Quick test method for directional diagram of phased-array antenna based on vector network segment function
Through the combination of the arcuate segment function and radio frequency switch, the multi-frequency point multi-wave position direction diagram of phased array antenna is realized, solving the problems of long test time and high equipment cost in the existing technology, and improving the testing efficiency and Equipment utilization.
Patent Information
- Application Number
- CN202411324689.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-23
- Publication Date
- 2025-01-10
- Estimated Expiration
- 2044-09-23
AI Technical Summary
The multi-frequency multi-wave position directional pattern testing method of existing phased array antennas has a long test time, which cannot meet the high efficiency needs, and requires additional purchase of FIFO options to increase equipment costs.
Using the fast test method of phased array antenna pattern based on the vector network segment function, by setting test parameters on the computer, configuring multiple identical segments, and using a timing controller and vector network analyzer to achieve beam control and spectrum trace data acquisition , generates the indicator parameters of the direction map, and realizes the transmission and reception switching of the RF link through the RF switch, supporting the independent measurement of the multi-frequency point and multi-wave position direction map.
It significantly saves the test and verification time of phased array antenna pattern indicators, improves work efficiency, reduces equipment costs, and realizes the rapid testing requirements of phased array antenna multi-frequency point multi-wave position direction maps.
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Figure CN119291312A_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the technical field of antenna measurement, and specifically relates to a phased array antenna pattern rapid testing method based on a vector network segment function. Background Art
[0002] Phased array antenna is an array antenna system with multiple antenna elements. Phased array antenna uses the phase control capability of each antenna element to achieve precise control of the radiation beam direction and beam shape by reasonably adjusting the phase difference. Phased array antennas are usually composed of a large number of antenna elements, which are arranged in a regular two-dimensional array. Each antenna element can independently adjust the phase of the transmitted or received signal. By properly controlling the phase difference of each antenna element, the antenna system can form a cluster, i.e., a beam, in a specific direction. By adjusting the phase difference, the pointing angle of the beam can be changed, thereby achieving accurate orientation, tracking or scanning of the target.
[0003] The testing method of multi-frequency and multi-wavelength patterns of phased array antennas is also a problem to be solved urgently. Conventional testing methods take a long time to test. When testing 56 wavelengths and frequencies, the test time is in hours, which cannot support more efficient testing needs. In addition, the rapid testing function in the current market requires users to configure the FIFO option when purchasing a vector network analyzer to achieve rapid testing, which requires additional costs. The present invention is a phased array antenna pattern rapid testing method based on the vector network segment function proposed to address this type of problem. It can provide support for the testing of multi-frequency and multi-wavelength patterns in phased array antenna testing without the need to purchase the FIFO option.
[0004] Difficulties in testing multi-frequency and multi-wavelength patterns in phased array antenna testing:
[0005] 1) Ordinary testing methods take a long time to test and cannot meet the needs of high-efficiency testing.
[0006] 2) It is necessary to purchase the FIFO option separately, which increases the equipment cost. Summary of the invention
[0007] The purpose of the present invention is to provide a method for quickly testing the radiation pattern of a phased array antenna based on the vector network segment function, so as to solve the problem in the prior art proposed in the background technology that the testing time is long and the testing time is in hours when testing 56 wave positions and frequency points, which cannot support the testing needs of higher efficiency.
[0008] In order to solve the above technical problems, the technical solution adopted by the present invention is:
[0009] A phased array antenna pattern rapid testing method based on a vector network segment function, the testing method comprising the following steps:
[0010] Step S1, setting test parameters in a computer, and configuring the segment according to the set test parameters;
[0011] Step S2, repeat step S1 to set multiple identical segments: set the number of wave positions * the number of vector network acquisition points to the same segment, and after the setting is completed, save the configuration to the vector network analyzer;
[0012] Step S3, the test turntable moves at a constant speed from the initial position to the end position, and during the constant speed movement, the test turntable reports the current position to the timing controller in real time;
[0013] Step S4, the timing controller receives the position information reported by the test turntable. When the trigger position is reached, the timing controller sends a beam control instruction to the phased array antenna to control beam generation; and sends a pulse signal to the vector network analyzer to trigger the vector network analyzer to perform a segment point scan;
[0014] Step S5, the test turntable repeats step S4 before moving to the end position. When the test turntable moves to the end position, the test is completed and a signal is returned to the computer; the computer reads the spectrum trace data in the vector network analyzer;
[0015] Step S6: the test software analyzes the read test data and generates directional pattern index parameters.
