A high voltage test device for high voltage diodes with double camelback structure

Abstract

The present invention provides a high-voltage diode high-voltage test device with a double-hump structure, comprising: a frame, a front feeding mechanism, a high-voltage test mechanism and a rear feeding mechanism, wherein a main shaft is arranged inside the frame; the front feeding mechanism comprises a front power wheel group and a front feeding chain group, and the diode is placed on the front feeding chain of the front feeding chain group; the high-voltage test mechanism comprises a high-voltage box, and a divider, a test piece group and a feeding device are arranged inside the high-voltage box, and the diode on the front feeding chain is sent into the high-voltage box from the top of the high-voltage box and placed on the test wheel of the divider, and the rear feeding mechanism comprises a rear power wheel group and a rear feeding chain group, and the rear feeding chain of the rear feeding chain group transports the diode out of the high-voltage box from the top of the high-voltage box. The present invention provides a high-voltage diode high-voltage test device with a double-hump structure, wherein the front feeding mechanism and the rear feeding mechanism form a double-hump structure, and the feeding chains are both in and out of the top of the high-voltage test box, which can effectively reduce the leakage of insulating gas during testing.

Description

Technical Field

[0001] The invention relates to a high-voltage test of a high-voltage diode, in particular to a high-voltage test device of a high-voltage diode with a double-hump structure. Background Art

[0002] A diode is an electronic device made of semiconductor materials (silicon, selenium, germanium, etc.). It has unidirectional conductivity, that is, when a forward voltage is applied to the anode and cathode of the diode, the diode is turned on. When a reverse voltage is applied to the anode and cathode, the diode is turned off. The diode is one of the earliest semiconductor devices and is widely used. A high-voltage diode is a silicon crystal diode that is only turned on under high voltage.

[0003] In order to detect whether the performance of high-voltage diodes meets the requirements, high-voltage diodes need to be tested online. Since high-voltage diodes are only turned on under high voltage, high-voltage diodes require special high-voltage test equipment. In order to ensure the safety of the test process, it is necessary to avoid leakage of insulating gas in the high-voltage test equipment. Summary of the invention

[0004] In view of this, the present invention provides a high-voltage diode high-voltage testing device with a double-hump structure. The front material-carrying mechanism and the rear material-carrying mechanism form a double-hump structure. The material-carrying chains enter and exit from the top of the high-voltage test box. The surroundings and the bottom are sealed, which can effectively reduce the leakage of insulating gas during testing.

[0005] To this end, the present invention provides a high-voltage diode high-voltage test device with a double-hump structure, comprising:

[0006] A frame, wherein a main shaft is arranged inside, and a first transmission pair, a second transmission pair and a third transmission pair arranged in parallel are sequentially arranged on the main shaft;

[0007] The front material belt mechanism includes a front power wheel group and a front material belt chain group. The power of the main shaft is transmitted to the front power wheel group through the first transmission pair. The front power wheel group transmits the power to the front material belt chain group. The diode is placed on the front material belt chain of the front material belt chain group.

[0008] The high-voltage testing mechanism includes a high-voltage box, in which a splitter, a test piece group and a feeding device are arranged. The power of the main shaft is transmitted to the splitter through the second transmission pair. A test wheel is sleeved on the output shaft of the splitter. The diode on the front material belt chain is sent into the high-voltage box from the top of the high-voltage box and placed on the test wheel. A light shielding piece group is arranged on an input shaft of the splitter. The test piece group is fixedly mounted on the frame vertical plate, and the feeding device is fixedly mounted on one side of the test wheel.

[0009] The rear material belt mechanism includes a rear power wheel group and a rear material belt chain group. The power of the main shaft is transmitted to the rear power wheel group through the third transmission pair. The rear power wheel group transmits the power to the rear material belt chain group. The rear material belt chain of the rear material belt chain group transports the diode out of the high-voltage box from the top of the high-voltage box.

[0010] Furthermore, the front power wheel assembly includes a front reducer, a front driving sprocket and a front driven sprocket. The front reducer is connected to the main shaft through a first transmission pair. The front reducer drives the front driving sprocket, and the front driving sprocket drives the front driven sprocket.

[0011] Furthermore, the front belt chain group also includes a front belt driving wheel, a front first tension wheel, a first transition wheel and a front second tension wheel. The front belt driving wheel and the front driven sprocket are coaxially arranged, and the front belt chain is sleeved on the front belt driving wheel, the front first tension wheel, the first transition wheel and the front second tension wheel.

