Chip parameter adaptive lookup trimming method and apparatus

Abstract

The application discloses a chip parameter self-adaptive searching and trimming method and device, wherein the chip parameter self-adaptive searching and trimming method is to obtain an initial value and a maximum trimming value by testing, combine a target trimming value to calculate a self-adaptive value by a first formula, convert the self-adaptive value into a self-adaptive trimming code and input the chip to test the self-adaptive trimming value, determine whether the self-adaptive trimming value is in a preset range, if not, re-calculate the self-adaptive value by a second formula or a third formula, and if yes, take the corresponding self-adaptive trimming code as a selected trimming code. According to the proportion of the difference between the target trimming value and the initial value in the difference between the maximum trimming value and the initial value, the self-adaptive estimation trimming code can improve the limitation that the dichotomy can only search the trimming value by half each time, and then the selected trimming code of the chip can be quickly searched, the trimming time is effectively reduced, and the trimming efficiency of the chip parameter is improved.

Description

Technical Field

[0001] This invention relates to the field of chip parameter adjustment technology, and more particularly to a chip parameter adaptive search and adjustment method and apparatus. Background Technology

[0002] Semiconductor manufacturing technology and equipment are becoming increasingly advanced, but defects still occur during the manufacturing process. Therefore, most chips with reference parameters such as reference voltage and reference current are designed with adjustment circuits embedded in them so that process changes affecting device parameters can be corrected by changing these circuits during wafer probe testing and packaging testing.

[0003] Trimming techniques include fuse burn-out trimming, laser trimming, electronic fuse trimming, Zener diode short-circuit trimming, and non-volatile memory cell trimming. Among these, non-volatile memory cell trimming offers advantages such as repeatable trimming and high trimming accuracy. A non-volatile memory cell chip parameter trimming circuit is shown below. Figure 1 and Figure 2 The diagram shows how the resistance between points A and B is adjusted by controlling the first and second components through the storage unit, thereby modifying the parameters (voltage, current, etc.) between points A and B.

[0004] In current trimming circuits, the resistance values ​​of trimming resistors are generally set according to a certain pattern to make the chip parameter trimming steps regular. That is, after inputting all trimming codes into the chip in ascending order, the trimming value of the parameter between points A and B obtained by testing gradually decreases or increases. Therefore, a binary search method can be used to find the optimal trimming code of the chip. Although the implementation of the binary search method is relatively simple and the search speed is faster than the full search method, the binary search method can only search half at a time. If the code value of the optimal trimming code is close to the trimming code value boundary (maximum trimming code or minimum trimming code), then using the binary search method to find the optimal trimming code of the chip will also take a long time, resulting in low chip parameter trimming efficiency. Summary of the Invention

[0005] The purpose of this invention is to provide a chip parameter adaptive lookup and adjustment method and apparatus that can reduce adjustment time and effectively improve chip parameter adjustment efficiency.

[0006] To achieve the above objectives, this invention discloses a chip parameter adaptive lookup and adjustment method, which includes the following steps:

[0007] S100. Test the chip without modification code input to obtain the initial values ​​of the chip parameters;

[0008] S110. Input the maximum trimming code into the chip to test and obtain the maximum trimming value of the chip;

[0009] S120. Calculate the adaptive value m using the first formula, where the first formula is: Where V0 is the initial value, V1 is the target trimming value of the chip, V2 is the maximum trimming value, and M is the calculated value obtained by converting the maximum trimming code;

[0010] S130. Convert the adaptive value into an adaptive trimming code, and input the adaptive trimming code into the chip to test and obtain the adaptive trimming value of the chip;

[0011] S140. Determine whether the adaptive trimming value is within a preset range. If it is not within the preset range, execute step S150; if it is within the preset range, execute step S190;

[0012] S150. Calculate the difference U1 between the adaptive trimming value and the initial value and the difference U2 between the adaptive trimming value and the maximum trimming value;

[0013] S160. Compare the magnitudes of U1 and U2. If U1 ≤ U2, execute step S170; if U1 > U2, execute step S180; or, if U1 < U2, execute step S170; if U1 ≥ U2, execute step S180;

[0014] S170. Recalculate the adaptive value m using a second formula, where the second formula is where V0 is the initial value, V1 is the target trimming value of the chip, V3 is the adaptive trimming value, n is the adaptive value in step 130, and return to steps S130 and S140;

[0015] S180. Recalculate the adaptive value m using a third formula, where the third formula is where V1 is the target trimming value, V2 is the maximum trimming value, V3 is the adaptive trimming value, M is the calculated value, n is the adaptive value in step 130, and return to steps S130 and S140;

[0016] S190. Take the adaptive trimming code corresponding to the adaptive trimming value as the selected trimming code of the chip.

