Low stray inductance test equipment for power device

By designing a low-complexity test device including a test bench mechanism and a fixture mechanism, it directly contacts the pins of a single-tube power device, the problems of inaccurate test results and safety hazards in existing test equipment are solved, and power device testing with high accuracy, compatibility and safety is achieved.

CN119716449APending Publication Date: 2025-03-28PRIME REL ELECTRONIC TECH CO LTD
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Patent Information

Application Number
CN202411858741.3
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-17
Publication Date
2025-03-28

AI Technical Summary

Technical Problem

The existing power device testing equipment has inaccurate test results due to the structural fixation of the aging seat and the lack of heating and protection measures, resulting in inaccurate test results, limited testing flexibility and scope of application, and poses safety risks.

Method used

A low-complexity testing device including a test bench mechanism and a fixture mechanism is designed. By setting up a probe assembly and a clamping module, it directly contacts the pins of the single-tube power device, shortens the power loop distance and reduces stray inductance; at the same time, the device is compatible with single-tube power devices of multiple sizes, and has heating and protection measures to improve safety.

Benefits of technology

Improves detection accuracy, enhances device compatibility, stability and safety, and is suitable for a variety of single-tube power devices.

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Abstract

The invention relates to low-stray-inductance test equipment for a power device, and the equipment comprises a test bench mechanism, the test bench mechanism is provided with a test work station, a probe assembly is cooperatively installed in the test work station, and the top of the test bench mechanism is cooperatively provided with a clamp mechanism. The clamp mechanism comprises a toggle clamp module fixed to the top of the test bench mechanism, a clamping module is installed at the end of the toggle clamp module in a matched mode, the work end of the clamping module clamps a workpiece, and the toggle clamp module drives the clamping module to be connected with the test work station. Therefore, the workpiece fixed to the working end of the clamping module is in contact with the probe assembly in an attached mode, and then the workpiece is tested through the probe assembly. By arranging the test board mechanism and the clamp mechanism, stray inductance in the detection process of the single-tube power device can be reduced, and the detection accuracy is improved; and meanwhile, the equipment compatibility is good, the working stability is high, and the safety is high.
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