[0012] Furthermore, the test wheel includes two coaxially arranged test wheel units, the two test wheel units are separated by a test guard bow, and the test wheel unit is provided with a plurality of circumferentially equidistantly arranged strip material grooves, and the diodes are placed in the strip material grooves.

[0013] Furthermore, a hard insert is arranged in the belt trough.

[0014] Furthermore, a spacing groove is provided between two adjacent belt material grooves.

[0015] Furthermore, the test piece group includes an insulating bracket, a test piece and a terminal. The insulating bracket is fixedly mounted on the frame vertical plate, and the test piece is fixedly mounted on the insulating bracket. One end of the test piece is connected to the terminal and the other end is against the edge of the test wheel.

[0016] Furthermore, the feeding device includes a pusher claw and a feeding box, the pusher claw is fixedly mounted on the feeding box, the end of the pusher claw is tangent to the test wheel, and the diode falls into the feeding box from the pusher claw and falls onto the rear material belt chain from the bottom of the feeding box.

[0017] Furthermore, the rear power wheel assembly includes a rear reducer, a rear driving sprocket and a rear driven sprocket. The rear reducer is connected to the main shaft through a third transmission pair. The rear reducer drives the rear driving sprocket, and the rear driving sprocket drives the rear driven sprocket.

[0018] Furthermore, the rear belt chain group also includes a rear belt driving wheel, a rear first tension wheel, a second transition wheel and a rear second tension wheel. The rear belt driving wheel and the rear driven sprocket are coaxially arranged, and the rear belt chain is sleeved on the rear belt driving wheel, the rear first tension wheel, the second transition wheel and the rear second tension wheel.

[0019] The present invention provides a high-voltage diode high-voltage test device with a double-hump structure, which is used for online testing of high-voltage diodes. The front feeding chain of the front feeding chain group delivers the diode from the top of the high-voltage box into the high-voltage box, and the rear feeding chain of the rear feeding chain group transports the diode from the top of the high-voltage box out of the high-voltage box. Due to the design of the first transition wheel on the front feeding chain group and the second transition wheel on the rear feeding chain group, a double-hump structure is formed. Since the high-voltage box only has gaps for the front feeding chain and the rear feeding chain on the top, and is sealed around and on the bottom, the leakage of insulating gas during testing can be effectively reduced. The power of the high-voltage test unit comes from the high-voltage continuous machine, which is input from the main shaft, and the center height of the main shaft is consistent with that of the continuous machine. The transmission structure can be divided into three parts: the front feeding mechanism, the high-voltage test mechanism and the rear feeding mechanism. The main shafts of each transmission part are connected by a double-row chain coupling, which is convenient for adjusting the device when it is handed over between the parts.

[0020] Front material belt mechanism: The spindle power drives the front reducer through the first transmission pair, and then the front driving sprocket drives the front driven sprocket. The front material belt driving wheel and the front driven sprocket coaxially drive the front material belt chain group. The front material belt chain group is two inner and outer 06C resistance material belt chains, which are mainly driven by the front material belt driving wheel, and driven by the front first tension wheel, the front second tension wheel, the first transition wheel and a series of other transition wheels to bring the diode into the high-voltage box and transfer it to the test wheel. In this mechanism, the transmission ratio of the front reducer input transmission pair is 1:1, and the reduction ratio of the front reducer is 1:15. Finally, the spindle rotates one circle, and the front material belt chain moves forward two sections.

[0021] High-voltage test mechanism: The spindle power is input to the divider through the second transmission 1:1, and the final transmission ratio is that the spindle rotates one circle and the test wheel rotates 2 teeth. A light shielding plate group is installed on the other input shaft of the divider, in which the light shielding plate is a double-leaf equally divided structure, which serves as the start and stop signal of the high-voltage test. The divider is a customized long output shaft type, and the output shaft and the frame vertical plate are sealed with a sealing ring to prevent leakage of insulating gas. A high-voltage test wheel is installed on the output shaft. The test wheel is a two-piece type. When working, the middle is separated by a test guard. The inner core of each set of test pieces is made of metal, with an insulating shell outside, and a shielding outer layer is added on the low-voltage side. The test piece group is fixed to the frame vertical plate through an insulating bracket. The workstation after the test piece is equipped with a feeding device, which includes a pusher and a feeding box. The end of the pusher is tangent to the test wheel, and the diode falls from the pusher into the feeding box and falls from the bottom of the feeding box to the rear belt chain.

