Quality detection apparatus, system, method and electronic device

By using a combination of electromagnetic weighing sensors and stress weighing sensors, along with calibration using a volume sensor, the problem of traditional sensors being susceptible to external factors is solved, achieving high-precision material quality detection.

CN116067467BActive Publication Date: 2026-06-12SMYZE INTELLIGENCE TECHNOLOGY (SHANGHAI) CO LTD
3 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
SMYZE INTELLIGENCE TECHNOLOGY (SHANGHAI) CO LTD
Filing Date
2023-03-13
Publication Date
2026-06-12

AI Technical Summary

⚠Technical Problem

Existing quality inspection sensors are susceptible to external factors such as mechanical vibration and ambient temperature, resulting in low detection accuracy, especially for liquid and gaseous materials.

⚗Method used

At least two independent sensor components are used, including an electromagnetic weighing sensor and a stress weighing sensor. The final mass of the object to be measured is determined by comparing the difference between the mass of the object initially measured by each sensor and the set threshold. The mass is then calibrated in conjunction with a volume sensor to achieve high-precision detection.

🎯Benefits of technology

It improves the accuracy of material quality testing, reduces the impact of vibration and temperature changes, adapts to various material environments, and enhances the reliability and accuracy of testing.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
Patent Text Reader

Abstract

The application discloses a quality detection device, system, method and electronic equipment. The device comprises a processor, at least one sensor component, and the sensor component comprises at least a first sensor and a second sensor. The sensor component is configured to be connected with the processor and output first sensing information and second sensing information related to the quality of a to-be-detected object. The processor is configured to acquire the first sensing information and the second sensing information, determine the quality of the to-be-detected object preliminarily measured by each sensor, and determine the final quality of the to-be-detected object according to the comparison between the preliminarily measured quality of the to-be-detected object and a first set threshold and the comparison between the absolute value of the difference between the preliminarily measured quality of the to-be-detected object by each sensor and a second set threshold. The application determines the final quality according to the difference between the measured results of the two sensors, can avoid the problem that the precision may be not high when one sensor is used for measurement, and can improve the overall detection precision of the device.
Need to check novelty before this filing date? Find Prior Art