A defect detection system, method, and storage medium
By using a detection system based on eddy current differential voltage and magnetic field differential voltage, combined with four sets of coils and magnets, the problem of signal distortion in high-speed moving specimens during eddy current detection in existing technologies has been solved, enabling efficient identification of pipeline defects.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- PIPECHINA SOUTH CHINA CO
- Filing Date
- 2023-12-29
- Publication Date
- 2026-07-03
Smart Images
Figure CN117571816B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of pipeline inspection technology, specifically to a defect detection system, method, and storage medium. Background Technology
[0002] Non-destructive testing (NDT) refers to the inspection and testing of the internal structure and surface of mechanical materials without damaging or affecting their performance or internal structure. It utilizes physical or chemical methods, aided by modern technology and equipment, to examine changes in thermal, acoustic, optical, electrical, and magnetic responses caused by abnormalities or defects in the material's internal structure. The main electromagnetic testing methods include eddy current testing, magnetic flux leakage testing, microwave testing, and magnetic memory testing of metals.
[0003] Eddy current testing is a non-destructive testing method based on the principle of electromagnetic induction, applicable to conductive materials. When a conductor is placed in an alternating magnetic field, an induced current, or eddy current, is generated within it. Changes in various factors of the conductor itself (such as conductivity, permeability, shape, size, and defects) lead to changes in the eddy currents. The testing method that utilizes this phenomenon to determine the properties and state of a conductor is called eddy current testing. Eddy current testing technology is widely used in the production and maintenance processes of industries such as natural gas and oil pipelines, rails, and ships due to its advantages of ease of operation, low cost, and fast signal acquisition.
[0004] In the field of industrial non-destructive testing, existing static non-destructive testing methods are limited for specimens with a certain speed of movement. Several existing non-destructive testing methods cannot be applied due to the limitations of their own testing principles. For example, in magnetic flux leakage testing, the magnetization field weakens during high-speed operation, affecting the quantitative detection of defects; eddy current testing is greatly affected by lift-off, resulting in severe signal distortion. Summary of the Invention
[0005] The technical problem to be solved by the present invention is to provide a defect detection system, method and storage medium to address the shortcomings of the prior art.
[0006] The technical solution of this invention to solve the above-mentioned technical problems is as follows: A defect detection system, comprising: a sensor and a processor,
[0007] The sensor is used to acquire the eddy current differential voltage and magnetic field differential voltage of the pipeline under test;
[0008] The processor is used to preprocess the eddy current differential voltage and the magnetic field differential voltage to obtain differential data;
[0009] The differential data is analyzed to obtain defect detection results.
[0010] Another technical solution of the present invention to solve the above-mentioned technical problems is as follows: A defect detection method, comprising the following steps:
[0011] Obtain the eddy current differential voltage and magnetic field differential voltage of the pipeline under test;
[0012] The eddy current differential voltage and the magnetic field differential voltage are preprocessed to obtain differential data;
[0013] The differential data is analyzed to obtain defect detection results.
[0014] The beneficial effects of this invention are as follows: by acquiring the eddy current differential voltage and magnetic field differential voltage of the pipeline to be tested, preprocessing the eddy current differential voltage and magnetic field differential voltage to obtain differential data, and analyzing the differential data to obtain defect detection results, the magnetization level of the pipeline can be improved, thereby improving the defect detection capability. At the same time, the influence of sensor lift-off vibration on the signal is eliminated, improving the accuracy of defect identification. Attached Figure Description
[0015] Figure 1 This is a block diagram of a defect detection system provided in an embodiment of the present invention;
[0016] Figure 2 This is a structural diagram of a sensor in a defect detection system provided in an embodiment of the present invention;
[0017] Figure 3 This is a structural diagram of the sensor and the pipeline to be inspected in a defect detection system provided in an embodiment of the present invention;
[0018] Figure 4 This is a structural diagram of the first coil of a defect detection system provided in an embodiment of the present invention;
[0019] Figure 5 This is a structural diagram of the magnet assembly of a defect detection system provided in an embodiment of the present invention;
[0020] Figure 6 This is a schematic diagram of the magnetization direction of a defect detection system provided in an embodiment of the present invention;
[0021] Figure 7 This is a flowchart illustrating a defect detection method provided in an embodiment of the present invention.