[0022] Rear material belt mechanism: The spindle power drives the rear reducer through the third transmission pair, and then the rear driving sprocket drives the rear driven sprocket. The rear material belt driving wheel and the rear driven sprocket coaxially drive the rear material belt chain group. The rear material belt chain group is two inner and outer 06C resistor belt chains, which are mainly driven by the rear material belt driving wheel, and driven by the rear first tension wheel, the rear second tension wheel, the second transition wheel and a series of other transition wheels to realize the introduction of the device from the bottom of the unloading box and take it out of the high-voltage test box. In this mechanism, the transmission ratio of the rear reducer input transmission pair is 1:1, and the reduction ratio of the rear reducer is 1:15. Finally, the spindle rotates one circle, and the material belt chain moves forward two sections.

[0023] The present invention provides a high-voltage diode high-voltage test device with a double-hump structure. The front material-carrying mechanism and the rear material-carrying mechanism form a double-hump structure. The material-carrying chains enter and exit from the top of the high-voltage test box. The surroundings and the bottom are sealed, which can effectively reduce the leakage of insulating gas during testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present invention. Moreover, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0025] Figure 1 A schematic structural diagram of a high-voltage test device for a high-voltage diode with a double-hump structure provided by an embodiment of the present invention;

[0026] Figure 2 for Figure 1 A partial enlarged view of the middle A;

[0027] Figure 3 for Figure 1 A partial enlarged view of point B in the middle;

[0028] Figure 4 A schematic diagram of the structure of a test wheel in a high-voltage test device for a high-voltage diode with a double-hump structure provided by an embodiment of the present invention;

[0029] Figure 5 A schematic structural diagram of a test piece group in a high-voltage test device for a high-voltage diode with a double-hump structure provided by an embodiment of the present invention;

[0030] Figure 6 A side view of a high voltage box in a high voltage test device for a high voltage diode with a double camelback structure provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0031] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0032] Embodiment 1:

[0033] See also Figures 1 to 6 , the figure shows a high-voltage diode high-voltage test device with a double-hump structure provided by Embodiment 1 of the present invention, comprising:

[0034] The frame 1 has a main shaft 11 disposed therein, and the main shaft 11 is provided with a first transmission pair 111, a second transmission pair 112 and a third transmission pair 113 arranged in parallel in sequence;

[0035] The front material belt mechanism 2 includes a front power wheel set 21 and a front material belt chain set 22. The power of the main shaft 11 is transmitted to the front power wheel set 21 through the first transmission 111. The front power wheel set 21 transmits the power to the front material belt chain set 22. The diode is placed on the front material belt chain 221 of the front material belt chain set 22.

[0036] The high-voltage testing mechanism 3 includes a high-voltage box 31, in which a splitter 32, a test piece group 33 and a feeding device 34 are arranged. The power of the main shaft 11 is transmitted to the splitter 32 through the second transmission 112. A test wheel 35 is sleeved on the output shaft 321 of the splitter 32. The diode on the front material belt chain 221 is sent into the high-voltage box 31 from the top of the high-voltage box 31 and placed on the test wheel 35. A light shielding piece group 36 is arranged on an input shaft of the splitter 32. The test piece group 33 is fixedly mounted on the frame vertical plate 12, and the feeding device 34 is fixedly mounted on one side of the test wheel 35.

[0037] The rear material belt mechanism 4 includes a rear power wheel group 41 and a rear material belt chain group 42. The power of the main shaft 11 is transmitted to the rear power wheel group 41 through the third transmission 113. The rear power wheel group 41 transmits the power to the rear material belt chain group 42. The rear material belt chain 421 of the rear material belt chain group 42 transports the diode out of the high-voltage box 31 from the top of the high-voltage box 31.

[0038] For details, see Figures 1 to 6 The front power wheel assembly 21 includes a front reducer 211, a front driving sprocket 212 and a front driven sprocket 213. The front reducer 211 is connected to the main shaft 11 through the first transmission pair 111. The front reducer 211 drives the front driving sprocket 212, and the front driving sprocket 212 drives the front driven sprocket 213.

