Photovoltaic module life prediction method, storage medium and electronic equipment

Abstract

The invention relates to a method for predicting the service life of a photovoltaic module, a storage medium and electronic equipment. The prediction method comprises the following steps: acquiring an actual power attenuation rate D0 of each of the plurality of photovoltaic modules after running for a preset time limit y0; based on the actual power attenuation rate D0, determining an average actual power attenuation rate # imgabs0 # of the plurality of photovoltaic modules, based on the average actual power attenuation rate # imgabs1 #, and determining a standard U value according to the following formula (1): (1) # imgabs2 # based on the preset age limit y0, the actual power attenuation rate D0 and the standard U value, and constructing a mapping relation D (y) between the power attenuation rate and the operating age limit y of each photovoltaic module according to the following formula (2): (2) # imgabs3 # and determining the remaining service life yre of each photovoltaic module based on the mapping relation D (y) and a preset power attenuation rate threshold Ds. According to the invention, the service life of the photovoltaic module can be accurately predicted.

Description

Technical Field

[0001] The invention relates to the field of photovoltaic technology, and in particular to a method for predicting the life of a photovoltaic component, a storage medium and an electronic device. Background Art

[0002] Photovoltaic modules (or solar panels) are devices that use the photovoltaic effect to convert sunlight into electrical energy. Each photovoltaic module includes core components such as cells, encapsulation glass, backplane, connectors and cables. Multiple photovoltaic modules are connected to each other in series or parallel to generate the required voltage and current. Photovoltaic modules have many advantages such as energy saving and environmental protection, long service life, low maintenance cost, and strong environmental adaptability. Therefore, they are widely used in photovoltaic power stations, traffic lighting, communications, aerospace and many other fields.

[0003] As the core component of the photovoltaic power generation system, the service life of the photovoltaic module is an important factor in determining the unit power generation cost of the photovoltaic system. In actual application, as the operating years continue to increase, the performance of the photovoltaic module will gradually decline, and the continuous accumulation of degradation will affect the reliability of photovoltaic power generation. The service life of photovoltaic modules is affected by a variety of factors, such as material selection, manufacturing process, use environment, maintenance, etc. Therefore, how to accurately predict the service life of photovoltaic modules is crucial.

[0004] Accordingly, the art needs a new technical solution to solve the above problems. Summary of the invention

[0005] In order to solve the technical problem of how to accurately predict the service life of photovoltaic modules in the prior art, the present invention provides a method for predicting the service life of photovoltaic modules. The prediction method comprises: obtaining the actual power attenuation rate D0 of each of the plurality of photovoltaic modules after the preset operation period y0; based on the actual power attenuation rate D0, determining the average actual power attenuation rate of the plurality of photovoltaic modules Based on the average actual power attenuation rate D, the standard U value is determined according to the following formula (1): Based on the preset years y0, the actual power attenuation rate D0 and the standard U value, a mapping relationship D between the power attenuation rate of each photovoltaic module and the operating years y is constructed according to the following formula (2): (y) : And based on the mapping relationship D (y) and preset power attenuation rate threshold D s , determine the remaining service life y of each of the photovoltaic modules re .

[0006] It can be understood by those skilled in the art that in the method for predicting the life of a photovoltaic module of the present invention, first, the actual power attenuation rate D0 of each of the plurality of photovoltaic modules after the preset operating period y0 is obtained; then, the average actual power attenuation rate D of the plurality of photovoltaic modules is determined according to the actual power attenuation rate D0 of each photovoltaic module; then, based on the determined average actual power attenuation rate D, the standard U value is calculated according to formula (1); then, based on the actual power attenuation rate D0, the preset operating period y0 and the standard U value, a mapping relationship D between the power attenuation rate of each photovoltaic module and the operating period y is constructed according to formula (2): (y) ; Finally, based on the mapping relationship D (y) and preset power attenuation rate threshold D s , calculate the remaining service life y of each photovoltaic module re Therefore, the present invention can construct a mapping relationship D between the power attenuation rate and the operating years y based on the actual power attenuation rate D0 of each photovoltaic module. (y) , accurately predict the service life of each photovoltaic module, and provide reliable data support for economic benefit evaluation, system design and planning, environmental protection and sustainable development, technological innovation and improvement, and risk assessment and management.