[0022] In the attached diagram, the component names represented by each label are as follows:
[0023] 1. First coil, 2. Second coil, 3. Third coil, 4. Fourth coil, 5. Magnetic core, 6. First magnet, 7. Second magnet, 8. Third magnet, 9. Fourth magnet, 10. Fifth magnet. Detailed Implementation
[0024] The principles and features of the present invention are described below with reference to the accompanying drawings. The examples given are only for explaining the present invention and are not intended to limit the scope of the present invention.
[0025] Figure 1 This is a block diagram of a defect detection system provided in an embodiment of the present invention.
[0026] like Figure 1 As shown, a defect detection system includes: a sensor and a processor.
[0027] The sensor is used to acquire the eddy current differential voltage and magnetic field differential voltage of the pipeline under test;
[0028] The processor is used to preprocess the eddy current differential voltage and the magnetic field differential voltage to obtain differential data;
[0029] The differential data is analyzed to obtain defect detection results.
[0030] It should be understood that the sensor is positioned above the pipe to be detected.
[0031] In the above embodiments, by acquiring the eddy current differential voltage and magnetic field differential voltage of the pipeline to be tested, preprocessing the eddy current differential voltage and magnetic field differential voltage to obtain differential data, and analyzing the differential data to obtain defect detection results, the magnetization level of the pipeline can be improved, thereby improving the defect detection capability. At the same time, the influence of sensor lift-off vibration on the signal is eliminated, improving the accuracy of defect identification.
[0032] Optionally, as an embodiment of the present invention, such as Figures 1 to 4 As shown, the sensor includes a first coil 1, a second coil 2, a third coil 3, a fourth coil 4, and a magnet assembly.
[0033] The first coil 1, the second coil 2, the third coil 3, and the fourth coil 4 are connected in sequence. The magnet group is located at the top of the second coil 2 and the third coil 3. The first coil 1, the second coil 2, the third coil 3, and the fourth coil 4 are all embedded with a magnetic core 5. The first coil 1 and the fourth coil 4 have the same number of turns, and the second coil 2 and the third coil 3 have the same number of turns. The first coil 1 and the fourth coil 4 are connected in reverse series to form a differential output, which is used to measure the magnetic field signal below the magnet group to obtain the eddy current differential voltage. The second coil 2 and the third coil 3 are connected in reverse series to form a differential output, which is used to measure the eddy current signal at both ends of the magnet group to obtain the magnetic field differential voltage.
[0034] It should be understood that an eddy current sensor (i.e., a sensor) includes a magnet (i.e., a magnet assembly), coil 1 (i.e., the first coil 1), coil 2 (i.e., the second coil 2), coil 3 (i.e., the third coil 3), and coil 4 (i.e., the fourth coil 4). Each coil contains a magnetic circuit (i.e., a magnetic core 5). The magnetic circuit (i.e., the magnetic core 5) is made of a high-permeability material. The coil height is Hc mm, and generally Hc does not exceed 3 mm. The magnet is placed next to the coil.
[0035] Specifically, such as Figure 2 and 3 As shown, the coils are placed below the magnet in a symmetrical arrangement. The number of turns of the coils are N1, N2, N3, and N4, where N1 = N4 and N2 = N3. Coil 1 (i.e., the first coil 1) and coil 4 (i.e., the fourth coil 4) form a differential output, as do coil 2 (i.e., the second coil 2) and coil 3 (i.e., the third coil 3). Coils 2 and 3 (i.e., the second coil 2 and the third coil 3) are used to measure the magnetic field signal directly below the magnet. Coils 1 and 4 (i.e., the first coil 1 and the fourth coil 4) are used to measure the eddy current signals in front of and behind the magnet. Coils 2 and 3 (i.e., the second coil 2 and the third coil 3) are sensitive to magnetic field disturbances and are suitable for detecting volumetric defects. Coils 1 and 4 (i.e., the first coil 1 and the fourth coil 4) measure moving magnetic eddy currents and are more sensitive to crack detection.
