Transformer short-circuit test method, device, equipment and storage medium

Abstract

The present application relates to a transformer short-circuit test method, device, equipment and storage medium, the method comprising: connecting the transformer to be tested with a first short-circuit test circuit, and controlling the first short-circuit test circuit to be turned on and off, so that the circuit breaker of the first short-circuit test circuit successively performs closing and opening operations, and obtains a short-circuit short-time test result, and connecting the transformer to be tested with a second short-circuit test circuit, and controlling the second short-circuit test circuit to be turned on and off, so that the circuit breaker of the second short-circuit test circuit successively performs closing and opening operations, and obtains a short-circuit development test result; the closing holding time of the circuit breaker of the first short-circuit test circuit is less than the closing holding time of the circuit breaker of the second short-circuit test circuit; respectively comparing the short-circuit short-time test result and the short-circuit development test result with the preset transformer operating conditions, and obtaining the final short-circuit test result of the transformer to be tested. The use of this method can improve the accuracy of the short-circuit test result of the transformer.

Description

Technical Field

[0001] The present application relates to the technical field of transformers, and in particular to a transformer short-circuit testing method, device, equipment and storage medium. Background Art

[0002] As one of the important equipment in the power system, the transformer may encounter sudden short-circuit faults during operation. Short-circuit faults not only cause the power system to shut down, but also may cause damage to the equipment, and in severe cases may even cause safety accidents such as fire. Therefore, the sudden short-circuit test of the transformer is very important for evaluating the performance and reliability of the transformer under extreme conditions. By performing short-circuit tests on transformers, potential hidden dangers of the equipment can be identified in advance, and data support can be provided for the design, manufacture and operation of the transformer.

[0003] In the existing short-circuit testing technology, manual or mechanical methods are usually used to create transformer outlet short-circuit faults, but it is impossible to achieve accurate control of the time and duration of the transformer short-circuit, and it is difficult to simulate complex short-circuit scenarios. In addition, after a transformer short-circuit fault occurs, the short-circuit situation usually continues to develop in a short period of time. The mechanical setting of short-circuit development conditions cannot accurately simulate the development process of the actual fault and has a large error. Therefore, the results obtained by the current transformer short-circuit test are less accurate. Summary of the invention

[0004] Based on this, it is necessary to provide a transformer short-circuit test method, device, equipment and storage medium that can improve the accuracy of the results obtained by the transformer short-circuit test in order to solve the above technical problems.

[0005] A transformer short-circuit testing method, comprising:

[0006] Connect the transformer to be tested with a first short-circuit test circuit, and control the first short-circuit test circuit to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit short-time test result, and connect the transformer to be tested with a second short-circuit test circuit, and control the second short-circuit test circuit to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit development test result; the closing holding time of the circuit breaker of the first short-circuit test circuit is shorter than the closing holding time of the circuit breaker of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating condition of the transformer to be tested at the time when a short circuit occurs; the second short-circuit test circuit is used to test the operating condition of the transformer to be tested during and during the short-circuit process;

[0007] The short-circuit short-time test result and the short-circuit development test result are respectively compared with the preset transformer operating conditions to obtain the final short-circuit test result of the transformer to be tested.

[0008] In one embodiment, the first short circuit test loop includes:

[0009] The first push button switch, the intermediate relay, three relay open source nodes, the circuit breaker, the first time relay, the second time relay, the power-on delay closing point and the power-on delay opening point;

[0010] Among them, the two ends of the first push button switch, the power-on delay closing point and the coil of the intermediate relay are connected in series and then connected in parallel with the two power terminals of the circuit breaker, the first relay open source node is connected in parallel to the two ends of the first push button switch, the second relay open source node is connected in series with the first time relay and then connected in parallel with the two power terminals of the circuit breaker, the third relay open source node is connected in series with the second time relay and then connected in parallel with the two power terminals of the circuit breaker, one of the power terminals of the circuit breaker is used to be connected to the live wire of the transformer to be tested, and the other power terminal of the circuit breaker is used to be connected to the neutral wire of the transformer to be tested, the remaining two ends of the first push button switch are respectively connected to the closing control terminal and the common terminal of the circuit breaker, and one end of the power-on delay disconnection point is connected to the opening control terminal and the common terminal of the circuit breaker.

[0011] In one embodiment, a first start conduction time of the power-on delay closing point is greater than a second start conduction time of the power-on delay opening point, and a difference between the first start conduction time and the second start conduction time is less than or equal to a preset threshold.

[0012] In one embodiment, the transformer to be tested is connected to a first short-circuit test circuit, and the first short-circuit test circuit is controlled to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations successively, and a short-circuit short-time test result is obtained, including:

[0013] Connecting the transformer to be tested to the first short-circuit test loop, and collecting operating parameters output by the transformer to be tested in real time;

[0014] Controlling the first button switch to be turned on so that the circuit breaker starts to close;

[0015] When the duration of the first button switch being turned on is equal to the second start turn-on time, controlling the power-on delay disconnection point to be turned on so that the circuit breaker starts to open;

[0016] When the duration of the first button switch being turned on is equal to the first start turn-on time, the power-on delay closing point is controlled to be turned off, so that the first short-circuit test loop is powered off to obtain a short-circuit short-time test result.