[0016] According to the above technical solution, before testing, it is necessary to calculate the RF link attenuation and air attenuation according to the frequency of the phased array antenna to be tested and then select a suitable RF link, specifically:
[0017] Cable attenuation = α × L dB
[0018] Where α is the attenuation constant (in dB / m) and L is the length of the cable.
[0019] According to the above technical solution, the free space electromagnetic wave calculation is specifically as follows:
[0020] FSPL = 20log 10 (d)+20log 10 (f)+20log 10 (4π / c)
[0021] Where: d = distance between antennas (in km); f = frequency (in GHz); c = speed of light in vacuum (in meters per second).
[0022] According to the above technical solution, the electromagnetic wave in free space propagates in the form of a plane wave, the propagation loss is proportional to the square of the distance, and the attenuation Pr is calculated by the following formula:
[0023] Pr=Pt+Gt-L+Gr
[0024] Where Pt is the transmit power, Gt is the transmit antenna gain, L is the free space loss, and Gr is the receive antenna gain. According to the previous free space loss calculation formula, the higher the frequency, the greater the free space loss.
[0025] According to the above technical solution, before testing, it is also necessary to configure the beam control parameters of the phased array antenna under test, which include the antenna transceiver mode, theta angle list, and power on and off of the entire array; specifically, a beam control command is sent to the phased array antenna to control all antenna units (or array elements) in the array to be powered on and enter the working state. At this time, the antenna array can receive the control signal and perform tasks such as beam scanning, tracking, or communication according to the signal.
[0026] According to the above technical solution, before testing, it is also necessary to configure the vector network analyzer parameters, including S parameters, intermediate frequency bandwidth, transmission power and test mode.
[0027] According to the above technical solution, before conducting the test, it is also necessary to configure the test turntable parameters, which include the starting and ending positions of the turntable movement, the movement interval of the azimuth angle, the polarization angle value, the azimuth error correction, and the pitch error correction.
[0028] According to the above technical solution, before conducting the test, it is also necessary to configure a frequency list, and the frequencies in the frequency list must meet the following requirements: the subtraction of any two adjacent frequencies among all frequencies is the same value; the frequency list is used for vector network analyzer parameter settings and phased array antenna wave control command settings.
[0029] According to the above technical solution, before conducting the test, other test parameters need to be configured, and the other test parameters are used to calculate some indicator values.
[0030] According to the above technical solution, other test parameters include test type, whether to test cross-polarization, whether to test axial ratio, fluctuation error threshold and test task name.
[0031] Compared with the prior art, the present invention has the following beneficial effects:
[0032] The method of the present invention can be used to meet the needs of rapid testing of multi-frequency and multi-wavelength patterns in phased array antenna testing. The RF link can be switched to transmit and receive, and the power amplifier can be realized through the RF switch. With the help of this test system, the multi-frequency and multi-wavelength patterns of the phased array antenna can be measured autonomously, and the index calculation and pattern generation can be realized. It improves work efficiency and promotes the research progress of phased array antenna devices; it greatly saves the time for testing and verifying the index of the phased array antenna pattern. BRIEF DESCRIPTION OF THE DRAWINGS
[0033] Figure 1 It is a flow chart of the testing method of the present invention;
[0034] Figure 2 A flow chart of vector network setting in the test method of the present invention;
[0035] Figure 3 Setting a timing flow chart for the test method of the present invention;
[0036] Figure 4 Testing software interface for the present invention;
[0037] Figure 5 Testing software interface for the present invention;
[0038] Figure 6 This is a schematic diagram of the radio frequency matrix switch of the present invention;
[0039] Figure 7 This is the test result interface of the present invention. DETAILED DESCRIPTION
[0040] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0041] Embodiment 1
[0042] like Figure 1 As shown, a phased array antenna pattern rapid testing method based on the vector network segment function, the testing method comprises the following steps:
[0043] Install the test equipment: The phased array antenna test fixture is used to install and fix the phased array antenna to be tested on the test turntable; the standard gain antenna is used to be installed on the feed turntable and used as a feed in the pattern test; the RF matrix switch is used in the pattern test to allow the user to switch the RF link through the RF matrix switch in the high-frequency test scenario to compensate for the attenuation of the entire RF link; the computer is used to run the test software and store the test data on the computer, and the test results can be viewed in the data management; the programmable power supply is used to provide high-quality and stable DC or AC power signals through the internal high-precision and stable circuit, providing the necessary power support for the antenna test.