[0039] For details, see Figures 1 to 6The front belt chain group 22 also includes a front belt driving wheel 222, a front first tension wheel 223, a first transition wheel 224 and a front second tension wheel 225. The front belt driving wheel 222 and the front driven sprocket 213 are coaxially arranged, and the front belt chain 221 is sleeved on the front belt driving wheel 222, the front first tension wheel 223, the first transition wheel 224 and the front second tension wheel 225.

[0040] For details, see Figures 1 to 6 The test wheel 35 includes two coaxially arranged test wheel units 351, the two test wheel units 351 are separated by a test guard bow 352, and a plurality of circumferentially equidistantly arranged strip material slots are provided on the test wheel unit 351, and the diodes are placed in the strip material slots.

[0041] For details, see Figures 1 to 6 The test piece group 33 includes an insulating bracket 331, a test piece 332 and a wiring 333. The insulating bracket 331 is fixedly mounted on the frame vertical plate 12, and the test piece 332 is fixedly mounted on the insulating bracket 331. One end of the test piece 332 is connected to the wiring post 333 and the other end is against the edge of the test wheel 35.

[0042] For details, see Figures 1 to 6 The feeding device 34 includes a pusher claw 341 and a feeding box 342. The pusher claw 341 is fixedly mounted on the feeding box 342. The end of the pusher claw 341 is tangent to the test wheel 35. The diode falls into the feeding box 342 from the pusher claw 341 and falls from the bottom of the feeding box 342 to the rear belt chain 421.

[0043] For details, see Figures 1 to 6 The rear power wheel group 41 includes a rear reducer 411, a rear driving sprocket 412 and a rear driven sprocket 413. The rear reducer 411 is connected to the main shaft 11 through the third transmission 113. The rear reducer 411 drives the rear driving sprocket 412. The rear driving sprocket 412 drives the rear driven sprocket 413.

[0044] For details, see Figures 1 to 6 The rear belt chain group 42 also includes a rear belt driving wheel 422, a rear first tension wheel 423, a second transition wheel 424 and a rear second tension wheel 425. The rear belt driving wheel 422 and the rear driven sprocket 413 are coaxially arranged, and the rear belt chain 421 is sleeved on the rear belt driving wheel 422, the rear first tension wheel 423, the second transition wheel 424 and the rear second tension wheel 425.

[0045] The present invention provides a high-voltage diode high-voltage test device with a double-hump structure, which is used for online testing of high-voltage diodes. The front feeding chain of the front feeding chain group delivers the diode from the top of the high-voltage box into the high-voltage box, and the rear feeding chain of the rear feeding chain group transports the diode from the top of the high-voltage box out of the high-voltage box. Due to the design of the first transition wheel on the front feeding chain group and the second transition wheel on the rear feeding chain group, a double-hump structure is formed. Since the high-voltage box only has gaps for the front feeding chain and the rear feeding chain on the top, and is sealed around and on the bottom, the leakage of insulating gas during testing can be effectively reduced. The power of the high-voltage test unit comes from the high-voltage continuous machine, which is input from the main shaft, and the center height of the main shaft is consistent with that of the continuous machine. The transmission structure can be divided into three parts: the front feeding mechanism, the high-voltage test mechanism and the rear feeding mechanism. The main shafts of each transmission part are connected by a double-row chain coupling, which is convenient for adjusting the device when it is handed over between the parts.

[0046] Front material belt mechanism: The spindle power drives the front reducer through the first transmission pair, and then the front driving sprocket drives the front driven sprocket. The front material belt driving wheel and the front driven sprocket coaxially drive the front material belt chain group. The front material belt chain group is two inner and outer 06C resistance material belt chains, which are mainly driven by the front material belt driving wheel, and driven by the front first tension wheel, the front second tension wheel, the first transition wheel and a series of other transition wheels to bring the diode into the high-voltage box and transfer it to the test wheel. In this mechanism, the transmission ratio of the front reducer input transmission pair is 1:1, and the reduction ratio of the front reducer is 1:15. Finally, the spindle rotates one circle, and the front material belt chain moves forward two sections.

