An electrical experiment analysis method and device and a storage medium

Abstract

The application discloses an electrical experiment analysis method and device and a storage medium, relates to the technical field of intelligent education and the technical field of teaching, examination and learning, and is used for improving the accuracy of electrical experiment analysis. The method comprises the following steps: obtaining a target video of an electrical experiment; wherein the target video comprises a to-be-detected circuit of a to-be-detected event of the electrical experiment; analyzing the target video to obtain a target state of the to-be-detected circuit; the target state refers to a connection state and / or an experimental phenomenon of the to-be-detected circuit which can be analyzed from the target video; and determining the matching degree of the target state of the to-be-detected circuit and a reference state to obtain a matching result.

Description

Technical Field

[0001] This application relates to the fields of smart education technology and teaching, testing and learning technology, and in particular to an electrical experimental analysis method, device and storage medium. Background Technology

[0002] Experimental operations are an important means to help students master knowledge. In order to achieve better teaching results in experimental operation courses, raise students' awareness of experimental operations, and improve students' experimental operation skills, the education department has included experimental operation examinations in the examination scope.

[0003] Traditional experimental operation examinations primarily employ multiple proctors and teacher grading, which is not only resource-intensive but also prone to inconsistencies in grading standards and unfairness. The main problems with human proctoring and grading are as follows: 1. Current examination evaluations generally involve teachers assessing students' experimental operations. This manual grading is labor-intensive and prone to error, reducing the accuracy of the assessment. 2. Subjective factors significantly influence the results. Inconsistent grading standards among teachers on-site compromise objectivity, reducing the validity and reliability of the experimental operation examination and compromising fairness and impartiality. 3. The experimental operation process lacks detailed records, making it difficult to resolve disputes.

[0004] Therefore, traditional experimental operation evaluation methods lack objectivity and accuracy. Summary of the Invention

[0005] This application provides an electrical experimental analysis method, apparatus, and storage medium to improve the accuracy of electrical experimental analysis.

[0006] In a first aspect, this application provides an electrical experiment analysis method, comprising: acquiring a target video of an electrical experiment; wherein the target video includes a circuit to be tested for an event to be tested in the electrical experiment; analyzing the target video to obtain a target state of the circuit to be tested; the target state refers to the connection state and / or experimental phenomenon of the circuit to be tested that can be analyzed from the target video; determining the degree of matching between the target state of the circuit to be tested and a reference state, and obtaining a matching result.

[0007] It is understood that the method provided in this application first acquires a target video of an electrical experiment, which includes the circuit to be tested in the electrical experiment's test event; then, by analyzing the target video, the target state of the circuit to be tested is obtained (the target state of the circuit to be tested includes at least one of the following: the connection status of the devices in the circuit to be tested and the experimental phenomena of the circuit to be tested); further, the degree of matching between the target state of the circuit to be tested and a reference state (e.g., a standard answer) is determined, and a matching result (e.g., an evaluation result) is obtained. Thus, based on the technical solution provided in this application, by analyzing the target video of the electrical experiment, automatic detection of the electrical experiment is achieved, eliminating the need for human resources, reducing the influence of subjective factors on the experimental detection, and improving the accuracy of the electrical experiment detection results. For example, when the method provided in the application embodiments is applied to the scenario of an electrical experiment examination, automatic evaluation of the electrical experiment can be achieved, eliminating the need for human evaluation and improving the accuracy of the electrical experiment evaluation results.

[0008] As one possible implementation, the target state of the circuit under test includes: the connection status of the devices in the entire circuit of the circuit under test; and / or, the experimental phenomena in the entire circuit of the circuit under test; and / or, the connection status of the devices in a local circuit of the circuit under test and the experimental phenomena in a local circuit of the circuit under test.

[0009] As another possible implementation, the circuit under test corresponds to one or more detection rules; wherein, the one or more detection rules include at least one of the following: a rule for detection based on the connection status of all devices in the circuit under test, a rule for detection based on experimental phenomena in the entire circuit of the circuit under test, and a rule for detection based on the connection status of devices in a local circuit of the circuit under test and experimental phenomena in a local circuit of the circuit under test; the above-mentioned determination of the matching degree between the target state and the reference state of the circuit under test to obtain a matching result includes: determining the target detection rule of the circuit under test from the one or more detection rules corresponding to the circuit under test based on the target state of the circuit under test; determining the matching degree between the target state and the reference state of the circuit under test according to the target detection rule of the circuit under test to obtain a matching result.

[0010] As another possible implementation, each device corresponds to a set of connection detection rules and a set of experimental phenomenon detection rules; the above method also includes: determining multiple devices included in the circuit to be tested; determining the set of connection detection rules and the set of experimental phenomenon detection rules corresponding to each of the multiple devices; obtaining rules for detecting the connection status of devices in the entire circuit of the circuit to be tested based on the set of connection detection rules corresponding to each device; and obtaining rules for detecting experimental phenomena in the entire circuit of the circuit to be tested based on the set of experimental phenomenon detection rules corresponding to each device.

[0011] As another possible implementation, the aforementioned plurality of devices includes a target device; the target device is any one of the plurality of devices; the aforementioned determination of the set of connection detection rules and the set of experimental phenomenon detection rules corresponding to each of the plurality of devices includes: selecting, from all the connection detection rules of the target device in the circuit under test, the connection detection rules involved in the target device in the circuit under test to form a set of connection detection rules; and selecting, from all the experimental phenomenon detection rules of the target device in the circuit under test, the experimental phenomenon detection rules involved in the target device in the circuit under test to form a set of experimental phenomenon detection rules.

[0012] As another possible implementation, when the target state includes the connection status of the devices in the circuit under test, the above analysis of the target video to obtain the target state of the circuit under test includes: identifying each of the multiple wires in the circuit under test from the target video; identifying the position of the terminal of each of the multiple devices in the circuit under test from the target video; and determining the connection status of the devices in the circuit under test based on the distance between the endpoint of each wire and the position of the terminal of each device.

[0013] As another possible implementation, the above method further includes: obtaining the target marking time; the target marking time is the time when the target state of the circuit to be tested is recorded; the above analysis of the target video to obtain the target state of the circuit to be tested includes: obtaining at least one target video frame from the target video according to the target marking time; the acquisition time of the target video frame is the target marking time; analyzing the target video frame to obtain the target state of the circuit to be tested.

[0014] As another possible implementation, when the electrical experiment includes multiple events to be detected, the above method further includes: determining the comprehensive matching result of the electrical experiment based on the matching results corresponding to the target states of the circuits to be detected for the multiple events to be detected, and the confidence level corresponding to each matching result; the comprehensive matching result is used to reflect the correctness of the electrical experiment.

[0015] Secondly, this application provides an electrical experiment analysis method, comprising: acquiring a target video of an electrical experiment; wherein the target video includes a circuit to be tested for an event to be tested in the electrical experiment; analyzing the target video, and, if it is determined that there is occlusion in the circuit to be tested, acquiring the target state of a local circuit of the circuit to be tested; the target state refers to the connection state and / or experimental phenomenon of the local circuit of the circuit to be tested that can be analyzed from the target video; and determining the matching result of the target states of all circuits of the circuit to be tested based on the degree of matching between the target state of the local circuit of the circuit to be tested and the reference state.

[0016] It is understandable that occlusion and wire entanglement are common during experiments. Therefore, if the detection is based solely on the target state of the entire circuit, the accuracy of the matching results will be low. Thus, the method provided in this application can determine the degree of matching between the target state of the entire circuit and the reference state of the circuit under test when occlusion exists in the circuit under test, based on the target state of a local circuit of the circuit under test, thereby improving the accuracy of the matching results.

[0017] As one possible implementation, the target state of the local circuit of the circuit under test includes at least one of the following: the connection status of the devices in the local circuit of the circuit under test, and the experimental phenomena of the local circuit of the circuit under test; the matching result of determining the target state of the entire circuit of the circuit under test based on the degree of matching between the target state of the local circuit of the circuit under test and the reference state includes: determining the matching result of the target state of the entire circuit of the circuit under test based on the degree of matching between the connection status of the devices in the circuit under test and the first reference state; and / or, the degree of matching between the experimental phenomena of the local circuit of the circuit under test and the second reference state; the first reference state represents the reference state of the circuit connection status of the circuit under test; the second reference state represents the reference state of the experimental phenomena of the circuit under test.

[0018] As another possible implementation, the circuit under test includes a first device, a second device, a third device, and a target device; the first device is used to detect the voltage across the target device; the second device is used to detect the current in the branch where the target device is located; the third device is used to adjust the current in the branch where the target device is located; when the first device is obstructed, the local circuit of the circuit under test includes the second device, the third device, and the target device; the target state of the local circuit of the circuit under test includes: the target state of the second device and the target state of the third device; the target state of the second device includes: the circuit connection status of the second device and / or the experimental phenomena of the second device; the target state of the third device includes: the circuit connection status of the third device and / or the experimental phenomena of the third device; the above is based on the degree of matching between the target state of the local circuit of the circuit under test and the reference state. Determining the matching results of the target states of all circuits in the circuit under test includes: obtaining a predicted result of the target state of the first device based on the degree of matching between the experimental phenomena of the second device and the second reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state; obtaining a first matching result of the target state of the second device based on the degree of matching between the circuit connection of the second device and the first reference state; and / or, based on the degree of matching between the experimental phenomena of the second device and the second reference state; obtaining a second matching result of the target state of the third device based on the degree of matching between the circuit connection of the third device and the first reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state; and determining the matching results of the target states of all circuits in the circuit under test based on the predicted result, the first matching result, and the second matching result.

[0019] As another possible implementation, the experimental phenomena of the second device include: the first current value of the second device at the first ticking time, and the second current value at the second ticking time; the experimental phenomena of the third device include: the first resistance value of the third device at the first ticking time, and the second resistance value at the second ticking time; the prediction result of the target state of the first device based on the degree of matching between the experimental phenomena of the second device and the reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the reference state, includes: the degree of matching between the first current value of the second device at the first ticking time, and the second current value at the second ticking time, and the reference current value; and / or, the degree of matching between the first resistance value of the third device at the first ticking time, and the second resistance value at the second ticking time, and the reference resistance value, to obtain the prediction result of the target state of the first device.

[0020] As another possible implementation, the above-mentioned determination of the target state matching results of all circuits of the circuit under test based on the prediction results, the first matching results, and the second matching results includes: determining the target state matching results of all circuits of the circuit under test based on the prediction results and their corresponding confidence levels, the first matching results and their corresponding confidence levels, and the second matching results and their corresponding confidence levels; the confidence levels corresponding to the prediction results include: a first confidence level, a second confidence level, or a third confidence level; the first confidence level is greater than the second confidence level; the second confidence level is greater than the third confidence level; wherein, the first confidence level is the confidence level corresponding to the prediction results obtained based on the degree of matching between the experimental phenomena of the first device and the reference state; the second confidence level is the confidence level corresponding to the prediction results obtained based on the degree of matching between the experimental phenomena of the second device and the experimental phenomena of the third device and the reference state; the third confidence level is the confidence level corresponding to the prediction results obtained based on the degree of matching between the experimental phenomena of the second device or the experimental phenomena of the third device and the reference state.

[0021] Thirdly, this application provides an electrical experiment analysis device, comprising: a first acquisition module for acquiring a target video of an electrical experiment; wherein the target video includes a circuit to be tested for an event to be tested in the electrical experiment; a first analysis module for analyzing the target video to obtain a target state of the circuit to be tested; wherein the target state of the circuit to be tested includes at least one of the following: the connection status of the devices in the circuit to be tested, and the experimental phenomena of the circuit to be tested; and a first determination module for determining the degree of matching between the target state of the circuit to be tested and a reference state, and obtaining a matching result.