[0017] Further, the adaptive value and the calculated value are decimal numbers, the maximum trimming code and the adaptive trimming code are binary numbers, the adaptive trimming code is obtained by converting the adaptive value minus one into a binary number, and the calculated value is obtained by adding one to the decimal number converted from the maximum trimming code.

[0018] Further, step S140 includes:

[0019] S1401. Calculate the effective value LSB using the fourth formula, where the fourth formula is where V0 is the initial value, V3 is the adaptive trimming value, and m is the adaptive numerical value;

[0020] S1402. Compare the difference U3 between the adaptive trimming value and the target trimming value with the effective value LSB. If U3 > LSB, execute step S150; if U3 ≤ LSB, execute step S190; or, if U3 ≥ LSB, execute step S150; if U3 < LSB, execute step S190.

[0021] Further, before step S110, it further includes:

[0022] S101. Compare the initial value with the target trimming range;

[0023] If the initial value is not within the target trimming range, execute step S110.

[0024] Further, before step S120, it further includes:

[0025] S111. Compare the maximum trimming value with the adjustable range;

[0026] If the maximum trimming value is within the adjustable range, execute step S120.

[0027] Further, step S190 includes:

[0028] S1901. Input the previous trimming code and the next trimming code of the adaptive trimming code into the chip to test and obtain the upper trimming value and the lower trimming value;

[0029] S1902. Compare the upper trimming value, the lower trimming value, and the adaptive trimming value with the target trimming value respectively;

[0030] S1903. Use the trimming code corresponding to the trimming value closest to the target trimming value as the selected trimming code of the chip.

[0031] Further, after step S190, it further includes:

[0032] S200. Burn the selected trimming code and test to obtain a trimming value;

[0033] S210. Determine whether the trimming value is within the target trimming range;

[0034] If it is within the target trimming range, the chip trimming is successful; if it is not within the target trimming range, the chip trimming fails.

[0035] To achieve the above objectives, the present invention also discloses a chip parameter adaptive lookup and adjustment device, comprising:

[0036] The first test module is used to test the chip without modification code input to obtain the initial values ​​of the chip parameters;

[0037] The second test module is used to input the maximum trimming code into the chip to test and obtain the maximum trimming value of the chip.

[0038] The first calculation module is used to calculate the adaptive value m using the first formula;

[0039] The conversion and testing module is used to convert the adaptive value into an adaptive trimming code, and input the adaptive trimming code into the chip to test and obtain the adaptive trimming value of the chip.

[0040] The determination module is used to determine whether the difference between the adaptive adjustment value and the target adjustment value is within a preset range;

[0041] The calculation and comparison module is used to calculate the difference U1 between the adaptive adjustment value and the initial value and the difference U2 between the adaptive adjustment value and the maximum adjustment value, and to compare the magnitudes of U1 and U2.

[0042] The second calculation module is used to recalculate the adaptive value m using the second formula;

[0043] The third calculation module is used to recalculate the adaptive value m using the third formula;

[0044] The trimming module is used to use the adaptive trimming code corresponding to the adaptive trimming value as the selected trimming code of the chip.

[0045] To achieve the above objectives, the present invention also discloses an electronic device comprising:

[0046] One or more processors;

[0047] One or more memories are used to store one or more programs, which, when executed by the processor, enable the processor to implement the chip parameter adaptive lookup and tuning method as described above.

[0048] To achieve the above objectives, the present invention also discloses a computer-readable storage medium having a program stored thereon, which, when executed by a processor, implements the chip parameter adaptive lookup and adjustment method as described above.

