Probe mounting structure for a detection component for obtaining the surface topography of an object being measured
Through the releasable mechanical connection between the support unit and the probe unit, and by utilizing magnetic and elastic effects, the problems of difficult replacement and easy damage of the probe unit in the contact profilometer are solved, which enables convenient replacement and improved safety, ensuring measurement accuracy.
Patent Information
- Application Number
- CN202410945980.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-15
- Publication Date
- 2025-09-05
- Estimated Expiration
- 2044-07-15
AI Technical Summary
In existing contact profilometers, the probe unit requires a large tightening force when replacing, which may cause damage to the rotating shaft. It is also easily damaged by accidental collision and has difficulty in buffering the impact force, affecting measurement accuracy and convenience.
A releasable mechanical connection is adopted between the support unit and the probe unit. Through the coupling and decoupling mechanism of the first contact part and the second contact part, magnetic force or elastic action is used to achieve convenient assembly of the probe unit and buffer impact force, thereby ensuring posture accuracy.
This improves the convenience and safety of probe unit replacement, reduces the risk of damage due to accidental collision, and ensures measurement accuracy.