[0036] It should be understood that the addition of the coil will lengthen the magnetic circuit of the magnet and reduce the strength of the spatial magnetic field. Therefore, a magnetic circuit structure is introduced. The magnetic circuit structure serves two purposes: firstly, to guide the magnetic field of the magnet into the specimen and strengthen the magnetic field at the specimen; and secondly, to enhance the magnetic flux through the coil, thereby improving the sensitivity of the sensor.
[0037] Specifically, the differential output voltage of the coil in the sensor is collected. The two differential voltages are denoted as U1 (eddy current differential voltage) and U2 (magnetic field differential voltage). Coil 1 (i.e., the first coil 1) and coil 4 (i.e., the fourth coil 4) are connected in reverse series, and the voltage at the two output terminals is measured, which is the differential voltage U1 (i.e., eddy current differential voltage). Coil 2 (i.e., the second coil 2) and coil 3 (i.e., the third coil 3) are connected in reverse series, and the voltage at the two output terminals is measured, which is the differential voltage U2 (i.e., magnetic field differential voltage).
[0038] In the above embodiments, the magnetic flux through the coils can be enhanced by using the first coil, second coil, third coil, fourth coil and magnet group, thereby improving the sensitivity of the sensor and making it more sensitive to crack detection.
[0039] Optionally, as an embodiment of the present invention, such as Figures 1 to 6 As shown, the magnet assembly includes a first magnet 6, a second magnet 7, a third magnet 8, a fourth magnet 9, and a fifth magnet 10.
[0040] The first magnet 6 is disposed at one end of the second magnet 7, one end of the third magnet 8 is connected to the other end of the second magnet 7, the other end of the third magnet 8 is connected to one end of the fourth magnet 9, and the other end of the fourth magnet 9 is connected to the fifth magnet 10. The magnetization direction of the first magnet 6 is directly upward, the magnetization direction of the second magnet 7 is 45° clockwise, the magnetization direction of the third magnet 8 is 90° clockwise, the magnetization direction of the fourth magnet 9 is 135° clockwise, and the magnetization direction of the fifth magnet 10 is 180° clockwise.
[0041] Preferably, the magnets (i.e., the first magnet 6, the second magnet 7, the third magnet 8, the fourth magnet 9, and the fifth magnet 10) are generally selected as neodymium iron boron magnets.
[0042] It should be understood that the dimensions of the magnet (i.e., the magnet assembly) are length L, width W, and height H.
[0043] It should be understood that the magnet assembly is composed of five magnets (i.e., the first magnet 6, the second magnet 7, the third magnet 8, the fourth magnet 9, and the fifth magnet 10).
[0044] Specifically, such as Figure 6 As shown, the magnets are numbered 1, 2, 3, 4, and 5 from left to right. Magnet 1 (i.e., the first magnet 6) is magnetized upwards, magnet 2 (i.e., the second magnet 7) is magnetized at 45°, magnet 3 (i.e., the third magnet 8) is magnetized to the right, magnet 4 (i.e., the fourth magnet 9) is magnetized at -45°, and magnet 5 (i.e., the fifth magnet 10) is magnetized downwards.
[0045] In the above embodiments, the magnetization level of the pipeline can be improved by using the first magnet, the second magnet, the third magnet, the fourth magnet, and the fifth magnet, thereby improving the ability to detect defects.
[0046] Optionally, as an embodiment of the present invention, the process of preprocessing the eddy current differential voltage and the magnetic field differential voltage in the processor to obtain differential data includes:
[0047] The eddy current differential voltage and the magnetic field differential voltage are amplified respectively to obtain the original eddy current differential signal corresponding to the eddy current differential voltage and the original magnetic field differential signal corresponding to the magnetic field differential voltage.