[0049] This application also provides a computer program product or computer program including computer instructions stored in a computer-readable storage medium. A processor of an electronic device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the electronic device to perform the chip parameter adaptive lookup and adjustment method as described above.

[0050] In the chip parameter adaptive lookup and adjustment method of the present invention, the initial value and maximum adjustment value of the chip parameters are obtained by testing, and an adaptive value is calculated by combining the target adjustment value of the chip with a first formula. The adaptive value is converted into an adaptive adjustment code and input into the chip to test and obtain an adaptive adjustment value. It is then determined whether the adaptive adjustment value is within a preset range. If it is not within the preset range, the adaptive value is recalculated using a second or third formula. If it is within the preset range, the adaptive adjustment code corresponding to the adaptive adjustment value is used as the selected adjustment code of the chip. The present invention adaptively estimates the adjustment code based on the proportion of the difference between the target adjustment value and the initial value to the difference between the maximum adjustment value and the initial value. This improves the limitation of the binary search method, which can only search for half of the adjustment value each time, thereby achieving rapid search for the selected adjustment code of the chip, effectively reducing adjustment time and improving the chip parameter adjustment efficiency. Attached Figure Description

[0051] Figure 1 This is a schematic diagram of a circuit for adjusting the parameters of a non-volatile memory cell chip.

[0052] Figure 2 Another schematic diagram of a non-volatile memory cell chip parameter adjustment circuit.

[0053] Figure 3 This is a flowchart of a chip adaptive parameter adjustment method according to an embodiment of the present invention.

[0054] Figure 4 for Figure 3 The detailed flowchart of step 140.

[0055] Figure 5 for Figure 3 The detailed flowchart of steps 100 to 120 is as follows.

[0056] Figure 6 for Figure 3 The detailed flowchart of step 190.

[0057] Figure 7 This is a partial flowchart of the chip adaptive parameter adjustment method of the present invention.

[0058] Figure 8 This is a schematic block diagram of a chip adaptive parameter lookup and adjustment device according to an embodiment of the present invention.

[0059] Figure 9 This is a schematic block diagram of an electronic device according to an embodiment of the present invention. Specific embodiments

[0060] To describe in detail the technical content, structural features, achieved objectives and effects of the present invention, the following will be described in detail in conjunction with the embodiments and accompanied by the drawings.

[0061] Please refer to Figures 1 to 7 , the present invention discloses a method for adaptively searching and trimming chip parameters, which includes the following steps:

[0062] S100. Test the chip with no trimming code input to obtain the initial value of the chip parameters of the chip;

[0063] S110. Input the maximum trimming code into the chip to test and obtain the maximum trimming value of the chip;

[0064] S120. Calculate the adaptive value m using the first formula, and the first formula is where V0 is the initial value, V1 is the target trimming value of the chip, V2 is the maximum trimming value, and M is the calculated value converted from the maximum trimming code;

[0065] S130. Convert the adaptive value into an adaptive trimming code, and input the adaptive trimming code into the chip to test and obtain the adaptive trimming value of the chip;

[0066] S140. Determine whether the adaptive trimming value is within the preset range. If it is not within the preset range, execute step S150; if it is within the preset range, execute step S190;

[0067] S150. Calculate the difference U1 between the adaptive trimming value and the initial value and the difference U2 between the adaptive trimming value and the maximum trimming value;

[0068] S160. Compare the magnitudes of U1 and U2. If U1 ≤ U2, execute step S170; if U1 > U2, execute step S180; but not limited to this. For example, it can also be that if U1 < U2, execute step S170; if U1 ≥ U2, execute step S180;

[0069] S170. Recalculate the adaptive value m using the second formula, and the second formula is where V0 is the initial value, V1 is the target trimming value of the chip, V3 is the adaptive trimming value, n is the adaptive value in step 130, and return to steps S130 and S140;

[0070] S180. Recalculate the adaptive value using the third formula, and the third formula is Where V1 is the target adjustment value, V2 is the maximum adjustment value, V3 is the adaptive adjustment value, M is the calculated value, n is the adaptive value in step 130, and returns to steps S130 and S140.

[0071] S190. Use the adaptive adjustment code corresponding to the adaptive adjustment value as the selected adjustment code for the chip.