[0017] In one embodiment, the second short circuit test loop includes:

[0018] A second push button switch, a first intermediate relay coil, three first relay open source nodes, a second intermediate relay coil, a second relay open source node, N+2 time delay relays, N+2 power-on delay contact points, and N circuit breakers; N is greater than or equal to 3;

[0019] Among them, the second push button switch, the first intermediate relay coil and the first power-on delay contact point are connected in series and then connected in parallel with the two power terminals of the first circuit breaker, the first first relay open source node is connected in parallel to the two ends of the second push button switch, the first delay relay is connected in series with the second first relay open source node and then connected in parallel with the two power terminals of the first circuit breaker, the second intermediate relay coil is connected in series with the N+2th first relay open source node and then connected in parallel with the two power terminals of the first circuit breaker, and the remaining N+1 delay relays are connected in parallel to the two ends of the first delay relay and / or the second intermediate relay. Two ends of the intermediate relay, the second to Nth circuit breakers are all connected in parallel with the two power terminals of the first circuit breaker, one end of the open source node of the second relay is connected to the closing terminal of the first circuit breaker, the other end of the open source node of the second relay is connected to the second power-on delay contact point, the second power-on delay contact point is respectively connected to the common terminals of the N circuit breakers, the N+2th power-on delay contact point is respectively connected to the opening terminals and common terminals of the N circuit breakers, one end of the Nth power-on delay contact point is connected to the closing terminal of the N-1th circuit breaker, and the other end of the Nth power-on delay contact point is connected to the second power-on delay contact point.

[0020] In one embodiment, the start conduction times corresponding to the third power-on delay contact point to the N+2th power-on delay contact point are arranged in ascending order.

[0021] In one embodiment, the transformer to be tested is connected to a second short-circuit test circuit, and the second short-circuit test circuit is controlled to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations successively, and a short-circuit development test result is obtained, including:

[0022] Connecting the transformer to be tested to the second short-circuit test loop, and collecting operating parameters output by the transformer to be tested in real time;

[0023] Controlling the second button switch to be turned on so that the N circuit breakers start to close in sequence according to the start conduction time of the power-on delay contact point connected to the closing end point of each circuit breaker;

[0024] When the duration of the conduction of the second push button switch is equal to the conduction time corresponding to the N+2th power-on delay contact point, the N+2th power-on delay contact point is controlled to be turned on, so that the N circuit breakers start to open at the same time;

[0025] When the duration of the conduction of the second button switch is equal to the start of the turning-off time of the first power-on delay contact point, the first power-on delay contact point is controlled to turn off, so that the second short-circuit test circuit is de-energized to obtain the short-circuit development test result.

[0026] A transformer short-circuit test device, comprising:

[0027] A short-circuit test module, used to connect the transformer to be tested with a first short-circuit test circuit, and control the first short-circuit test circuit to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit short-time test result, and connect the transformer to be tested with a second short-circuit test circuit, and control the second short-circuit test circuit to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit development test result; the closing holding time of the circuit breaker of the first short-circuit test circuit is shorter than the closing holding time of the circuit breaker of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating condition of the transformer to be tested at the time when a short circuit occurs; the second short-circuit test circuit is used to test the operating condition of the transformer to be tested during and during the short-circuit process;

[0028] The result determination module is used to compare the short-circuit short-time test result and the short-circuit development test result with the preset transformer operating conditions respectively to obtain the final short-circuit test result of the transformer to be tested.

[0029] A computer device comprises a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0030] Connect the transformer to be tested with a first short-circuit test circuit, and control the first short-circuit test circuit to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit short-time test result, and connect the transformer to be tested with a second short-circuit test circuit, and control the second short-circuit test circuit to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit development test result; the closing holding time of the circuit breaker of the first short-circuit test circuit is shorter than the closing holding time of the circuit breaker of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating condition of the transformer to be tested at the time when a short circuit occurs; the second short-circuit test circuit is used to test the operating condition of the transformer to be tested during and during the short-circuit process;

[0031] The short-circuit short-time test result and the short-circuit development test result are respectively compared with the preset transformer operating conditions to obtain the final short-circuit test result of the transformer to be tested.

[0032] A computer-readable storage medium stores a computer program, which, when executed by a processor, implements the following steps:

[0033] Connect the transformer to be tested with a first short-circuit test circuit, and control the first short-circuit test circuit to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit short-time test result, and connect the transformer to be tested with a second short-circuit test circuit, and control the second short-circuit test circuit to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit development test result; the closing holding time of the circuit breaker of the first short-circuit test circuit is shorter than the closing holding time of the circuit breaker of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating condition of the transformer to be tested at the time when a short circuit occurs; the second short-circuit test circuit is used to test the operating condition of the transformer to be tested during and during the short-circuit process;

[0034] The short-circuit short-time test result and the short-circuit development test result are respectively compared with the preset transformer operating conditions to obtain the final short-circuit test result of the transformer to be tested.

[0035] The above transformer short-circuit test method, device, equipment and storage medium are obtained by connecting the transformer to be tested with a first short-circuit test circuit, and controlling the first short-circuit test circuit to be turned on and off, so that the circuit breaker of the first short-circuit test circuit successively performs closing and opening operations, and obtaining a short-circuit short-time test result, and connecting the transformer to be tested with a second short-circuit test circuit, and controlling the second short-circuit test circuit to be turned on and off, so that the circuit breaker of the second short-circuit test circuit successively performs closing and opening operations, and obtaining a short-circuit development test result. Among them, the closing holding time of the circuit breaker of the first short-circuit test circuit is shorter than the closing holding time of the circuit breaker of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating conditions of the transformer to be tested at the time of short circuit; the second short-circuit test circuit is used to test the operating conditions of the transformer to be tested during and during the short circuit process. The short-circuit short-time test results and short-circuit development test results obtained in this way can not only test the fault occurrence of the transformer at the moment of short circuit, but also test the fault development of the transformer during the duration of short circuit, which can more realistically simulate the dynamic process of the transformer short-circuit fault and improve the accuracy of the transformer short-circuit test. The short-circuit short-time test results and short-circuit development test results are respectively compared with the preset transformer operating conditions to obtain the final short-circuit test results of the transformer to be tested, which can be used as data support to optimize the design of the transformer, and the hidden dangers of the transformer can be identified in advance to improve the safety of the power system. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0037] Figure 1 A schematic diagram of a flow chart of a transformer short-circuit testing method in one embodiment;

