A transparent component infrared imaging defect detection device based on array thermal jet flow

By adopting array thermal jet flow infrared imaging technology in transparent component detection, the problem that traditional detection methods are difficult to achieve high-precision online detection is solved, and accurate detection and efficient detection of transparent component defects are achieved.

CN118777374BActive Publication Date: 2025-04-04GUANGDONG HUST IND TECH RES INST
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Patent Information

Application Number
CN202410898099.5
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-07-05
Publication Date
2025-04-04
Estimated Expiration
2044-07-05

AI Technical Summary

Technical Problem

Traditional detection methods are difficult to achieve high-precision online detection of defects of transparent components, especially in highly translucent and reflective products, and existing machine vision detection methods are difficult to accurately identify defects.

Method used

An infrared imaging defect detection device based on array thermal jet flow is adopted to realize the initial inspection and precision inspection of transparent components through the coordinated work of the power and conveying module, jet module and infrared detection module. The initial inspection array tube and the fine inspection array tube heat the compressed air and spray it onto the surface of the transparent component respectively. The infrared camera acquires the image for defect detection.

Benefits of technology

It realizes high-precision detection of transparent component defects, improves detection accuracy and efficiency, and can realize online inspection on the production line, reducing the dependence of manual inspection.

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Abstract

The present disclosure relates to the field of transparent component detection technology, and in particular to a transparent component infrared imaging defect detection device based on array hot jet flow, including: a power and conveying module, used to move the transparent component from the material loading station, the preliminary inspection station, and the fine inspection station to the material unloading station in sequence, and also includes a position sensor, the position sensor is used to detect the position information of the transparent component; a jet module, including a preliminary inspection array tube and a fine inspection array tube, an infrared detection module, respectively obtaining the preliminary inspection infrared image and the fine inspection infrared image of the transparent component moved to the preliminary inspection station and the fine inspection station after being sprayed by the jet module; a control module, and based on the position information, controlling the preliminary inspection array tube or the fine inspection array tube in the jet module to jet, and obtaining the preliminary inspection infrared image or the fine inspection infrared image, and realizing defect detection based on the preliminary inspection infrared image or the fine inspection infrared image. The use of multi-process parallel detection can improve the detection speed.
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