[0022] As one possible implementation, the target state of the circuit under test includes: the connection status of the devices in the entire circuit of the circuit under test; and / or, the experimental phenomena in the entire circuit of the circuit under test; and / or, the connection status of the devices in a local circuit of the circuit under test and the experimental phenomena in a local circuit of the circuit under test.

[0023] As another possible implementation, the circuit under test corresponds to one or more detection rules; wherein, the one or more detection rules include at least one of the following: a rule for detection based on the connection status of all devices in the circuit under test, a rule for detection based on experimental phenomena in the entire circuit of the circuit under test, and a rule for detection based on the connection status of devices in a local circuit of the circuit under test and experimental phenomena in a local circuit of the circuit under test; the first determining module is specifically used to determine the target detection rule of the circuit under test from the one or more detection rules corresponding to the circuit under test based on the target state of the circuit under test; and determine the degree of matching between the target state and the reference state of the circuit under test according to the target detection rule of the circuit under test to obtain a matching result.

[0024] As another possible implementation, each device corresponds to a set of connection status detection rules and a set of experimental phenomenon detection rules; the first determining module is further used to determine multiple devices included in the circuit to be tested; determine the set of connection status detection rules and the set of experimental phenomenon detection rules corresponding to each of the multiple devices; obtain rules for detecting the connection status of devices in all circuits of the circuit to be tested based on the set of connection status detection rules corresponding to each device; and obtain rules for detecting experimental phenomena in all circuits of the circuit to be tested based on the set of experimental phenomenon detection rules corresponding to each device.

[0025] As another possible implementation, multiple devices include a target device; the target device is any one of the multiple devices; the first determining module is specifically used to select, from all the connection detection rules of the target device in the circuit under test, the connection detection rules involved in the target device in the circuit under test, to form a set of connection detection rules; and to select, from all the experimental phenomenon detection rules of the target device in the circuit under test, the experimental phenomenon detection rules involved in the target device in the circuit under test, to form a set of experimental phenomenon detection rules.

[0026] As another possible implementation, when the target state includes the connection status of the devices in the circuit under test, the first analysis module is specifically used to identify each of the multiple wires in the circuit under test from the target video; identify the position of the terminal of each of the multiple devices in the circuit under test from the target video; and determine the connection status of the devices in the circuit under test based on the distance between the end of each wire and the position of the terminal of each device.

[0027] As another possible implementation, the first acquisition module is also used to acquire the target marking time; the target marking time is the time when the target state of the circuit to be tested is recorded; the first analysis module is specifically used to acquire at least one target video frame from the target video according to the target marking time; the acquisition time of the target video frame is the target marking time; and the target state of the circuit to be tested is obtained by analyzing the target video frame.

[0028] As another possible implementation, when the electrical experiment includes multiple events to be detected, the first determining module is also used to determine the comprehensive matching result of the electrical experiment based on the matching results corresponding to the target states of the circuits to be detected for the multiple events to be detected and the confidence level corresponding to each matching result; the comprehensive matching result is used to reflect the correctness of the electrical experiment.

[0029] Fourthly, this application provides an electrical experiment analysis device, which includes: a second acquisition module for acquiring a target video of an electrical experiment; wherein the target video includes a circuit to be tested for an event to be tested in the electrical experiment; a second analysis module for analyzing the target video and, if it is determined that there is occlusion in the circuit to be tested, acquiring the target state of a local circuit of the circuit to be tested; the target state refers to the connection state and / or experimental phenomenon of the local circuit of the circuit to be tested that can be analyzed from the target video; and a second determination module for determining the matching result of the target states of all circuits of the circuit to be tested based on the degree of matching between the target states of the local circuits of the circuit to be tested and the reference states.

[0030] As one possible implementation, the target state of a local circuit of the circuit under test includes at least one of the following: the connection status of the devices in the local circuit of the circuit under test, and the experimental phenomena of the local circuit of the circuit under test; the second determining module is specifically used to determine the matching result of the target state of the entire circuit of the circuit under test based on the degree of matching between the connection status of the devices in the circuit under test and the first reference state; and / or, the degree of matching between the experimental phenomena of the local circuit of the circuit under test and the second reference state; the first reference state represents the reference state of the circuit connection status of the circuit under test; the second reference state represents the reference state of the experimental phenomena of the circuit under test.

[0031] As another possible implementation, the circuit to be tested includes a first device, a second device, a third device, and a target device; the first device is used to detect the voltage across the target device; the second device is used to detect the current in the branch where the target device is located; the third device is used to adjust the current in the branch where the target device is located; when the first device is obstructed, a local circuit of the circuit to be tested includes the second device, the third device, and the target device; the target state of the local circuit of the circuit to be tested includes: the target state of the second device and the target state of the third device; the target state of the second device includes: the circuit connection status of the second device and / or the experimental phenomena of the second device; the target state of the third device includes: the circuit connection status of the third device and / or the experimental phenomena of the third device; the aforementioned second determining module Specifically, it is used to obtain a predicted result of the target state of the first device based on the degree of matching between the experimental phenomena of the second device and the second reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state; to obtain a first matching result of the target state of the second device based on the degree of matching between the circuit connection of the second device and the first reference state; and / or, based on the degree of matching between the experimental phenomena of the second device and the second reference state; to obtain a second matching result of the target state of the third device based on the degree of matching between the circuit connection of the third device and the first reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state; and to determine the matching result of the target state of all circuits of the circuit to be tested based on the predicted result, the first matching result, and the second matching result.

[0032] As another possible implementation, the experimental phenomena of the second device include: the first current value of the second device at the first marking time, and the second current value at the second marking time; the experimental phenomena of the third device include: the first resistance value of the third device at the first marking time, and the second resistance value at the second marking time; the aforementioned second determining module is specifically used to obtain the prediction result of the target state of the first device based on the degree of matching between the first current value of the second device at the first marking time, and the second current value at the second marking time, and the reference current value; and / or, based on the degree of matching between the first resistance value of the third device at the first marking time, and the second resistance value at the second marking time, and the reference resistance value.

[0033] As another possible implementation, the second determining module is specifically used to determine the matching result of the target state of all circuits of the circuit to be tested based on the prediction result and the confidence level corresponding to the prediction result, the first matching result and the confidence level corresponding to the first matching result, and the second matching result and the confidence level corresponding to the second matching result; the confidence level corresponding to the prediction result includes: a first confidence level, a second confidence level, or a third confidence level; the first confidence level is greater than the second confidence level; the second confidence level is greater than the third confidence level; wherein, the first confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the first device and the reference state; the second confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the second device and the experimental phenomena of the third device and the reference state; the third confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the second device or the experimental phenomena of the third device and the reference state.

[0034] Fifthly, this application provides an electronic device, comprising: one or more processors; one or more memories; wherein the one or more memories are used to store computer program code, the computer program code including computer instructions, and when the one or more processors execute the computer instructions, the electronic device performs any one of the methods described in the first to second aspects and their possible implementations.

[0035] Sixthly, this application provides a computer-readable storage medium storing computer-executable instructions that, when executed on a computer, cause the computer to perform any one of the methods described in the first to second aspects and their possible implementations.

[0036] For a detailed description of aspects three through six and their various implementations in this application, please refer to the detailed descriptions in aspects one through two and their various implementations. For the beneficial effects of aspects three through six and their various implementations, please refer to the analysis of the beneficial effects of aspects one through two and their various implementations; these will not be repeated here.

[0037] These or other aspects of this application will become more readily apparent in the following description. Attached Figure Description

[0038] Figure 1 A schematic diagram of the implementation environment involved in an electrical experimental analysis method provided in this application embodiment. Figure 1 ;

[0039] Figure 2 A schematic diagram of the implementation environment involved in an electrical experimental analysis method provided in this application embodiment. Figure 2 ;

[0040] Figure 3 A schematic diagram of the implementation environment involved in an electrical experimental analysis method provided in this application embodiment. Figure 3 ;

[0041] Figure 4 A flowchart of an electrical experimental analysis method provided in this application embodiment Figure 1 ;

[0042] Figure 5 A flowchart of an electrical experimental analysis method provided in this application embodiment Figure 2 ;

[0043] Figure 6 A schematic diagram of the connection of devices in a circuit provided in this application embodiment. Figure 1 ;

[0044] Figure 7 This is a schematic diagram of the interface of an experimental data acquisition device provided in an embodiment of this application;

[0045] Figure 8 A schematic diagram of the connection of devices in a circuit provided in this application embodiment. Figure 2 ;

[0046] Figure 9 This application provides an example of an interface for setting detection rules. Figure 1 ;

[0047] Figure 10 This application provides an example of an interface for setting detection rules. Figure 2 ;

[0048] Figure 11 A flowchart of an electrical experimental analysis method provided in this application embodiment Figure 3 ;

[0049] Figure 12 A schematic diagram of the connection of devices in a circuit provided in this application embodiment. Figure 3 ;

[0050] Figure 13 A flowchart of an electrical experimental analysis method provided in this application embodiment Figure 4 ;

[0051] Figure 14 A schematic diagram of the structure of an electrical experimental analysis device provided in this application embodiment. Figure 1 ;

[0052] Figure 15 A schematic diagram of the structure of an electrical experimental analysis device provided in this application embodiment. Figure 2 ;

[0053] Figure 16 A schematic diagram of the structure of an electrical experimental analysis device provided in this application embodiment. Figure 3 . Detailed Implementation

[0054] In this article, the term "and / or" is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can represent three situations: A exists alone, A and B exist simultaneously, and B exists alone.

[0055] The terms "first" and "second," etc., used in the specification and drawings of this application are used to distinguish different objects or to distinguish different treatments of the same object, rather than to describe a specific order of objects.

[0056] Furthermore, the terms "comprising" and "having," and any variations thereof, used in the description of this application are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the steps or units listed, but may optionally include other steps or units not listed, or may optionally include other steps or units inherent to such process, method, product, or apparatus.

[0057] It should be noted that in the embodiments of this application, the words "exemplary" or "for example" are used to indicate examples, illustrations, or explanations. Any embodiment or design scheme described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design schemes. Specifically, the use of the words "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0058] In the description of this application, unless otherwise stated, "a plurality of" means two or more.

[0059] As described in the background section, traditional experimental operation examinations primarily employ multiple proctors and are graded by teachers. This is not only resource-intensive but also prone to inconsistencies in grading standards and unfairness. The main problems with human proctoring and grading are as follows: 1. Current examination evaluations generally involve teachers assessing students' experimental operations. Human grading is labor-intensive and prone to error, reducing the accuracy of the assessment. 2. Subjective factors significantly influence the results. Inconsistent grading standards among teachers on-site compromise objectivity, reducing the validity and reliability of the experimental operation examination and compromising fairness and impartiality. 3. The experimental operation process lacks detailed records, making it difficult to resolve disputes.

[0060] Therefore, traditional experimental operation evaluation methods lack objectivity and accuracy.

[0061] To address the aforementioned technical problems, this application provides an electrical experiment analysis method. The method involves: acquiring a target video of an electrical experiment, which includes a circuit to be tested in the event to be tested; analyzing the target video to obtain the target state of the circuit to be tested (the target state of the circuit to be tested includes at least one of the following: the connection status of the devices in the circuit to be tested and the experimental phenomena of the circuit to be tested); and then determining the degree of matching between the target state of the circuit to be tested and a reference state (e.g., a standard answer) to obtain a matching result (e.g., an evaluation result). Thus, based on the technical solution provided by this application, by analyzing the target video of an electrical experiment, automatic detection of the electrical experiment is achieved, eliminating the need for human resources, reducing the influence of subjective factors on the experimental detection, and improving the accuracy of the electrical experiment detection results. For example, when the method provided by this application is applied to an electrical experiment examination scenario, automatic evaluation of the electrical experiment can be achieved, eliminating the need for human evaluation and improving the accuracy of the electrical experiment evaluation results.