[0038] Figure 2 is a schematic structural diagram of a first short-circuit test loop in an embodiment;

[0039] Figure 3 is a schematic structural diagram of a second short-circuit test loop in one embodiment;

[0040] Figure 4 It is a flowchart of a method for determining a control loop of a transformer sudden short-circuit test in one embodiment;

[0041] Figure 5 is a structural block diagram of a transformer short-circuit testing device in one embodiment;

[0042] Figure 6 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0043] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0044] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0045] It can be understood that the terms "first", "second", etc. used in the present application can be used in this article to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish the first element from another element.

[0046] It should be noted that when an element is considered to be "connected" to another element, it can be directly connected to the other element, or connected to the other element through an intermediate element. In addition, the "connection" in the following embodiments should be understood as "electrical connection", "communication connection", etc. if there is transmission of electrical signals or data between the connected objects.

[0047] When used herein, the singular forms "a", "an" and " / the" may also include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" and the like specify the presence of stated features, wholes, steps, operations, components, parts or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof. At the same time, the term "and / or" used in this specification includes any and all combinations of the relevant listed items.

[0048] In one embodiment, Figure 1 As shown, a transformer short circuit test method is provided, the method comprising the following steps S102 and S104:

[0049] Step S102, connecting the transformer to be tested to the first short-circuit test circuit, and controlling the first short-circuit test circuit to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations in succession, and obtaining a short-circuit short-time test result; and connecting the transformer to be tested to the second short-circuit test circuit, and controlling the second short-circuit test circuit to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations in succession, and obtaining a short-circuit development test result.

[0050] Among them, the circuit breaker closing holding time of the first short-circuit test circuit is much shorter than the circuit breaker closing holding time of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating conditions of the transformer to be tested when a short circuit occurs; the second short-circuit test circuit is used to test the operating conditions of the transformer to be tested during and during the short-circuit process.

[0051] The transformer to be tested may be a transformer whose performance needs to be verified by a short-circuit test.

[0052] Optionally, the system first adopts a first short-circuit test loop to connect to the transformer to be tested for testing, and obtains a short-circuit short-time test result. Then, a second short-circuit test loop is used to test the transformer to be tested, and obtains a short-circuit development test result. Among them, the short-circuit short-time test result can be the operating condition of the transformer to be tested during the test when it is connected to the first short-circuit test loop, such as the changes in parameters such as input and output voltage, input and output current, frequency, and power. Among them, the short-circuit development test result can be the operating condition of the transformer to be tested during the test when it is connected to the second short-circuit test loop, and can also include the changes in parameters such as input and output voltage, input and output current, frequency, and power.

[0053] It should be noted that the first short-circuit test circuit and the second short-circuit test circuit can be a simulation circuit set on the simulation system or a circuit formed by connecting actual electronic components. The component parameters of the two circuits are configured according to the voltage level, rated current and other parameters of the transformer to be tested, ensuring that the first short-circuit test circuit and the second short-circuit test circuit can accurately control the short-circuit occurrence time and short-circuit duration.

[0054] Step S104, respectively compare the short-circuit short-time test result and the short-circuit development test result with the preset transformer operating conditions to obtain the final short-circuit test result of the transformer to be tested.

[0055] The preset transformer operating condition may be pre-collected operating parameters of the transformer in a normal working condition or in various types of fault conditions.

[0056] Optionally, the system compares and analyzes the short-circuit short-time test results and the short-circuit development test results with the preset transformer operating conditions to determine whether the transformer to be tested triggers a fault during the short circuit and what the type of fault is, so that the final short-circuit test result can be obtained based on the type of fault generated and the corresponding fault parameters in the short-circuit short-time test results and the short-circuit development test results. The short-circuit test results can identify potential hidden dangers of the transformer in advance and provide data support for the design, manufacture and operation of the transformer.

[0057] In the above transformer short-circuit test method, the transformer to be tested is connected to the first short-circuit test circuit, and the first short-circuit test circuit is controlled to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations successively, and the short-circuit short-time test result is obtained, and the transformer to be tested is connected to the second short-circuit test circuit, and the second short-circuit test circuit is controlled to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations successively, and the short-circuit development test result is obtained. Among them, the closing holding time of the circuit breaker of the first short-circuit test circuit is shorter than the closing holding time of the circuit breaker of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating conditions of the transformer to be tested at the time of short circuit; the second short-circuit test circuit is used to test the operating conditions of the transformer to be tested during and during the short circuit process. The short-circuit short-time test results and short-circuit development test results obtained in this way can not only test the fault occurrence of the transformer at the moment of short circuit, but also test the fault development of the transformer during the duration of short circuit, which can more realistically simulate the dynamic process of the transformer short-circuit fault and improve the accuracy of the transformer short-circuit test. The short-circuit short-time test results and short-circuit development test results are respectively compared with the preset transformer operating conditions to obtain the final short-circuit test results of the transformer to be tested, which can be used as data support to optimize the design of the transformer, and the hidden dangers of the transformer can be identified in advance to improve the safety of the power system.