[0047] High-voltage test mechanism: The spindle power is input to the divider through the second transmission pair at a ratio of 1:1. The final transmission ratio is that the spindle rotates one circle and the test wheel rotates 2 teeth. A shading plate group is installed on the other input shaft of the divider, in which the shading plate is a double-leaf equally divided structure, which serves as the start and stop signal of the high-voltage test. The divider is a customized long output shaft type, and the output shaft and the frame vertical plate are sealed with a sealing ring to prevent leakage of insulating gas. A high-voltage test wheel is installed on the output shaft. The test wheel is a two-piece type. When working, the middle is separated by a test guard. The inner core of each group of test pieces is made of metal, with an insulating shell outside, and a shielding outer layer is added on the low-voltage side. The test piece group is fixed to the frame vertical plate through an insulating bracket. The workstation after the test piece is equipped with a feeding device, which includes a pusher and a feeding box. The end of the pusher is tangent to the test wheel, and the diode falls from the pusher into the feeding box and falls from the bottom of the feeding box to the rear belt chain.

[0048] Rear material belt mechanism: The spindle power drives the rear reducer through the third transmission pair, and then the rear driving sprocket drives the rear driven sprocket. The rear material belt driving wheel and the rear driven sprocket coaxially drive the rear material belt chain group. The rear material belt chain group is two inner and outer 06C resistor material belt chains, which are mainly driven by the rear material belt driving wheel, and driven by the rear first tension wheel, the rear second tension wheel, the second transition wheel and a series of other transition wheels to realize the introduction of the device from the bottom of the unloading box and take it out of the high-voltage test box. In this mechanism, the transmission ratio of the rear reducer input transmission pair is 1:1, and the reduction ratio of the rear reducer is 1:15. Finally, the spindle rotates one circle, and the material belt chain moves forward two sections.

[0049] The present invention provides a high-voltage diode high-voltage test device with a double-hump structure. The front material-carrying mechanism and the rear material-carrying mechanism form a double-hump structure. The material-carrying chains enter and exit from the top of the high-voltage test box. The surroundings and the bottom are sealed, which can effectively reduce the leakage of insulating gas during testing.

[0050] Embodiment 2:

[0051] See also Figures 1 to 6 , the figure shows a high-voltage diode high-voltage test device with a double-hump structure provided by Embodiment 2 of the present invention. This embodiment further makes the following improved technical solutions on the basis of the above embodiment: a hard insert 353 is arranged in the material groove.

[0052] The material groove of the test wheel is inlaid with hard materials to improve the wear resistance of the test wheel and extend the service life of the test wheel.

[0053] Embodiment three:

[0054] See also Figures 1 to 6 , the figure shows a high-voltage diode high-voltage test device with a double camelback structure provided by embodiment 3 of the present invention. This embodiment further makes the following improved technical solution on the basis of the above embodiment: a spacing groove 354 is provided between two adjacent material grooves.

[0055] Sparks and dust are inevitable during high voltage testing. Spacer grooves are set between the material troughs to prevent such dust from conducting electricity, avoid affecting the test, and ensure the accuracy of the test results.

[0056] Embodiment 4:

[0057] See also Figures 1 to 6 The figure shows a high-voltage diode high-voltage test device with a double-hump structure provided by embodiment 4 of the present invention. This embodiment further makes the following improved technical solutions on the basis of the above embodiments: a first movable door 311 is arranged on the top of the high-voltage box 31, and a second movable door 312 is arranged on the front of the high-voltage box 31. The first movable door 311 is hinged on the high-voltage box 31, and the second movable door 312 is hinged on the high-voltage box 31.

[0058] The first movable door and the second movable door are made of transparent material, which is convenient for observing the high-voltage test situation in the high-voltage box, and timely repair and treatment can be carried out if any problems are found.