[0062] Please refer to Figure 1 This illustration shows a schematic diagram of the implementation environment involved in an electrical experimental analysis method provided in an embodiment of this application. For example... Figure 1 As shown, the implementation environment may include: acquisition device 100 and data processing device 200.

[0063] In some embodiments, the acquisition device 100 and the data processing device 200 may be integrated together; or, the acquisition device 100 and the data processing device 200 may be two independent devices.

[0064] In some embodiments, such as Figure 2 As shown, the acquisition device 100 includes: a video acquisition device 110 and an experimental data acquisition device 120.

[0065] The video acquisition device 110 is used to acquire video data of the target object performing the electrical experiment in the target scene. Specifically, the video acquisition device 110 is used to acquire the hand movements of the target object and the video of the electrical experiment operation process.

[0066] Optionally, the video acquisition device 110 is positioned directly above or slightly above the experimental workbench to capture video of the target object performing the experiment. The height of the video acquisition device 110 is higher than the experimental workbench; specifically, the height of the video acquisition device 110 can be determined based on the height of the various experimental devices on the experimental workbench.

[0067] For example, the video acquisition device 110 can be set at a height of 65cm to 85cm above the tabletop to ensure that it can cover the entire experimental instrument and capture the complete actions of the experimental operation.

[0068] For example, the video capture device 110 can be a camera, a digital camera, or an electronic device with video recording function.

[0069] In some embodiments, the video acquisition device 110 is also used to send the acquired video data to the data processing device 200.

[0070] The experimental data acquisition device 120 is used to collect experimental data recorded by the target object in the target scene during the operation of an electrical experiment. For example, the experimental data acquisition device 120 can collect the readings of electrical instruments recorded by the target object.

[0071] For example, the experimental data acquisition device 120 can be a mobile phone, tablet computer, desktop computer, laptop computer, handheld computer, notebook computer, ultra-mobile personal computer (UMPC), netbook, as well as cellular phone, personal digital assistant (PDA), augmented reality (AR) / virtual reality (VR) device, etc.

[0072] This application does not impose any special limitations on the specific form of the experimental data acquisition device 120. The experimental data acquisition device 120 can interact with the target object through one or more methods such as a keyboard, touchpad, touch screen, remote control, voice interaction, or handwriting device.

[0073] In some embodiments, the experimental data acquisition device 120 is also used to send the acquired experimental data to the data processing device 200.

[0074] Data processing equipment 200 is used to analyze video data and experimental data of electrical experiments and determine the analysis results of electrical experiments.

[0075] In some embodiments, the data processing device 200 is further configured to determine the timing of the data collection of the target object recorded by the experimental data acquisition device 120 at various time points, and to analyze the video data of the electrical experiment based on the timing of the data collection.

[0076] For example, the data processing device 200 can be a single electronic device, such as a laptop or desktop computer; or it can be a cluster of multiple electronic devices, such as a backend server cluster composed of multiple desktop computers, in which each electronic device can handle one or more steps in the electrical experiment analysis process. Here, this embodiment of the invention does not limit the specific hardware architecture and number of data processing devices.

[0077] Specifically, such as Figure 3 As shown, the acquisition device 100 sends the video data of the target object operating the electrical experiment to the data processing device 200; the acquisition device 100 sends the experimental data recorded by the target object to the data processing device 200; the data processing device 200 analyzes the video data of the target object operating the electrical experiment and the experimental data recorded during the target object operating the electrical experiment to determine the analysis results of the electrical experiment of the target object.

[0078] The embodiments provided in this application will now be described in detail with reference to the accompanying drawings.

[0079] This application provides an electrical experimental analysis method, applicable to, for example... Figure 1 The data analysis device shown is as follows. Figure 4 As shown, the method includes the following steps:

[0080] S101. Obtain the target video of the electrical experiment.

[0081] The target video includes a circuit to be tested for an event in an electrical experiment. The event to be tested in the electrical experiment is an event that needs to be tested during the experiment. For example, when the method provided in this embodiment is applied in an experimental examination scenario, the event to be tested can be a test point in the electrical experiment. For example, the event to be tested can be: measuring current with an ammeter; measuring voltage with a voltmeter; changing the current in the circuit with a sliding rheostat; measuring the power of a small light bulb, etc.

[0082] Optionally, one event to be detected corresponds to one circuit to be detected; or, multiple events to be detected correspond to one circuit to be detected.

[0083] It is understandable that the circuit to be tested described above is a circuit for the event to be tested. When the circuit for the event to be tested includes all the circuits of the electrical experiment, then the circuit to be tested also includes all the circuits of the electrical experiment.

[0084] In some embodiments, the target video is a video of a target object performing an electrical experiment in a target scene. Optionally, the target scene includes, for example, an examination scene, an experimental scene, or a classroom scene. The target object may include, for example, a student, an examinee, or an experimenter.

[0085] Examples of electrical experiments include: measuring resistance using the voltmeter-ammeter method, measuring the power of a small light bulb, etc.

[0086] Optionally, the target video can be a video of the target object performing an electrical experiment, captured in real time by a video acquisition device.

[0087] Optionally, the target video can be a video of an electrical experiment acquired from a video storage space. The video storage space is used to store videos of all electrical experiments acquired by the video acquisition device.

[0088] In some embodiments, the video storage space can be divided into multiple storage units to store video data of different types or different time periods.

[0089] For example, the physical storage space in the video storage space can be used to store videos of all physical experiments (including videos of electrical experiments) captured by video acquisition devices set up on all physical lab benches in a school; the chemical storage space in the storage space can be used to store videos of all chemical experiments captured by video acquisition devices set up on all chemical lab benches in a school.

[0090] In some embodiments, the video storage space may be used solely to store video data for a fixed time period. This fixed time period can be the time frame of an electrical engineering experiment class or the time frame of an electrical engineering experiment exam. For example, the fixed time period for storing video data in the video storage space is determined based on the time frame of the experiment class and the time frame of the experiment exam as scheduled in the timetable.

[0091] Therefore, setting a strict storage plan to store only valid video data during class or exam periods can save storage space and video analysis resources.

[0092] In some embodiments, video storage space is hierarchically indexed, and storage locations are optimized based on these indexes to improve the concurrency efficiency of storing and retrieving multiple video streams simultaneously. For example, taking a school as an example, a unique index is determined based on the subject, laboratory number, experimental table number, and camera location number. For instance: First Middle School - Physics - Laboratory 2 - Experimental Table 12 - Top-down Camera.

[0093] S102. Analyze the target video to obtain the target state of the circuit to be tested.

[0094] The target state of the circuit under test is the state that needs to be analyzed during electrical experimental analysis. The target state of the circuit under test includes at least one of the following: the connection status of the components in the circuit under test, and the experimental phenomena observed in the circuit under test.

[0095] In some embodiments, the target state of the circuit under test includes: the connection status of devices in all circuits of the circuit under test; and / or, experimental phenomena in all circuits of the circuit under test; and / or, the connection status of devices in a local circuit of the circuit under test and experimental phenomena in a local circuit of the circuit under test.

[0096] It is understandable that in practical use, the target video may contain issues such as occlusion or tangled wires, making the connection status of the components in the circuit under test obtained from analyzing the target video incomplete (partial); or the experimental phenomena of the circuit under test incomplete. In this case, if the electrical experiment is analyzed based solely on the connection status of the components in a partial circuit, or solely on the experimental phenomena of a partial circuit, the analysis results will be inaccurate. Therefore, to improve the accuracy of electrical experiment analysis, the embodiments of this application can use the connection status of the components in a partial circuit of the circuit under test and the experimental phenomena of a partial circuit of the circuit under test as the target state of the circuit under test.

[0097] Meanwhile, the embodiments of this application support flexibly determining the target state of the circuit under test based on the actual situation. In this way, on the one hand, the method provided by the embodiments of this application can be applied to different scenarios and has strong applicability; on the other hand, it can determine the target state that best matches the actual situation and improve the accuracy of electrical experimental analysis.

[0098] In some embodiments, the circuit under test includes multiple devices connected by wires. The connection status of the devices in the circuit under test can be determined based on the connection status of the wires to each of the multiple devices.

[0099] For example, the components in the circuit under test include at least one of the following: a voltmeter, an ammeter, a sliding rheostat, a small light bulb, etc. The connections of the components in the circuit under test include at least one of the following: the connection of the wires to the positive and negative terminals of the voltmeter or ammeter; the connection of the wires to the range of the voltmeter or ammeter; the connection of the small light bulb to the voltmeter or ammeter (series or parallel); the connection of the wires to the range of the sliding rheostat, etc. The experimental phenomena of the circuit under test include at least one of the following: the voltmeter reading, the ammeter reading, the brightness of the small light bulb, the resistance of the sliding rheostat, etc.

[0100] In some embodiments, when the target state includes the connection status of devices in the circuit under test, such as Figure 5 As shown, step S102 can be implemented as follows:

[0101] S1021. Identify each of the multiple wires in the target video.

[0102] In some embodiments, a wire recognition model is used to identify each of a plurality of wires from a target video.

[0103] The wire recognition model is built on an Encoder-Decoder framework. The Encoder takes one or more video segments or frames from the target video as input, and the Decoder takes the vector encoded by the Encoder as input, outputting the position of one or more wires in the video segment or frame, as well as the category of each wire.

[0104] S1022. Identify the position of the terminal block of each of the multiple devices in the target video.

[0105] In some embodiments, a device identification model is used to identify the position of the terminal block of each of a plurality of devices from the target video.

[0106] The device identification model is built on a one-stage target detection framework and a deep neural network-based object recognition and localization algorithm (you only look once, YOLO).

[0107] Specifically, one or more video segments or one or more video frames from the target video are input into the YOLO model, and the output is the category of each device in the video segment or video frame, as well as the category of the terminals of each device and the position of the terminals of each device.

[0108] S1023. Determine the connection status of the devices in the circuit under test based on the distance between the end of each wire and the position of the terminal of each device.

[0109] In some embodiments, if the distance between the end of a wire and the position of a terminal of a device is less than a preset threshold, it is determined that the wire is connected to the device; then, based on the classification information of the wire, the device connected to the other end of the wire is determined, and thus the device connected to the device is determined.

[0110] For example, if the distance between the positive terminal of the power supply and the end of the first wire is less than a preset threshold, the distance between the negative terminal of the power supply and the end of the second wire is less than a preset threshold, and the distance between the other end of the first wire and the switch terminal is less than a preset threshold, and the distance between the other end of the second wire and the sliding rheostat terminal is less than a preset threshold, then the sliding rheostat, power supply, and switch are determined to be connected. For example, the connection status of the devices in the circuit under test determined by this method can be as follows: Figure 6 As shown in the figure.

[0111] In some embodiments, when the target state includes the experimental phenomena of the circuit to be tested, step S102 can be implemented as: detecting the experimental phenomena of each of the multiple devices from the target video, thereby obtaining the experimental phenomena of the circuit to be tested.

[0112] In some embodiments, techniques such as bounding box detection and angle detection are used to detect the experimental phenomena of each of the multiple devices in the target video.