[0072] In the chip parameter adaptive lookup and adjustment method of the present invention, the initial value and maximum adjustment value of the chip parameters are obtained by testing, and an adaptive value is calculated by combining the target adjustment value of the chip with a first formula. The adaptive value is converted into an adaptive adjustment code and input into the chip to test and obtain an adaptive adjustment value. It is then determined whether the adaptive adjustment value is within a preset range. If it is not within the preset range, the adaptive value is recalculated using a second or third formula. If it is within the preset range, the adaptive adjustment code corresponding to the adaptive adjustment value is used as the selected adjustment code of the chip. The present invention adaptively estimates the adjustment code based on the proportion of the difference between the target adjustment value and the initial value to the difference between the maximum adjustment value and the initial value. This improves the limitation of the binary search method, which can only search for half of the adjustment value each time, thereby achieving rapid search for the selected adjustment code of the chip, effectively reducing adjustment time and improving the chip parameter adjustment efficiency.

[0073] Specifically, such as Figure 1 and Figure 2 As shown, the chip includes a trimming circuit and a non-volatile memory cell 10. The trimming circuit includes a fixed resistor Rc connected in series between points A and B, several trimming resistors Rn, several first components 1, and several second components 2 connected in parallel with the series trimming resistors Rn and the first components 1. One trimming resistor Rn, one first component 1 connected in series with that trimming resistor Rn, and one second component 2 connected in parallel with that trimming resistor Rn form a trimming component 3. The non-volatile memory cell 10 is connected to each trimming component 3. The non-volatile memory cell 10 controls the first components 1 and second components 2 in the trimming component 3 to be turned on or off according to the trimming code, so that the corresponding trimming resistor Rn is connected to the trimming circuit or short-circuited. Trimming the chip refers to changing the parameters (voltage, current, etc.) between points A and B by controlling the connection or short-circuiting of specific trimming resistors in the trimming circuit, thereby correcting the chip's reference parameters (reference voltage, reference current, etc.) and ensuring the accuracy of the reference parameters.

[0074] Specifically, in this embodiment, the voltage between points A and B is tested as the chip parameter value, but it is not limited to this. For example, the current between points A and B can also be tested as the chip parameter value. When the chip is adjusted, the voltage between points A and B will also change after the number of adjustment resistors in the adjustment circuit changes. The voltage value obtained by the test is then the chip parameter adjustment value. During adjustment, the target adjustment value of the chip needs to be manually set according to the chip's reference parameters so that when the voltage value between points A and B (the chip parameter adjustment value) is adjusted to be close to the target adjustment value, the chip's reference parameters are restored to accuracy.

[0075] When adjusting the chip, the adjustment code is input into the non-volatile memory cell 10. The adjustment code includes several bits of data. If the chip's adjustment circuit has n adjustment resistors, then the adjustment code includes n bits of data. For example, when the adjustment circuit has 4 adjustment resistors, the corresponding adjustment codes, from smallest to largest, include 0000, 0001, 0010, 0011, 0100, 0101, 0110, 0111, 1000, 1001, 1010, 1011, 1100, 1101, 1110, and 1111, for a total of 16. Each bit of the adjustment code (0 or 1) is an adjustment signal. An adjustment signal is used to control the first component 1 and the second component 2 in an adjustment component 3 to be turned on or off.

[0076] exist Figure 1 In the illustrated embodiment, the first component 1 in the trimming assembly 3 is an N-channel MOSFET Nn, and the second component 2 is a P-channel MOSFET Pn, but is not limited thereto. The non-volatile memory cell 10 inputs the trimming signal of the trimming assembly 3 and simultaneously inputs the control terminals of the first component 1 and the second component 2. When the trimming signal is 0, the second component 2 is turned on, the first component 1 is turned off, and the corresponding trimming resistor Rn is short-circuited; while when the trimming signal is 1, the first component 1 is turned on, the second component 2 is turned off, and the corresponding trimming resistor Rn is connected to the trimming circuit.

[0077] Therefore, in this embodiment, when several trimming codes are sequentially input into the non-volatile memory cell 10 from smallest to largest and the trimming value of the chip parameters between points A and B is tested, the obtained trimming value gradually decreases. For example, if the trimming circuit is equipped with 4 trimming resistors, the trimming value (initial value) obtained by inputting trimming code 0000 is the largest, and the trimming value obtained by inputting trimming code 1111 is the smallest.