[0048] The original eddy current differential signal and the original magnetic field differential signal are filtered respectively to obtain the target eddy current differential signal corresponding to the eddy current differential voltage and the target magnetic field differential signal corresponding to the magnetic field differential voltage.
[0049] The peak value, waveform width, and peak time of the eddy current differential signal are extracted from the target eddy current differential signal.
[0050] The peak value, waveform width, and peak time of the magnetic field differential signal are extracted from the target magnetic field differential signal.
[0051] The difference between the peak time of the eddy current differential signal and the peak time of the magnetic field differential signal is calculated to obtain the peak time difference of the differential signals. The differential data includes the peak value of the eddy current differential signal, the waveform width of the eddy current differential signal, the peak value of the magnetic field differential signal, the waveform width of the magnetic field differential signal, and the peak time difference of the differential signals.
[0052] It should be understood that the differential output voltage (i.e., eddy current differential voltage and magnetic field differential voltage) is amplified and filtered.
[0053] Specifically, peak values (i.e., the peak values of the eddy current differential signal and the magnetic field differential signal) and waveform widths (i.e., the waveform widths of the eddy current differential signal and the magnetic field differential signal) are characteristics of the two waveforms respectively. The peak phase difference time (i.e., the peak phase difference time of the differential signal) is the time difference between the peak values of the two waveforms, and it is a numerical value.
[0054] In the above embodiments, the differential data obtained by preprocessing the eddy current differential voltage and the magnetic field differential voltage can reduce the impact of sensor lift-off vibration on the detection data, improve the accuracy of defect identification, and realize the capture of defect magnetic field characteristics during motion.
[0055] Optionally, as an embodiment of the present invention, the process of detecting and analyzing the differential data in the processor to obtain defect detection results includes:
[0056] The sensor speed is imported, and the defect width is calculated using the first formula based on the sensor speed, the peak value of the eddy current differential signal, the waveform width of the eddy current differential signal, the peak value of the magnetic field differential signal, the waveform width of the magnetic field differential signal, and the time difference between the peak values of the differential signals. The first formula is:
[0057] W=f1(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k1),
[0058] Where W is the defect width, f1() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time between the peak values of the differential signal, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k1 is the preset first correction coefficient.
[0059] The defect length is obtained by calculating the sensor velocity, eddy current differential signal peak value, eddy current differential signal waveform width, magnetic field differential signal peak value, magnetic field differential signal waveform width, and the time difference between the peak values of the differential signals using the second formula. The second formula is:
[0060] L=f2(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k2),
[0061] Where L is the defect length, f2() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time between the peak values of the differential signal, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k2 is the preset second correction coefficient.
[0062] The defect depth is calculated using the third equation by considering the sensor velocity, eddy current differential signal peak value, eddy current differential signal waveform width, magnetic field differential signal peak value, magnetic field differential signal waveform width, and the time difference between the peak values of the differential signals. The defect depth is then obtained, and the defect width, defect length, and defect depth are combined as the defect detection result. The third equation is:
[0063] D=f3(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k3),
[0064] Where D is the defect depth, f3() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time between the peak values of the differential signal, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k3 is the preset third correction coefficient.
[0065] It should be understood that the correction coefficients (i.e., the preset first correction coefficient, the preset second correction coefficient, and the preset third correction coefficient) are initially set to 1, and the k value is adjusted according to the function fitting.
[0066] Specifically, the sensor speed Vsensor is acquired, the differential signal waveform is acquired, and the peak values Ssensor1 and Ssensor2 (i.e., the peak values of the eddy current differential signal and the magnetic field differential signal), the waveform widths Wsensor1 and Wsensor2 (i.e., the waveform widths of the eddy current differential signal and the magnetic field differential signal), and the phase difference time Tsensor (i.e., the phase difference time of the differential signal peaks) of the two differential voltage peaks are extracted as signal features. A defect library is then established to establish the correspondence between defects and signal features and sensor speed, as shown in the following formula:
[0067] W=f1(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k1),
[0068] L=f2(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k2), D=f3(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k3),
[0069] Where k1, k2, and k3 are correction coefficients, and f1(), f2(), and f3() are function mapping relationships.
