Onium salt compound
The use of an onium salt compound as a radiation-sensitive acid generator in a resin composition addresses the insufficiencies of existing technologies by enhancing sensitivity, LWR, and CDU performance, facilitating high-quality resist pattern formation for next-generation photolithography.
Patent Information
- Application Number
- JP2025075215
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2020-05-29
- Filing Date
- 2025-04-30
- Publication Date
- 2025-08-05
- Estimated Expiration
- 2041-05-13
AI Technical Summary
Existing radiation-sensitive resin compositions do not provide sufficient levels of sensitivity, Line Width Roughness (LWR) performance, and Critical Dimension Uniformity (CDU) performance required for next-generation photolithography technologies.
Incorporating an onium salt compound with a specific structure as a radiation-sensitive acid generator in a resin composition, which includes a solvent and optionally an acid diffusion controller, to enhance sensitivity, LWR performance, and CDU performance during resist pattern formation.
The onium salt compound composition achieves high-quality resist patterns with improved sensitivity, LWR performance, and CDU performance, enabling efficient formation of fine circuits in semiconductor elements.