[0078] exist Figure 2In the illustrated embodiment, the first component 1 in the trimming assembly 3 is a first N-channel MOSFET N1n, and the second component 2 is a second N-channel MOSFET N2n, but is not limited thereto. The trimming signal from the non-volatile memory cell 10 to the trimming assembly 3 is input to the control terminal of the first component 1, and simultaneously passed through a NOT gate Un before being input to the control terminal of the second component 2. When the trimming signal is 0, the first component 1 is turned on, the second component 2 is turned off, and the corresponding trimming resistor Rn is connected to the trimming circuit. When the trimming signal is 1, the second component 2 is turned on, the first component 1 is turned off, and the corresponding trimming resistor Rn is short-circuited.

[0079] Therefore, in this embodiment, when several trimming codes are sequentially input into the non-volatile memory cell 10 from smallest to largest and the trimming value of the chip parameters between points A and B is tested, the obtained trimming value gradually increases. For example, if the trimming circuit is equipped with 4 trimming resistors, the trimming value (initial value) obtained by inputting trimming code 0000 is the smallest, and the trimming value obtained by inputting trimming code 1111 is the largest.

[0080] It should be noted that the maximum correction value is named so because it is the correction value obtained by testing the input maximum correction code (all bits are 1). It is not subject to naming restrictions, and the maximum correction value is not necessarily the largest numerical value. For example, in... Figure 1 In the illustrated embodiment, the maximum trimming value is the smallest compared to the trimming values ​​obtained from testing with other input trimming codes; while... Figure 2 In the embodiment shown, the maximum trim value is the largest when compared to the trim values ​​obtained from testing other input trim codes.

[0081] It should be noted that the initial value of the chip parameters obtained by testing the chip without trimming input is equivalent to the trimmed value of the chip parameters obtained by testing the chip with trimming input where all bit data is 0. This is because the preset bit data in the non-volatile memory cell 10 of the chip without trimming input is 0, but it is not limited to this. For example, in some embodiments, the preset bit data can be 1.

[0082] Furthermore, in this embodiment, the adaptive value and the calculated value are decimal numbers, and the maximum adjustment code and the adaptive adjustment code are binary numbers. The adaptive value is reduced by one and converted into a binary number to obtain the adaptive adjustment code, and the maximum adjustment code is converted into a decimal number and then increased by one to obtain the calculated value, but it is not limited to this.

[0083] For example, if the adjustment circuit has 4 adjustment resistors, the adaptive adjustment code is 0111 when the adaptive value is 8; and the calculated value is 16 when the maximum adjustment code is 1111, but it is not limited to these.

[0084] Specifically, in this example, the adaptive values calculated by the above first formula, second formula, and third formula may not be integers. Then, the values are rounded to the nearest integer, and then subtracted by one and converted into binary numbers to obtain the corresponding adaptive trimming code.

[0085] Refer to Figure 3 and Figure 4 , further, step S140 of the chip parameter adaptive search and trimming method includes:

[0086] S1401. Calculate the effective value LSB with the fourth formula, and the fourth formula is where V0 is the initial value, V3 is the adaptive trimming value, and m is the adaptive value;

[0087] S1402. Compare the difference U3 between the adaptive trimming value and the target trimming value and the magnitude of the effective value LSB. If U3 > LSB, execute step S150. If U3 ≤ LSB, execute step S190; but not limited to this. For example, it can also be that if U3 ≥ LSB, execute step S150. If U3 < LSB, execute step S190.

[0088] Judging the gap between the adaptive trimming value and the target trimming value by dynamically calculating the effective value LSB is beneficial to improving the accuracy of chip parameter trimming.

[0089] It should be noted that in this embodiment, after each calculation of an adaptive trimming value, an effective value LSB is calculated to judge whether the adaptive trimming value is close to the target trimming value of the chip, but not limited to this. For example, in some embodiments, a target trimming range can also be set according to the target trimming value. If the adaptive trimming value is within the target trimming range, it is considered that the gap between it and the target trimming value is acceptable.