[0058] In one embodiment, in step S102, the transformer to be tested is connected to a first short-circuit test circuit, and the first short-circuit test circuit is controlled to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations successively, and the content of the short-circuit short-time test result is obtained, including:

[0059] The transformer to be tested is connected to the first short-circuit test loop, and the operating parameters of the transformer to be tested output are collected in real time; the first button switch is controlled to be turned on so that the circuit breaker starts to close; when the duration of the first button switch being turned on is equal to the second start turn-on time, the power-on delay disconnection point is controlled to be turned on so that the circuit breaker starts to open; when the duration of the first button switch being turned on is equal to the first start turn-on time, the power-on delay closing point is controlled to be turned off so that the first short-circuit test loop is de-energized to obtain a short-circuit short-time test result.

[0060] Among them, Figure 2 As shown, the first short circuit test circuit includes: a first push button switch HA, an intermediate relay KA, three relay open source nodes KA, a circuit breaker QF1, a first time relay KT1, a second time relay KT2, a power-on delay closing point KT1 and a power-on delay disconnecting point KT2. It also includes: two automatic switches ZK, which are connected to the live terminal L and the neutral terminal N respectively. Among them, the two ends of the first push-button switch HA, the power-on delay closing point KT1 and the coil of the intermediate relay KA are connected in series and then connected in parallel with the two power terminals of the circuit breaker, the first relay open source node is connected in parallel to the two ends of the first push-button switch HA, the second relay open source node is connected in series with the first time relay and then connected in parallel with the two power terminals of the circuit breaker, the third relay open source node is connected in series with the second time relay KT2 and then connected in parallel with the two power terminals of the circuit breaker, one power terminal of the circuit breaker is used to be connected to the live wire of the transformer to be tested, and the other power terminal of the circuit breaker is used to be connected to the neutral wire of the transformer to be tested, the remaining two ends of the first push-button switch HA are respectively connected to the closing control terminal and the common terminal of the circuit breaker, and one end of the power-on delay disconnection point KT2 is connected to the opening control terminal and the common terminal of the circuit breaker.

[0061] Among them, the response time of the first button switch, the three relay open source nodes, the power-on delay closing point and the power-on delay disconnecting point should be short enough. For example, in the present embodiment, the response time should reach the millisecond level to ensure the accuracy of the loop control.

[0062] The first start-on time of the power-on delay closing point is greater than the second start-on time of the power-on delay disconnecting point, and the difference between the first start-on time and the second start-on time is less than or equal to a preset threshold. For example, in this embodiment, the first start-on time of the power-on delay closing point is set to 1.2s, and the second start-on time of the power-on delay disconnecting point is set to 1s.

[0063] Optionally, the system connects the transformer to be tested to the first short-circuit test circuit, and collects the operating parameters of the transformer to be tested output in real time. The system controls the first button switch to be turned on and records the start time of the first button switch as 0s, so that the circuit breaker starts to close. When the duration of the first button switch on is equal to the second start on time 1s, the power-on delay disconnection point is controlled to be turned on, so that the circuit breaker starts to open; when the duration of the first button switch on is equal to the first start on time 1.2s, the power-on delay closing point is controlled to be turned off, so that the first short-circuit test circuit is de-energized, and the short-circuit short-time test result is obtained. Specifically, the logic of the first short-circuit control circuit is: turn on the first button switch, so that the closing circuit of the circuit breaker is energized, and the circuit breaker starts the closing operation. At the same time, the coil of the intermediate relay is energized, so that the three relay open source nodes are turned on, and the relay open source nodes connected in parallel at both ends of the first button switch are self-locking, ensuring that the circuit breaker closing circuit is always energized, and the remaining two relay open source nodes energize the coils of the first delay relay and the second delay relay. When the conduction duration of the first push button switch reaches 1s, the power-on delay disconnection point is controlled to be turned on, the opening circuit of the circuit breaker is energized, and the opening operation begins. When the conduction duration of the first push button switch reaches 1.2s, the power-on delay closing point is controlled to be turned off, thereby de-energizing the entire first short-circuit test circuit.

[0064] In this embodiment, by connecting the transformer to be tested with the first short-circuit test loop, after the button switch is turned on, the circuit breaker starts to close, so that the transformer to be tested is connected to the short-circuit current. When the on-time of the button switch lasts until the second start on-time of the power-on delay disconnection point, the power-on delay disconnection point is controlled to be turned on, the circuit breaker starts to open, and the short-circuit state of the transformer to be tested ends. Because the second start on-time is extremely short, the time that the transformer to be tested is in the short-circuit state is extremely short, so the collected operating parameters can be regarded as the operating parameters of the transformer to be tested at the short-circuit moment. When the duration of the first button switch on is equal to the first start on-time, the power-on delay closing point is controlled to be turned off, so that the first short-circuit test loop is powered off, and the short-circuit short-time test result is obtained, which realizes the precise control of the short-circuit occurrence time and short-circuit duration of the short-circuit test of the transformer, and can simulate the real scene of the transformer being short-circuited in a very short time, thereby improving the accuracy of the transformer short-circuit test result.

