Microwave electric field measurement probe device and method of use

Abstract

The application discloses a microwave electric field measuring probe device and a use method thereof. The device comprises an atomic vapor chamber, a double-wavelength spectrometer prism connected to the end of the atomic vapor chamber, an input coupling light fiber collimation assembly and an output signal light fiber collimation assembly connected to the end of the double-wavelength spectrometer prism away from the atomic vapor chamber, an input probe light fiber assembly connected to the atomic vapor chamber, the input probe light fiber assembly connected to the end of the atomic vapor chamber away from the double-wavelength spectrometer prism, the input probe light fiber assembly, the output signal light fiber collimation assembly and the atomic vapor chamber arranged on the same axial line, probe light capable of passing through the double-wavelength spectrometer prism into the output signal light fiber collimation assembly, and coupling light entering the atomic vapor chamber capable of coinciding with the probe light capable of passing through the double-wavelength spectrometer prism in the atomic vapor chamber. The purpose of improving light collection efficiency and use flexibility is achieved.

Description

Technical Field

[0001] This application relates to the field of microwave electric field measurement technology, and specifically to a microwave electric field measurement probe device and its usage method, particularly to a microwave electric field measurement probe device and its usage method based on an optical fiber coupled atomic vapor chamber structure. Background Technology

[0002] Traditional quantum electric field probes suffer from low integration, instability, and limited mobility, making them unsuitable for microwave electric field testing in confined spaces. Furthermore, the optical path, composed of optical lenses placed in free space, is susceptible to vibrations transmitted from the mounting brackets, affecting the overlap of the two beams. Changes in direction affect the overlap between the 509nm and 852nm beams. Since only atoms in the overlap region can sense the microwave electric field, a reduction in the overlap region's volume alters the number of sensing units (Rydberg atoms) receiving the electric field, leading to a decrease in the measured electric field signal and consequently affecting the field-induced spectral splitting signal. Although some samples utilize fiber optic access to atomic gas chambers, the low collection efficiency of the probe signal light limits the measurable minimum field strength and signal-to-noise ratio. Moreover, in the direction away from the microwave source within the gas chamber, the field strength does not decrease with distance but exhibits multiple maxima and minima. The higher the frequency, the greater the difference in electric field strength at different locations along the optical path; therefore, changes in the beam direction can alter the measured field strength.

[0003] The original direct-through atomic electric field probe scheme is as follows: Figure 1 As shown, since both the 509nm input collimation section and the 852nm output coupling section pass through collimating lens A2, the different wavelengths of 509nm and 852nm result in different dispersions during Clens collimation or Clens coupling, leading to different focal point positions. To enhance the induced microwave electric field signal, when ensuring the 509nm parallel beam and 852nm beam coincide in the vapor chamber, the efficiency of the 852nm output from port A2 drops to 50%. Furthermore, an additional fiber optic WDM is added to separate the 509nm and 852nm lasers; this device has a loss of approximately 40-50%, meaning the maximum efficiency of the WDM is 60%. In reality, the highest efficiency of the direct-through scheme can only reach 30%. This does not even consider the connection loss between the probe and the fiber optic WDM. Moreover, the original direct-through connection point uses PM630 fiber on both sides to ensure simultaneous use of 852nm and 509nm, with a transmittance of 80% at 852nm and 70% at 509nm. Summary of the Invention

[0004] This specification provides an embodiment of a microwave electric field measurement probe device and its usage method, which solves the problems of low optical signal collection efficiency and simple structure and inflexible use in the prior art.

[0005] Therefore, the embodiments of this specification provide the following solutions:

[0006] On one hand, this application provides a microwave electric field measurement probe device, including: an atomic vapor chamber. A dual-wavelength beam splitter is connected to one end of the atomic vapor chamber, and an input coupling optical fiber collimation assembly and an output signal optical fiber collimation assembly are connected to the end of the dual-wavelength beam splitter away from the atomic vapor chamber; an input probe optical fiber assembly is connected to the atomic vapor chamber.