[0044] Step S1, setting test parameters in a computer, and configuring the segment according to the set test parameters;
[0045] Step S2, repeat step S1 to set multiple identical segments: set the number of wave positions * the number of vector network acquisition points to the same segment, and after the setting is completed, save the configuration to the vector network analyzer;
[0046] Step S3, the test turntable moves at a constant speed from the initial position to the end position, and during the constant speed movement, the test turntable reports the current position to the timing controller in real time;
[0047] Step S4, the timing controller receives the position information reported by the test turntable. When the trigger position is reached, the timing controller sends a beam control instruction to the phased array antenna to control beam generation; and sends a pulse signal to the vector network analyzer to trigger the vector network analyzer to perform a segment point scan;
[0048] Step S5, the test turntable repeats step S4 before moving to the end position. When the test turntable moves to the end position, the test is completed and a signal is returned to the computer; the computer reads the spectrum trace data in the vector network analyzer;
[0049] Step S6: the test software analyzes the read test data and generates directional pattern index parameters.
[0050] The method of the present invention can be used to meet the needs of rapid testing of multi-frequency and multi-wavelength patterns in phased array antenna testing. The RF link can be switched to transmit and receive, and the power amplifier can be realized through the RF switch. With the help of this test system, the multi-frequency and multi-wavelength patterns of the phased array antenna can be measured autonomously, and the index calculation and pattern generation can be realized. It improves work efficiency and promotes the research progress of phased array antenna devices; it greatly saves the time for testing and verifying the index of the phased array antenna pattern.
[0051] Embodiment 2
[0052] This embodiment is a further refinement of the first embodiment.
[0053] Step 1: Install the phased array antenna test fixture on the mounting platform of the test turntable.
[0054] Step 2: Use an optical alignment device to fix the normal center of the phased array antenna and the normal center of the standard gain antenna on the feed turntable on the same straight line so that their normal directions are aligned.
[0055] It should be noted that the optical alignment device used here is a laser device that can adjust the three-dimensional position. It emits visible light. The light can display the position on the feed turntable after passing through a darkroom environment, and the normal direction of the phased array antenna is adjusted through the optical path.
[0056] Step 3: Open the test software, select the test item as the directional pattern test, click the instrument connection button to connect and control the instruments required for the test, and enter the parameter configuration page to set the parameters for this directional pattern test (such as Figures 4 to 6 After the parameters are set, click Test to start the test.
[0057] It should be noted that:
[0058] 1. The switch parameter card sets the RF link, and the user can switch according to the actual test scenario (for example, the test frequency list for this test is 10GHz, 10.1GHz, 10.2GHz, 10.3GHz, 10.4GHz, 10.5GHz, 10.6GHz, and 10.7GHz. According to the calculation of spatial attenuation and RF link loss, it can be seen that there is no need to select a power amplifier link, so the user needs to select an 18G power amplifier link).
[0059] 2. The off-axis angle, transceiver mode, etc. of the phased array antenna need to be set in the beam control parameter card (the transmit mode is used as an example in this test, so the user needs to select the transmit mode as the transmit mode in this parameter module and enter the off-axis angle list to be tested; this example takes -60°, -30°, -15°, 0°, 15°, 30°, and 60° as examples).