[0065] In one embodiment, in step S102, the transformer to be tested is connected to the second short-circuit test circuit, and the second short-circuit test circuit is controlled to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations successively, and the content of the short-circuit development test result is obtained, including:

[0066] The transformer to be tested is connected to the second short-circuit test circuit, and the operating parameters of the transformer output to be tested are collected in real time; the second button switch is controlled to be turned on, so that N circuit breakers start to close in sequence according to the start conduction time of the power-on delay contact points connected to the closing endpoints of each circuit breaker; when the duration of the conduction of the second button switch is equal to the conduction time corresponding to the N+2th power-on delay contact point, the N+2th power-on delay contact point is controlled to be turned on, so that the N circuit breakers start to open at the same time; when the duration of the conduction of the second button switch is equal to the start off time of the first power-on delay contact point, the first power-on delay contact point is controlled to be turned off, so that the second short-circuit test circuit is de-energized to obtain the short-circuit development test result.

[0067] Among them, Figure 3 As shown, the second short-circuit test circuit includes: a second push button switch HA, a first intermediate relay coil KA1, three first relay open source nodes KA1, a second intermediate relay coil KA2, a second relay open source node KA2, N+2 delay relays KTN+2, N+2 power-on delay contact points KTN+2 and N circuit breakers QFN; N is greater than or equal to 3. It also includes: two automatic switches ZK, which are respectively connected to the live terminal L and the neutral terminal N. Among them, the second push button switch HA, the first intermediate relay coil KA1 and the first power-on delay contact point KT1 are connected in series and then connected in parallel with the two power terminals of the first circuit breaker QF1, the first first relay open source node KA1 is connected in parallel to the two ends of the second push button switch HA, the first delay relay KT1 is connected in series with the second first relay open source node KA1 and then connected in parallel with the two power terminals of the first circuit breaker QF1, the second intermediate relay coil KA2 is connected in series with the N+2 first relay open source node KA1 and then connected in parallel with the two power terminals of the first circuit breaker QF1, and the remaining N+1 delay relays are connected in parallel to the two ends of the first delay relay KT1 and / or the second intermediate relay coil KA2. At both ends of the relay coil KA2, the 2nd to Nth circuit breakers are connected in parallel with the two power terminals of the first circuit breaker QF1, one end of the second relay open source node KA2 is connected to the closing terminal of the first circuit breaker, the other end of the second relay open source node KA2 is connected to the second power-on delay contact point KT2, the second power-on delay contact point KT2 is respectively connected to the common terminals of N circuit breakers, the N+2th power-on delay contact point KTN+2 is respectively connected to the opening terminals and common terminals of N circuit breakers, one end of the Nth power-on delay contact point KTN is connected to the closing terminal of the N-1th circuit breaker, and the other end of the Nth power-on delay contact point KTN is connected to the second power-on delay contact point KT2.

[0068] Among them, the start conduction time corresponding to each of the 3rd power-on delay contact point to the N+2th power-on delay contact point is arranged in ascending order. The 1st and 2nd power-on delay contact points are long-closed nodes, which are usually always in the on state. The start off time of the 1st power-on delay contact point is set to be greater than the start conduction time corresponding to each of the N+2th power delay contact points, and the start off time of the 2nd power-on delay contact point is greater than the start conduction time corresponding to the N+1th power-on delay contact point, but less than the start conduction time corresponding to each of the N+2th power delay contact points. For example, in this embodiment, the circuit breakers are 3, the delay relays are 5, and the power-on delay contact points are 5 for illustration. The start conduction time of the third power-on delay contact point is set to 30ms, the start conduction time of the fourth power-on delay contact point is set to 60ms, and the start conduction time of the fifth power-on delay contact point is set to 1.5s. The start turn-off time of the second power-on delay contact point is set to 90ms, and the start turn-off time of the first power-on delay contact point is set to 1.7s. The following description will be expanded based on the example here.

[0069] Optionally, the system connects the transformer to be tested to the second short-circuit test circuit, and collects the operating parameters of the transformer output to be tested in real time. The system controls the second button switch to be turned on, so that the N circuit breakers start to close in sequence according to the start conduction time of the power-on delay contact point connected to the closing end point of each circuit breaker. For example, the second circuit breaker corresponds to the third power-on delay contact point, and the corresponding start conduction time is 30ms. When the conduction duration of the second button switch reaches 30ms, the second circuit breaker starts to close. The third circuit breaker corresponds to the fourth power-on delay contact point, and the corresponding start conduction time is 60ms. When the conduction duration of the second button switch reaches 60ms, the third circuit breaker starts to close, and so on, until all circuit breakers complete the closing operation. It should be noted that the closing end of the first circuit breaker is connected to the second relay open source node. When the second push button switch is turned on, the first intermediate relay coil is energized, and the three first relay open source nodes are turned on, so that the second intermediate relay coil is energized, and the second relay open source node is turned on, and the first circuit breaker starts to close. Therefore, the closing time of the first circuit breaker is approximately the same as the time when the second push button switch is turned on.

[0070] Further, when the duration of the conduction of the second button switch is equal to the conduction time corresponding to the N+2th power-on delay contact point, the system controls the N+2th power-on delay contact point to be turned on, so that the N circuit breakers start to open at the same time. When the duration of the conduction of the second button switch is equal to the start off time of the first power-on delay contact point, the system controls the first power-on delay contact point to be turned off, so that the second short-circuit test circuit is de-energized to obtain the short-circuit development test result. For example, continuing to explain according to the example in the above description, when the duration of the conduction of the second button switch is equal to 90ms, the second power-on delay contact point is turned off, so that the closing terminals of each circuit breaker lose power. When the duration of the conduction of the second button switch is equal to 1.5s, the fifth power-on delay contact point connected to the opening terminals of each circuit breaker is turned on, so that each circuit breaker starts the opening operation at the same time. When the duration of the conduction of the second button switch is equal to 1.7s, the first power-on delay contact point is controlled to be turned off, so that the second short-circuit test circuit is de-energized.

