, allowing them to be closer to the product under test to obtain a stronger magnetic field effect. It also facilitates the replacement and maintenance of individual permanent magnets, reducing the long-term operating cost of the equipment.

[0017] 3. By setting multiple independent product placement positions on the product carrier unit and arranging permanent magnets one-to-one with all test points, the magnetic induction test of multiple products can be completed simultaneously with a single drive action, improving the testing efficiency of mass production. The mating structure of the cavity and adjusting screw allows for independent fine-tuning of the horizontal position of each permanent magnet, effectively compensating for accumulated errors generated during component processing and assembly. This ensures that each test point receives an accurate and consistent magnetic field strength, improving the accuracy and repeatability of test results.

[0018] 4. By precisely fitting the first guide post in the upper probe unit with the bushing on the product carrier unit, accurate positioning of the upper probe die and the product under test is achieved. This guiding structure effectively prevents the upper probe die from skewing during the pressing process, ensuring that all upper test points simultaneously and reliably contact and conduct with the product. This prevents fluctuations in test data caused by poor contact or uneven contact pressure, providing structural assurance for obtaining stable and accurate electrical performance parameters.

[0019] 5. A symmetrical structure with the upper probe unit is adopted, and the lower probe die is precisely positioned through the cooperation of the second guide post and the bushing. The symmetrical drive and guide structure ensures that all test points on the upper and lower surfaces of the product make contact and conduction simultaneously, avoiding test errors caused by different contact sequences of the upper and lower probes, further improving the accuracy and consistency of test results, and also simplifying the design of the equipment's control system.

[0020] 6. The electric slide table is mounted on the side of the lifting assembly via a slide table mounting plate, and a permanent magnet mounting plate is used to connect it to the fixing plate of the magnetic field generating unit. This fully utilizes the unused longitudinal space inside the lower probe unit, achieving a high degree of integration between the magnetic field generating unit and the lower probe unit. This compact nested installation structure provides sufficient movement space for the permanent magnet without increasing the lateral dimensions of the equipment, further reducing the overall size of the equipment and making it more suitable for use in confined production spaces. Attached Figure Description

[0021] Figure 1 This is a three-dimensional schematic diagram of the multi-acupoint magnetic induction testing device for confined spaces according to the present invention.

[0022] Figure 2 This is a schematic diagram of the magnetic field generating unit in the multi-acupoint magnetic induction testing device for confined spaces of the present invention.

[0023] Figure 3 This is a schematic diagram of the upper probe unit in the multi-aperture magnetic induction testing device for confined spaces of the present invention.

[0024] Figure 4 This is a schematic diagram of the lower probe unit in the multi-aperture magnetic induction testing device for confined spaces of the present invention.

[0025] Figure 5 This is a schematic diagram of the product-bearing unit in the multi-aperture magnetic induction testing device for confined spaces according to the present invention. Detailed Implementation

[0026] To better understand the purpose, structure, and function of this invention, the following detailed description of the multi-acupoint magnetic induction testing device and method for confined spaces, in conjunction with the accompanying drawings, is provided.

[0027] like Figures 1 to 5As shown, this invention provides a multi-aperture magnetic induction testing device for confined spaces. The device employs a modular, layered design, primarily consisting of four parts: a product support unit 1, an upper probe unit, a lower probe unit, and a magnetic field generating unit 2. The product support unit 1 serves as the testing reference platform and is horizontally positioned in the center of the device. The upper and lower probe units are respectively located on the upper and lower sides of the product support unit 1, used to make electrical contact with the upper and lower surfaces of the product under test during testing to acquire test signals. The magnetic field generating unit 2 is integrated into the lower probe unit and is driven independently up and down by an electric slide 4.

[0028] The magnetic field generating unit 2 of this invention uses multiple permanent magnets 3 as magnetic field sources. These permanent magnets 3 are arranged in a one-to-one correspondence with the positions of the magnetic field-sensitive test points on the product under test, forming a compact and complete permanent magnet array. During testing, the electric slide 4 drives the entire permanent magnet array to reciprocate linearly along a direction perpendicular to the surface of the product under test: when the permanent magnet array moves upward and closer to the product, a stable test magnetic field is generated simultaneously at all test points; when the permanent magnet array moves downward and away from the product, the magnetic field at all test points disappears simultaneously. This method of achieving synchronous switching of magnetic fields through physical displacement fundamentally solves the problems of large size of electromagnets, complex circuits, and poor synchronization of magnetic fields at multiple points, making it particularly suitable for parallel magnetic induction testing of multiple products and multiple points in a confined space.