[0007] An input coupling light fiber collimation assembly receives the coupling light, and the dual-wavelength beam splitter reflects the coupling light into the atomic vapor chamber. An output signal light fiber collimation assembly outputs the probe light. An input probe light fiber assembly transmits the probe light to the atomic vapor chamber.

[0008] The atomic vapor chamber is connected to a dual-wavelength beam splitter at one end, and the end of the dual-wavelength beam splitter away from the atomic vapor chamber is connected to an input coupling optical fiber collimation component and an output signal optical fiber collimation component; an input probe optical fiber component is connected to the atomic vapor chamber.

[0009] The input probe fiber assembly is connected to the end of the atomic vapor chamber away from the dual-wavelength beam splitter prism, and the input probe fiber assembly, the output signal fiber collimation assembly, and the atomic vapor chamber are on the same axis; or, the input probe fiber assembly and the dual-wavelength beam splitter prism are connected to the same end of the atomic vapor chamber, and a corner cube reflector is connected to the end of the atomic vapor chamber away from the dual-wavelength beam splitter prism.

[0010] The probe light can pass through the dual-wavelength beam splitter and enter the output signal optical fiber collimation assembly, and the probe light can pass through the cornerstone mirror and enter the atomic vapor chamber.

[0011] Furthermore, the atomic vapor chamber has a cylindrical structure and an anti-reflective film on its end face.

[0012] Furthermore, the dual-wavelength beam splitter includes a right-angled triangular prism and an oblique quadrangular prism. The right-angled triangular prism includes a right-angled face and a triangular prism oblique face, and the oblique quadrangular prism includes an incident coupling light narrow face, an exit light narrow face, and an oblique quadrangular prism oblique face.

[0013] The inclined surface of the oblique quadrangular prism is connected to the inclined surface of the right-angled triangular prism; the narrow surface of the emitted light is connected to the atomic vapor chamber; the narrow surface of the incident coupled light is connected to the collimating fiber of the input coupled light.

[0014] The right-angled surface, the incident coupling light narrow surface, and the outgoing light narrow surface are provided with light-enhancing films; the triangular prism inclined surface and the quadrangular prism inclined surface are provided with probe light-enhancing films and coupling light-high reflectivity films.

[0015] Furthermore, the emitted light narrow surface is seamlessly bonded to the atomic vapor chamber using optical adhesive.

[0016] Furthermore, the incident coupling light narrow facet and the input coupling light fiber collimation component are bonded together with high-strength UV adhesive.

[0017] Furthermore, the inclined surface of the oblique quadrangular prism and the inclined surface of the right-angled triangular prism are bonded together with adhesive.

[0018] Furthermore, the output signal optical fiber collimation assembly includes a fixed coaxial glass tube and a C-shaped lens and an optical fiber end face disposed within the fixed coaxial glass tube. The C-shaped lens and the optical fiber end face are spaced apart, and the corner face of the C-shaped lens is parallel to the corner face of the optical fiber end face.

[0019] Furthermore, if the input probe optical fiber assembly and the dual-wavelength beam splitter are connected to the same end of the atomic vapor chamber, then the cornerstone reflector includes a laser incident surface, a first reflecting slope, and a second reflecting slope.

[0020] The laser incident surface is provided with an anti-reflection film, and the first and second reflective inclined surfaces are provided with a high-reflection film for the probe light and a high-transmittance film for the coupling light, and are coated with black paint. The laser incident surface is connected to the atomic vapor chamber.

[0021] Furthermore, the atomic vapor chamber, the dual-wavelength beam splitter prism, the output signal fiber collimation assembly, the input coupling fiber collimation assembly, and the input probe fiber assembly are all made of glass.