[0070] In the above embodiments, the detection and analysis of differential data to obtain defect detection results can improve the magnetization level of the pipeline, thereby improving the defect detection capability. At the same time, it eliminates the influence of sensor lift-off vibration on the signal and improves the accuracy of defect identification.
[0071] Optionally, as another embodiment of the present invention, the present invention relates to the field of non-destructive testing of pipelines, specifically to a detection sensor based on the eddy current principle. This sensor can detect defects in a test piece during movement, and by processing the detected data, it can identify defects in the pipeline. The problems it solves include:
[0072] 1. The magnetic field generated by the magnet in the specimen is divided into magnetic field disturbance and induced eddy current. This invention detects both magnetic field disturbance and moving magnetic eddy current. The magnetic field disturbance is caused by volumetric defects, while the moving magnetic eddy current is more sensitive to crack-like defects. Therefore, the sensor proposed in this invention can detect both cracks and volumetric defects during operation.
[0073] 2. The magnets in this invention are magnetized in different directions, which can improve the magnetization level of the pipeline, thereby improving the ability to detect defects;
[0074] 3. The arrangement of the four coils ensures that no defects are missed, and the differential arrangement can eliminate the influence of sensor lifting vibration on the signal.
[0075] Optionally, as another embodiment of the present invention, the existing technology uses magnetization in a single direction, which can provide a small magnetic field and is not enough to magnetize the test piece, resulting in poor detection effect. The present invention proposes to combine magnets with different magnetization directions to form a magnet group to improve the magnetization level. The existing technology only uses magnetic disturbance signal or eddy current signal, while the present invention uses magnetic field disturbance and eddy current signal at the same time, which can realize the simultaneous detection of volume defects and crack defects.
[0076] Alternatively, as another embodiment of the present invention, the test specimen that the sensor of the present invention can detect must be a conductive material, and there must be relative motion between the test specimen and the sensor.
[0077] Alternatively, as another embodiment of the present invention, the specific steps of the present invention are as follows:
[0078] S1: Fix the sensor to the pipeline defect detection device and move it with the detection device in the pipeline;
[0079] S2: Create defects in the pipe, such as defect width W, length L, and depth D;
[0080] S2: Acquire the differential output voltage of the coil in the sensor. The two differential voltages are denoted as U1 and U2 respectively, and the differential output voltage is amplified and filtered.
[0081] S3: Obtain the sensor speed Vsensor, obtain the differential signal waveform, extract the peak values of the two differential signals Ssensor1 and Ssensor2, the waveform widths of the two differential signals Wsensor1 and Wsensor2, and the time difference between the peak values of the two differential voltages Tsensor as signal features, and establish a defect library that corresponds to the defects, signal features, and sensor speed.
[0082] W=f1(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k1)
[0083] L=f2(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k2)
[0084] D=f3(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k3)
[0085] Where k1, k2, and k3 are correction coefficients, and f1(), f2(), and f3() are function mapping relationships.
[0086] S4: During actual detection, the characteristics of the two differential signals and the sensor speed are substituted into the inversion mapping relationship to obtain the quantified defect size.
[0087] Alternatively, as another embodiment of the present invention, the advantages of the present invention are as follows:
[0088] 1. The use of differential detection can reduce the impact of sensor lift-off vibration on the detection data;
[0089] 2. Using four sets of coils and comparing the differential results of each pair of coils can improve the accuracy of defect identification.
[0090] 3. By adopting the principle of motional eddy currents, it is possible to capture the magnetic field characteristics of defects during motion.
[0091] Optionally, as another embodiment of the present invention, the key points of the present invention are: 1. the arrangement of the magnet group; 2. the coil arrangement to simultaneously detect magnetic field disturbances and eddy currents; and 3. the detection method.