[0071] In this embodiment, by setting N circuit breakers in the second short-circuit test loop, closing the circuits one after another during the test to control and extend the short-circuit duration of the transformer to be tested, and the N circuit breakers are connected in parallel and closed in sequence, the short-circuit current of the transformer to be tested can be controlled to prevent the transformer to be tested from being directly damaged by excessive short-circuit current. In addition, the number of circuit breakers and time delay relays can be flexibly set according to test requirements, which improves the scalability of the second short-circuit test loop and can be applied to different transformer short-circuit test scenarios.

[0072] In one embodiment, Figure 4 As shown, a method for determining a control loop of a transformer sudden short-circuit test is provided, the method comprising:

[0073] Step 1: Before determining the control circuit of the transformer sudden short-circuit test, select key components with high reliability and fast response capabilities according to the voltage level of the transformer.

[0074] Among them, the control circuit of the transformer sudden short circuit test may include components such as relays, circuit breakers and push button switches. Among them, the selection of relays must take into account the high-speed response and electrical isolation characteristics to ensure that the transformer can act quickly when a short circuit occurs suddenly, and the relay should be reasonably selected according to the voltage level of the transformer to be tested to ensure that it has sufficient withstand voltage level. In addition, the circuit breaker should have a fast fuse characteristic, and the rated current of the circuit breaker is slightly higher than the rated current of the transformer to be tested but lower than the short-circuit current to ensure that the circuit can be quickly cut off in the event of a short circuit. Among them, the push button switch should have a shorter action time to ensure that the control circuit can work in time and ensure the correct setting of the short-circuit moment.

[0075] Step 2: According to the short-circuit test requirements of the transformer to be tested, including short-term short-circuit test and short-circuit development test, configure the parameters of corresponding components respectively.

[0076] Optionally, the action time of each component is designed according to the short-circuit moment and duration required for the short-circuit test, and the switch response time should be within a few milliseconds to ensure that the circuit can be quickly cut off in the event of a sudden short circuit. For example, when setting a single short-circuit test, the circuit breaker needs to maintain a certain period of time (such as 40ms) after closing and then immediately open the circuit, wherein the duration of closing can be manually adjusted, and the closing and opening deviations of the switch do not exceed ±3ms. When setting a short-circuit development test for a transformer, it is necessary to set multiple short-circuit rings (corresponding to the power-on delay contact points of the above embodiment) to act in sequence, and the three switches of the short-circuit rings can sequentially control the corresponding circuit breaker to maintain a certain period of time (such as 40ms) after closing and then immediately open the circuit. For example, control circuit breaker Q1 to close at time 0, circuit breaker Q2 to close 20-30ms after circuit breaker Q1 is closed, circuit breaker Q3 to close 20-30ms after circuit breaker Q2 is closed, and circuit breaker Q3 to keep a certain time (such as 40ms) after closing, and then circuit breakers Q1, Q2 and Q3 are disconnected at the same time. The deviation of the closing and opening time of the circuit breaker does not exceed ±3ms. According to different test types, the action time of each relay switch is reasonably set according to the above method, so as to ensure the accuracy of the control loop response.

[0077] Step 3: Use relays, circuit breakers and push button switches according to Figure 2 The control circuit connection shown in the figure completes the design of the control circuit for a single short-circuit fault (corresponding to the first short-circuit test circuit in the above embodiment). The control logic of the circuit is: press the closing button HA (corresponding to the first button switch in the above embodiment), the closing circuit coil of the switch QF1 is immediately energized, the switch starts to close, and at the same time, the intermediate relay coil KA1 is energized, and the three passive open points of KA1 are all turned into closed points. Circuit 1 is self-locking to ensure that the closing circuit is always energized, and circuit 2 energizes the coils of the time relays KT1 and KT2 respectively. Among them, the time setting of KT2 is 1s, and the time setting of KT1 is 1.2s. Therefore, the timing starts after the coil is energized. At 1s, the power-on delay open point of KT2 becomes a closed point, the switch QF1 opening circuit coil is energized, and the switch starts to open. At 1.2s, the power-on delay closed point of KT1 becomes an open point, and the entire control circuit loses power.

[0078] Step 4: Use relays, circuit breakers and push button switches according to Figure 3The control circuit connection shown in the figure completes the control circuit design of the short circuit development test. Its control logic is: press the closing button HA, the coil of the intermediate relay KA1 is energized, and the three passive open points of KA1 become closed points. One is self-locking to ensure that the closing circuit is always energized, and the two circuits respectively energize the coil of the intermediate relay KA1 and the coils of the time relays (corresponding to the delay relays in the above embodiment) KT1, KT2, KT3...KTN+2. After the KA1 coil is energized, the passive open point of KA1 becomes a closed point, and then the closing circuit coil of the circuit breaker QF1 is energized to start closing. If N=3, 30ms after the time relay KT3 is energized, the power-on delay open point becomes a closed point, so that the closing circuit coil of QF2 is energized to start closing. 60ms after the time relay KT4 is energized, the power-on delay open point becomes a closed point, so that the closing circuit coil of QF3 is energized to start closing. 90ms after time relay KT2 is energized, the power-on delay closed point becomes an open point, causing the closing circuits of QF1, QF2, and QF3 to lose power. 1.5s after time relay KT5 is energized, the power-on delay open point becomes a closed point, causing the opening circuits of QF1, QF2, and QF3 to be energized, and then QF1, QF2, and QF3 begin to open. 1.7s after time relay KT2 is energized, the power-on delay closed point becomes an open point, causing the entire control circuit to lose power.

