Electro-optical device fabricated on a substrate and comprising a ferroelectric layer epitaxially grown on the substrate
By epitaxially growing an active layer with ferroelectric characteristics on the SOI substrate, and combining the design of buffer layer, ferroelectric layer, additional layer and contacts, the problems of low efficiency and high cost of ferroelectric film integration in the prior art are solved, and high-quality and low-cost electro-optical device integration is achieved.
Patent Information
- Application Number
- CN202080088210.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2019-10-18
- Filing Date
- 2020-10-19
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2040-10-19
AI Technical Summary
The prior art has problems of low efficiency, high cost and limited architecture of the underlying device when integrating ferroelectric films into silicon or silicon nitride-based waveguide platforms.
An active layer with ferroelectric characteristics is epitaxially grown on a silicon-on-insulator (SOI) substrate, and other parts of the electro-optical device, including a buffer layer, a ferroelectric layer, an additional layer and a contact piece, are formed on the same SOI substrate, thereby achieving seamless integration of the ferroelectric layer.
This method allows the formation of complex oxide films and other components of electro-optical devices on the semiconductor platform, simplifies manufacturing processes, reduces costs, and provides flexible three-dimensional architectural design.