Radiation measurement system
The radiation measurement system addresses inefficiencies in measuring multiple samples by using a rotatable shaft unit and support units with a correction table, ensuring accurate and efficient sample processing.
WO2025191954A1 Publication Date: 2025-09-18RIGAKU CORP
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Patent Information
- Application Number
- PCT/JP2024/044516
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-03-14
- Filing Date
- 2024-12-17
- Publication Date
- 2025-09-18
AI Technical Summary
Technical Problem
Existing radiation measurement systems face inefficiencies when measuring multiple samples due to variations in the distance between the X-ray source or detector and the sample, leading to inaccuracies in measurement results.
Method used
A radiation measurement system with a rotatable shaft unit and support units that allow for efficient installation and positioning of multiple samples, utilizing a correction table to adjust for distance variations and improve measurement accuracy.
Benefits of technology
The system enables precise and efficient measurement of multiple samples by correcting for distance-related intensity changes, reducing measurement time and increasing the number of samples that can be processed without increasing system size.
✦ Generated by Eureka AI based on patent content.
Abstract
According to an aspect of the present invention, a radiation measurement system is provided. This radiation measurement system comprises: an irradiation unit; a target placement unit; a detection unit; and a candidate placement unit. The irradiation unit is configured to irradiate a measurement target with radiation. The target placement unit is configured so that the measurement target can be placed within the irradiation range of the radiation. The detection unit is configured to detect the radiation having passed through the measurement target. The candidate placement unit is configured to be able to place a candidate for the measurement target, and is provided with a shaft part, a first support part, and a second support part. The shaft part extends along the axial direction, and is configured to be rotatable about a rotation axis along the axial direction. The first support part is configured to be rotatable in accordance with rotation of the shaft part, and is provided with a plurality of first support regions. Each of the first support regions supports the candidate for the measurement target, and is disposed along the outer peripheral edge of the first support part. The second support part is configured to be rotatable in accordance with the rotation of the shaft part, and is provided with a plurality of second support regions. Each of the second support regions supports the candidate for the measurement target, and is disposed along the outer periphery of the shaft part. The first support part and the second support part are disposed at positions separated in the axial direction.
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