[0090] Refer to Figure 3 and Figure 5 , further, before step S110 of the chip parameter adaptive search and trimming method, it also includes:

[0091] S101. Compare the initial value with the target trimming range;

[0092] If the initial value is not within the target trimming range, execute step S110.

[0093] By judging the initial value of the chip parameters of the chip, the chips that need to be trimmed can be screened out, and then the chips that do not need to be trimmed can be excluded, which is beneficial to improving the trimming efficiency of the chips.

[0094] Understandably, when the initial values ​​of the chip's parameters are within the target adjustment range, the initial values ​​are already close to the target adjustment value, and the difference between them is acceptable, requiring no adjustment. Next, the adjustment code with all bits set to 0 needs to be programmed into the chip, and then the chip's parameters are tested and compared to ensure they remain close to the target adjustment value.

[0095] See Figure 3 and Figure 5 Furthermore, before step S120 of the chip parameter adaptive lookup and adjustment method, the following is also included:

[0096] S111. Compare the maximum adjustment value with the adjustable range;

[0097] If the maximum adjustment value is within the adjustable range, then proceed to step S120.

[0098] By determining the maximum adjustment value of a chip, chips that can be adjusted can be selected, while those that cannot be adjusted can be eliminated, which helps to improve the chip adjustment efficiency.

[0099] Understandably, if the maximum adjustment value is within the adjustable range, it means that the chip parameters can be adjusted to approach the target chip adjustment value. This adjustable range is generally estimated by the wafer manufacturer during wafer production. Therefore, if the chip's maximum adjustment value is not within the adjustable range, the chip cannot be adjusted to approach the target adjustment value, and the chip is directly judged as an adjustment failure.

[0100] See Figure 3 and Figure 6 Furthermore, step S190 of the chip parameter adaptive lookup and adjustment method includes:

[0101] S1901. Input the previous and next bits of the adaptive modifier code into the chip to test and obtain the upper and lower bit modifier values.

[0102] S1902. Compare the upper-level correction value, lower-level correction value, and adaptive correction value with the target correction value respectively.

[0103] S1903. Select the trim code corresponding to the trim value that is closest to the target trim value as the selected trim code for the chip.

[0104] Determining the selected trimming code for a chip by comparing the adaptive trimming code with the trimming values ​​corresponding to its preceding and following trimming codes helps improve the accuracy of chip parameter trimming.

[0105] Specifically, in this embodiment, the previous bit of the adaptive adjustment code is obtained by subtracting one from the adaptive adjustment code, and the next bit of the adaptive adjustment code is obtained by adding one to the adaptive adjustment code. For example, if there are four adjustment resistors, and the adaptive adjustment code is 0010, the previous bit of the adaptive adjustment code is 0001, and the next bit of the adaptive adjustment code is 0011.

[0106] It is understandable that the selected tuning code obtained for the chip is the optimal tuning code for the chip. After inputting the selected tuning code into the chip, the tuned value of the chip parameters obtained by testing is closest to the target tuned value of the chip, and the difference between this tuned value and the target tuned value of the chip is acceptable.

[0107] See Figure 3 and Figure 7 Furthermore, after step S190 of the chip parameter adaptive lookup and adjustment method, it also includes:

[0108] S200. The selected tuning code is burned and tested to obtain a tuning value;

[0109] S210. Determine whether the correction value is within the target correction range;

[0110] If the chip is within the target tuning range, the tuning is successful; otherwise, the tuning fails.

[0111] The selected tuning code is input into the chip, and the tuned value obtained from the test is judged to ensure that the tuned value is within the target tuning range, that is, the difference between it and the target tuned value is acceptable, which helps to improve the accuracy of chip parameter tuning.

[0112] Please see Figure 8 The present invention also discloses a chip parameter adaptive lookup and adjustment device, which includes:

[0113] The first test module 301 is used to test the chip without modification code input to obtain the initial values ​​of the chip parameters.

[0114] The second test module 302 is used to input the maximum trimming code into the chip to test and obtain the chip's maximum trimming value.