[0007] In the preferred technical solution of the above-mentioned method for predicting the life of a photovoltaic module, the step of obtaining the actual power attenuation rate D0 of each photovoltaic module includes: obtaining the actual output power P0 of the photovoltaic module; based on the actual output power P0, determining the actual power attenuation rate D0 of the photovoltaic module according to the following formula (3): Among them, the P B is the nominal output power of the photovoltaic module. Through the above settings, the actual power attenuation rate of each photovoltaic module can be accurately and conveniently obtained, thereby providing reliable data support for evaluating and predicting the service life of photovoltaic modules.

[0008] In the preferred technical solution of the above-mentioned method for predicting the life of a photovoltaic module, the actual output power P0 is the maximum output power of the photovoltaic module under standard test conditions, wherein the standard test conditions include: under AM1.5 spectrum illumination, solar irradiance of 1000W / m2, and operating temperature of 25° C. Through the above-mentioned settings, the reliability of the actual output power P0 can be ensured.

[0009] In the preferred technical solution of the above-mentioned method for predicting the life of a photovoltaic module, based on the mapping relationship D (y) and preset power attenuation rate threshold D s , determine the remaining service life y of each of the photovoltaic modules re The step includes: determining according to the formula (2) the power attenuation rate threshold Ds Corresponding operating years y s ; Determine the remaining service life y according to the following formula (4) re :(4)y re =y s -y0. Through the above settings, the remaining service life y of each photovoltaic module can be easily obtained re .

[0010] In the preferred technical solution of the above-mentioned method for predicting the life of a photovoltaic module, the preset power attenuation rate threshold D s The range is 11%-20%.

[0011] In the preferred technical solution of the above-mentioned method for predicting the life of photovoltaic modules, the prediction method further includes: based on the preset years y0, the average actual power attenuation rate D and the standard U value, a mapping relationship between the average power attenuation rate of the plurality of photovoltaic modules and the operating years y is constructed according to the following formula (5): And based on the mapping relationship and preset power attenuation rate threshold D s , determine the average remaining useful life of the plurality of photovoltaic modules Through the above settings, the mapping relationship between the average power attenuation rate of multiple photovoltaic modules and the operating years y can be constructed. Thus, the average remaining service life of multiple photovoltaic modules can be accurately predicted. re In addition, by selecting appropriate samples, the average remaining service life y of multiple photovoltaic modules can be obtained. re Finally, it can also provide reliable data support for predicting the service life of the entire photovoltaic power generation system (such as a photovoltaic power station).

[0012] In the preferred technical solution of the above-mentioned method for predicting the life of the photovoltaic module, based on the mapping relationship D(y) and the preset power attenuation rate threshold D s , determine the average remaining service life y of the plurality of photovoltaic modules re The step includes: determining according to the formula (5) the power attenuation rate threshold D s Corresponding operating years y s ; Determine the average remaining useful life y according to the following formula (6): re :(6)y re =y s -y0. Through the above settings, the average remaining service life y of multiple photovoltaic modules can be easily obtained re .

[0013] In the preferred technical solution of the above-mentioned method for predicting the life of photovoltaic modules, the multiple photovoltaic modules are all photovoltaic modules in one or more strings. By selecting all photovoltaic modules in one or more strings, in addition to being able to comprehensively evaluate the service life of each of these photovoltaic modules, it is also possible to provide data support for evaluating and predicting the service life of the entire photovoltaic power generation system.