[0079] Step 5, verify the function and reliability of the control loop through a series of tests. First, a static test is performed to verify the response time and accuracy of the protection circuit and the control loop by gradually applying the load current, and record the port current of the control loop of the system under different current levels of load current, record the moment of current change, and determine whether the moment of current change is consistent with the opening and closing moment of the circuit breaker. Then a dynamic short-circuit test is performed to simulate the actual transformer sudden short-circuit scenario, use a high-speed oscilloscope to record the short-circuit current waveform of the transformer to be tested, and verify whether the circuit breaker can operate within the specified time. Among them, it is necessary to carry out a single short-circuit test and a short-circuit development test respectively to verify the correctness of the two control loops. Finally, the durability test is performed to evaluate the durability of the system through repeated short-circuit tests to ensure that it can still work stably under multiple short-circuit conditions.

[0080] In this embodiment, by reasonably designing the control loop of the transformer sudden short-circuit test, the short-circuit moment, duration and development process are autonomously controlled, the full process characteristics of the short-circuit fault are accurately and safely simulated, and a series of problems caused by manually setting the short-circuit conditions are avoided. In addition, the control loop of the transformer sudden short-circuit test has a simple circuit structure and strong expansibility. By increasing the number of circuit breakers, any number of short-circuit fault tests can be achieved, and the scope of application is wide.

[0081] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0082] Based on the same inventive concept, the embodiment of the present application also provides a transformer short-circuit test device for implementing the transformer short-circuit test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more transformer short-circuit test device embodiments provided below can refer to the limitations of the transformer short-circuit test method above, and will not be repeated here.

[0083] In one embodiment, Figure 5 As shown, a transformer short circuit test device 500 is provided, comprising: a short circuit test module 502 and a result determination module 504, wherein:

[0084] The short-circuit test module 502 is used to connect the transformer to be tested with a first short-circuit test circuit, and control the first short-circuit test circuit to be turned on and off, so that the circuit breaker of the first short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit short-time test result, and connect the transformer to be tested with a second short-circuit test circuit, and control the second short-circuit test circuit to be turned on and off, so that the circuit breaker of the second short-circuit test circuit performs closing and opening operations in succession to obtain a short-circuit development test result; the closing holding time of the circuit breaker of the first short-circuit test circuit is shorter than the closing holding time of the circuit breaker of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating conditions of the transformer to be tested at the time when a short circuit occurs; the second short-circuit test circuit is used to test the operating conditions of the transformer to be tested during and during the short-circuit process.

[0085] The result determination module 504 is used to compare the short-circuit short-time test result and the short-circuit development test result with the preset transformer operating conditions respectively to obtain the final short-circuit test result of the transformer to be tested.

[0086] Furthermore, in one embodiment, the short-circuit test module 502 is also used to connect the transformer to be tested to the first short-circuit test loop, and collect the operating parameters of the output of the transformer to be tested in real time; control the first button switch to be turned on so that the circuit breaker starts to close; when the duration of the first button switch being turned on is equal to the second start turn-on time, control the power-on delay disconnection point to be turned on so that the circuit breaker starts to open; when the duration of the first button switch being turned on is equal to the first start turn-on time, control the power-on delay closing point to be turned off so that the first short-circuit test loop is powered off to obtain a short-circuit short-time test result.

[0087] Furthermore, in one embodiment, the short-circuit test module 502 is also used to connect the transformer to be tested to the second short-circuit test loop, and collect the operating parameters of the output of the transformer to be tested in real time; control the second button switch to be turned on, so that the N circuit breakers start to close in sequence according to the start turn-on time of the power-on delay contact point connected to the closing end point of each circuit breaker; when the duration of the second button switch being turned on is equal to the turn-on time corresponding to the N+2th power-on delay contact point, control the N+2th power-on delay contact point to be turned on, so that the N circuit breakers start to open at the same time; when the duration of the second button switch being turned on is equal to the start turn-off time of the first power-on delay contact point, control the first power-on delay contact point to be turned off, so that the second short-circuit test loop is de-energized to obtain the short-circuit development test result.

[0088] Each module in the above transformer short circuit test device 500 can be implemented in whole or in part by software, hardware or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0089] In one embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as follows: Figure 6 As shown. The computer device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store operating parameter data of the transformer to be tested. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a transformer short-circuit test method is implemented.

[0090] Those skilled in the art will understand that Figure 6The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0091] In one embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above method embodiments when executing the computer program.

[0092] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0093] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0094] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0095] In the description of this specification, the description with reference to the terms "some embodiments", "other embodiments", "ideal embodiments", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.

[0096] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0097] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A transformer short-circuit testing method, characterized in that: include: First, a first short-circuit test circuit is connected to the transformer to be tested to test the operating conditions of the transformer to be tested during the period when the transformer to be tested is connected to the first short-circuit test circuit, and a short-time short-circuit test result is obtained; and a second short-circuit test circuit is connected to the transformer to be tested to test the operating conditions of the transformer to be tested during the period when the transformer to be tested is connected to the second short-circuit test circuit, and a short-circuit development test result is obtained; the circuit breaker closing holding time of the first short-circuit test circuit is shorter than the circuit breaker closing holding time of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating conditions of the transformer to be tested at the time when a short circuit occurs; the second short-circuit test circuit is used to test the operating conditions of the transformer to be tested during and during the short circuit process; The short-circuit short-time test result and the short-circuit development test result are respectively compared with the preset transformer operating conditions to obtain the final short-circuit test result of the transformer to be tested.