[0115] The first calculation module 303 is used to calculate the adaptive value m using the first formula;

[0116] The conversion and testing module 304 is used to convert adaptive values ​​into adaptive trimming codes and input the adaptive trimming codes into the chip to test the adaptive trimming values ​​obtained from the chip.

[0117] The determination module 305 is used to determine whether the difference between the adaptive adjustment value and the target adjustment value is within a preset range.

[0118] The calculation and comparison module 306 is used to calculate the difference U1 between the adaptive adjustment value and the initial value and the difference U2 between the adaptive adjustment value and the maximum adjustment value, and to compare the magnitudes of U1 and U2.

[0119] The second calculation module 307 is used to recalculate the adaptive value m using the second formula;

[0120] The third calculation module 308 is used to recalculate the adaptive value m using the third formula;

[0121] The trimming module 309 is used to use the adaptive trimming code corresponding to the adaptive trimming value as the selected trimming code of the chip.

[0122] Please see Figure 9 The present invention also discloses an electronic device comprising:

[0123] One or more processors 401;

[0124] One or more memories 402 are used to store one or more programs, which, when executed by a processor, enable the processor to implement the chip parameter adaptive lookup and adjustment method as described in the foregoing embodiments.

[0125] This invention also discloses a computer-readable storage medium storing a program thereon, which, when executed by a processor, implements the chip parameter adaptive lookup and adjustment method as described in the foregoing embodiments.

[0126] This application discloses a computer program product or computer program, which includes computer instructions stored in a computer-readable storage medium. The processor of an electronic device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the electronic device to perform the aforementioned chip parameter adaptive lookup and adjustment method.

[0127] It should be understood that, in the embodiments of this application, the processor may be a central processing unit (CPU), but it may also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0128] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by hardware related to computer program instructions. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0129] The above-disclosed embodiments are merely preferred embodiments of the present invention and should not be construed as limiting the scope of the present invention. Therefore, any equivalent variations made in accordance with the claims of the present invention are still within the scope of the present invention.

Claims

1. A method for adaptively searching and adjusting chip parameters, characterized in that, Includes the following steps: S100. Test the chip without modification code input to obtain the initial values ​​of the chip parameters; S110. Input the maximum trimming code into the chip to test and obtain the maximum trimming value of the chip; S120. Calculate the adaptive value m using the first formula, where the first formula is: Where V0 is the initial value, V1 is the target adjustment value of the chip, V2 is the maximum adjustment value, and M is the calculated value obtained by the maximum adjustment code conversion; S130. Convert the adaptive value into an adaptive trimming code, and input the adaptive trimming code into the chip to test and obtain the adaptive trimming value of the chip. S140. Determine whether the adaptive adjustment value is within a preset range. If it is not within the preset range, proceed to step S150; if it is within the preset range, proceed to step S190. S150, Calculate the difference U1 between the adaptive adjustment value and the initial value, and the difference U2 between the adaptive adjustment value and the maximum adjustment value; S160. Compare the sizes of U1 and U2. If U1... If U2, then proceed to step S170; if U1 > U2, then proceed to step S180; or, if U1 > U2, then proceed to step S180. If U2, then proceed to step S170; if U1 If U2 is selected, then step S180 is executed. S170. Recalculate the adaptive value m using the second formula, which is: Where V0 is the initial value, V1 is the target adjustment value of the chip, V3 is the adaptive adjustment value, n is the adaptive value in step 130, and the process returns to steps S130 and S140. S180. Recalculate the adaptive value m using the third formula, wherein the third formula is: Where V1 is the target adjustment value, V2 is the maximum adjustment value, V3 is the adaptive adjustment value, M is the calculated value, n is the adaptive value in step 130, and return to steps S130 and S140. S190. The adaptive adjustment code corresponding to the adaptive adjustment value is used as the selected adjustment code of the chip.

2. The chip parameter adaptive lookup and adjustment method according to claim 1, characterized in that, The adaptive value and the calculated value are decimal numbers, the maximum adjustment code and the adaptive adjustment code are binary numbers. The adaptive value is reduced by one and converted to a binary number to obtain the adaptive adjustment code. The maximum adjustment code is converted to a decimal number and then increased by one to obtain the calculated value.

