Method, system and equipment for testing induced degradation of photovoltaic module and storage medium

Abstract

The invention belongs to the technical field of photovoltaic module testing, and discloses a photovoltaic module induced degradation testing method, system and device and a storage medium, and the method comprises the steps: placing a photovoltaic module sample in a test box, setting a first test condition of the to-be-tested photovoltaic module sample, and setting a second test condition of the to-be-tested photovoltaic module sample; carrying out induced degradation test on the photovoltaic module sample by adopting ultraviolet radiation based on the first test condition; and after testing, irradiating the photovoltaic module sample under the condition of target irradiance until the power of the sample does not change any more, checking the appearance of the photovoltaic module sample, and testing the final power. The first test condition and the second test condition are set in the test process, in the test process, the first test condition is adopted to detect the photovoltaic module sample, if the first test condition passes, the second test condition can be used for detection again, and finally, comparison and analysis can be performed based on the detection results corresponding to the two test conditions. Therefore, the attenuation characteristic of the photovoltaic module sample is judged, and the reliability of the photovoltaic module is judged.

Description

Technical Field

[0001] The present invention belongs to the technical field of photovoltaic module testing, and in particular relates to a testing method, system, equipment and storage medium for photovoltaic module induced attenuation. Background Art

[0002] The existing ultraviolet induced decay (UVID) test of photovoltaic modules is to provide irradiation to the front of the module. However, in the actual use of the power station, first of all, there is current flowing inside the photovoltaic module; secondly, the photovoltaic module has a certain operating temperature, which will be affected by many factors, such as the application scenario, installation method, environmental conditions, battery type, design, and the working current inside the module. The surface temperature of the module will also tend to rise. Studies have shown that in high-irradiation areas, the operating temperature of the components installed on the bracket can reach above 70°C. If it is installed on the roof, the operating temperature can reach about 80°C; in addition, under high-irradiation conditions, the power of the module will decrease instead. Through comparative experiments, it was found that the power attenuation of the cells that have been initially treated with light will be significantly reduced after being encapsulated into modules.

[0003] Therefore, the existing photovoltaic modules have not been tested for photostability before the ultraviolet induced degradation (UVID) test. Since the performance of photovoltaic cell products has certain fluctuations, the standard does not stipulate that photostability tests should be conducted before UV testing. The test process does not provide working current, and the test temperature and ultraviolet radiation intensity conditions cannot cover special areas and special installation methods, and cannot fully simulate the environmental impacts that the components are actually subjected to during operation. Summary of the invention

[0004] In order to solve the problem in the background technology, the present invention proposes a testing method, system, device and storage medium for induced attenuation of photovoltaic modules.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] A method for testing induced attenuation of a photovoltaic module comprises the following steps:

[0007] Before the test, irradiate the PV module sample under the target irradiance until the sample power no longer changes, check the appearance of the PV module sample, and test the initial power;

[0008] Placing a photovoltaic module sample in a test box, setting a first test condition for the photovoltaic module sample to be tested, and performing an induced attenuation test on the photovoltaic module sample by ultraviolet irradiation based on the first test condition;

[0009] After the test, the photovoltaic module samples are irradiated under the target irradiance until the sample power no longer changes, the appearance of the photovoltaic module samples is checked, and the final power is tested;

[0010] The power attenuation rate of the photovoltaic module sample is calculated based on the initial power and the final power. If the power attenuation rate exceeds the target range, the test is terminated. Otherwise, the test passes and the first test condition is replaced with the second test condition for another test to determine whether the second test condition can pass the test.

[0011] Preferably, the target irradiance is less than or equal to 1000 W / m 2 .

[0012] Preferably, setting the first test condition of the photovoltaic module sample to be tested includes:

[0013] Set the irradiance on the front of the PV module sample to be less than or equal to 60kW / m 2 ,

[0014] And, set the irradiance on the back of the PV module sample to be less than or equal to 15kW / m 2 ;

[0015] And, the test temperature of the photovoltaic module samples is set to 55-65 degrees Celsius.