[0060] 3. The intermediate frequency bandwidth, transmission power, etc. need to be set in the vector network analyzer parameter card (such as Figure 2 shown).
[0061] 4. The current, current limit, voltage, voltage limit, etc. need to be set in the power parameter card.
[0062] 5. The turntable parameter card needs to set the turntable's motion range, motion interval, polarization axis installation error value, azimuth axis installation error value, pitch axis installation error value, etc. (the turntable's motion range is the minimum azimuth value and maximum azimuth value of the turntable scan, such as -90° to +90°. The turntable's motion interval is the angular spacing of each turntable movement, such as 1°).
[0063] 6. The frequency list you want to test in the current test needs to be set in the frequency parameter card (this method only supports a regular frequency point list, and the regularity here means that the subtraction of any two adjacent frequencies in all frequencies is the same value).
[0064] Step 4: After starting the test, the test software will automatically set the power supply parameters and move the test turntable to the test starting position, and compensate for the installation error values of the polarization, pitch, and azimuth axes (the installation error is the position error that may occur during the installation of the antenna under test. The user enters the compensation value and moves the turntable during the test to achieve error correction. The test software automatically controls the movement of the corresponding axis to the compensation position through the error values of the polarization, pitch, and azimuth axes).
[0065] Step 5: The test software will search the vector network analyzer for the corresponding segment parameter configuration file according to the current test parameters. If the corresponding configuration parameters are found, the configuration file will be read directly; if not found, the segment will be configured according to the frequency, wave position, turntable acquisition point and other parameters in the test parameters. The segment setting method is: configure multiple identical frequency bands, the number of frequency bands is the number of wave positions set for the tested phased array antenna * the number of turntable acquisition points, where the number of wave positions is the number of Theta angle lists of the tested phased array antenna (for example, if the tested antenna needs to test 7 wave position angles of -60°, -30°, -15°, 0°, 15°, 30°, and 60°, the number of wave positions is 7), and the number of turntable acquisition points is calculated according to the turntable moving range and turntable moving interval (for example, if the turntable is set to move from -90° azimuth to 90° azimuth, and the acquisition interval is 1°, the turntable has a total of 1267 acquisition points (absolute value ((start angle - end angle) / acquisition interval + 1))). Add a segment setting in the vector network analyzer. The segment setting parameter startFreq is the minimum value of the frequency list, the parameter stopFreq is the maximum value of the frequency list, and the parameter sweepPoint is the number of frequency lists (for example, if the frequency list is 10GHz, 10.1GHz, 10.2GHz, 10.3GHz, 10.4GHz, 10.5GHz, 10.6GHz, 10.7GHz, then startFreq is 10GHz, stopFreq is 10.7GHz, and sweepPoint is 8). Repeat the above steps multiple times to set multiple identical segments. A total of the same segments (number of wave positions * number of vector network acquisition points) need to be set (in the above example, 7*181). After the setting is completed, save the configuration to the local configuration file of the vector network analyzer, and you can directly call it the next time you test the same parameters. In this way, the setting of all test scanning points is completed on the vector network analyzer. Each point in the vector network segment represents the collection point of the phased array antenna under test at a certain wave position and frequency when the turntable moves to a certain azimuth angle.
[0066] Step 6: Generate a set of wave control instructions based on the antenna wave position and frequency list that need to be tested, and send these wave control instructions to the timing controller. For example, if the test wave position is set to 7 angles such as -60°, -30°, -15°, 0°, 15°, 30°, and 60°, and the test frequency list is 8 frequency points including 10GHz, 10.1GHz, 10.2GHz, 10.3GHz, 10.4GHz, 10.5GHz, 10.6GHz, and 10.7GHz, 56 wave control instructions need to be generated, and all of these 56 wave control instructions are sent to the register of the timing controller for storage.