[0113] For example, if multiple devices include a small light bulb, bounding box detection technology is used to detect the area where the small light bulb is located in the target video, and then to detect whether there is light emission in the area where the small light bulb is located, as well as the light intensity. In this way, it can be determined whether a small light bulb exists in the target video, whether the small light bulb emits light when it exists in the target video, and the brightness of the small light bulb.

[0114] For example, if multiple devices include voltmeters (or ammeters), bounding box detection technology is used to detect the area where the voltmeter is located in the target video. Then, from the area where the voltmeter (or ammeter) is located, the area where the voltmeter (or ammeter) dial is located, and the position of the voltmeter (or ammeter) pointer, are detected. Next, angle detection technology is used to detect the angle between the voltmeter (or ammeter) pointer and the voltmeter (or ammeter) dial. Thus, the voltmeter (or ammeter) reading can be determined based on the angle between the voltmeter (or ammeter) pointer and the voltmeter (or ammeter) dial.

[0115] For example, if multiple devices include a sliding rheostat, bounding box detection technology is used to detect the region where the sliding rheostat is located in the target video, and then the position of the sliding rheostat's slider is detected from that region. Thus, the resistance value of the sliding rheostat can be determined based on the position of the slider.

[0116] In some embodiments, the method further includes: obtaining the target marking time; the target marking time is the time when the target object in the target scene records the target state of the circuit to be detected.

[0117] As one possible implementation, the target object in the target scenario can record the target state of the circuit under test on the experimental data acquisition device. Then, the target object records the time corresponding to each target state of the circuit under test, which is the target time point.

[0118] For example, at the start of the experiment, the target objects in the target scene need to be connected with wires to form the circuit to be tested. Then, after the circuit is connected, it is adjusted so that one or more devices within it display the target state. During this process, the experimental data acquisition device first displays a first interface, such as... Figure 7 As shown in (a), the first interface includes a time limit for connecting the circuit and a "Circuit Completed" indicator. After the target object completes the circuit connection, clicking the "Circuit Completed" indicator in the first interface will switch to the second interface, as shown in (a). Figure 7 As shown in (b), the second interface is the experimental phenomenon recording interface, which includes at least one recording box for filling in the experimental phenomena of one or more devices in the circuit to be tested, such as voltmeter readings, ammeter readings, etc.

[0119] Therefore, the target timing mentioned above includes: the time when the target clicks the "Complete Circuit" icon, and the time when the target fills in the experimental phenomena of the circuit to be tested in the record box (e.g., the time when the target fills in the voltmeter reading, the time when the target fills in the ammeter reading), etc.

[0120] As another possible implementation, when the target object in the target scene does not record the target state of the circuit to be detected, the target marking time can be a predefined time.

[0121] For example, if the specified circuit connection time for an electrical experiment is two minutes, then the time corresponding to two minutes after the start time of the experiment is the target time for marking the point. For instance, if the start time of the experiment is 8:00, then 8:02 is the target time for marking the point.

[0122] In some embodiments, step S102 can be implemented as follows: based on the target marking time, at least one target video frame is obtained from the target video, and then the target video frame is analyzed to obtain the target state of the circuit to be detected.

[0123] The acquisition time of the aforementioned target video frame is the target marking time.

[0124] For example, when the target object clicks the "Complete Circuit" marker at the target time, the target video frame includes the video frame corresponding to the connection status of the circuit to be tested in the target video; then, by analyzing the video frame corresponding to the connection status of the circuit to be tested, the connection status of the circuit to be tested can be obtained.

[0125] In another example, when the target object fills in the record box with the time corresponding to the experimental phenomenon of the circuit to be tested at the target mark time, the target video frame includes the video frame corresponding to the experimental phenomenon of the circuit to be tested in the target video; then, by analyzing the video frame corresponding to the experimental phenomenon of the circuit to be tested, the experimental phenomenon of the circuit to be tested can be obtained.

[0126] One possible implementation is to obtain the target video frame corresponding to the target time marker after obtaining the target time marker; or, after obtaining the target time marker, a time interval can be determined based on the target time marker, and all video frames within that time interval can be obtained from the target video as the target video frame. For example, a time interval can be determined based on the times corresponding to a period before the target time marker and the times corresponding to a period after the target time marker. For instance, if the target time marker is 8:30, the time interval can be [8:27, 8:33].

[0127] Understandably, based on the target marking times mentioned above, the target video frame where the target state of the circuit under test is located can be determined. Therefore, only the target video frame needs to be analyzed, without having to analyze the entire target video. This can save analysis resources and improve analysis efficiency.

[0128] S103. Determine the degree of matching between the target state and the reference state of the circuit under test, and obtain the matching result.

[0129] The reference state refers to the correct connection of the circuit under test and / or the correct experimental phenomena of the circuit under test.

[0130] In some embodiments, the matching result may be a score of the degree of matching between the target state and the reference state of the circuit under test; or, it may be a level of the degree of matching between the target state and the reference state of the circuit under test. The specific form of the matching result is not limited in the embodiments of this application.

[0131] In some embodiments, the circuit to be detected for each event to be detected (e.g., test site) corresponds to one or more detection rules (e.g., assessment rules).

[0132] The detection rules include at least one of the following: rules for detection based on the connection status of all components in the circuit under test; rules for detection based on experimental phenomena in the entire circuit of the circuit under test; and rules for detection based on the connection status of components in a local circuit of the circuit under test and experimental phenomena in that local circuit. These detection rules constitute an algorithm for automatically evaluating the circuit under test for a detection event. For example, assuming the detection event is a circuit connection status check, the detection rule corresponding to this event is a rule for detecting circuit connection status.

[0133] In some embodiments, the circuit to be tested corresponding to a detected event includes multiple devices, each with different connection configurations and experimental phenomena. Therefore, the detection rules corresponding to each device are also different. Thus, the method provided in this application further includes: determining the detection rules for the multiple devices in the circuit to be tested; and then obtaining one or more detection rules for the circuit to be tested based on the detection rules for the multiple devices. Exemplarily, this can be implemented as follows:

[0134] Step a1: Identify the multiple components included in the circuit to be tested.

[0135] Optionally, multiple devices in the circuit to be tested can be identified from the target video based on the device identification model in step S1022 above. For details on the implementation, please refer to step S1022 above; it will not be repeated here.

[0136] For example, assuming the event to be detected is measuring current with an ammeter, the detection circuit for the event to be detected can be as follows: Figure 8 As shown in (a) above, the components in the circuit to be tested include: a battery, a switch, an ammeter, and a light bulb.

[0137] Another example is to assume that the event to be detected is measuring voltage with a voltmeter. The detection circuit for this event could be as follows: Figure 8 As shown in (b) above, the components in the circuit to be tested include: a battery, a switch, a voltmeter, and a small light bulb.

[0138] Another example is to assume that the event to be detected is changing the current in the circuit using a sliding rheostat. The circuit to be detected for this event could be as follows: Figure 8 As shown in (c), the components in the circuit to be tested include: a battery, a switch, an ammeter, a sliding rheostat, and a small light bulb.

[0139] Step a2: Determine the set of connection detection rules and the set of experimental phenomenon detection rules for each of the multiple devices.

[0140] In some embodiments, determining the set of connection detection rules for each of the plurality of devices includes: selecting the connection detection rules for the target device in the circuit under test from all the connection detection rules for the target device, based on the connection status of the target device in the circuit under test, to form a set of connection detection rules.

[0141] It is understood that the connection method of the same device may be different in different circuits. Therefore, embodiments of this application can select the connection detection rules involved in the target device in the circuit under test from all the connection detection rules of the target device, and form the connection detection rule set. In this way, the connection detection rule set of the target circuit can be flexibly selected according to the change of the connection method of the target device in different circuits.

[0142] For example, assuming the target device is an ammeter, the detection rules for all ammeter connection configurations include: current flows into the positive terminal and out the negative terminal; the ammeter is connected in series with the device under test; the ammeter is not directly connected to the power supply terminals; a small range of the ammeter is selected; a large range of the ammeter is selected. Assuming the ammeter is connected in the circuit under test as follows... Figure 8 As shown in (a) in the figure, then as Figure 9 As shown, users can select the connection conditions of the ammeter in the circuit connection test rule setting interface of the ammeter: current flows in from the positive terminal and flows out from the negative terminal; the ammeter is connected in series with the electrical appliance under test; the ammeter is not directly connected to the two poles of the power supply; and select the small range of the ammeter.

[0143] In some embodiments, a set of experimental phenomenon detection rules is determined for each of the multiple devices: based on the experimental phenomena of the target device in the circuit under test, the experimental phenomenon detection rules involved by the target device in the circuit under test are selected from all the experimental phenomenon detection rules of the target device to form the set of experimental phenomenon detection rules.

[0144] It is understood that the same device may exhibit different experimental phenomena in different circuits. Therefore, embodiments of this application can select the experimental phenomenon detection rules involved in the target device in the circuit under test from all the experimental phenomenon detection rules of the target device, thus forming the experimental phenomenon detection rule set. In this way, the experimental phenomenon detection rule set of the target circuit can be flexibly selected according to the changes in the experimental phenomena exhibited by the target device in different circuits.

[0145] For example, assuming the target device is an ammeter, the experimental detection rules for the ammeter include: before the switch is closed, the ammeter reading is 0; after the switch is closed, the ammeter reading is I1; when the sliding rheostat is adjusted to bring the voltmeter to its rated voltage, the ammeter reading is I2; when the sliding rheostat is adjusted to bring the voltmeter to 0.8 times its rated voltage, the ammeter reading is I3; when the sliding rheostat is adjusted to bring the voltmeter to 1.2 times its rated voltage, the ammeter reading is I4. Assuming the ammeter is connected in the circuit under test as follows... Figure 8 As shown in (a) in the figure, then as Figure 10 As shown, users can select the experimental phenomena involved in the circuit under test by the ammeter in the experimental phenomenon detection rule setting interface: before the switch is closed, the ammeter reading is 0; after the switch is closed, the ammeter reading is I1.

[0146] Step a3: Based on the set of connection detection rules for each device, obtain the rules for detecting the connection status of the devices in the circuit to be tested.

[0147] In some embodiments, when the target state of the circuit under test includes the connection status of all circuits of the circuit under test, the rule for detecting based on the connection status of the devices in the circuit under test is: the rule for detecting based on the connection status of all circuits in the circuit under test; when the target state of the circuit under test includes the connection status of a portion of the circuit under test, the rule for detecting based on the connection status of the devices in the circuit under test is: the rule for detecting based on the connection status of a portion of the circuit under test.

[0148] Step a4: Based on the set of experimental phenomenon detection rules corresponding to each device, obtain the rules for detecting experimental phenomena based on the circuit under test.

[0149] In some embodiments, when the target state of the circuit under test includes experimental phenomena of all circuits of the circuit under test, the above-mentioned rule for detection based on experimental phenomena of the circuit under test is: the rule for detection based on experimental phenomena of all circuits of the circuit under test; when the target state of the circuit under test includes experimental phenomena of a local circuit of the circuit under test, the above-mentioned rule for detection based on experimental phenomena of the circuit under test is: the rule for detection based on experimental phenomena of a local circuit of the circuit under test.

[0150] It is understandable that if each event to be detected (e.g., a test point) is generic, then the detection rules (e.g., assessment rules) corresponding to each event to be detected are also generic. Therefore, an algorithm repository can be built based on the event identifier (e.g., test point identifier) ​​of each generic event to be detected (e.g., a test point identifier) ​​and the detection rules corresponding to each generic event to be detected. This algorithm repository is used to quickly match corresponding detection rules for different events to be detected. Thus, when different electrical experiment questions are recombined based on different test points, the detection rules corresponding to each test point identifier can be quickly retrieved from the algorithm repository based on the test point identifiers included in each electrical experiment question.