[0016] Preferably, in the first test condition:

[0017] The irradiation intensity on the front side of the photovoltaic module sample is 60 kW / m 2 ;

[0018] The irradiation intensity on the back of the photovoltaic module sample is 15kW / m 2 ;

[0019] The test temperature of the photovoltaic module samples is 55 degrees Celsius.

[0020] Preferably, setting the second test condition of the photovoltaic module sample to be tested includes:

[0021] Set the irradiation intensity on the front of the photovoltaic module sample to 120-180W / m 2 ;

[0022] And, set the irradiance on the back of the PV module sample to be less than or equal to 30W / m 2 ;

[0023] and, setting the test temperature of the photovoltaic module samples to 70 to 80 degrees Celsius;

[0024] And, set the power-on current of the photovoltaic module sample to be less than or equal to 20A.

[0025] Preferably, in the second test condition:

[0026] The irradiation intensity on the front side of the photovoltaic module sample is 120 kW / m 2 ;

[0027] The irradiation intensity on the back of the photovoltaic module sample is 30kW / m 2 ;

[0028] The test temperature of the photovoltaic module samples is 70 degrees Celsius;

[0029] The current of the photovoltaic module sample is 20A.

[0030] Preferably, in the second test condition:

[0031] The irradiation intensity on the front side of the photovoltaic module sample is 180 kW / m 2 ;

[0032] The irradiation intensity on the back of the photovoltaic module sample is 30kW / m 2 ;

[0033] The test temperature of the photovoltaic module samples is 70 degrees Celsius;

[0034] The current of the photovoltaic module sample is 20A.

[0035] Preferably, the power attenuation rate is the ratio of the difference between the initial power and the final power to the initial power.

[0036] A photovoltaic module induced degradation test system, comprising:

[0037] The first processing unit is used to irradiate the photovoltaic module sample under the condition of target irradiance until the sample power no longer changes before testing, check the appearance of the photovoltaic module sample, and test the initial power;

[0038] A test unit, placing a photovoltaic module sample in a test box, setting a first test condition for the photovoltaic module sample to be tested, and performing an induced attenuation test on the photovoltaic module sample by ultraviolet irradiation based on the first test condition;

[0039] The second processing unit is used to irradiate the photovoltaic module sample under the target irradiance until the sample power no longer changes after the test, check the appearance of the photovoltaic module sample, and test the final power;

[0040] The third processing unit calculates the power attenuation rate of the photovoltaic module sample based on the initial power and the final power. If the power attenuation rate exceeds the target range, the test is terminated. Otherwise, the test passes and the first test condition is replaced with the second test condition for another test to determine whether the second test condition can pass the test.

[0041] A device comprising a processor and a processor;

[0042] Memory, used to store computer programs;

[0043] The processor is used to implement the above-mentioned photovoltaic component induced degradation test method when executing the program stored in the memory.

[0044] A computer-readable storage medium stores a computer program, which, when executed by a processor, implements the above-mentioned photovoltaic component induced degradation testing method.

[0045] Beneficial effects of the present invention:

[0046] 1. The test process of the present invention sets a first test condition and a second test condition. In the test process, the first test condition is first used to test the photovoltaic module sample. If the first test condition passes, the second test condition can be used to test again. Finally, the test results corresponding to the two test conditions can be compared and analyzed to determine the attenuation characteristics of the photovoltaic module sample, and then determine the reliability of the photovoltaic module.

[0047] 2. The testing method of the present invention can set the testing conditions for photovoltaic module samples to simulate the environment in which they are used in power stations. Through this test, the long-term reliability of photovoltaic modules can be fully evaluated in the early stages of product design and production. The early evaluation can verify the suitability of the product design on the one hand, and supervise the stability of the performance of the modules during the production process on the other hand, ultimately ensuring the reliability of the photovoltaic modules throughout their life cycle during use.