[0014] In the preferred technical solution of the above-mentioned method for predicting the life of photovoltaic modules, before obtaining the power attenuation rate threshold value D0 of each photovoltaic module, the prediction method further includes: inspecting each photovoltaic module to exclude defective products with predetermined defects. Through the above-mentioned setting, the introduction of defective products can be prevented and the error of the standard U value can be reduced.

[0015] In the preferred technical solution of the above-mentioned method for predicting the life of a photovoltaic module, the predetermined defects include one or more of diode failure, encapsulation glass breakage, hot spot burn-through, and junction box damage.

[0016] In order to solve the technical problem of how to accurately predict the service life of a photovoltaic module in the prior art, the present invention provides a storage medium on which a computer program is stored, and when the computer program is executed by a processor, the method for predicting the service life of a photovoltaic module described above is implemented.

[0017] In order to solve the technical problem of how to accurately predict the service life of a photovoltaic module in the prior art, the present invention provides an electronic device. The electronic device comprises: a memory on which a computer program is stored; and a processor, the processor is connected to the memory in communication and executes the method for predicting the service life of a photovoltaic module according to any one of the above items when calling the computer program. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings, in which:

[0019] Figure 1 It is a schematic flow chart of a method for predicting the life of a photovoltaic module of the present invention;

[0020] Figure 2 is a schematic flow chart of a first embodiment of a method for predicting the life of a photovoltaic module of the present invention;

[0021] Figure 3 is a schematic flow chart of a second embodiment of a method for predicting the life of a photovoltaic module of the present invention;

[0022] Figure 4 It is a schematic structural diagram of an embodiment of an electronic device of the present invention.

[0023] List of reference numerals:

[0024] 100. Electronic device; 101. Memory; 102. Processor; 103. Display. DETAILED DESCRIPTION

[0025] The preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are only used to explain the technical principles of the present invention and are not intended to limit the protection scope of the present invention.

[0026] It should be noted that in the description of the present invention, the terms "upper", "lower", "left", "right", "inner", "outer" and the like indicating directions or positional relationships are based on the directions or positional relationships shown in the drawings, which are only for the convenience of description, and do not indicate or imply that the device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0027] In addition, it should be noted that in the description of the present invention, unless otherwise clearly specified and limited, the terms "installation", "setting", and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a direct connection, an indirect connection through an intermediate medium, or the internal connection of two components. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0028] Figure 1 FIG. 1 is a flow chart of a method for predicting the life of a photovoltaic module according to the present invention. Figure 1 As shown, in order to solve the technical problem of how to accurately predict the service life of photovoltaic modules in the prior art, the present invention provides a method for predicting the service life of photovoltaic modules. The prediction method comprises: step S1: obtaining the actual power attenuation rate D0 of each of a plurality of photovoltaic modules after a preset number of years y0 of operation; step S2: determining the average actual power attenuation rate of a plurality of photovoltaic modules based on the actual power attenuation rate D0; Step S3: Based on the average actual power attenuation rate The standard U value is determined according to the following formula (1): Step S4: Based on the preset years y0, the actual power attenuation rate D0 and the standard U value, a mapping relationship D between the power attenuation rate of each photovoltaic module and the operating years y is constructed according to the following formula (2): (y) :(2) Step S5: Based on the mapping relationship D (y) and preset power attenuation rate threshold D s , determine the remaining service life y of each PV module re .

[0029] Figure 2 FIG. 1 is a flow chart of a first embodiment of a method for predicting the life of a photovoltaic module according to the present invention. Figure 2 As shown, in one or more embodiments, when the method for predicting the life of a photovoltaic module of the present invention is started, step S10 is first executed, that is, all photovoltaic modules in one string are selected as target samples. It should be noted that a photovoltaic power generation system is formed by connecting a plurality of photovoltaic modules in series or in parallel. Therefore, selecting all photovoltaic modules in one string as target samples can not only comprehensively evaluate the individual service life of these photovoltaic modules, but also provide data support for evaluating and predicting the service life of the entire photovoltaic power generation system. The number of all photovoltaic modules in one string can be adjusted according to actual needs, such as 13, 14, 15, etc. Alternatively, all photovoltaic modules in a plurality of strings can be selected as target samples, such as 2 strings, 3 strings, etc. Furthermore, some photovoltaic modules in different strings can be selected as target samples according to actual needs.