[0022] On the other hand, embodiments of this application provide a method for using a microwave electric field measurement probe device, including the following steps: if the input probe optical fiber assembly and the output signal optical fiber collimation assembly are located at opposite ends of the atomic vapor chamber, then the method includes the following steps:

[0023] The probe light enters the atomic vapor chamber after passing through the input probe light fiber collimation assembly;

[0024] After passing through the atomic vapor chamber, the light is transmitted through a dual-wavelength beam splitter into the output signal optical fiber collimation component.

[0025] The coupled light is collimated by the input coupling light fiber collimation component to form a parallel beam with a large beam diameter, and then reflected by the dual-wavelength beam splitter prism before entering the atomic vapor chamber, where it coincides with the probe light that is about to exit the atomic vapor chamber.

[0026] If the input probe fiber collimator and the output signal fiber collimator are located at the same end of the atomic vapor chamber, then the following steps are included:

[0027] The probe light enters the atomic vapor chamber after passing through the input probe light fiber collimation assembly;

[0028] After the probe light passes through the atomic vapor chamber, it is reflected by a pyramidal reflector and re-enters the atomic vapor chamber.

[0029] After passing through the atomic vapor chamber again, it is transmitted through a dual-wavelength beam splitter into the output signal optical fiber assembly.

[0030] The coupled light is collimated by the input coupling light fiber collimation component to form a parallel beam with a large beam diameter. After being reflected by the dual-wavelength beam splitter, it enters the atomic vapor chamber and coincides with the probe light that is about to exit the atomic vapor chamber.

[0031] The above-described technical solutions adopted in the embodiments of this application can achieve the following beneficial effects:

[0032] The atomic electric field probe of this invention can achieve low-loss detection laser transmission coupling, high-efficiency collection of microwave electric field induction intensity, obtain high signal-to-noise ratio spectral signals, and improve the measurement sensitivity of the atomic electric field meter.

[0033] Compared to metal-structured electric field probes, all-glass atomic electric field probes have a lower dielectric constant, reducing interference from the probe to the measured microwave electric field.

[0034] By using an optically coupled atomic vapor chamber encapsulated with photoresist, the poor reproducibility of electric field amplitude can be avoided by detecting different atomic groups inside the chamber due to the pointing jitter of the free space optical path.

[0035] Furthermore, the all-optical glass adhesive bonding structure ensures that the probe has advantages such as high temperature resistance and vibration resistance. Reflective electric field probes and direct-through electric field probes can be arranged as needed, facilitating on-site wiring and layout.

[0036] The collimation and output sections are independent, each with adjustable focusing parameters. This ensures the overlap of the probe and coupling beams within the vapor chamber and improves output coupling efficiency. It enables the measurement of field strength in confined spaces, guaranteeing the consistency and stability of the double-beam overlap and ensuring the beam path within the vapor chamber remains unchanged when the atomic gas chamber is arranged, thus ensuring consistent electric field strength measurement. Simultaneously, a small, dual-wavelength beam splitter with a purely free-space design achieves highly efficient laser beam splitting of the probe and coupling beams. Utilizing inclined plane reflection, the input and output laser beams are aligned along the same axis, facilitating the layout of the straight-in / straight-out fiber-coupled structure, avoiding excessive bending, and improving operational flexibility. Attached Figure Description

[0037] To more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are merely exemplary, and those skilled in the art can derive other embodiments based on the provided drawings without creative effort.

[0038] The structures, proportions, sizes, etc. illustrated in this specification are only for the purpose of assisting those skilled in the art in understanding and reading the content disclosed herein, and are not intended to limit the conditions under which the present invention can be implemented. Therefore, they have no substantial technical significance. Any modifications to the structure, changes in the proportions, or adjustments to the size, without affecting the effects and objectives that the present invention can produce, should still fall within the scope of the technical content disclosed in the present invention.

[0039] In the attached diagram:

[0040] Figure 1 This is a schematic diagram of a traditional through-type atomic electric field probe.