[0029] The specific structure of the magnetic field generating unit 2 includes a horizontally positioned fixing plate 5, with multiple stepped columnar fixing parts 6 arranged vertically on the upper surface of the fixing plate 5. Each permanent magnet 3 is mounted on the top of a corresponding fixing part 6. The stepped column structure provides a stable mounting reference for the permanent magnet 3 and effectively limits the radial displacement of the permanent magnet 3, preventing it from shifting during movement. Mounting the permanent magnet 3 on an independent fixing part 6, rather than directly fixing it to the surface of the fixing plate 5, increases the effective stroke of the permanent magnet 3, allowing it to be closer to the product under test and obtain a stronger magnetic field effect. It also facilitates the individual replacement and maintenance of the permanent magnet 3, reducing the operating cost of the equipment.

[0030] To improve testing efficiency and meet the needs of mass production, at least two independent product placement positions can be set on the product carrier unit 1. Each product placement position corresponds to four test acupoints arranged in close sequence. Correspondingly, the number of permanent magnets 3 in the permanent magnet array is equal to the number of all test acupoints in all product placement positions, and their positions correspond one-to-one. In this way, a single driving action can simultaneously provide a magnetic field to all test acupoints of all products, realizing true parallel testing.

[0031] It should be noted that in this embodiment, the horizontal and vertical spacing between two adjacent test acupoints is 8mm and 72mm respectively, and the length and width of each test acupoint are 48mm and 4mm respectively, thus forming the aforementioned narrow space.

[0032] To ensure that each permanent magnet 3 is precisely aligned with its corresponding test acupoint, multiple recesses are formed on the top surface of the fixing plate 5 corresponding to the positions of each fixing part 6. The bottom of the fixing part 6 is embedded in the recesses, and adjusting screws 7 corresponding to the bottom of the fixing part 6 are provided on the side of the fixing plate 5. By turning the adjusting screws 7, the fixing part 6 can be pushed to make a slight horizontal displacement within the recesses, thereby independently adjusting the horizontal position of each permanent magnet 3 relative to its corresponding test acupoint. This independently adjustable structure can effectively compensate for processing and assembly errors, ensuring that each test acupoint receives an accurate magnetic field strength, and improving the accuracy and consistency of the test results.

[0033] The upper probe unit mainly consists of an upper mold fixing assembly 8, a first cylinder 9, a lower pressing assembly 10, a first adapter plate 11, an upper mold adapter plate 12, and upper needle molds 13. The upper mold fixing assembly 8 serves as the mounting base for the entire upper probe unit and is fixed to the upper frame of the device. The first cylinder 9 is vertically mounted on one side of the upper mold fixing assembly 8, and its output end is connected to the lower pressing assembly 10 to drive the lower pressing assembly 10 to perform vertical linear motion. The lower end of the lower pressing assembly 10 is fixedly connected to the first adapter plate 11, and the upper mold adapter plate 12 is mounted on the bottom surface of the first adapter plate 11. Multiple upper needle molds 13 are arranged on the upper mold adapter plate 12 according to the positions of the test points on the upper surface of the product to be tested. To ensure that the upper needle molds 13 can accurately align and contact the product to be tested, first guide posts 14 extending downwards are provided around the first adapter plate 11, and tubular bushings 26 are correspondingly provided on the outer side of the product placement position on the product carrying unit 1. During testing, the first cylinder 9 drives the pressing assembly 10 downwards. The first guide post 14 is first inserted into the corresponding bushing 26. Through the precise fit between the guide post and the bushing 26, the upper needle mold 13 is accurately positioned relative to the product. Subsequently, the upper needle mold 13 reliably contacts and conducts electrical communication with the test point on the upper surface of the product. This guiding structure of the guide post and bushing 26 effectively prevents the upper needle mold 13 from skewing during the pressing process, ensuring the stability and reliability of the electrical contact.