[0092] Figure 7 This is a flowchart illustrating a defect detection method provided in an embodiment of the present invention.
[0093] Alternatively, as another embodiment of the present invention, such as Figure 7 As shown, a defect detection method includes the following steps:
[0094] Obtain the eddy current differential voltage and magnetic field differential voltage of the pipeline under test;
[0095] The eddy current differential voltage and the magnetic field differential voltage are preprocessed to obtain differential data;
[0096] The differential data is analyzed to obtain defect detection results.
[0097] Optionally, as an embodiment of the present invention, the process of preprocessing the eddy current differential voltage and the magnetic field differential voltage to obtain differential data includes:
[0098] The eddy current differential voltage and the magnetic field differential voltage are amplified respectively to obtain the original eddy current differential signal corresponding to the eddy current differential voltage and the original magnetic field differential signal corresponding to the magnetic field differential voltage.
[0099] The original eddy current differential signal and the original magnetic field differential signal are filtered respectively to obtain the target eddy current differential signal corresponding to the eddy current differential voltage and the target magnetic field differential signal corresponding to the magnetic field differential voltage.
[0100] The peak value, waveform width, and peak time of the eddy current differential signal are extracted from the target eddy current differential signal.
[0101] The peak value, waveform width, and peak time of the magnetic field differential signal are extracted from the target magnetic field differential signal.
[0102] The difference between the peak time of the eddy current differential signal and the peak time of the magnetic field differential signal is calculated to obtain the peak time difference of the differential signals. The differential data includes the peak value of the eddy current differential signal, the waveform width of the eddy current differential signal, the peak value of the magnetic field differential signal, the waveform width of the magnetic field differential signal, and the peak time difference of the differential signals.
[0103] Optionally, as an embodiment of the present invention, the process of detecting and analyzing the differential data to obtain defect detection results includes:
[0104] The sensor speed is imported, and the defect width is calculated using the first formula based on the sensor speed, the peak value of the eddy current differential signal, the waveform width of the eddy current differential signal, the peak value of the magnetic field differential signal, the waveform width of the magnetic field differential signal, and the time difference between the peak values of the differential signals. The first formula is:
[0105] W=f1(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k1),
[0106] Where W is the defect width, f1() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time between the peak values of the differential signal, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k1 is the preset first correction coefficient.
[0107] The defect length is obtained by calculating the sensor velocity, eddy current differential signal peak value, eddy current differential signal waveform width, magnetic field differential signal peak value, magnetic field differential signal waveform width, and the time difference between the peak values of the differential signals using the second formula. The second formula is:
[0108] L=f2(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k2),
[0109] Where L is the defect length, f2() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time between the peak values of the differential signal, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k2 is the preset second correction coefficient.
[0110] The defect depth is calculated using the third equation by considering the sensor velocity, eddy current differential signal peak value, eddy current differential signal waveform width, magnetic field differential signal peak value, magnetic field differential signal waveform width, and the time difference between the peak values of the differential signals. The defect depth is then obtained, and the defect width, defect length, and defect depth are combined as the defect detection result. The third equation is:
[0111] D=f3(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k3),
[0112] Where D is the defect depth, f3() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time between the peak values of the differential signal, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k3 is the preset third correction coefficient.
[0113] Optionally, another embodiment of the present invention provides a defect detection system, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the defect detection method described above. This system can be a computer or similar system.
[0114] Optionally, another embodiment of the present invention provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the defect detection method described above.
[0115] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.
[0116] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the above-described apparatus and unit can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.
[0117] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed.
[0118] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of the embodiments of the present invention, depending on actual needs.
[0119] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.
[0120] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. This is understood to mean that the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.
[0121] The above are merely specific embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present invention, and these modifications or substitutions should all be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.