[0048] Other features and advantages of the present invention will be described in the following description, and partly become obvious from the description, or be understood by implementing the present invention. The purpose and other advantages of the present invention can be realized and obtained by the structures pointed out in the description and the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0050] Figure 1 A schematic flow chart of a method for testing induced attenuation of a photovoltaic module of the present invention is shown;

[0051] Figure 2a A flow chart showing a second embodiment of the present invention is shown;

[0052] Figure 2b A diagram showing the position of a photovoltaic module sample of the present invention in a test box;

[0053] Figure 3 A structural diagram of a photovoltaic module induced attenuation test system of the present invention is shown. DETAILED DESCRIPTION

[0054] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0055] Embodiment 1

[0056] A method for testing induced degradation of photovoltaic modules, such as Figure 1 As shown, the following steps are included:

[0057] S1: Before testing, place the sample under target irradiance (≤1000W / m 2 ) until the sample power does not change, check the appearance of the photovoltaic module sample, and test the initial power; S2: place the photovoltaic module sample in the test box, set the first test condition of the photovoltaic module sample to be tested, and use ultraviolet irradiation to perform an induced attenuation test on the photovoltaic module sample based on the first test condition; S3: after the test, place the sample to be tested under the target irradiance (≤1000W / m 2 ) irradiate the sample until the power does not change, check the appearance of the photovoltaic module sample, and test the final power; S4: calculate the power attenuation rate of the photovoltaic module sample based on the initial power and the final power. If the power attenuation rate exceeds the target range, the test is terminated. Otherwise, the test passes, and the first test condition is replaced with the second test condition for another test to determine whether the second test condition can pass the test. The power attenuation rate is the ratio of the difference between the initial power and the final power to the initial power.

[0058] It should be noted that the PV module samples to be tested should have the same BOM and packaging process as the finished modules, including glass, film, battery, solder joints, backplane, etc. The modules may be subjected to the polarity of ultraviolet induced attenuation (UVID) after being connected to the power station, so at least two PV module samples should be prepared for testing.

[0059] It should be further explained that the inspection of product appearance is mainly to determine whether it has major defects, including:

[0060] 1. Crack: A crack that appears on the surface or inside a component.

[0061] 2. Stains: There are stains or spots on the surface that are difficult to remove.

[0062] 3. Discoloration: The component color is uneven or there is abnormal color change.

[0063] 4. Bubbles: There are air bubbles inside the component or between layers.

[0064] 5. Scratches: There are obvious scratches on the surface.

[0065] 6. Missing corners: The edges or corners of the components are damaged or missing.

[0066] 7. Warping: The edge of the component is warped and the seal is not tight.

[0067] 8. Solder joint defects: uneven solder joints, cold solder joints or leaking solder joints.

[0068] 9. Glass breakage: The cover glass is cracked or broken.

[0069] 10. Wiring problem: The wiring is not neat, exposed or poorly connected.

[0070] Furthermore, the first test condition includes: setting the irradiance on the front side of the photovoltaic module sample to be less than or equal to 60 kW / m 2 And set the irradiation time, 60W / m 2 ; and, setting the irradiance on the back of the photovoltaic module sample to be less than or equal to 15kW / m 2 , where the back irradiation intensity can be selected as 15W / m 2 ; and, setting the test temperature of the photovoltaic module samples to 55 to 65 degrees Celsius.

[0071] The second test condition includes: setting the irradiance intensity of the front side of the photovoltaic module sample, wherein the irradiance intensity of the front side is specifically 120-180W / m 2 ; and, setting the irradiation intensity and time of the back side of the photovoltaic module sample, wherein the back side irradiation intensity is less than or equal to 30W / m 2 ; and, setting the test temperature of the photovoltaic module sample, specifically to 70 to 80 degrees Celsius; and, setting the power-on current of the photovoltaic module sample, which can be selected to be less than or equal to 20A.

[0072] It should be noted that by adopting the first test condition and the second test condition for testing, the power attenuation conditions in the non-powered and powered conditions can be obtained respectively. During the testing process, it is necessary to first adopt the first test condition to check whether the photovoltaic module sample can pass the test, and then test under the second test condition. The second test condition checks whether the photovoltaic module sample can pass the test, and then continue to test under the third condition. The testing process is explained below in combination with Examples 2 to 4.