[0034] The structure of the lower probe unit is similar to that of the upper probe unit, mainly including a lower mold fixing assembly 15, a second cylinder 16, a lifting assembly 17, a second adapter plate 18, a lower mold adapter plate 19, and lower needle molds 20. The lower mold fixing assembly 15 is fixed on the lower frame of the device. The second cylinder 16 is vertically mounted on one side of the lower mold fixing assembly 15, and its output end is connected to the lifting assembly 17 to drive the lifting assembly 17 to perform vertical linear motion. The upper end of the lifting assembly 17 is fixedly connected to the second adapter plate 18, and the lower mold adapter plate 19 is mounted on the top surface of the second adapter plate 18. Multiple lower needle molds 20 are arranged on the lower mold adapter plate 19 according to the position of the test points on the lower surface of the product to be tested. Similarly, the second adapter plate 18 is provided with upwardly extending second guide posts 21 around its perimeter, and the second guide posts 21 are correspondingly arranged with the bushings 26 on the product carrying unit 1. During testing, the second cylinder 16 drives the lifting assembly 17 to move upward, and the second guide post 21 inserts into the corresponding bushing 26, achieving precise positioning of the lower probe die 20 with the product. Subsequently, the lower probe die 20 reliably contacts and conducts with the test points on the lower surface of the product. The upper and lower probe units adopt a symmetrical driving and guiding structure, which can ensure that the test points on the upper and lower surfaces of the product contact and conduct simultaneously, avoiding test errors caused by different contact sequences.

[0035] The electric slide table 4 is mounted on one side of the lifting assembly 17, opposite the lower mold fixing assembly 15, via a slide table fixing plate 22. The lifting assembly 17 and the second transition fixing plate 18 are connected by a frame 23. An inverted L-shaped permanent magnet fixing plate 24 is fixedly connected to the slide table 4, and the fixing plate 5 of the magnetic field generating unit 2 is fixedly connected to the horizontal top end of the permanent magnet fixing plate 24. This inverted L-shaped installation structure allows the magnetic field generating unit 2 to be positioned above the electric slide table 4, below the lower probe unit, making full use of the longitudinal space of the device and further reducing the overall size of the equipment.

[0036] To allow the permanent magnet 3 to pass through the lower probe unit and approach the product under test, the frame 23 is vertically continuous, forming a first channel through which the fixing plate 5 can pass. Simultaneously, through holes are provided on the second adapter plate 18 and the lower mold adapter plate 19 corresponding to the positions of each fixing part 6. These through holes are interconnected, forming a second channel through which the fixing parts 6 can pass. During testing, the electric slide 4 drives the permanent magnet array upwards. The fixing plate 5 passes through the first channel of the frame 23, while the fixing parts 6 sequentially pass through the second channels on the second adapter plate 18 and the lower mold adapter plate 19. This allows the permanent magnet 3 to directly approach the lower surface of the product support unit 1, thereby generating a sufficiently strong magnetic field at the test acupoints on the product. This nested structure allows for independent movement of the magnetic field generating unit 2 and the lower probe unit, without interference. This ensures that the lower probe mold 20 can reliably contact the product, and that the permanent magnet 3 can approach the product sufficiently closely, achieving ideal testing results.

[0037] Each product placement position on the product carrier unit 1 is equipped with a product positioning groove 25. The shape of the product positioning groove 25 matches the shape of the product under test, enabling rapid coarse positioning and preventing positional displacement during placement. To further improve the reliability of product fixation, a vacuum hole 27 is provided on the side of the product carrier unit 1. The vacuum hole 27 is connected to the bottom of the product positioning groove 25 and is also connected to an external vacuum generator. During testing, the external vacuum generator is turned on, generating negative pressure within the product positioning groove 25 through the vacuum hole 27, firmly adsorbing and fixing the product under test within the groove. This vacuum adsorption fixation method does not cause any mechanical damage to the product, and the uniform fixing force effectively prevents product displacement during probe pressing and magnetic field switching, ensuring the stability of the testing process.

[0038] The present invention also provides a method for multi-acupoint magnetic induction testing in confined spaces, which is implemented using the above-mentioned magnetic induction testing device, and the specific steps are as follows: Before the test begins, the operator places the small electronic products to be tested sequentially into the corresponding product positioning slots 25 of the product carrier unit 1, using the matching relationship between the positioning slots and the product shape to achieve rapid coarse positioning. After all products are in place, the external vacuum generator connected to the vacuum vent 27 on the side of the product carrier unit 1 is turned on. A negative pressure is formed under the product through the vacuum vent 27 at the bottom of the positioning slot, firmly adsorbing and fixing the product in the positioning slot. This ensures that the product will not shift during the subsequent probe pressing and magnetic field switching processes, providing a basic guarantee for the accuracy of the test.

