Device for measuring offset and deflection angle of glass substrate
By designing a combination device consisting of a positioning frame, calipers, angle gauges, and probes, the problem of efficiently measuring the offset and deflection angle of the glass substrate was solved, achieving efficient and accurate measurement results, reducing the risk of glass scratches, and enhancing the stability and flexibility of the device.
Patent Information
- Application Number
- CN202520818328.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-27
- Publication Date
- 2026-03-31
- Estimated Expiration
- 2035-04-27
AI Technical Summary
Existing technologies are difficult to use efficiently and accurately to measure the offset and deflection angle of glass substrates. Manual measurement is inefficient and inaccurate, and can easily scratch the glass surface. Furthermore, existing mechanisms are not compatible with the support structure of horizontal frame packaging, resulting in insufficient installation stability.
A measuring device including a positioning frame, calipers, angle gauges, probes, and probes was designed. Through the cooperation of the positioning plate and the handle, it is adapted to the support structure of the horizontal frame packaging. The stability is improved by using secondary bolts and buffer layers, and the calipers and probes reduce the risk of scratches, so as to achieve fast and accurate measurement of offset and deflection angle.
It improves the detection efficiency and accuracy of glass substrate offset and deflection angle, reduces the probability of glass surface scratches, enhances measurement flexibility and coverage, and improves device stability.