[0073] Embodiment 2

[0074] 1. Test based on the first test condition

[0075] like Figure 2a As shown in the figure, after the photovoltaic module samples are prepared, the light-induced attenuation before the test is first performed. Specifically, the photovoltaic module samples are placed Figure 2b In the UV environment test box, and then at an irradiance of 1000W / m 2 After irradiation under the conditions until stable, check the appearance of the photovoltaic module samples, test the initial power and electroluminescence (EL) components or screens.

[0076] During the test: a. Place the PV module sample in a UV environment test chamber, short-circuit the positive and negative terminals, and use an insulated wire to connect to the power supply terminal (positive or negative) that provides current. b. Turn on the UV test equipment and set the test time and test temperature corresponding to the front and back irradiation intensity of the module. The front UV irradiation intensity is 60kWh / m 2 ; The back UV radiation intensity is 15kWh / m 2 , the test temperature of the photovoltaic module sample is 60℃±5℃, such as 55℃. c. After the test, place the photovoltaic module sample under an irradiance of 1000W / m 2 After irradiation under the conditions until stable, check the appearance of the photovoltaic module samples and test the final power and electroluminescence.

[0077] 3) Judgment:

[0078] a) Visual inspection should include careful observation of the appearance of the PV module product to determine whether there are any major defects. This includes but is not limited to cracks, dents, scratches, uneven color, missing or damaged parts, etc. All of these defects may affect the normal use and life of the equipment, so they must be carefully inspected and recorded.

[0079] b) The maximum output power of the PV module product to ensure that the power attenuation between the initial measurement and the final measurement does not exceed ±5%. This requires multiple measurements throughout the entire cycle of the PV module product to ensure the stability of the power output. If the power attenuation exceeds this range, it may indicate that the PV module product has performance degradation or other problems, requiring further inspection and maintenance.

[0080] c) Check the electroluminescent screen or component to confirm whether it is black or has a poor solder joint. Black EL may indicate an electrical fault or aging problem in the screen or component, while a poor solder joint may affect the reliability of the connection, resulting in poor contact or open circuit. These situations need to be confirmed by visual inspection and possible electrical testing, and any problems found should be recorded.

[0081] 2. Based on the second test condition, the front UV radiation intensity is selected as 120kWh / m 2 Conducting the test

[0082] Before testing: Place the photovoltaic module samples under an irradiance of 1000W / m 2 After irradiation under stable conditions, check the appearance of the photovoltaic module samples and test the initial power and EL.

[0083] During the test: a. Place the PV module sample in a UV environment test chamber, short-circuit the positive and negative terminals, and use an insulated wire to connect to the power supply terminal that provides current. (Positive or negative). b. Turn on the UV test equipment and set the test time and test temperature corresponding to the front and back irradiation intensity of the module. The front UV irradiation intensity is 120kWh / m 2 ; The back UV radiation intensity is 30kWh / m 2 The test temperature of the photovoltaic module sample is 75℃±5℃, such as 70℃, and the current is 20A. c. After the test, place the photovoltaic module sample under an irradiance of 1000W / m 2 After irradiation under the conditions until stable, check the appearance of the photovoltaic module samples and test the final power and electroluminescence.

[0084] 3) Judgment:

[0085] a) Visual inspection should include a careful observation of the overall appearance of the equipment to determine whether there are any major defects.

[0086] b) Test the maximum output power of the equipment to ensure that the power reduction between the initial measurement and the final measurement does not exceed ±5%.

[0087] c) Check the EL to see if it is black or has cold solder joints.

[0088] 3. Based on the second test condition, the front UV radiation intensity is selected as 180kWh / m 2Conduct a test.