[0067] Step 7: If Figure 3 As shown in the figure, the test software reads the time required for a segment scan and automatically calculates the total time required for the test based on the current test content. For example, it takes 10us to set a wave control instruction for the tested phased array antenna, the pulse width of the trigger signal of the timing controller is 10us, the pulse width of the trigger signal of the vector network analyzer (TriggerIn and TriggerOut) is 10us, the time for the timing controller to send a command is 20us, and the time required for the vector network analyzer segment to scan a point is 15us. Then, the time required to measure a point each time (the turntable measures a single wave position and a single frequency point at a single azimuth angle) is the wave control instruction setting time plus the vector network trigger time (TriggerIn+TiggerOut) plus the time for the timing controller to send the instruction plus the time for the vector network to scan a point, that is, (10+10+10*2+20+15)us. The minimum time required for a complete test is the single point measurement time*the number of wave positions*the number of frequency point lists*the number of turntable acquisition points.
[0068] Step 8: The test software selects the appropriate speed for the turntable according to the total test time obtained in step 7, and sets the turntable to move at a constant speed from the initial position to the end position. The turntable needs to move at a constant speed from the starting position to the end position during the test. For example, if the turntable is set to move from -90° to +90°, and the total test time is calculated to be 180s, then the appropriate speed needs to be set to allow the turntable to complete the uniform movement of the scanning position within >180s. Because the multi-frequency and multi-wavelength phased array antenna pattern test needs to be completed during the uniform movement process, in order to ensure the time sequence of the test, the turntable movement time needs to be slightly longer than the total test time calculated in step 7.
[0069] Step 9: The turntable continuously reports its position information during the uniform movement. The timing controller automatically checks whether it has moved to the trigger position. The trigger position is calculated based on the turntable movement range and the acquisition interval (e.g., if the turntable movement range is -90° to +90° and the acquisition interval is 1°, the trigger position is -90°, -89°, -88°...88°, 89°, 90°). If it has moved to the trigger position, the timing controller will send the wave control instruction set set in step 6 to the antenna wave control in sequence. After each wave control instruction is sent, a pulse signal is generated to trigger the vector network analyzer to perform a segment point scanning test. The amplitude and phase values obtained from the test are stored in the vector network analyzer. After the vector network analyzer performs a point scanning test, it will return a trigger signal to the timing controller. After receiving the return signal, the timing controller will send and test the next wave control instruction until the test of all wave control instruction sets set in step 6 is completed.
[0070] Step 10: The timing controller automatically repeats step 9 until it reaches the end position, and stops triggering to end the test. After the test, the test software reads the test data from the vector network analyzer. The test result is the spectrum trace data of the vector network analyzer (divided into two groups of data: amplitude and phase). Because multiple identical segment lists were set before, the data obtained is the directional pattern data of the far-field test.
[0071] Step 11: The test software analyzes the test data, calculates relevant indicators and generates multi-frequency and multi-wavelength directivity diagrams. For example, set the test frequency list to 10GHz, 10.1GHz, 10.2GHz, 10.3GHz, 10.4GHz, 10.5GHz, 10.6GHz, 10.7GHz, set the wavelength to -60°, -30°, -15°, 0°, 15°, 30°, 60°, and set the turntable acquisition point to (-90°, -89°...89°, 90°). The first of the test data obtained is the amplitude and phase data of the antenna frequency 10GHz and the wavelength -60° when the turntable is at the -90° azimuth, and the second is the amplitude and phase data of the antenna frequency 10.1GHz and the wavelength -60° when the turntable is at the -90° azimuth. All test data are analyzed in sequence to obtain multiple two-dimensional coordinate data graphs with the turntable azimuth angle as the X-axis and the test amplitude (or phase) as the Y-axis, which are the test direction diagrams. The results are as follows: Figure 7 As shown; (one frequency point and one wave position determine one directional diagram. In the above example, there are 7 wave positions and 8 frequency points, so 56 directional diagrams will be obtained in the end).
[0072] The device of the present invention can be used to measure the multi-frequency and multi-wavelength pattern of phased array antennas at normal temperature and pressure. Switching the radio frequency link can achieve the switching of the power amplifier link and the direct link. With the help of the test device, the multi-frequency and multi-wavelength pattern parameters of the phased array antenna can be measured autonomously, which improves work efficiency and promotes the research progress of phased array antenna devices.