[0151] In some embodiments, such as Figure 11 As shown, step S103 can be implemented as follows:

[0152] S1031. Based on the target state of the circuit under test, determine the target detection rule of the circuit under test from one or more detection rules corresponding to the circuit under test.

[0153] The target detection rule mentioned above is the detection rule corresponding to the target state of the circuit to be detected.

[0154] In some embodiments, when the target state of the circuit under test includes the connection status of all devices in the circuit under test, the target detection rule of the circuit under test is a rule for detection based on the connection status of all devices in the circuit.

[0155] In some embodiments, when the target state of the circuit under test includes experimental phenomena in all circuits of the circuit under test, the target detection rule of the circuit under test is a rule for detection based on experimental phenomena in all circuits.

[0156] In some embodiments, when the target state of the circuit under test includes the connection status of the devices in the local circuit of the circuit under test and the experimental phenomena of the local circuit of the circuit under test, the target detection rule of the circuit under test is: a rule for detection based on the connection status of the devices in the local circuit and the experimental phenomena of the local circuit.

[0157] S1032. Based on the target detection rules of the circuit under test, determine the degree of matching between the target state and the reference state of the circuit under test, and obtain the matching result.

[0158] In some embodiments, when the event to be detected includes the connection status of a detection circuit, the matching result is determined based on the target detection rule corresponding to the target state of the circuit to be detected, which can be implemented in the following way:

[0159] Implementation Method 1: When the target state of the circuit to be tested includes the connection status of all components in the circuit to be tested, the matching result is determined based on the rules for testing the connection status of all components in the circuit.

[0160] For example, if the event to be detected is: measuring voltage with a voltmeter, then the voltmeter is connected in parallel with the light bulb. The detection rule corresponding to the event to be detected includes: detecting the parallel connection of the voltmeter and the light bulb. The detection process according to the detection rule is as follows: if the distance between the small-range terminal of the voltmeter and the end of the first wire is less than a preset threshold, the distance between the negative terminal of the voltmeter and the end of the second wire is less than a preset threshold, and the distance between the other end of the first wire and the terminal of the light bulb is less than a preset threshold, and the distance between the other end of the second wire and the terminal of the light bulb is less than a preset threshold, then it is determined that the voltmeter and the light bulb are connected in parallel, and the matching result is: the connection of the voltmeter and the light bulb is correct.

[0161] Another example: if the event to be detected is measuring current with an ammeter, then the ammeter is connected in series with a small light bulb. The detection rules for the event to be detected include: detecting the series connection of the ammeter and the small light bulb. The detection process according to the detection rules is as follows: if the distance between the small-range terminal of the ammeter and the end of the first wire is less than a preset threshold, the distance between the negative terminal of the ammeter and the end of the second wire is less than a preset threshold, and the distance between the other end of the first wire and the terminal of the small light bulb is less than a preset threshold, and the distance between the other end of the second wire and the terminal of the small light bulb is greater than a preset threshold, and the connection is on the terminal of the sliding rheostat or the terminal of the power supply, then it can be determined that the sliding rheostat, the ammeter, and the small light bulb are connected in series, and the matching result is: the connection of the ammeter and the small light bulb is correct.

[0162] For another example, if the event to be detected is: changing the current in the circuit using a sliding rheostat, then the connection of the sliding rheostat is: the wiring method of the sliding rheostat is: one up and one down; then the detection rule corresponding to the event to be detected includes: detecting that the wiring method of the sliding rheostat is: one up and one down, then the detection process according to the detection rule is as follows: based on the entire circuit connection: if the distance between the upper left terminal of the sliding rheostat and the end of the first wire is less than a preset threshold, and the distance between the lower right terminal of the sliding rheostat and the end of the second wire is less than a preset threshold, then it can be determined that the wiring method of the sliding rheostat is: one up and one down, and the matching result is: the connection of the sliding rheostat is correct.

[0163] Method 2: When the target state of the circuit to be tested includes experimental phenomena in all circuits of the circuit to be tested, the matching result is determined based on the rules for testing based on the experimental phenomena in all circuits.

[0164] For example, if the event to be detected is: measuring voltage with a voltmeter, then the experimental phenomena of the circuit to be detected are: the reading of the voltmeter and the brightness of the light bulb; then the detection rules corresponding to the event to be detected include: the rules for detection based on the experimental phenomena of the voltmeter and the light bulb, and the process of detection based on the detection rules is as follows: if the reading of the voltmeter and the brightness of the light bulb are positively correlated (i.e., the larger the voltmeter reading, the brighter the light bulb), then the matching result is determined to be: the voltmeter and the light bulb are connected in parallel, and the experimental phenomena of the voltmeter and the light bulb are correct.

[0165] Another example: if the event to be tested is measuring current with an ammeter, then the experimental phenomena of the circuit to be tested are the ammeter reading and the brightness of the light bulb; then the detection rules corresponding to the event to be tested include: the rules for detection based on the experimental phenomena of the ammeter and the light bulb, and the process of detection based on the detection rules is as follows: based on the experimental phenomena of the entire circuit: if the ammeter reading and the brightness of the light bulb are positively correlated (i.e., the larger the ammeter reading, the brighter the light bulb), then the matching result is determined to be: the ammeter and the light bulb are connected in series, and the experimental phenomena of the ammeter and the light bulb are correct.

[0166] Another example: if the event to be tested is changing the current in the circuit using a sliding rheostat, then the experimental phenomena of the circuit to be tested are: the resistance of the sliding rheostat, the brightness of the light bulb, the reading of the ammeter, and the reading of the voltmeter. The testing rules corresponding to the event to be tested include: rules for testing based on the experimental phenomena of the sliding rheostat, the light bulb, the ammeter, and the voltmeter. The testing process according to these rules is as follows: if the resistance of the sliding rheostat is inversely proportional to the brightness of the light bulb (i.e., the larger the resistance of the sliding rheostat, the dimmer the light bulb); and / or, when the ammeter is connected correctly, the resistance of the sliding rheostat is inversely proportional to the ammeter reading (i.e., the larger the resistance of the sliding rheostat, the smaller the ammeter reading); and / or, when the voltmeter is connected correctly, the resistance of the sliding rheostat is inversely proportional to the voltmeter reading (i.e., the larger the resistance of the sliding rheostat, the smaller the voltmeter reading), then the matching result is determined to be: the sliding rheostat is connected in a top-bottom configuration, and the experimental phenomena of the sliding rheostat are correct.

[0167] Implementation Method 3: When the target state of the circuit under test includes the connection status of the devices in the local circuit of the circuit under test and the experimental phenomena of the local circuit, the matching result is determined based on the rules for detection based on the connection status of the devices in the local circuit and the experimental phenomena of the local circuit.

[0168] For example, the process of detecting the connection of components in the circuit to be tested, based on the connection of components in the local circuit and the experimental phenomena of the local circuit, is as follows: If the voltmeter reading is greater than 0, it is only necessary to determine the local circuit diagram of the voltmeter and the light bulb being connected in parallel according to the detection rule of "voltmeter and light bulb in parallel"; if the connection of the voltmeter and the light bulb in parallel is correct, and the voltmeter reading changes (the voltmeter reading will change during the process of moving the slider of the sliding rheostat), then it is determined that the connection of the sliding rheostat and the light bulb is in series.

[0169] It is understandable that in practical use, the target video acquired by the data analysis device may contain issues such as occlusion or tangled wires, making the connection status of the devices in the circuit under test obtained from the target video incomplete (partial). Therefore, in such cases, a matching result for the connection status of the devices in the circuit under test can be determined based on the rules for detecting the connection status of the local devices in the circuit under test and the local experimental phenomena of the circuit under test. In this way, the method provided in this application embodiment can be applied to different scenarios and has strong applicability.

[0170] In some embodiments, when there is an obstruction in the circuit to be detected, the matching result can be determined according to the method provided in steps S201-S203, which will not be repeated here.

[0171] In some embodiments, an event to be detected may correspond to multiple detection rules, and each detection rule corresponds to a confidence level. The detection rule corresponding to the event to be detected is determined based on the confidence level of the detection rule.

[0172] Optionally, the confidence level of a rule that detects based on the connection status of devices in the entire circuit is lower than the confidence level of a rule that detects based on the connection status of devices in a local circuit and experimental phenomena in that local circuit; and the confidence level of a rule that detects based on the connection status of devices in a local circuit and experimental phenomena in that local circuit is lower than the confidence level of a rule that detects based on experimental phenomena in the entire circuit.

[0173] In other words, if the target state of the circuit to be tested only includes the connection status of all the devices in the circuit, then the accuracy of the matching result obtained by determining the degree of matching between the target state and the reference state based on the rules for testing the connection status of all the devices in the circuit is low.

[0174] Therefore, to improve the accuracy of the matching results, multiple states of the circuit under test can be selected as the target states of the circuit under test at the same time, and the matching results can be determined based on the detection rules applied to the multiple states.

[0175] For example, the connection status of all devices in the circuit under test and the experimental phenomena in the circuit under test can be used as the target state of the circuit under test. At the same time, the matching result is determined based on the detection rules based on the connection status of all devices in the circuit and the detection rules based on the experimental phenomena in the circuit.

[0176] Another example is that the connection status of all devices in the circuit under test, the connection status of devices in a local circuit of the circuit under test, and the experimental phenomena of the local circuit of the circuit under test can be used as the target state of the circuit under test. The matching result is determined by simultaneously using the detection rules based on the connection status of all devices in the circuit and the detection rules based on the connection status of devices in the local circuit and the experimental phenomena of the local circuit.

[0177] Another example is that the connection status of all devices in the circuit under test, the experimental phenomena in the circuit under test, and the connection status of devices in a local circuit of the circuit under test and the experimental phenomena in a local circuit of the circuit under test can be used as the target state of the circuit under test. The matching result is determined by simultaneously using the detection rules based on the connection status of devices in the entire circuit, the detection rules based on the experimental phenomena in the entire circuit, and the detection rules based on the connection status of devices in a local circuit and the experimental phenomena in a local circuit.

[0178] It is understandable that occlusion and wire entanglement are common during experiments. Therefore, if the detection is based solely on the connection status of all components in the circuit, the accuracy of the matching results will be low. Thus, users can select the optimal target state and detection rules based on the actual situation and the confidence level of the matching results corresponding to each target state to improve the accuracy of the matching results.

[0179] In some embodiments, the method further includes: comparing the experimental parameters recorded by the target object with the experimental parameters analyzed by the data analysis device to determine the detection result of the experimental parameters of the circuit to be tested. Specifically, if the difference between the experimental parameters recorded by the target object and the experimental parameters analyzed by the data analysis device is less than a preset threshold, then the experimental parameters recorded by the target object are determined to be correct.

[0180] The experimental parameters analyzed by the aforementioned data analysis device are obtained by the data analysis device based on the connection status of the devices in the circuit under test and the experimental phenomena of the circuit under test.

[0181] It is understandable that since the results of electrical experiments performed on different target objects may differ, as long as the error between the experimental parameters recorded by the target object and the experimental parameters analyzed by the data analysis device is within a reasonable range, it can be determined that the experimental parameters recorded by the target object are correct.

[0182] In some embodiments, a matching result corresponds to a confidence level. The confidence level of the matching result reflects its reliability (or accuracy).

[0183] For example, such as Figure 12 As shown, if the voltmeter connection is obstructed in the circuit under test, the confidence level of the matching result obtained by detecting the connection between the voltmeter and the light bulb, based on the rule of detecting the connection of all components in the circuit under test, is low. Simultaneously, the confidence level of the matching results for other events related to the voltmeter is also low. For example, the confidence level of the matching result obtained when detecting the readings of the rated voltage and 0.8 times the rated voltage across the light bulb is also low.