[0039] After the product is fixed, the control system first drives the first cylinder 9 of the upper probe unit to move. The first cylinder 9 drives the lower pressing component 10 to move downwards in the vertical direction. The first guide post 14 installed around the first adapter plate 11 is inserted into the corresponding tubular bushing 26 on the product carrier unit 1. The precise clearance between the guide post and the bushing 26 achieves accurate positioning of the upper needle mold 13 and the product. As the lower pressing component 10 continues to move downwards, all the upper needle molds 13 on the upper mold adapter plate 12 simultaneously form reliable electrical contact with the corresponding test points on the upper surface of the product. Next, the second cylinder 16 of the lower probe unit is activated, driving the lifting component 17 to move upwards in the vertical direction. Similarly, the second guide post 21 around the second adapter plate 18 first inserts into the corresponding bushing 26 to complete the positioning. Then, all the lower needle molds 20 on the lower mold adapter plate 19 simultaneously make electrical contact with the corresponding test points on the lower surface of the product. At this point, all the test circuits of the products under test are connected, ready to enter the magnetic induction test stage.

[0040] After the circuit is turned on, the testing system first collects and records the electrical performance parameters of all products in an environment without an external magnetic field, as benchmark data. Then, the control system sends a drive signal to the electric slide 4, which drives the inverted L-shaped permanent magnet plate 24 and the magnetic field generating unit 2 fixed on it to move upwards as a whole. During this process, the fixing plate 5 of the magnetic field generating unit 2 passes through the first channel in the middle of the frame 23, and the stepped columnar fixing parts 6 pass through the corresponding second channels on the second transition plate 18 and the lower mold transition plate 19 in sequence, causing the permanent magnets 3 installed at the top of the fixing parts 6 to gradually approach the lower surface of the product carrying unit 1. When the electric slide 4 reaches the preset upper limit position, all permanent magnets 3 simultaneously reach the position closest to the corresponding test acupoint. At this time, a stable and consistent test magnetic field is synchronously formed at all test acupoints, and the testing system immediately collects and records the electrical performance parameters of all products in this state. After completing the test in a magnetic environment, the electric slide 4 reverses its direction, causing the permanent magnet array to move downwards away from the product until it returns to its initial lower limit position. At the same time, the magnetic field at all test points disappears. The test system can then collect parameters again in a non-magnetic environment for comparison and verification as needed.

[0041] After all tests are completed, the control system issues reset commands sequentially. First, it controls the electric slide 4 to remain at its initial lower limit position, ensuring that the permanent magnet array is completely away from the product support unit 1. Then, it drives the second cylinder 16 to move the lifting assembly 17 downward to reset, causing the lower needle mold 20 to disengage from the lower surface of the product. Next, it drives the first cylinder 9 to move the pressing assembly 10 upward to reset, causing the upper needle mold 13 to disengage from the upper surface of the product. Finally, it shuts off the external vacuum generator to release the product's adsorption and fixation. The operator can then remove the tested product from the product limiting groove 25 and place the next batch of products to be tested. Repeating the above process allows for continuous batch testing.

[0042] This testing method achieves synchronous switching of magnetic fields at multiple acupoints through physical displacement. Combined with a symmetrical probe conduction structure and vacuum adsorption fixation, it not only significantly improves testing efficiency and enables simultaneous magnetic field testing of multiple products and multiple acupoints in a confined space, but also effectively ensures the accuracy and consistency of test results. It is particularly suitable for industrial mass production testing of small electronic products.

[0043] The terms “above,” “below,” and “within” as used above include the number itself; the terms “exceeding” and “excluding” do not include the number itself.

[0044] The present invention has been further described above with reference to specific embodiments. However, it should be understood that the specific descriptions herein should not be construed as limiting the substance and scope of the present invention. Various modifications made to the above embodiments by those skilled in the art after reading this specification are all within the scope of protection of the present invention. The various specific technical features described in the above embodiments can be combined in any suitable manner without contradiction. To avoid unnecessary repetition, the embodiments of the present invention will not further describe various possible combinations.

[0045] If the embodiments of the present invention involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicators will also change accordingly.