3. The chip parameter adaptive lookup and adjustment method according to claim 1, characterized in that, Step S140 includes: S1401. Calculate the effective value LSB using the fourth formula, wherein the fourth formula is: Wherein, V0 is the initial value, V3 is the adaptive adjustment value, and m is the adaptive value; S1402, compare the difference U3 between the adaptive adjustment value and the target adjustment value with the effective value LSB. If Then proceed to step S150, if If so, then proceed to step S190; or, if Then proceed to step S150, if Then proceed to step S190.

4. The chip parameter adaptive lookup and adjustment method according to claim 1, characterized in that, The steps preceding step S110 also include: S101. Compare the initial value with the target adjustment range; If the initial value is not within the target adjustment range, then step S110 is executed.

5. The chip parameter adaptive lookup and adjustment method according to claim 1, characterized in that, The steps preceding step S120 also include: S111. Compare the maximum adjustment value with the adjustable range; If the maximum adjustment value is within the adjustable range, then step S120 is executed.

6. The chip parameter adaptive lookup and adjustment method according to claim 1, characterized in that, Step S190 includes: S1901. Input the previous and next bits of the adaptive modifier code into the chip to test and obtain the upper and lower bit modifier values. S1902, compare the upper-level adjustment value, the lower-level adjustment value and the adaptive adjustment value with the target adjustment value respectively; S1903. The adjustment code corresponding to the adjustment value that is closest to the target adjustment value is taken as the selected adjustment code of the chip.

7. The chip parameter adaptive lookup and adjustment method according to claim 1, characterized in that, Step S190 also includes: S200. The selected tuning code is burned and tested to obtain a tuning value; S210. Determine whether the adjustment value is within the target adjustment range; If the chip is within the target adjustment range, the chip adjustment is successful; otherwise, the chip adjustment fails.

8. A chip parameter adaptive lookup and adjustment device, characterized in that, include: The first test module is used to test the chip without modification code input to obtain the initial values ​​of the chip parameters; The second test module is used to input the maximum trimming code into the chip to test and obtain the maximum trimming value of the chip. A first calculation module is used to calculate the adaptive value m using a first formula, wherein the first formula is: Where V0 is the initial value, V1 is the target adjustment value of the chip, V2 is the maximum adjustment value, and M is the calculated value obtained by the maximum adjustment code conversion; The conversion and testing module is used to convert the adaptive value into an adaptive trimming code, and input the adaptive trimming code into the chip to test and obtain the adaptive trimming value of the chip. The determination module is used to determine whether the adaptive adjustment value is within a preset range. If it is not within the preset range, the calculation and comparison module is executed. If it falls within the preset range, the adjustment module is executed; The calculation and comparison module is used to calculate the difference U1 between the adaptive adjustment value and the initial value, and the difference U2 between the adaptive adjustment value and the maximum adjustment value, and compare the magnitudes of U1 and U2. If U1 If U2 is true, then the second calculation module is executed; if U1 > U2, then the third calculation module is executed; or, if U1 > U2, then the third calculation module is executed. If U2, then the second calculation module is executed; if U1 U2 will then execute the third calculation module; The second calculation module is used to recalculate the adaptive value m using a second formula, which is: Wherein, V0 is the initial value, V1 is the target adjustment value of the chip, V3 is the adaptive adjustment value, and n is the adaptive value in the conversion and testing module, and the result is returned to the conversion and testing module and the determination module. The third calculation module is used to recalculate the adaptive value m using a third formula, which is: Wherein, V1 is the target adjustment value, V2 is the maximum adjustment value, V3 is the adaptive adjustment value, M is the calculated value, and n is the adaptive value in the conversion and testing module, and the result is returned to the conversion and testing module and the determination module. The trimming module is used to use the adaptive trimming code corresponding to the adaptive trimming value as the selected trimming code of the chip.

9. An electronic device, characterized in that, include: One or more processors; One or more memories are used to store one or more programs, which, when executed by the processor, cause the processor to implement the chip parameter adaptive lookup and tuning method as described in any one of claims 1 to 7.

10. A computer-readable storage medium having a program stored thereon, characterized in that, When the program is executed by the processor, it implements the chip parameter adaptive lookup and adjustment method as described in any one of claims 1 to 7.

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