[0184] In some embodiments, when the electrical experiment includes multiple events to be detected, the method further includes: determining a comprehensive matching result of the electrical experiment based on the matching results corresponding to the target states of the circuits to be detected for the multiple events to be detected and the confidence level corresponding to each matching result.

[0185] The overall matching result is used to reflect the correctness of the electrical experiment.

[0186] It is understood that the method provided in this application first acquires a target video of an electrical experiment, which includes the circuit to be tested in the electrical experiment's test event; then, by analyzing the target video, the target state of the circuit to be tested is obtained (the target state of the circuit to be tested includes at least one of the following: the connection status of the devices in the circuit to be tested and the experimental phenomena of the circuit to be tested); further, the degree of matching between the target state of the circuit to be tested and a reference state (e.g., the correct answer or standard answer) is determined, and a matching result (e.g., the evaluation result) is obtained. Thus, based on the technical solution provided in this application, by analyzing the target video of the electrical experiment, automatic detection of the electrical experiment is achieved, eliminating the need for human resources, reducing the influence of subjective factors on the experimental detection, and improving the accuracy of the electrical experiment detection results. For example, when the method provided in the application embodiments is applied to the scenario of an electrical experiment examination, automatic evaluation of the electrical experiment can be achieved, eliminating the need for human evaluation and improving the accuracy of the electrical experiment evaluation results.

[0187] This application also provides an electrical experiment analysis method for analyzing electrical experiments based on the circuit connections and experimental phenomena when there is obstruction in the circuit under test. For example... Figure 13 As shown, this method can be implemented through the following steps:

[0188] S201. Obtain the target video of the electrical experiment.

[0189] The target video includes the circuit to be detected for an event in an electrical experiment. The event to be detected in the electrical experiment is an event that needs to be detected during the experiment. For example, when the method provided in this embodiment is applied in an experimental examination scenario, the aforementioned event to be detected can be a test point in the electrical experiment.

[0190] S202. Analyze the target video. If it is determined that there is an obstruction in the circuit to be tested, obtain the target state of a local circuit of the circuit to be tested.

[0191] Here, "target state" refers to the connection state and / or experimental phenomena of a local circuit of the circuit under test that can be analyzed from the target video. It is understood that when the circuit under test is obstructed, only a local circuit of the circuit under test can be analyzed from the target video.

[0192] In some embodiments, the target state of the local circuit of the circuit under test includes at least one of the following: the connection status of the devices in the local circuit of the circuit under test, and the experimental phenomena of the local circuit of the circuit under test.

[0193] In some embodiments, the circuit to be tested includes: a first device, a second device, a third device, and a target device; the first device is used to detect the voltage across the target device (e.g., a voltmeter); the second device is used to detect the current in the branch where the target device is located (e.g., an ammeter); and the third device is used to adjust the current in the branch where the target device is located (e.g., a sliding rheostat). When the first device is obstructed, a partial circuit of the circuit to be tested includes: the second device, the third device, and the target device; then the target state of the partial circuit of the circuit to be tested includes: the target state of the second device and the target state of the third device; the target state of the second device includes: the circuit connection status of the second device and / or the experimental phenomena of the second device; the target state of the third device includes: the circuit connection status of the third device and / or the experimental phenomena of the third device.

[0194] For example, suppose the circuit to be tested includes: a voltmeter, an ammeter, a sliding rheostat, and a small light bulb; if the voltmeter is obstructed, the partial circuit of the circuit to be tested includes: an ammeter, a sliding rheostat, and a small light bulb; then the target state of the partial circuit of the circuit to be tested includes: the target state of the ammeter and the target state of the voltmeter; wherein, the target state of the ammeter includes: the circuit connection of the ammeter (e.g., the range selection of the ammeter, and the positive and negative terminals of the ammeter, etc.), and / or the experimental phenomena of the ammeter (e.g., the reading of the ammeter); the circuit connection of the sliding rheostat (e.g., the connection method of the sliding rheostat's terminals), and / or the experimental phenomena of the sliding rheostat (e.g., the position of the sliding rheostat's slider).

[0195] S203. Based on the degree of matching between the target state and the reference state of a local circuit of the circuit under test, determine the matching result of the target state of the entire circuit of the circuit under test.

[0196] In some embodiments, when the target state of a local circuit of the circuit under test includes the connection status of the devices in the local circuit of the circuit under test, the above step S203 can be implemented as: determining the matching result of the target state of the entire circuit of the circuit under test based on the degree of matching between the connection status of the devices in the circuit under test and the first reference state.

[0197] The first reference state refers to the reference state of the circuit connection of the circuit to be tested.

[0198] In some embodiments, when the target state of a local circuit of the circuit under test includes the experimental phenomena of the local circuit of the circuit under test, the above step S203 can be implemented as: determining the matching result of the target state of the entire circuit of the circuit under test based on the degree of matching between the experimental phenomena of the local circuit of the circuit under test and the second reference state.

[0199] The second reference state represents the reference state of the experimental phenomena of the circuit under test.

[0200] In some embodiments, when the target state of a local circuit of the circuit under test includes: the connection status of the devices in the local circuit of the circuit under test; and / or, the experimental phenomena of the local circuit of the circuit under test; the above step S203 can be implemented as: determining the matching result of the target state of the entire circuit of the circuit under test based on the degree of matching between the connection status of the devices in the circuit under test and the first reference state; and / or, the degree of matching between the experimental phenomena of the local circuit of the circuit under test and the second reference state.

[0201] For example, assuming that the first device (e.g., a voltmeter) in the circuit under test is obstructed, the target state of a local circuit of the circuit under test includes the target state of the second device (e.g., an ammeter) and the target state of the third device (e.g., a sliding rheostat). Then, according to the principle of voltage operation (voltage operation: moving the sliding rheostat to make the voltmeter reading reach the rated voltage and reading the ammeter reading as the rated current), the matching result of the target state of the first device can be predicted based on the target state of the second device and the target state of the third device; thereby determining the matching result of the target state of the entire circuit of the circuit under test.

[0202] Specifically, it can be achieved through the following steps:

[0203] Step b1: Based on the degree of matching between the experimental phenomena of the second device and the second reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state, obtain the prediction result of the target state of the first device.

[0204] For example, the experimental phenomena of the second device include: the first current value of the second device at the first marking time, and the second current value at the second marking time; the experimental phenomena of the third device include: the first resistance value of the third device at the first marking time, and the second resistance value at the second marking time. The first marking time is the time when the target object records the first voltage value of the third device (e.g., the first voltage value can be the rated voltage, such as 2.5V); the second marking time is the time when the target object records the second voltage value of the third device (e.g., the second voltage value can be 0.8 times the rated voltage, such as 2.0V).

[0205] Then step b1 above can be implemented as follows: based on the first current value of the second device at the first marking time and the second current value at the second marking time, and the degree of matching with the reference current value; and / or, based on the first resistance value of the third device at the first marking time and the second resistance value at the second marking time, and the degree of matching with the reference resistance value, to obtain the prediction result of the target state of the first device.

[0206] For example, assuming the first current value of the second device at the first ticking time is 0.28A and the second current value at the second ticking time is 0.26A; assuming the reference current value is within the range of [0.24, 0.30], then the experimental phenomenon of the second device matches the reference state; assuming the first resistance value of the third device at the first ticking time is 9Ω and the second resistance value at the second ticking time is 7.7Ω; assuming the reference resistance value is within the range of [9.5, 6], then the experimental phenomenon of the third device matches the reference state; and further, if the experimental phenomena of the second and third devices are both normal, then the predicted result of the target state of the first device is: the target state of the first device is correct.

[0207] Step b2: Based on the degree of matching between the circuit connection of the second device and the first reference state; and / or the degree of matching between the experimental phenomena of the second device and the second reference state, obtain the first matching result of the target state of the second device.

[0208] Optionally, when the target state of the second device includes the circuit connection status of the second device, a first matching result of the target state of the second device is obtained based on the degree of matching between the circuit connection status of the second device and the first reference state.

[0209] When the target state of the second device includes the experimental phenomena of the second device, the first matching result of the target state of the second device is obtained based on the degree of matching between the experimental phenomena of the second device and the second reference state.

[0210] When the target state of the second device includes: the circuit connection status of the second device and the experimental phenomena of the second device, the first matching result of the target state of the second device is obtained based on the degree of matching between the circuit connection status of the second device and the first reference state; and / or the degree of matching between the experimental phenomena of the second device and the second reference state.

[0211] For example, determining the degree of matching between the circuit connection of the second device and the first reference state can be achieved by: detecting the current connection of the second device according to the set of connection detection rules for the second device, and determining the degree of matching between the circuit connection of the second device and the first reference state. Determining the degree of matching between the experimental phenomena of the second device and the second reference state can be achieved by: detecting the experimental phenomena of the second device according to the set of experimental phenomenon detection rules for the second device, and determining the degree of matching between the experimental phenomena of the second device and the second reference state.

[0212] Step b3: Based on the degree of matching between the circuit connection of the third device and the first reference state; and / or the degree of matching between the experimental phenomena of the third device and the second reference state, obtain the second matching result of the target state of the third device.

[0213] Optionally, when the target state of the third device includes the circuit connection status of the third device, a second matching result of the target state of the third device is obtained based on the degree of matching between the circuit connection status of the third device and the first reference state.

[0214] When the target state of the third device includes the experimental phenomena of the third device, the second matching result of the target state of the third device is obtained based on the degree of matching between the experimental phenomena of the third device and the second reference state.

[0215] When the target state of the third device includes: the circuit connection status of the third device and the experimental phenomena of the third device, a second matching result of the target state of the third device is obtained based on the degree of matching between the circuit connection status of the third device and the first reference state; and / or the degree of matching between the experimental phenomena of the third device and the second reference state.

[0216] For example, determining the degree of matching between the circuit connection of the third device and the first reference state can be achieved by: detecting the current connection of the third device according to the connection detection rule set of the third device, and determining the degree of matching between the circuit connection of the third device and the first reference state. Determining the degree of matching between the experimental phenomena of the third device and the second reference state can be achieved by: detecting the experimental phenomena of the third device according to the experimental phenomenon detection rule set of the third device, and determining the degree of matching between the experimental phenomena of the third device and the second reference state.

[0217] Step b4: Based on the prediction results, the first matching results, and the second matching results, determine the matching results of the target states of all circuits in the circuit to be tested.

[0218] In some embodiments, each result corresponds to a confidence level, and step b4 above can be implemented as follows: based on the prediction result and the confidence level corresponding to the prediction result, the first matching result and the confidence level corresponding to the first matching result, and the second matching result and the confidence level corresponding to the second matching result, determine the matching result of the target state of all circuits of the circuit to be detected.

[0219] The confidence level of each matching result is related to the target state of the device from which the matching result is obtained. For example, the confidence level of the detection result obtained based on the device's connectivity is the lowest; the confidence level of the detection result obtained based on both the device's connectivity and experimental phenomena is the highest; and the confidence level of the detection result obtained based on the device's experimental phenomena is moderate.

[0220] The confidence level corresponding to the above prediction result is related to the target state of the device from which the prediction result is obtained. For example, the confidence level corresponding to the above prediction result includes: a first confidence level, a second confidence level, or a third confidence level; the first confidence level is greater than the second confidence level; the second confidence level is greater than the third confidence level; wherein, the first confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the first device and the reference state; the second confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the second device and the experimental phenomena of the third device and the reference state; the third confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the second device or the experimental phenomena of the third device and the reference state.