[0030] like Figure 2 As shown, in one or more embodiments, after the target sample selection is completed, the prediction method executes step S20, that is, inspecting each photovoltaic module to exclude defective products with predetermined defects. Through preliminary inspection (including appearance inspection, instrument inspection, etc.), if the photovoltaic module is determined to be a defective product, it means that the photovoltaic module cannot be used normally and its service life is 0. In addition, excluding defective products with predetermined defects from the target sample can also reduce the error of the standard U value and ensure the accuracy of the prediction. The predetermined defects include one or more of diode failure, broken encapsulation glass, hot spot burn-through, and damaged junction box.

[0031] like Figure 2 As shown, in one or more embodiments, after the preliminary inspection of the photovoltaic components is completed, the prediction method executes step S30, that is, obtaining the actual power attenuation rate D0 of each of the multiple photovoltaic components after the preset operating period y0. In this article, unless there is a clear statement to the contrary, the technical term "preset period y0" refers to the number of years from the time the photovoltaic component is put into use to the time it is selected for the actual power attenuation rate test. For example, the preset period y0 is 10 years. In one or more embodiments, the actual power attenuation rate D0 is obtained according to the following steps: obtaining the actual output power P0 of the photovoltaic component; based on the actual output power P0, determining the actual power attenuation rate D0 of the photovoltaic component according to the following formula (3): Among them, P Bis the nominal output power of the photovoltaic module. For example, if the actual output power P0 of the photovoltaic module is 80W, and the nominal output power is 100W, then the actual power attenuation rate D0 is 20%. Furthermore, the actual output power P0 of the photovoltaic module is the maximum output power of the photovoltaic module under standard test conditions (i.e., tested using the maximum power point method), where the standard test conditions include: under AM1.5 spectrum irradiation, solar irradiance is 1000W / m2, and the operating temperature is 25°C. Through the above settings, the actual output power of the photovoltaic module can be accurately detected to ensure the reliability of the data.

[0032] like Figure 2 As shown, in one or more embodiments, after the actual power attenuation rate D0 of each photovoltaic module is measured, the prediction method executes step S40, that is, based on the actual power attenuation rate D0, determining the average actual power attenuation rate D of multiple photovoltaic modules. The average actual power attenuation rate D is equal to the sum of the actual power attenuation rates D0 of all photovoltaic modules in the target sample (after excluding defective products) divided by the number of photovoltaic modules.

[0033] like Figure 2 As shown, in one or more embodiments, after the average actual power attenuation rate D is obtained, the prediction method executes step S50, that is, based on the average actual power attenuation rate D, the standard U value is determined according to the following formula (1): For example, when the average actual power attenuation rate D is 5.23%, the standard U value calculated according to formula (1) is 0.36118. It should be noted that, in this article, unless otherwise expressly stated, the technical term "standard U value" refers to the preset parameter value calculated by formula (1).

[0034] like Figure 2 As shown, in one or more embodiments, after the standard U value is determined, the prediction method executes step S60, that is, based on the preset age y0, the actual power attenuation rate D0 and the standard U value, a mapping relationship D between the power attenuation rate of each photovoltaic module and the operating age y is constructed according to the following formula (2): (y) :