Claims
1. A defect detection system, characterized in that, include: Sensors and processors The sensor is used to acquire the eddy current differential voltage and magnetic field differential voltage of the pipeline under test; The processor is used to preprocess the eddy current differential voltage and the magnetic field differential voltage to obtain differential data; The differential data is analyzed to obtain defect detection results; The sensor includes a first coil (1), a second coil (2), a third coil (3), a fourth coil (4), and a magnet assembly. The first coil (1), the second coil (2), the third coil (3), and the fourth coil (4) are connected in sequence. The magnet group is set at the top of the second coil (2) and the third coil (3). The first coil (1), the second coil (2), the third coil (3), and the fourth coil (4) are all embedded with magnetic cores (5). The first coil (1) and the fourth coil (4) have the same number of turns. The second coil (2) and the third coil (3) have the same number of turns. The first coil (1) and the fourth coil (4) are connected in reverse series to form a differential output, which is used to measure the magnetic field signal below the magnet group to obtain the eddy current differential voltage. The second coil (2) and the third coil (3) are connected in reverse series to form a differential output, which is used to measure the eddy current signal at both ends of the magnet group to obtain the magnetic field differential voltage.
2. The defect detection system according to claim 1, characterized in that, The magnet assembly includes a first magnet (6), a second magnet (7), a third magnet (8), a fourth magnet (9), and a fifth magnet (10). The first magnet (6) is disposed at one end of the second magnet (7), one end of the third magnet (8) is connected to the other end of the second magnet (7), the other end of the third magnet (8) is connected to one end of the fourth magnet (9), and the other end of the fourth magnet (9) is connected to the fifth magnet (10). The magnetization direction of the first magnet (6) is directly upward, the magnetization direction of the second magnet (7) is 45° clockwise, the magnetization direction of the third magnet (8) is 90° clockwise, the magnetization direction of the fourth magnet (9) is 135° clockwise, and the magnetization direction of the fifth magnet (10) is 180° clockwise.
3. The defect detection system according to claim 1, characterized in that, The processor performs preprocessing on the eddy current differential voltage and the magnetic field differential voltage to obtain differential data, including: The eddy current differential voltage and the magnetic field differential voltage are amplified respectively to obtain the original eddy current differential signal corresponding to the eddy current differential voltage and the original magnetic field differential signal corresponding to the magnetic field differential voltage. The original eddy current differential signal and the original magnetic field differential signal are filtered respectively to obtain the target eddy current differential signal corresponding to the eddy current differential voltage and the target magnetic field differential signal corresponding to the magnetic field differential voltage. The peak value, waveform width, and peak time of the eddy current differential signal are extracted from the target eddy current differential signal. The peak value, waveform width, and peak time of the magnetic field differential signal are extracted from the target magnetic field differential signal. The difference between the peak time of the eddy current differential signal and the peak time of the magnetic field differential signal is calculated to obtain the peak time difference of the differential signals. The differential data includes the peak value of the eddy current differential signal, the waveform width of the eddy current differential signal, the peak value of the magnetic field differential signal, the waveform width of the magnetic field differential signal, and the peak time difference of the differential signals.
4. The defect detection system according to claim 3, characterized in that, In the processor, the process of detecting and analyzing the differential data to obtain defect detection results includes: The sensor speed is imported, and the defect width is calculated using the first formula based on the sensor speed, the peak value of the eddy current differential signal, the waveform width of the eddy current differential signal, the peak value of the magnetic field differential signal, the waveform width of the magnetic field differential signal, and the time difference between the peak values of the differential signals. The first formula is: W=f1(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k1), Where W is the defect width, f1() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time between the peak values of the differential signal, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k1 is the preset first correction coefficient. The defect length is obtained by calculating the sensor velocity, eddy current differential signal peak value, eddy current differential signal waveform width, magnetic field differential signal peak value, magnetic field differential signal waveform width, and the time difference between the peak values of the differential signals using the second formula. The second formula is: L=f2(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k2), Where L is the defect length, f2() is the mapping function, Vsensor is the sensor speed, Tsensor is the differential signal peak phase difference time, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k2 is the preset second correction coefficient. The defect depth is calculated using the third equation by considering the sensor velocity, eddy current differential signal peak value, eddy current differential signal waveform width, magnetic field differential signal peak value, magnetic field differential signal waveform width, and the time difference between the peak values of the differential signals. The defect depth is then obtained, and the defect width, defect length, and defect depth are combined as the defect detection result. The third equation is: D=f3(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k3), Where D is the defect depth, f3() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time of the differential signal peaks, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k3 is the preset third correction coefficient.