[0089] Embodiment 3

[0090] The comparison is based on the data of Example 2, and the results are shown in Table 1:

[0091] Table 1

[0092]

[0093]

[0094] From the attenuation rate results, based on the first test condition, the front UV radiation intensity is 60kWh / m 2 ; The back UV radiation intensity is 15kWh / m 2 , the PV module sample temperature is 60℃±5℃. The front attenuation rate is 0.13%, and the back attenuation rate is 0.08%. Based on the second test condition, the front UV irradiation intensity condition is 120kWh / m 2 ; The back UV radiation intensity is 30kWh / m 2 The temperature condition of the photovoltaic module sample is 75℃±5℃, and the current source is turned on to provide a current of 20A. The front attenuation rate is 0.87%, and the back attenuation rate is 0.24%. Based on the second test condition, the front UV irradiation intensity condition is 180kWh / m 2 ; The back UV radiation intensity is 30kWh / m 2 The temperature condition of the photovoltaic module sample is 75℃±5℃, and the current source is turned on to provide a current of 20A. The front attenuation rate is 1.79%, and the back attenuation rate is 0.81%. Example 2 (120kWh / m 2 ) is 0.74% higher on the front side and 0.16% higher on the back side than the attenuation rate of Example 1; Example 2 (180kWh / m 2 ) is 1.66% higher on the front side and 0.73% higher on the back side than that of the first embodiment.

[0095] Embodiment 4

[0096] A test system for induced degradation of photovoltaic modules, such as Figure 3As shown, it includes a first processing unit, a test unit, a second processing unit and a third processing unit. The first processing unit is used to irradiate the photovoltaic module sample under the condition of target irradiance until it is stable before the test, check the appearance of the photovoltaic module sample, and test the initial power; the test unit is used to set the test conditions of the photovoltaic module sample to be tested, and test based on the test conditions; the second processing unit is used to irradiate the photovoltaic module sample under the condition of target irradiance until it is stable after the test, check the appearance of the photovoltaic module sample, and test the final power; the third processing unit is used to calculate the power attenuation rate of the photovoltaic module sample based on the initial power and the final power, if the power attenuation rate exceeds the target range, the test is terminated, otherwise the test is passed, and the first test condition is replaced by the second test condition for another test to determine whether the second test condition can pass the test.

[0097] It should be noted that, for the system embodiment, since it basically corresponds to the method embodiment, the relevant parts can refer to the partial description of the method embodiment. The various units and modules of the photovoltaic module induced attenuation test system are only divided according to functional logic, but are not limited to the above division, as long as the corresponding functions can be achieved; in addition, the specific names of the units are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of the present invention.

[0098] Embodiment 5

[0099] An electronic device comprising a processor and a processor;

[0100] Memory, used to store computer programs;

[0101] The processor is used to execute the program stored in the memory, and the photovoltaic module induced attenuation testing method in embodiment 1.

[0102] It should be noted that the memory may include a random access memory (RAM) or a non-volatile memory, such as at least one disk memory.

[0103] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0104] Embodiment 6

[0105] A computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, a method for testing induced attenuation of a photovoltaic module in the first embodiment is implemented.

[0106] It should be noted that the computer-readable storage medium may be included in the device / apparatus described in the above embodiment; or it may exist independently without being assembled into the device / apparatus. The above computer-readable storage medium carries one or more programs, and when the above one or more programs are executed, the test method for induced attenuation of photovoltaic modules according to the embodiment of the present invention is implemented.

[0107] According to an embodiment of the present invention, the computer-readable storage medium may be a non-volatile computer-readable storage medium, such as a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present invention, the computer-readable storage medium may be any tangible medium containing or storing a program that may be used by or in combination with an instruction execution system, apparatus, or device.

[0108] Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent substitutions for some of the technical features therein; and these modifications or substitutions do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for testing induced attenuation of photovoltaic modules, characterized in that: The following steps are involved: Before the test, irradiate the PV module sample under the target irradiance until the sample power no longer changes, check the appearance of the PV module sample, and test the initial power; Placing a photovoltaic module sample in a test box, setting a first test condition for the photovoltaic module sample to be tested, and performing an induced attenuation test on the photovoltaic module sample by ultraviolet irradiation based on the first test condition; After the test, the photovoltaic module samples are irradiated under the target irradiance until the sample power no longer changes, the appearance of the photovoltaic module samples is checked, and the final power is tested; The power attenuation rate of the photovoltaic module sample is calculated based on the initial power and the final power. If the power attenuation rate exceeds the target range, the test is terminated. Otherwise, the test passes and the first test condition is replaced with the second test condition for another test to determine whether the second test condition can pass the test.