Claims

1. A multi-aperture magnetic induction testing device for confined spaces, characterized in that, The device includes a product carrier unit for carrying multiple products under test, an upper probe unit and a lower probe unit correspondingly arranged on both sides of the product carrier unit, and an electric slide table arranged on the lower probe unit. A magnetic field generating unit is arranged on one end of the electric slide table near the product carrier unit. The magnetic field generating unit includes multiple permanent magnets corresponding to the products under test. The electric slide table can drive the multiple permanent magnets to reciprocate in a direction perpendicular to the surface of the products under test, so that the multiple permanent magnets synchronously approach or move away from the products under test.

2. The multi-aperture magnetic induction testing device for confined spaces according to claim 1, characterized in that, The magnetic field generating unit also includes a fixed plate and multiple fixed parts arranged in a vertical array on the fixed plate, with each permanent magnet correspondingly disposed on the top of a fixed part.

3. The multi-aperture magnetic induction testing device for confined spaces according to claim 2, characterized in that, The product carrier unit is provided with at least two independent product placement positions, and each product placement position is provided with multiple test acupoints. The number of permanent magnets and the test acupoints of the product placement positions are equal and their positions correspond one-to-one. Multiple cavities are formed on the top surface of the fixing plate, and the bottom of the fixing part is correspondingly placed in the cavity. The side of the fixing plate is provided with adjusting screws corresponding to the bottom of the fixing part. The adjusting screws are used to independently adjust the horizontal position of each permanent magnet relative to the corresponding test acupoint.

4. The multi-aperture magnetic induction testing device for confined spaces according to any one of claims 1 to 3, characterized in that, The product carrier unit is equipped with a bushing. The upper probe unit includes an upper mold fixing component, a pressing component and a first cylinder set on one side of the upper mold fixing component, a first adapter plate on the end of the pressing component near the product carrier unit, and an upper mold adapter plate set on the first adapter plate. Multiple upper needle molds are set on the upper mold adapter plate. The first adapter plate is equipped with a first guide post extending downward. The first guide post is set in correspondence with the bushing.

5. The multi-aperture magnetic induction testing device for confined spaces according to claim 4, characterized in that, The lower probe unit includes a lower mold fixing assembly, a lifting assembly and a second cylinder disposed on one side of the lower mold fixing assembly, a second adapter plate disposed on the lifting assembly near the product carrying unit, and a lower mold adapter plate disposed on the second adapter plate. The lower mold adapter plate is provided with multiple lower needle molds, and the second adapter plate is provided with an upwardly extending second guide post, which is correspondingly disposed with the bushing.

6. The multi-aperture magnetic induction testing device for confined spaces according to claim 5, characterized in that, It also includes a slide plate fixed on the side of the lifting assembly and the lower mold fixing assembly, and a frame connecting the lifting assembly and the second transfer plate. The electric slide is set on the slide plate, and a permanent magnet plate is set on the electric slide. The fixing plate of the magnetic field generating unit is connected to the top of the permanent magnet plate.

7. The multi-aperture magnetic induction testing device for confined spaces according to claim 6, characterized in that, The frame extends vertically to form a first channel through which the fixing plate can pass. The second adapter plate and the lower mold adapter plate are both provided with through holes to form a second channel through which the fixing part can pass.

8. The multi-aperture magnetic induction testing device for confined spaces according to claim 3, characterized in that, The product carrying unit is provided with a product limiting groove for each product placement position, and the shape of the product limiting groove matches the shape of the product to be tested.

9. The multi-aperture magnetic induction testing device for confined spaces according to claim 8, characterized in that, It also includes a vacuum hole on the side of the product carrier unit and an external vacuum generator connected to the vacuum hole. The vacuum hole is connected to the product limiting groove, and the external vacuum generator is used to adsorb and fix the product to be tested placed in the product limiting groove.

10. A method for multi-acupoint magnetic induction testing in confined spaces, characterized in that, The magnetic induction testing device according to any one of claims 1 to 9 is used to implement the method, which includes placing the product under test at the testing station, arranging multiple permanent magnets in a one-to-one correspondence with the positions of multiple test points on the product under test to form a permanent magnet array, electrically connecting the product under test with the test probe to form a test circuit, and driving the permanent magnet array as a whole to perform linear reciprocating motion in a direction perpendicular to the surface of the product under test, so that the permanent magnet array is close to or away from the product under test, so as to achieve switching between a magnetic testing environment and a non-magnetic testing environment at all test points of the product under test.

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