[0035] like Figure 2 As shown, in one or more embodiments, when the mapping relationship D (y) After the construction is completed, the prediction method executes step S70, that is, based on the mapping relationship D (y) and preset power attenuation rate threshold D s , determine the remaining service life y of each PV module re In one or more embodiments, the preset power attenuation rate threshold D s The range is 11%-20%. For example, the preset power attenuation rate threshold D sis 11%, 17%, 20%, etc. Alternatively, the power attenuation rate threshold D is preset s It can also be set to other suitable values. In one or more embodiments, based on the mapping relationship D (y) and preset power attenuation rate threshold D s , determine the remaining service life y of each PV module re The steps include: determining according to formula (2) a power attenuation rate threshold D s Corresponding operating years y s ; Determine the remaining service life y according to the following formula (4) re :(4)y re =y s For example, according to formula (2), the power attenuation rate threshold D s Corresponding operating years y s If y0 is 20 years and y0 is 9 years, then the remaining service life y of the PV module is calculated according to formula (4): re For 11 years.

[0036] Figure 3 FIG. 2 is a flow chart of a second embodiment of a method for predicting the life of a photovoltaic module according to the present invention. Figure 3 As shown, in one or more embodiments, when the prediction method of the life of the photovoltaic module of the present invention is started, first, step S10 is executed, that is, all photovoltaic modules in one string are selected as target samples. Next, step S20 is executed, that is, each photovoltaic module is inspected to exclude defective products with predetermined defects. Then, step S30 is executed to obtain the actual power attenuation rate D0 of each of the multiple photovoltaic modules after the preset running period y0. Subsequently, the prediction method executes step S40, that is, based on the actual power attenuation rate D0, the average actual power attenuation rate of the multiple photovoltaic modules is determined. Next, the prediction method proceeds to step S50, that is, based on the average actual power attenuation rate The standard U value is determined according to the following formula (1):

[0037] like Figure 3 As shown, in one or more embodiments, when the standard U value is determined, the prediction method proceeds to step S80, that is, based on the preset age y0, the average actual power attenuation rate and standard U value, the mapping relationship between the average power attenuation rate of multiple photovoltaic modules and the operating years y is constructed according to the following formula (5):

[0038] like Figure 3 As shown, in one or more embodiments, when the mapping relationship After the construction is completed, the prediction method executes step S90, that is, based on the mapping relationship and preset power attenuation rate threshold D s , determine the average remaining useful life of the plurality of photovoltaic modules In one or more embodiments, based on the mapping relationship and preset power attenuation rate threshold D s , determine the average remaining useful life of multiple PV panels The steps include: determining according to formula (5) a power attenuation rate threshold D s Corresponding operating life The average remaining useful life y is determined according to the following formula (6): re :(6)y re =y s -y0.

[0039] It should be noted that the parts not mentioned in the second embodiment can be configured in the same manner as in the first embodiment, and will not be described in detail here. In addition, by selecting appropriate samples, the average remaining service life y of multiple photovoltaic modules is obtained. re Finally, it can also provide reliable data support for predicting the service life of the entire photovoltaic power generation system (such as a photovoltaic power station).

[0040] In one or more embodiments, the present invention further provides a storage medium (not shown in the figure). A computer program is stored on the storage medium, and when the computer program is executed by the processor, the method for predicting the life of the photovoltaic module described in any of the above embodiments is implemented. The storage medium can be a computer-readable signal medium or a computer-readable storage medium. The computer-readable storage medium can be, but is not limited to, an electrical, magnetic, optical, electromagnetic, infrared or semiconductor system, device or device, or any suitable combination of the above.

[0041] Figure 4 Schematic diagram of the structure of an embodiment of the electronic device of the present invention. Figure 4 As shown, in one or more embodiments, the present invention further provides an electronic device 100. The electronic device 100 includes a memory 101 and a processor 102. A computer program is stored on the memory 101; the processor 102 is in communication with the memory 101, and executes the method for predicting the life of the photovoltaic module described in any of the above embodiments when the computer program is called. In one or more embodiments, the electronic device 100 also includes a display 103. The display 103 is in communication with the memory 101 and the processor 102, and is used to display a related GUI interactive interface of the method for predicting the life of the photovoltaic module. It should be noted that the electronic device 100 can be a mobile phone, a computer, a tablet, a wearable device, a vehicle-mounted device or other suitable terminal device.