2. A photovoltaic module induced attenuation testing method according to claim 1, characterized in that: The target irradiance is less than or equal to 1000W / m 2 .

3. A photovoltaic module induced attenuation testing method according to claim 2, characterized in that: The first test condition of the photovoltaic module sample to be tested is set, including: Set the irradiance on the front of the PV module sample to be less than or equal to 60kW / m 2 ; And, set the irradiance on the back of the PV module sample to be less than or equal to 15kW / m 2 ; And, the test temperature of the photovoltaic module samples is set to 55-65 degrees Celsius.

4. A photovoltaic module induced attenuation testing method according to claim 3, characterized in that: In the first test condition: The irradiation intensity on the front side of the photovoltaic module sample is 60 kW / m 2 ; The irradiation intensity on the back of the photovoltaic module sample is 15kW / m 2 ; The test temperature of the photovoltaic module samples is 55 degrees Celsius.

5. A method for testing induced attenuation of a photovoltaic module according to claim 4, characterized in that: The second test condition of the photovoltaic module sample to be tested is set, including: Set the irradiation intensity on the front of the photovoltaic module sample to 120-180W / m 2 ; And, set the irradiance on the back of the PV module sample to be less than or equal to 30W / m 2 ; and, setting the test temperature of the photovoltaic module samples to 70 to 80 degrees Celsius; And, set the power-on current of the photovoltaic module sample to be less than or equal to 20A.

6. A method for testing induced attenuation of a photovoltaic module according to claim 5, characterized in that: In the second test condition: The irradiation intensity on the front side of the photovoltaic module sample is 120 kW / m 2 ; The irradiation intensity on the back of the photovoltaic module sample is 30kW / m 2 ; The test temperature of the photovoltaic module samples is 70 degrees Celsius; The current of the photovoltaic module sample is 20A.

7. A method for testing induced attenuation of a photovoltaic module according to claim 5, characterized in that: In the second test condition: The irradiation intensity on the front side of the photovoltaic module sample is 180 kW / m 2 ; The irradiation intensity on the back of the photovoltaic module sample is 30kW / m 2 ; The test temperature of the photovoltaic module samples is 70 degrees Celsius; The current of the photovoltaic module sample is 20A.

8. A photovoltaic module induced attenuation testing method according to claim 1, characterized in that: The power attenuation rate is the ratio of the difference between the initial power and the final power to the initial power.

9. A photovoltaic module induced attenuation test system, characterized in that: include: The first processing unit is used to irradiate the photovoltaic module sample under the target irradiance condition until the sample power no longer changes before testing, check the appearance of the photovoltaic module sample, and test the initial power; A test unit, used for placing a photovoltaic module sample in a test box, setting a first test condition for the photovoltaic module sample to be tested, and performing an induced attenuation test on the photovoltaic module sample by ultraviolet irradiation based on the first test condition; The second processing unit is used to irradiate the photovoltaic module sample under the target irradiance until the sample power no longer changes after the test, check the appearance of the photovoltaic module sample, and test the final power; The third processing unit is used to calculate the power attenuation rate of the photovoltaic module sample based on the initial power and the final power. If the power attenuation rate exceeds the target range, the test is terminated; otherwise, the test passes and the first test condition is replaced with the second test condition for another test to determine whether the second test condition can pass the test.

10. A device, characterized in that: This includes processors and processors; Memory, used to store computer programs; The processor is used to implement a photovoltaic module induced attenuation testing method according to any one of claims 1 to 8 when executing a program stored in the memory.

11. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, a method for testing induced degradation of a photovoltaic module according to any one of claims 1 to 8 is implemented.

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