[0221] It is understandable that occlusion and wire entanglement are common during experiments. Therefore, if the detection is based solely on the target state of the entire circuit, the accuracy of the matching results will be low. Thus, the method provided in this application can determine the degree of matching between the target state of the entire circuit and the reference state of the circuit under test when occlusion exists in the circuit under test, based on the target state of a local circuit of the circuit under test, thereby improving the accuracy of the matching results.

[0222] like Figure 14 As shown, this application provides an electrical experimental analysis device for performing, for example... Figure 4 The electrical experimental analysis method shown is described. The electrical experimental analysis device 300 includes: a first acquisition module 301, a first analysis module 302, and a first determination module 303.

[0223] The first acquisition module 301 is used to acquire the target video of the electrical experiment; wherein, the target video includes the circuit to be detected for the event to be detected in the electrical experiment.

[0224] The first analysis module 302 is used to analyze the target video to obtain the target state of the circuit under test; wherein, the target state of the circuit under test includes at least one of the following: the connection status of the devices in the circuit under test, and the experimental phenomena of the circuit under test.

[0225] The first determining module 303 is used to determine the degree of matching between the target state and the reference state of the circuit under test, and to obtain the matching result.

[0226] As one possible implementation, the target state of the circuit under test includes: the connection status of the devices in the entire circuit of the circuit under test; and / or, the experimental phenomena in the entire circuit of the circuit under test; and / or, the connection status of the devices in a local circuit of the circuit under test and the experimental phenomena in a local circuit of the circuit under test.

[0227] As another possible implementation, the circuit under test corresponds to one or more detection rules; wherein, the one or more detection rules include at least one of the following: a rule for detection based on the connection status of all devices in the circuit under test, a rule for detection based on experimental phenomena in the entire circuit of the circuit under test, and a rule for detection based on the connection status of devices in a local circuit of the circuit under test and experimental phenomena in a local circuit of the circuit under test; the first determining module 303 is specifically used to determine the target detection rule of the circuit under test from the one or more detection rules corresponding to the circuit under test based on the target state of the circuit under test; and determine the degree of matching between the target state and the reference state of the circuit under test according to the target detection rule of the circuit under test to obtain a matching result.

[0228] As another possible implementation, each device corresponds to a set of connection status detection rules and a set of experimental phenomenon detection rules; the first determining module 303 is further used to determine multiple devices included in the circuit to be tested; determine the set of connection status detection rules and the set of experimental phenomenon detection rules corresponding to each of the multiple devices; obtain rules for detecting the connection status of devices in all circuits of the circuit to be tested based on the set of connection status detection rules corresponding to each device; and obtain rules for detecting experimental phenomena in all circuits of the circuit to be tested based on the set of experimental phenomenon detection rules corresponding to each device.

[0229] As another possible implementation, multiple devices include a target device; the target device is any one of the multiple devices; the first determining module 303 is specifically used to select, from all the connection detection rules of the target device in the circuit under test, the connection detection rules involved in the target device in the circuit under test, to form a set of connection detection rules; and to select, from all the experimental phenomenon detection rules of the target device in the circuit under test, the experimental phenomenon detection rules involved in the target device in the circuit under test, to form a set of experimental phenomenon detection rules.

[0230] As another possible implementation, when the target state includes the connection status of the devices in the circuit under test, the first analysis module 302 is specifically used to identify each of the multiple wires in the circuit under test from the target video; identify the position of the terminal of each of the multiple devices in the circuit under test from the target video; and determine the connection status of the devices in the circuit under test based on the distance between the end of each wire and the position of the terminal of each device.

[0231] As another possible implementation, the first acquisition module 301 is also used to acquire the target marking time; the target marking time is the time when the target state of the circuit to be tested is recorded; the first analysis module 302 is specifically used to acquire at least one target video frame from the target video according to the target marking time; the acquisition time of the target video frame is the target marking time; analyze the target video frame to obtain the target state of the circuit to be tested.

[0232] As another possible implementation, when the electrical experiment includes multiple events to be detected, the first determining module 303 is further configured to determine the comprehensive matching result of the electrical experiment based on the matching results corresponding to the target states of the circuits to be detected for the multiple events to be detected and the confidence level corresponding to each matching result; the comprehensive matching result is used to reflect the correctness of the electrical experiment.

[0233] like Figure 15As shown in the embodiments of this application, an electrical experimental analysis device is also provided for performing, for example... Figure 13 The electrical experimental analysis method shown is described. The electrical experimental analysis device 400 includes: a second acquisition module 401, a second analysis module 402, and a second determination module 403.

[0234] The second acquisition module 401 is used to acquire the target video of the electrical experiment; wherein, the target video includes the circuit to be detected of the event to be detected in the electrical experiment.

[0235] The second analysis module 402 is used to analyze the target video and, if it is determined that there is occlusion in the circuit to be tested, to obtain the target state of a local circuit of the circuit to be tested; the target state refers to the connection state and / or experimental phenomena of the local circuit of the circuit to be tested that can be analyzed from the target video.

[0236] The second determining module 403 is used to determine the matching result of the target state of all circuits of the circuit under test based on the degree of matching between the target state and the reference state of a local circuit of the circuit under test.

[0237] As one possible implementation, the target state of a local circuit of the circuit under test includes at least one of the following: the connection status of the devices in the local circuit of the circuit under test, and the experimental phenomena of the local circuit of the circuit under test; the second determining module 403 is specifically used to determine the matching result of the target state of the entire circuit of the circuit under test based on the degree of matching between the connection status of the devices in the circuit under test and the first reference state; and / or the degree of matching between the experimental phenomena of the local circuit of the circuit under test and the second reference state; the first reference state represents the reference state of the circuit connection status of the circuit under test; the second reference state represents the reference state of the experimental phenomena of the circuit under test.

[0238] As another possible implementation, the circuit to be tested includes a first device, a second device, a third device, and a target device; the first device is used to detect the voltage across the target device; the second device is used to detect the current in the branch where the target device is located; the third device is used to adjust the current in the branch where the target device is located; when the first device is obstructed, a local circuit of the circuit to be tested includes the second device, the third device, and the target device; the target state of the local circuit of the circuit to be tested includes: the target state of the second device and the target state of the third device; the target state of the second device includes: the circuit connection status of the second device and / or the experimental phenomena of the second device; the target state of the third device includes: the circuit connection status of the third device and / or the experimental phenomena of the third device; the aforementioned second determining module 40 3. Specifically, it is used to obtain a predicted result of the target state of the first device based on the degree of matching between the experimental phenomena of the second device and the second reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state; to obtain a first matching result of the target state of the second device based on the degree of matching between the circuit connection of the second device and the first reference state; and / or, based on the degree of matching between the experimental phenomena of the second device and the second reference state; to obtain a second matching result of the target state of the third device based on the degree of matching between the circuit connection of the third device and the first reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state; and to determine the matching result of the target state of all circuits of the circuit to be tested based on the predicted result, the first matching result, and the second matching result.

[0239] As another possible implementation, the experimental phenomena of the second device include: the first current value of the second device at the first marking time, and the second current value at the second marking time; the experimental phenomena of the third device include: the first resistance value of the third device at the first marking time, and the second resistance value at the second marking time; the aforementioned second determining module 403 is specifically used to obtain the prediction result of the target state of the first device based on the degree of matching between the first current value of the second device at the first marking time, and the second current value at the second marking time, and the reference current value; and / or, based on the degree of matching between the first resistance value of the third device at the first marking time, and the second resistance value at the second marking time, and the reference resistance value.

[0240] As another possible implementation, the second determining module 403 is specifically used to determine the matching result of the target state of all circuits of the circuit to be tested based on the prediction result and the confidence level corresponding to the prediction result, the first matching result and the confidence level corresponding to the first matching result, and the second matching result and the confidence level corresponding to the second matching result; the confidence level corresponding to the prediction result includes: a first confidence level, a second confidence level, or a third confidence level; the first confidence level is greater than the second confidence level; the second confidence level is greater than the third confidence level; wherein, the first confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the first device and the reference state; the second confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the second device and the experimental phenomena of the third device and the reference state; the third confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the second device or the experimental phenomena of the third device and the reference state.

[0241] In implementing the functions of the integrated modules described above using hardware, this application provides another possible structural schematic diagram of the electrical experimental analysis device involved in the above embodiments. For example... Figure 16 As shown, the electrical experiment analysis device 500 includes: a processor 502, a communication interface 503, and a bus 504. Optionally, the electrical experiment analysis device 500 may also include a memory 501.

[0242] Processor 502 may implement or execute various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. Processor 502 may be a central processing unit, a general-purpose processor, a digital signal processor, an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It may implement or execute various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. Processor 502 may also be a combination that implements computing functions, such as including one or more microprocessor combinations, a combination of a DSP and a microprocessor, etc.

[0243] Communication interface 503 is used to connect to other devices via a communication network. This communication network can be Ethernet, wireless access network, wireless local area network (WLAN), etc.

[0244] The memory 501 may be a read-only memory (ROM) or other type of static storage device capable of storing static information and instructions, random access memory (RAM) or other type of dynamic storage device capable of storing information and instructions, or electrically erasable programmable read-only memory (EEPROM), disk storage medium or other magnetic storage device, or any other medium capable of carrying or storing desired program code in the form of instructions or data structures and accessible by a computer, but is not limited thereto.

[0245] As one possible implementation, the memory 501 can exist independently of the processor 502. The memory 501 can be connected to the processor 502 via a bus 504 and is used to store instructions or program code. When the processor 502 calls and executes the instructions or program code stored in the memory 501, it can implement the electrical experimental analysis method provided in the embodiments of this application.

[0246] In another possible implementation, the memory 501 can also be integrated with the processor 502.

[0247] Bus 504 can be an extended industry standard architecture (EISA) bus, etc. Bus 504 can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 16 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0248] Through the above description of the implementation methods, those skilled in the art can clearly understand that, for the sake of convenience and brevity, only the division of the above functional modules is used as an example. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the electrical experimental analysis device can be divided into different functional modules to complete all or part of the functions described above.

[0249] This application also provides a computer-readable storage medium. All or part of the processes in the above method embodiments can be executed by computer instructions instructing related hardware. The program can be stored in the computer-readable storage medium, and when executed, it can include the processes of the above method embodiments. The computer-readable storage medium can be any of the foregoing embodiments or memory. The computer-readable storage medium can also be an external storage device of the above electrical experimental analysis apparatus, such as a plug-in hard drive, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the electrical experimental analysis apparatus. Further, the computer-readable storage medium can include both internal storage units and external storage devices of the electrical experimental analysis apparatus. The computer-readable storage medium is used to store the computer program and other programs and data required by the electrical experimental analysis apparatus. The computer-readable storage medium can also be used to temporarily store data that has been output or will be output.

[0250] This application also provides a computer program product, which includes a computer program that, when run on a computer, causes the computer to perform any of the electrical experimental analysis methods provided in the above embodiments.

[0251] Although this application has been described herein in conjunction with various embodiments, those skilled in the art, by reviewing the accompanying drawings, disclosure, and appended claims, will understand and implement other variations of the disclosed embodiments in carrying out the claimed application. In the claims, the word "comprising" does not exclude other components or steps, and "a" or "an" does not exclude multiple components. A single processor or other unit can implement several functions listed in the claims. While different dependent claims may recite certain measures, this does not mean that these measures cannot be combined to produce good results.

