Small sample image generation method for power defect scene
By building a diffusion model in the power defect scenario and introducing a texture modulation module, and combining the EMA algorithm to smoothly update the model parameters, the problem of low detection accuracy caused by data scarcity is solved, and high-quality and diverse defect images are generated under small sample conditions.
Patent Information
- Application Number
- CN202411751167.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-02
- Publication Date
- 2025-03-25
AI Technical Summary
In the power defect scenario, data scarcity limits the training effect of deep learning models, resulting in unsatisfactory detection accuracy, and the existing GAN models lack generalization capabilities under small sample data conditions, making it difficult to generate high-quality and diverse images.
By constructing a diffusion model and introducing a texture modulation module, combining EMA algorithm to smoothly update the model parameters, the synthetic defective images are generated to supplement the actual samples, and the quality of image generation and the stability of the model are improved.
It realizes the generation of high-quality and diverse power defect images under small sample conditions, improves the stability and detection accuracy of the model, and alleviates the problem of data scarcity.