[0041] Figure 2 This is a schematic diagram of a possible structure of a microwave electric field measurement probe device provided in the embodiments of this specification;

[0042] Figure 3 This is a schematic diagram of the input coupling optical fiber collimation component structure provided in the embodiments of this specification;

[0043] Figure 4 This is a schematic diagram of the dual-wavelength beam splitter structure provided in the embodiments of this specification;

[0044] Figure 5 This is a schematic diagram illustrating another possible configuration of a microwave electric field measurement probe device provided in the embodiments of this specification.

[0045] Figure 6 This is a schematic diagram of the cornerstone reflector structure provided in the embodiments of this specification. Detailed Implementation

[0046] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be clearly and completely described below in conjunction with specific embodiments and corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0047] The technical solutions provided by the various embodiments of this application are described in detail below with reference to the accompanying drawings.

[0048] Example 1

[0049] Example 1 of this manual provides a microwave electric field measurement probe device. Please refer to [link / reference]. Figure 2 The system includes: an atomic vapor chamber 6, which is not limited to a cylindrical structure with an anti-reflection coating on its end face; a dual-wavelength beam splitter 5 connected to the end of the atomic vapor chamber; an input coupling optical fiber collimation component 4 and an output signal optical fiber collimation component 2 connected to the end of the dual-wavelength beam splitter away from the atomic vapor chamber; in use, the input coupling optical fiber collimation component 4 is connected to the input coupling optical fiber 3, and the output signal optical fiber collimation component 2 is connected to the output signal optical fiber 1; an input probe optical fiber component 7 connected to the atomic vapor chamber; in use, the input probe optical fiber component 7 is connected to the input probe optical fiber 8; the input probe optical fiber component 7 is connected to the end of the atomic vapor chamber 6 away from the dual-wavelength beam splitter 5, and the input probe optical fiber component, the output signal optical fiber collimation component, and the atomic vapor chamber are on the same axis.

[0050] To further explain, the coupling light fiber collimation component 4 is used to receive the coupling light and transmit it to the dual-wavelength beam splitter prism, which can reflect the coupling light into the atomic vapor chamber; the output signal light fiber collimation component is used to output the probe light; the input probe light fiber component is used to transmit the probe light to the atomic vapor chamber; wherein, the probe light can pass through the dual-wavelength beam splitter prism and enter the output signal light fiber collimation component; the coupling light entering the atomic vapor chamber can coincide with the probe light in the atomic vapor chamber that can pass through the dual-wavelength beam splitter prism.

[0051] For further explanation, please refer to Figure 3 As shown, the output signal optical fiber collimation assembly 2 includes a fixed coaxial glass tube 21, a C-shaped lens 22 disposed within the fixed coaxial glass tube 21, and an optical fiber end face 23. The C-shaped lens 22 and the optical fiber end face 23 are spaced apart, and the corner faces of the C-shaped lens and the optical fiber end face are parallel. (Other optical fiber collimation assemblies have the same structure and will not be described again here.)

[0052] For further explanation, please refer to Figure 4 As shown, the dual-wavelength beam splitter prism 5 includes a right-angled triangular prism 51 and an oblique quadrangular prism 52. The right-angled triangular prism includes a right-angled face 511 and a triangular prism oblique face 512. The oblique quadrangular prism 52 includes an incident coupling light narrow face 521, an exit light narrow face 523, and an oblique quadrangular prism oblique face 522. The oblique quadrangular prism oblique face is connected to the right-angled triangular prism oblique face. The exit light narrow face is connected to the atomic vapor chamber. The incident coupling light narrow face is connected to the input coupling light fiber collimation assembly. The right-angled face, the incident coupling light narrow face, and the exit light narrow face are provided with light anti-reflection coatings. The triangular prism oblique face and the quadrangular prism oblique face are provided with probe light anti-reflection coatings and coupling light high-reflection coatings.