[0073] Embodiment 3
[0074] This embodiment is a further refinement of the second embodiment.
[0075] The system consists of a test turntable, phased array antenna test fixture, vector network analyzer, feed turntable, standard gain antenna, RF matrix switch, timing controller, computer, programmable power supply and cabinet. The system layout diagram is shown in Figure 3 .
[0076] 1. Test turntable: used to fix the phased array antenna fixture, to align the phased array antenna fixture with the standard gain antenna of the feed turntable during the test, and to rotate it during the pattern test.
[0077] 2. Phased array antenna test fixture: used to install phased array antenna devices. The mounting parts provide interfaces for power supply and communication of phased array antenna devices.
[0078] 3. Vector network analyzer: A vector network analyzer is an instrument that uses its own signal source to measure scattering parameters of RF microwave devices, cables, connectors, etc. It combines spectrum analysis, signal generation, and signal separation technologies. It can measure the amplitude of various parameters of a single-port network or a two-port network, as well as the phase, and is used to obtain test results during testing.
[0079] 4. Standard gain antenna: A standard gain antenna is an antenna with known gain characteristics. A linearly polarized horn antenna is often used in engineering. It is used to receive or transmit radio frequency signals, and its indicators will also be included in the calculation of the measured phased array antenna indicators in the radiation pattern test.
[0080] 5. RF matrix switch: RF matrix switch plays an indispensable role in phased array antenna pattern testing. Different RF link switching is achieved by switching the RF matrix switch. This method takes the far-field darkroom as an example. The test frequency range in this scenario is 1G~40G and it needs to support vector network or signal source and spectrum analyzer testing.
[0081] like Figure 3 In this example, the switch matrix integrates 1-18G power amplifiers, 18-40G power amplifiers, and 1-40G low-noise amplifiers, so that users can select appropriate links for signal amplification according to product characteristics when testing different products.
[0082] Take a vector network analyzer as an example (S parameter is S21):
[0083] The user connects port 1 and port 2 of the vector network to vector network 1 and vector network 2 on the switch box respectively. When the controller receives the link switching to the vector network link, switch 1 will switch to the vector network end; the RF signal emitted by the vector network is fed from switch 1 to switch 2. After the user selects an amplification link, the controller switches switches 2 and switch 3 to the corresponding link; the output signal is fed into switch 3 after the amplifier and fed into switch 4 from switch 3. The controller switches switch 4 to the corresponding link according to the transceiver link selected by the user (taking transmission 1 as an example); the output signal is fed into switch 5 through switch 4 and then fed into switch 6 from switch 4. The output signal is directly fed from switch 6 into switch 8 and then fed into the transmission 1 link through switch 8. (If the transmission 2 link is selected, the signal will be fed into switch 7 after reaching switch 5 and fed into switch 9 from switch 7, and then fed into the transmission 2 link after switch 9).
[0084] The RF signal is transmitted from the transmitting end to the receiving end, attenuated by air, and captured by the receiving end, and fed into the switch box from the receiving end 1; the RF signal is fed from switch 9 into switch 11 and from switch 11 into switch 12 (if the transmitting 2 link is selected, the RF signal will enter from the receiving end 2 and be fed into switch 8, and from switch 8 into switch 11; and from switch 11 into switch 12). The RF signal is fed into switch 13 through switch 12, and into switch 14 through switch 13; the controller automatically controls switch 14 to switch to the corresponding link according to whether the user selects a low noise amplifier link or a direct link, and then feeds into switch 15 after the link; after switching 15, it is fed into switch 16, and from switch 16 is fed into port 2 of the vector network analyzer, and from port 2 of the vector network analyzer through the RF line. The signal source plus spectrum analyzer link is basically the same as the vector network link.