2. The method according to claim 1, characterized in that The first short circuit test loop comprises: The first push button switch, the intermediate relay, three relay open source nodes, the circuit breaker, the first time relay, the second time relay, the power-on delay closing point and the power-on delay opening point; Among them, the first push button switch, the power-on delay closing point and the coil of the intermediate relay are connected in series and then connected in parallel with the two power terminals of the circuit breaker, the first relay open source node is connected in parallel to the two ends of the first push button switch, the second relay open source node is connected in series with the first time relay and then connected in parallel with the two power terminals of the circuit breaker, the third relay open source node is connected in series with the second time relay and then connected in parallel with the two power terminals of the circuit breaker, one of the power terminals of the circuit breaker is used to be connected to the live wire of the transformer to be tested, and the other power terminal of the circuit breaker is used to be connected to the neutral wire of the transformer to be tested, the remaining two ends of the first push button switch are respectively connected to the closing control terminal and the common terminal of the circuit breaker, and one end of the power-on delay disconnection point is connected to the opening control terminal and the common terminal of the circuit breaker.

3. The method according to claim 2, characterized in that The first start conduction time of the power-on delay closing point is greater than the second start conduction time of the power-on delay opening point, and the difference between the first start conduction time and the second start conduction time is less than or equal to a preset threshold.

4. The method according to claim 3, characterized in that: The method of using the first short-circuit test loop to test the transformer to be tested and obtaining a short-circuit short-time test result includes: Connecting the transformer to be tested to the first short-circuit test loop, and collecting operating parameters output by the transformer to be tested in real time; Controlling the first button switch to be turned on so that the circuit breaker starts to close; When the duration of the first button switch being turned on is equal to the second start turn-on time, controlling the power-on delay disconnection point to be turned on so that the circuit breaker starts to open; When the duration of the first button switch being turned on is equal to the first start turn-on time, the power-on delay closing point is controlled to be turned off, so that the first short-circuit test loop is powered off to obtain a short-circuit short-time test result.

5. The method according to claim 1, characterized in that The second short circuit test circuit comprises: A second push button switch, a first intermediate relay coil, three first relay open source nodes, a second intermediate relay coil, a second relay open source node, N+2 time delay relays, N+2 power-on delay contact points, and N circuit breakers; N is greater than or equal to 3; Among them, the second push button switch, the first intermediate relay coil and the first power-on delay contact point are connected in series and then connected in parallel with the two power terminals of the first circuit breaker, the first first relay open source node is connected in parallel to the two ends of the second push button switch, the first delay relay and the second first relay open source node are connected in series and then connected in parallel with the two power terminals of the first circuit breaker, the second intermediate relay coil and the third first relay open source node are connected in series and then connected in parallel with the two power terminals of the first circuit breaker, the second delay relay is connected in parallel to the two ends of the first delay relay, and the remaining N delay relays are connected in parallel at the ends of the At both ends of the second intermediate relay, the second to Nth circuit breakers are connected in parallel with the two power terminals of the first circuit breaker, one end of the open source node of the second relay is connected to the closing terminal of the first circuit breaker, the other end of the open source node of the second relay is connected to the second power-on delay contact point, the second power-on delay contact point is respectively connected to the common terminals of the N circuit breakers, the N+2th power-on delay contact point is respectively connected to the opening terminals and common terminals of the N circuit breakers, one end of the Nth power-on delay contact point is connected to the closing terminal of the N-1th circuit breaker, and the other end of the Nth power-on delay contact point is connected to the second power-on delay contact point.

6. The method according to claim 5, characterized in that The start conduction times corresponding to the third power-on delay contact point to the N+2th power-on delay contact point are arranged in ascending order.

7. The method according to claim 6, characterized in that The second short-circuit test loop is used to test the transformer to be tested, and the short-circuit development test result is obtained, including: Connecting the transformer to be tested to the second short-circuit test loop, and collecting operating parameters output by the transformer to be tested in real time; Controlling the second button switch to be turned on so that the N circuit breakers start to close in sequence according to the start conduction time of the power-on delay contact point connected to the closing end point of each circuit breaker; When the duration of the conduction of the second push button switch is equal to the conduction time corresponding to the N+2th power-on delay contact point, the N+2th power-on delay contact point is controlled to be turned on, so that the N circuit breakers start to open at the same time; When the duration of the conduction of the second button switch is equal to the start of the turning-off time of the first power-on delay contact point, the first power-on delay contact point is controlled to turn off, so that the second short-circuit test circuit is de-energized to obtain the short-circuit development test result.

8. A transformer short-circuit test device, characterized in that: include: A short-circuit test module, used to successively use a first short-circuit test circuit and a second short-circuit test circuit to test the transformer to be tested, and obtain a short-circuit short-time test result and a short-circuit development test result respectively; the circuit breaker closing holding time of the first short-circuit test circuit is much shorter than the circuit breaker closing holding time of the second short-circuit test circuit; the first short-circuit test circuit is used to test the operating condition of the transformer to be tested at the time of short circuit; the second short-circuit test circuit is used to test the operating condition of the transformer to be tested during and during the short circuit process; The result determination module is used to compare the short-circuit short-time test result and the short-circuit development test result with the preset transformer operating conditions respectively to obtain the final short-circuit test result of the transformer to be tested.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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