[0053] The exit beam narrow facet is seamlessly bonded to the atomic vapor chamber using optical adhesive. The incident coupling beam narrow facet is bonded to the input coupling beam fiber collimation assembly using high-strength UV adhesive. The beveled faces of the oblique quadrangular prism and the right-angled triangular prism are bonded together using optical adhesive.

[0054] In one specific implementation, the probe wavelength is 852 nm, the coupling wavelength is 509 nm, and the output signal light is also 852 nm. The input probe light and the input coupling light are used to prepare atoms from the ground state to the Rydberg level. The laser frequency of the input probe light resonates with the atomic ground state and intermediate excited state, and the frequency of the input coupling light continuously and periodically scans near the Rydberg level. When this scheme is used for microwave electric field measurement, the time-domain intensity distribution of the output signal light carries the information of the measured microwave electric field intensity.

[0055] The input probe light passes sequentially through the input probe light fiber, the input probe light fiber assembly, the atomic vapor chamber, the dual-wavelength beam splitter, and the output signal light fiber collimation assembly, and is output through the output signal fiber.

[0056] The input coupling light passes sequentially through the coupling optical fiber, the input coupling optical fiber assembly, the dual-wavelength beam splitter, and the atomic vapor chamber. The coupling light and the probe light coincide in the atomic vapor chamber and propagate in opposite directions.

[0057] The coupling light and the probe light coincide at the right-angled triangular prism inclined surface 512 of the dual-wavelength beam splitter 5. A 509nm high reflectivity and 852nm anti-reflection film is coated on this surface, which enables the coupling light to achieve high reflectivity and the probe light to achieve high transmittance.

[0058] By having the input probe fiber optic assembly and the output signal fiber optic assembly collinear, high signal light collection efficiency can be achieved.

[0059] The coupled light is reflected sequentially by the two beam-splitting surfaces of the dual-wavelength beam splitter 5, and then enters the atomic vapor chamber through the narrow exit beam surface 523.

[0060] The output laser of the fiber collimation component is a beam with a near-parallel spot diameter of 1 mm.

[0061] Laser beams always enter or exit from a plane at a zero-degree angle, ensuring that laser transmission does not involve refraction or beam direction deviation. When a laser beam passes through a prism, it is reflected by an even number of triangular facets, ensuring that astigmatism does not occur when passing through the prism.

[0062] An 8-degree angled C-shaped lens and an 8-degree angled optical fiber with polished end faces are bonded and fixed at a certain distance inside a fixed coaxial glass tube 21, and sealed by encapsulating the glass tube with the end faces of the optical fiber. The two 8-degree angled surfaces are parallel, which ensures that the light spot does not shift axially and is transmitted parallelly into the atomic vapor chamber.

[0063] The atomic vapor chamber has an antireflection coating of 400nm-900nm on its end face to increase the utilization rate of the probe light, improve the efficiency of signal light acquisition, and achieve the purpose of improving the spectral signal-to-noise ratio of the probe electric field information.

[0064] The atomic vapor chamber is a vapor chamber for cesium atoms, with a high vacuum environment inside where the atoms are at saturated vapor pressure.

[0065] Example 2

[0066] Example 2 of this specification provides a microwave electric field measurement probe device that is basically the same as the example, except that... (Please refer to...) Figure 5 As shown, the input probe fiber assembly and the dual-wavelength beam splitter are connected to the same end of the atomic vapor chamber. A pyramidal reflector 9 is connected to the end of the atomic vapor chamber furthest from the dual-wavelength beam splitter. For further details, please refer to [link to relevant documentation]. Figure 6 As shown, the pyramidal reflector includes a laser incident surface 921, a first reflecting inclined surface 922, and a second reflecting inclined surface 923. An anti-reflection coating is provided on the laser incident surface, while a high-reflectivity coating for the probe light and a high-transmittance coating for the coupling light are provided on the first and second reflecting inclined surfaces, both coated with black paint. The laser incident surface is connected to the atomic vapor chamber. The atomic vapor chamber, the dual-wavelength beam splitter prism, the output signal fiber collimation assembly, the input coupling fiber collimation assembly, and the input probe fiber assembly are all made of glass. The input probe light, the input coupling light, and the output signal are all located on the same side of the vapor chamber. The three fibers can be bundled together, resulting in a compact structure that is easy to carry, install, and test. The pyramidal reflector is fixed at the other end of the atomic vapor chamber, ensuring a stable and reliable structure.