[0042] So far, the technical solutions of the present invention have been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to these specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the protection scope of the present invention.

Claims

1. A method for predicting the life of a photovoltaic module, characterized in that: The prediction method comprises: Obtaining an actual power attenuation rate D0 of each of the plurality of photovoltaic modules after running for a preset number of years y0; Based on the actual power attenuation rate D0, determine the average actual power attenuation rate of the plurality of photovoltaic components Based on the average actual power attenuation rate The standard U value is determined according to the following formula (1): (1) Based on the preset years y0, the actual power attenuation rate D0 and the standard U value, a mapping relationship D between the power attenuation rate of each photovoltaic module and the operating years y is constructed according to the following formula (2): (y) : (2) and Based on the mapping relationship D (y) and preset power attenuation rate threshold D s , determine the remaining service life y of each of the photovoltaic modules re .

2. The method for predicting the life of a photovoltaic module according to claim 1 or 2, characterized in that: The step of obtaining the actual power attenuation rate D0 of each photovoltaic module comprises: Obtaining the actual output power P0 of the photovoltaic module; Based on the actual output power P0, the actual power attenuation rate D0 of the photovoltaic module is determined according to the following formula (3): (3) Among them, the P B is the nominal output power of the photovoltaic module.

3. The method for predicting the life of a photovoltaic module according to claim 2, characterized in that: The actual output power P0 is the maximum output power of the photovoltaic module under standard test conditions, wherein the standard test conditions include: under AM1.5 spectrum illumination, solar irradiance of 1000W / m2, and operating temperature of 25°C.

4. The method for predicting the life of a photovoltaic module according to claim 1, characterized in that: Based on the mapping relationship D (y) and preset power attenuation rate threshold D s , determine the remaining service life y of each of the photovoltaic modules re The steps include: According to the formula (2), the power attenuation rate threshold D s Corresponding operating years y s ; The remaining useful life y is determined according to the following formula (4): re : (4)and re =and s -y0。 5. The method for predicting the life of a photovoltaic module according to claim 1, characterized in that: The preset power attenuation rate threshold D s The range is 11%-20%.

6. The method for predicting the life of a photovoltaic module according to any one of claims 1 to 5, characterized in that: The prediction method further comprises: Based on the preset years y0, the average actual power attenuation rate D and the standard U value, a mapping relationship between the average power attenuation rate of the plurality of photovoltaic modules and the operating years y is constructed according to the following formula (5): (5) and Based on the mapping relationship and preset power attenuation rate threshold D s , determine the average remaining service life y of the plurality of photovoltaic modules re .

7. The method for predicting the life of a photovoltaic module according to claim 6, characterized in that: Based on the mapping relationship D(y) and the preset power attenuation rate threshold D s , determine the average remaining service life y of the plurality of photovoltaic modules re The steps include: According to the formula (5), the power attenuation rate threshold D s Corresponding operating years y s ; The average remaining useful life y is determined according to the following formula (6): re : (6)and re =and s -y0。 8. The method for predicting the life of a photovoltaic module according to claim 1, characterized in that: The plurality of photovoltaic modules are all photovoltaic modules in one or more strings; and / or Before obtaining the power attenuation rate threshold value D0 of each photovoltaic module, the prediction method further includes: inspecting each photovoltaic module to exclude defective products with predetermined defects; and / or The predetermined defects include one or more of diode failure, package glass breakage, hot spot burn-through, and junction box damage.

9. A storage medium, characterized in that: A computer program is stored on the storage medium, and when the computer program is executed by a processor, the method for predicting the life of a photovoltaic component according to any one of claims 1 to 8 is implemented.

10. An electronic device, characterized in that: The electronic device comprises: a memory having stored thereon a computer program; and A processor is communicatively connected to the memory and executes the method for predicting the life of a photovoltaic component according to any one of claims 1 to 8 when calling the computer program.

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