[0085] 6. Timing controller: The timing controller is used to control the execution order of instructions, the timing of data transmission and the coordination between various components, so as to ensure that the various components of the test system perform operations in the correct order and time. The timing controller generates, distributes and synchronizes clock signals to ensure that each operation in the system is triggered within the correct clock cycle and the timing relationship between various components is maintained. The timing controller can ensure that the operation is triggered within the correct clock cycle and the timing relationship between various components is maintained. It can also control the delay time to adapt to the timing requirements between different components.
[0086] 7. Computer: used to store system test software to realize automated testing, data processing and analysis of multi-frequency and multi-wavelength phased array antennas.
[0087] 8. Programmable power supply: used to provide power for phased array antenna devices, and can also be used to calculate some indicators in antenna testing.
[0088] 9. Cabinet: used for integrated test equipment.
[0089] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.
[0090] Finally, it should be noted that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.
Claims
1. A phased array antenna pattern rapid testing method based on vector network segment function, characterized by: The test method includes the following steps: Step S1, setting test parameters in a computer, and configuring the segment according to the set test parameters; Step S2, repeat step S1, set multiple identical segments: set the number of wave positions * the number of vector network acquisition points to the same segment, and save the configuration to the vector network analyzer after the setting is completed; Step S3, the test turntable moves at a constant speed from the initial position to the end position, and during the constant speed movement, the test turntable reports the current position to the timing controller in real time; Step S4, the timing controller receives the position information reported by the test turntable. When the trigger position is reached, the timing controller sends a beam control instruction to the phased array antenna to control beam generation; and sends a pulse signal to the vector network analyzer to trigger the vector network analyzer to perform a segment point scan; Step S5, the test turntable repeats step S4 before moving to the end position. When the test turntable moves to the end position, the test is completed and a signal is returned to the computer; the computer reads the spectrum trace data in the vector network analyzer; Step S6: the test software analyzes the read test data and generates directional pattern index parameters.
2. According to claim 1, a phased array antenna pattern rapid testing method based on vector network segment function is characterized by: Before testing, it is necessary to calculate the RF link attenuation and air attenuation according to the frequency of the phased array antenna to be tested and then select the appropriate RF link. Specifically: Cable attenuation = α × LdB Where α is the attenuation constant (in dB / m) and L is the length of the cable.
3. According to claim 2, a phased array antenna pattern rapid testing method based on vector network segment function is characterized by: The free space electromagnetic wave calculation is specifically as follows: FSPL=20log 10 (d)+20log 10 (f)+20log 10 (4π / c) Where: d = distance between antennas (in km); f = frequency (in GHz); c = speed of light in vacuum (in meters per second).
4. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 3 is characterized in that: Electromagnetic waves in free space propagate in the form of plane waves. The propagation loss is proportional to the square of the distance. The attenuation Pr is calculated by the following formula: Pr=Pt+Gt-L+Gr Where Pt is the transmit power, Gt is the transmit antenna gain, L is the free space loss, and Gr is the receive antenna gain. According to the previous free space loss calculation formula, the higher the frequency, the greater the free space loss.
5. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 4 is characterized in that: Before testing, you also need to configure the beam control parameters of the phased array antenna under test. The beam control parameters include the antenna transmit and receive mode, theta angle list, and power on and off of the entire array.
6. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 1 is characterized in that: Before testing, you also need to configure the vector network analyzer parameters, including S parameters, intermediate frequency bandwidth, transmission power, and test mode.
7. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 1 is characterized in that: Before testing, you also need to configure the test turntable parameters, which include the start and end positions of the turntable movement, the azimuth angle movement interval, the polarization angle value, the azimuth error correction, and the pitch error correction.
8. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 1 is characterized in that: Before testing, you also need to configure a frequency list. The frequencies in the frequency list must meet the following requirements: the subtraction of any two adjacent frequencies among all frequencies is the same value; the frequency list is used for vector network analyzer parameter settings and phased array antenna wave control command settings.
9. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 1, characterized in that: Before testing, you need to configure other test parameters, which are used to calculate some indicator values.
10. The method for rapid testing of phased array antenna patterns based on vector network segment function according to claim 8, characterized in that: Other test parameters include test type, whether to test cross-polarization, whether to test axial ratio, fluctuation error threshold, and test task name.
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