[0067] In one possible implementation, the laser incident plane 921 of the cornerstone reflector is coated with an antireflection film of 400nm-900nm, and the first reflecting slope 922 and the second reflecting slope 923 of the cornerstone reflector are coated with a high reflectivity film for the probe light and a high transmittance film for the coupling light and are covered with black paint.

[0068] All components are made of glass, exhibiting a low dielectric constant and minimal interference with microwave electric fields, thus enhancing the accuracy of microwave field strength measurements. The input coupling and probe optical fibers utilize single-mode polarization-maintaining fibers to ensure the laser's polarization direction. The output signal optical fiber is a large-core-diameter multimode fiber, increasing signal light collection efficiency, improving the signal-to-noise ratio of the spectral signal, and achieving a probe laser utilization rate of up to 80%.

[0069] By changing the rotation angle of the fiber collimation component to align the polarization directions of the probe light and the coupling light, atoms can be placed in the same polarization direction, enabling highly sensitive measurement of microwave electric field polarization.

[0070] The 509nm collimation section and the 852nm output section are independent of each other, and their focusing parameters can be adjusted independently. This ensures that the 509nm and 852nm light overlaps in the vapor chamber and also improves the output coupling efficiency of the 852nm beam. Simultaneously, a small dual-wavelength beam splitter with a purely free-space design achieves high-efficiency laser beam splitting. Furthermore, the use of oblique reflection ensures that the input and output laser beams are aligned along the same axis, facilitating the arrangement of the straight-in / straight-out fiber-coupled structure and avoiding excessive bending. This also improves transmittance.

[0071] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0072] It should also be noted that the terms "first" and "second" in this application are used to distinguish multiple objects with the same name, and are not used to limit the order or size. Unless otherwise specified, they have no other special meaning.

[0073] The above description is merely an embodiment of this application and is not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A microwave electric field measurement probe device, characterized in that, include: Atomic vapor chamber; A dual-wavelength beam splitter is connected to the end of the atomic vapor chamber. An input coupling optical fiber collimation component and an output signal optical fiber collimation component are connected to the end of the dual-wavelength beam splitter away from the atomic vapor chamber. An input probe optical fiber component is connected to the atomic vapor chamber. The input probe optical fiber assembly is connected to the end of the atomic vapor chamber away from the dual-wavelength beam splitter, and the input probe optical fiber assembly, the output signal optical fiber collimation assembly, and the atomic vapor chamber are on the same axis. Alternatively, the input probe fiber assembly and the dual-wavelength beam splitter are connected to the same end of the atomic vapor chamber, and a corner cube mirror is connected to the end of the atomic vapor chamber away from the dual-wavelength beam splitter. The probe light can pass through the dual-wavelength beam splitter and enter the output signal optical fiber collimation assembly, and the probe light can pass through the pyramidal reflector and enter the atomic vapor chamber. The dual-wavelength beam splitter includes a right-angled triangular prism and an oblique quadrangular prism. The right-angled triangular prism includes a right-angled face and a triangular prism oblique face. The oblique quadrangular prism includes an incident coupling light narrow face, an exit light narrow face, and an oblique quadrangular prism oblique face. The inclined surface of the oblique quadrangular prism is connected to the inclined surface of the right-angled triangular prism; the narrow surface of the emitted light is connected to the atomic vapor chamber; the narrow surface of the incident coupled light is connected to the collimating fiber of the input coupled light. The right-angled surface, the incident coupling light narrow surface, and the outgoing light narrow surface are provided with light-enhancing films; the triangular prism inclined surface and the quadrangular prism inclined surface are provided with probe light-enhancing films and coupling light-high reflectivity films.