5. A defect detection method, characterized in that, The defect detection device according to any one of claims 1 to 4 includes the following steps: Obtain the eddy current differential voltage and magnetic field differential voltage of the pipeline under test; The eddy current differential voltage and the magnetic field differential voltage are preprocessed to obtain differential data; The differential data is analyzed to obtain defect detection results.
6. The defect detection method according to claim 5, characterized in that, The process of preprocessing the eddy current differential voltage and the magnetic field differential voltage to obtain differential data includes: The eddy current differential voltage and the magnetic field differential voltage are amplified respectively to obtain the original eddy current differential signal corresponding to the eddy current differential voltage and the original magnetic field differential signal corresponding to the magnetic field differential voltage. The original eddy current differential signal and the original magnetic field differential signal are filtered respectively to obtain the target eddy current differential signal corresponding to the eddy current differential voltage and the target magnetic field differential signal corresponding to the magnetic field differential voltage. The peak value, waveform width, and peak time of the eddy current differential signal are extracted from the target eddy current differential signal. The peak value, waveform width, and peak time of the magnetic field differential signal are extracted from the target magnetic field differential signal. The difference between the peak time of the eddy current differential signal and the peak time of the magnetic field differential signal is calculated to obtain the peak time difference of the differential signals. The differential data includes the peak value of the eddy current differential signal, the waveform width of the eddy current differential signal, the peak value of the magnetic field differential signal, the waveform width of the magnetic field differential signal, and the peak time difference of the differential signals.
7. The defect detection method according to claim 6, characterized in that, The process of detecting and analyzing the differential data to obtain defect detection results includes: The sensor speed is imported, and the defect width is calculated using the first formula based on the sensor speed, the peak value of the eddy current differential signal, the waveform width of the eddy current differential signal, the peak value of the magnetic field differential signal, the waveform width of the magnetic field differential signal, and the time difference between the peak values of the differential signals. The first formula is: W=f1(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k1), Where W is the defect width, f1() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time between the peak values of the differential signal, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k1 is the preset first correction coefficient. The defect length is obtained by calculating the sensor velocity, eddy current differential signal peak value, eddy current differential signal waveform width, magnetic field differential signal peak value, magnetic field differential signal waveform width, and the time difference between the peak values of the differential signals using the second formula. The second formula is: L=f2(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k2), Where L is the defect length, f2() is the mapping function, Vsensor is the sensor speed, Tsensor is the differential signal peak phase difference time, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k2 is the preset second correction coefficient. The defect depth is calculated using the third equation by considering the sensor velocity, eddy current differential signal peak value, eddy current differential signal waveform width, magnetic field differential signal peak value, magnetic field differential signal waveform width, and the time difference between the peak values of the differential signals. The defect depth is then obtained, and the defect width, defect length, and defect depth are combined as the defect detection result. The third equation is: D=f3(Vsensor,Tsensor,Ssensor1,Ssensor2,Wsensor1,Wsensor2,k3), Where D is the defect depth, f3() is the mapping function, Vsensor is the sensor speed, Tsensor is the phase difference time of the differential signal peaks, Ssensor1 is the peak value of the eddy current differential signal, Ssensor2 is the peak value of the magnetic field differential signal, Wsensor1 is the waveform width of the eddy current differential signal, Wsensor2 is the waveform width of the magnetic field differential signal, and k3 is the preset third correction coefficient.
8. A defect detection system, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the defect detection method as described in any one of claims 5 to 7.
9. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the defect detection method as described in any one of claims 5 to 7.