[0252] Although this application has been described in conjunction with specific features and embodiments, it is obvious that various modifications and combinations can be made thereto without departing from the spirit and scope of this application. Accordingly, this specification and drawings are merely exemplary illustrations of this application as defined by the appended claims, and are considered to cover any and all modifications, variations, combinations, or equivalents within the scope of this application. Clearly, those skilled in the art can make various alterations and modifications to this application without departing from the spirit and scope of this application. Thus, if such modifications and modifications of this application fall within the scope of the claims of this application and their equivalents, this application is also intended to include such modifications and modifications.

[0253] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. An electrical experimental analysis method, characterized in that, include: Acquire a target video of an electrical experiment; wherein the target video includes the circuit to be detected for the event to be detected in the electrical experiment; The target video is analyzed to obtain the target state of the circuit under test; the target state refers to the connection state and / or experimental phenomena of the circuit under test that can be analyzed from the target video; the circuit under test includes multiple devices; When the target state of the circuit under test includes the connection status of all devices in the circuit under test, based on the connection status of the target device in the circuit under test, a connection status detection rule for the target device in the circuit under test is selected from the total connection status detection rules of the target device, resulting in a rule for detection based on the connection status of all devices in the circuit under test, which is then used as the target detection rule for the circuit under test; the target device is any one of the plurality of devices; When the target state of the circuit under test includes experimental phenomena in all circuits of the circuit under test, based on the experimental phenomena of the target device in the circuit under test, the experimental phenomena detection rules involving the target device in the circuit under test are selected from all experimental phenomena detection rules of the target device, and the rules for detection based on experimental phenomena in all circuits of the circuit under test are obtained, and are used as the target detection rules corresponding to the circuit under test. When the target state of the circuit under test includes the connection status of the devices in the local circuit of the circuit under test and the experimental phenomena of the local circuit of the circuit under test, the rule for detection based on the connection status of the devices in the local circuit of the circuit under test and the experimental phenomena of the local circuit of the circuit under test shall be used as the target detection rule corresponding to the circuit under test. Based on the target detection rules of the circuit under test, the degree of matching between the target state and the reference state of the circuit under test is determined, and the matching result is obtained. When the electrical experiment includes multiple events to be detected, a comprehensive matching result of the electrical experiment is determined based on the matching results corresponding to the target states of the circuits to be detected for the multiple events to be detected, and the confidence level corresponding to each matching result. The comprehensive matching result is used to reflect the correctness of the electrical experiment. The confidence level corresponding to the matching result is related to the detection rule used to obtain the matching result. Specifically, the confidence level corresponding to the rule based on the connection status of devices in the entire circuit is lower than the confidence level corresponding to the rule based on the connection status of devices in a local circuit and the experimental phenomena of the local circuit. The confidence level corresponding to the rule based on the connection status of devices in a local circuit and the experimental phenomena of the local circuit is lower than the confidence level corresponding to the rule based on the experimental phenomena of the entire circuit.

2. The method according to claim 1, characterized in that, When the target state includes the connection status of the devices in the circuit under test, the step of analyzing the target video to obtain the target state of the circuit under test includes: Identify each of the multiple wires in the circuit to be detected from the target video; Identify the position of the terminal block of each of the multiple devices in the circuit under test from the target video; The connection status of the devices in the circuit under test is determined based on the distance between the endpoint of each wire and the position of the terminal of each device.

3. The method according to claim 1, characterized in that, The method further includes: Obtain the target marking time; the target marking time is the time when the target state of the circuit to be tested is recorded. The analysis of the target video to obtain the target state of the circuit to be detected includes: Based on the target tracking time, at least one target video frame is obtained from the target video; the acquisition time of the target video frame is the target tracking time. The target state of the circuit to be detected is obtained by analyzing the target video frame.

4. An electrical experimental analysis method, characterized in that, The method includes: Acquire a target video of an electrical experiment; wherein the target video includes a circuit to be detected for an event to be detected in the electrical experiment; the circuit to be detected includes a first device, a second device, a third device, and a target device; the first device is used to detect the voltage across the target device; the second device is used to detect the current in the branch where the target device is located; the third device is used to adjust the current in the branch where the target device is located; the target state of a local circuit of the circuit to be detected includes: the target state of the second device and the target state of the third device; Analyzing the target video, if it is determined that the first device in the circuit to be tested is obstructed, the target state of a local circuit of the circuit to be tested is obtained; the target state refers to the connection state and / or experimental phenomena of the local circuit of the circuit to be tested that can be analyzed from the target video; the local circuit of the circuit to be tested includes the second device, the third device, and the target device; Based on the degree of matching between the experimental phenomena of the second device and the second reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state, the predicted result of the target state of the first device is obtained; the second reference state represents the reference state of the experimental phenomena of the circuit under test. Based on the degree of matching between the circuit connection of the second device and the first reference state; and / or the degree of matching between the experimental phenomena of the second device and the second reference state, a first matching result of the target state of the second device is obtained; the first reference state represents the reference state of the circuit connection of the circuit to be tested. Based on the degree of matching between the circuit connection of the third device and the first reference state; and / or the degree of matching between the experimental phenomena of the third device and the second reference state, a second matching result of the target state of the third device is obtained; Based on the prediction results, the first matching results, and the second matching results, the matching results of the target states of all circuits of the circuit to be detected are determined.

5. The method according to claim 4, characterized in that, The target state of the local circuit of the circuit under test includes at least one of the following: the connection status of the devices in the local circuit of the circuit under test, and the experimental phenomena of the local circuit of the circuit under test. Based on the degree of matching between the target state and the reference state of a local circuit of the circuit under test, the matching result of the target state of the entire circuit of the circuit under test is determined, including: Based on the degree of matching between the connection status of the devices in the circuit under test and the first reference state; and / or the degree of matching between the experimental phenomena of a local circuit of the circuit under test and the second reference state, the matching result of the target state of the entire circuit of the circuit under test is determined.

6. The method according to claim 4, characterized in that, The experimental phenomena of the second device include: the first current value of the second device at the first marking time, and the second current value at the second marking time; the experimental phenomena of the third device include: the first resistance value of the third device at the first marking time, and the second resistance value at the second marking time; the first marking time is the time for recording the first voltage value of the third device; the second marking time is the time for recording the second voltage value of the third device, and the second voltage value is a preset multiple of the first voltage value; The step of obtaining the prediction result of the target state of the first device based on the degree of matching between the experimental phenomena of the second device and the reference state; and / or based on the degree of matching between the experimental phenomena of the third device and the reference state includes: Based on the degree of matching between the first current value of the second device at the first marking time and the second current value at the second marking time and the reference current value; and / or, based on the degree of matching between the first resistance value of the third device at the first marking time and the second resistance value at the second marking time and the reference resistance value, the prediction result of the target state of the first device is obtained.

7. The method according to claim 4, characterized in that, The step of determining the matching result of the target state of all circuits of the circuit to be detected based on the prediction result, the first matching result, and the second matching result includes: Based on the prediction result and the confidence level corresponding to the prediction result, the first matching result and the confidence level corresponding to the first matching result, and the second matching result and the confidence level corresponding to the second matching result, the matching result of the target state of all circuits of the circuit to be detected is determined; The confidence level corresponding to the prediction result includes: a first confidence level, a second confidence level, or a third confidence level; the first confidence level is greater than the second confidence level; the second confidence level is greater than the third confidence level; wherein, the first confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the first device and the reference state; the second confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the second device and the experimental phenomena of the third device and the reference state; the third confidence level is the confidence level corresponding to the prediction result obtained based on the degree of matching between the experimental phenomena of the second device or the experimental phenomena of the third device and the reference state.

8. An electrical experimental analysis apparatus, characterized in that, The electrical experimental analysis device includes: The first acquisition module is used to acquire a target video of an electrical experiment; wherein, the target video includes a circuit to be detected for an event to be detected in the electrical experiment; The first analysis module is used to analyze the target video to obtain the target state of the circuit under test; the target state refers to the connection state and / or experimental phenomena of the circuit under test that can be analyzed from the target video; the circuit under test includes multiple devices; The first determining module is configured to, when the target state of the circuit under test includes the connection status of devices in all circuits of the circuit under test, select, based on the connection status of the target device in the circuit under test, a connection status detection rule for the target device involved in the circuit under test from the total connection status detection rules of the target device, to obtain a rule for detection based on the connection status of devices in all circuits of the circuit under test, and use it as the target detection rule corresponding to the circuit under test; the target device is any one of the plurality of devices; when the target state of the circuit under test includes experimental phenomena in all circuits of the circuit under test, select, based on the experimental phenomena of the target device in the circuit under test, an experimental phenomenon detection rule for the target device involved in the circuit under test from the total experimental phenomenon detection rules of the target device, to obtain a rule for detection based on the experimental phenomena in all circuits of the circuit under test, and use it as the target detection rule corresponding to the circuit under test; when the target state of the circuit under test includes the connection status of devices in a local circuit of the circuit under test and the local circuit of the circuit under test... In the case of experimental phenomena in a circuit, the rules for detection based on the connection status of devices in a local circuit of the circuit under test and the experimental phenomena of that local circuit are used as the target detection rules for the circuit under test. Based on the target detection rules for the circuit under test, the degree of matching between the target state and the reference state of the circuit under test is determined, resulting in a matching result. If the electrical experiment includes multiple events to be tested, the comprehensive matching result of the electrical experiment is determined based on the matching results corresponding to the target states of the circuit under test for each of the multiple events, and the confidence level corresponding to each matching result. The comprehensive matching result reflects the correctness of the electrical experiment. The confidence level corresponding to the matching result is determined based on the confidence level of the detection rules that yield the matching result. Specifically, the confidence level corresponding to the rules for detection based on the connection status of devices in the entire circuit is lower than the confidence level corresponding to the rules for detection based on the connection status of devices in a local circuit and the experimental phenomena of that local circuit; the confidence level corresponding to the rules for detection based on the connection status of devices in a local circuit and the experimental phenomena of that local circuit is lower than the confidence level corresponding to the rules for detection based on the experimental phenomena of the entire circuit.

9. An electrical experimental analysis apparatus, characterized in that, The electrical experimental analysis device includes: The second acquisition module is used to acquire a target video of an electrical experiment; wherein the target video includes a circuit to be detected for an event to be detected in the electrical experiment; the circuit to be detected includes a first device, a second device, a third device, and a target device; the first device is used to detect the voltage across the target device; the second device is used to detect the current in the branch where the target device is located; the third device is used to adjust the current in the branch where the target device is located; the target state of a local circuit of the circuit to be detected includes the target state of the second device and the target state of the third device; The second analysis module is used to analyze the target video and, if it is determined that the first device in the circuit to be tested is obstructed, to obtain the target state of a local circuit of the circuit to be tested; the target state refers to the connection state and / or experimental phenomena of the local circuit of the circuit to be tested that can be analyzed from the target video; the local circuit of the circuit to be tested includes the second device, the third device, and the target device; The second determining module is used to obtain a predicted result of the target state of the first device based on the degree of matching between the experimental phenomena of the second device and the second reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state; the second reference state represents a reference state of the experimental phenomena of the circuit under test; a first matching result of the target state of the second device is obtained based on the degree of matching between the circuit connection of the second device and the first reference state; and / or, based on the degree of matching between the experimental phenomena of the second device and the second reference state; the first reference state represents a reference state of the circuit connection of the circuit under test; a second matching result of the target state of the third device is obtained based on the degree of matching between the circuit connection of the third device and the first reference state; and / or, based on the degree of matching between the experimental phenomena of the third device and the second reference state; and a matching result of the target state of all circuits of the circuit under test is determined based on the predicted result, the first matching result, and the second matching result.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions that, when executed on a computer, cause the computer to perform the method according to any one of claims 1 to 7.

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