2. The microwave electric field measurement probe device as described in claim 1, characterized in that, The atomic vapor chamber has a cylindrical structure and an anti-reflective film on its end face.

3. The microwave electric field measurement probe device as described in claim 1, characterized in that, The input coupling optical fiber and the probe optical fiber are single-mode polarization-maintaining fibers; the output signal optical fiber is a multimode fiber.

4. The microwave electric field measurement probe device as described in claim 1, characterized in that, The emitted light narrow surface is seamlessly bonded to the atomic vapor chamber using photoresist.

5. The microwave electric field measurement probe device as described in claim 1, characterized in that, The incident coupling light narrow facet and the input coupling light fiber collimation component are bonded together with high-strength UV adhesive.

6. The microwave electric field measurement probe device as described in claim 1, characterized in that, The inclined surface of the oblique quadrangular prism and the inclined surface of the right-angled triangular prism are bonded together with adhesive.

7. The microwave electric field measuring probe device as described in claim 1, characterized in that, The output signal optical fiber collimation assembly includes a fixed coaxial glass tube and a C-shaped lens and an optical fiber end face disposed within the fixed coaxial glass tube. The C-shaped lens and the optical fiber end face are spaced apart, and the corner face of the C-shaped lens is parallel to the corner face of the optical fiber end face.

8. The microwave electric field measurement probe device as described in claim 1, characterized in that, If the input probe fiber assembly and the dual-wavelength beam splitter are connected to the same end of the atomic vapor chamber, then the cornerstone reflector includes a laser incident surface, a first reflecting slope, and a second reflecting slope. The laser incident surface is provided with an anti-reflection film, and the first and second reflective inclined surfaces are provided with a high-reflection film for the probe light and a high-transmittance film for the coupling light, and are coated with black paint. The laser incident surface is connected to the atomic vapor chamber.

9. The microwave electric field measuring probe device as described in claim 1, characterized in that, The atomic vapor chamber, dual-wavelength beam splitter, output signal fiber collimation assembly, input coupling fiber collimation assembly, and input probe fiber assembly are all made of glass.

10. A method of using a microwave electric field measuring probe device, comprising using the device according to any one of claims 1 to 9, characterized in that, Includes the following steps: If the input probe fiber optic assembly and the output signal fiber optic collimation assembly are located at opposite ends of the atomic vapor chamber, then the following steps are included: The probe light enters the atomic vapor chamber after passing through the input probe light fiber collimation assembly; After passing through the atomic vapor chamber, the light is transmitted through a dual-wavelength beam splitter into the output signal optical fiber collimation component. The coupled light is collimated by the input coupling light fiber collimation component to form a parallel beam with a large beam diameter, and then reflected by the dual-wavelength beam splitter prism before entering the atomic vapor chamber, where it coincides with the probe light that is about to exit the atomic vapor chamber. If the input probe fiber collimator and the output signal fiber collimator are located at the same end of the atomic vapor chamber, then the following steps are included: The probe light enters the atomic vapor chamber after passing through the input probe light fiber collimation assembly; After the probe light passes through the atomic vapor chamber, it is reflected by a pyramidal reflector and re-enters the atomic vapor chamber. After passing through the atomic vapor chamber again, it is transmitted through a dual-wavelength beam splitter into the output signal optical fiber assembly. The coupled light is collimated by the input coupling light fiber collimation component to form a parallel beam with a large beam diameter. After being reflected by the dual-wavelength beam splitter, it enters the atomic vapor chamber and coincides with the probe light that is about to exit the atomic vapor chamber.

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