[0059] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A high voltage test device for a high voltage diode with a double camelback structure, characterized in that: include: A frame (1) having a main shaft (11) disposed therein, wherein the main shaft (11) is provided with a first transmission pair (111), a second transmission pair (112) and a third transmission pair (113) arranged in parallel in sequence; A front material belt mechanism (2), comprising a front power wheel group (21) and a front material belt chain group (22), wherein the power of the main shaft (11) is transmitted to the front power wheel group (21) through the first transmission pair (111), and the front power wheel group (21) transmits the power to the front material belt chain group (22), and the diode is placed on the front material belt chain (221) of the front material belt chain group (22); A high-voltage testing mechanism (3), comprising a high-voltage box (31), wherein a divider (32), a test piece group (33) and a feeding device (34) are arranged in the high-voltage box (31), the power of the main shaft (11) is transmitted to the divider (32) through the second transmission pair (112), a test wheel (35) is sleeved on the output shaft (321) of the divider (32), the diode on the front material belt chain (221) is sent into the high-voltage box (31) from the top of the high-voltage box (31) and placed on the test wheel (35), a light shielding piece group (36) is arranged on an input shaft of the divider (32), the test piece group (33) is fixedly mounted on the frame vertical plate (12), and the feeding device (34) is fixedly mounted on one side of the test wheel (35); A rear material belt mechanism (4), comprising a rear power wheel group (41) and a rear material belt chain group (42), wherein the power of the main shaft (11) is transmitted to the rear power wheel group (41) through the third transmission pair (113), the rear power wheel group (41) transmits the power to the rear material belt chain group (42), and the rear material belt chain (421) of the rear material belt chain group (42) transports the diode from the top of the high-voltage box (31) out of the high-voltage box (31); The front power wheel assembly (21) comprises a front reducer (211), a front driving sprocket (212) and a front driven sprocket (213); The front belt material chain assembly (22) further comprises a front belt material driving wheel (222), a front first tension wheel (223), a first transition wheel (224) and a front second tension wheel (225); The rear power wheel assembly (41) comprises a rear reducer (411), a rear driving sprocket (412) and a rear driven sprocket (413); The rear belt material chain assembly (42) further comprises a rear belt material driving wheel (422), a rear first tension wheel (423), a second transition wheel (424) and a rear second tension wheel (425).

2. A high voltage test device for high voltage diodes with a double camelback structure according to claim 1, characterized in that: The front reducer (211) is connected to the main shaft (11) via the first transmission pair (111), the front reducer (211) drives the front driving sprocket (212), and the front driving sprocket (212) drives the front driven sprocket (213).

3. A high voltage test device for high voltage diodes with double camelback structure according to claim 1, characterized in that: The front material driving wheel (222) and the front driven sprocket (213) are coaxially arranged, and the front material chain (221) is sleeved on the front material driving wheel (222), the front first tension wheel (223), the first transition wheel (224) and the front second tension wheel (225).

4. A high voltage test device for high voltage diodes with a double camelback structure according to claim 1, characterized in that: The test wheel (35) comprises two coaxially arranged test wheel units (351), the two test wheel units (351) being separated by a test guard bow (352), the test wheel unit (351) being provided with a plurality of circumferentially equidistantly arranged strip material slots, the diodes being placed in the strip material slots.

5. A high voltage test device for high voltage diodes with double camelback structure according to claim 4, characterized in that: A hard insert (353) is arranged in the belt material groove.

6. A high voltage test device for high voltage diodes with double camelback structure according to claim 4, characterized in that: A spacing groove (354) is provided between two adjacent belt material grooves.

7. The high-voltage diode high-voltage test device with a double-hump structure according to claim 1, characterized in that: The test piece group (33) comprises an insulating bracket (331), a test piece (332) and a terminal (333); the insulating bracket (331) is fixedly mounted on the frame vertical plate (12); the test piece (332) is fixedly mounted on the insulating bracket (331); one end of the test piece (332) is connected to the terminal (333) and the other end abuts against the edge of the test wheel (35).

8. The high-voltage diode high-voltage test device with a double-hump structure according to claim 1, characterized in that: The unloading device (34) comprises a pusher claw (341) and a unloading box (342); the pusher claw (341) is fixedly mounted on the unloading box (342); an end of the pusher claw (341) is tangent to the test wheel (35); the diode falls from the pusher claw (341) into the unloading box (342) and falls from the bottom of the unloading box (342) onto the rear material belt chain (421).

9. The high-voltage diode high-voltage test device with a double-hump structure according to claim 1, characterized in that: The rear reducer (411) is connected to the main shaft (11) via the third transmission pair (113); the rear reducer (411) drives the rear driving sprocket (412); and the rear driving sprocket (412) drives the rear driven sprocket (413).

10. The high voltage test device for high voltage diodes with double camelback structure according to claim 1, characterized in that: The rear belt material driving wheel (422) and the rear driven sprocket (413) are coaxially arranged, and the rear belt material chain (421) is sleeved on the rear belt material driving wheel (422), the rear first tension wheel (423), the second transition wheel (424) and the rear second tension wheel (425).

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