Test system, test method, chip and electronic equipment
By using separate current excitation paths and voltage measurement paths in integrated circuit test systems, the voltage drop problems caused by line resistance and contact impedance are solved, and the accuracy of test results and the reduction of hardware costs are achieved.
CN119716462APending Publication Date: 2025-03-28BEIJING X RING TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202311271532.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-09-27
- Publication Date
- 2025-03-28
AI Technical Summary
Technical Problem
During the integrated circuit testing process, the line resistance and contact impedance in the hardware cause voltage drop, affecting the accuracy of the test results.
Method used
By using the first Kelvin path and the second Kelvin path, the current excitation path and the voltage measurement are separated, so that the current signal and the voltage signal go through different paths respectively, ensuring that there is no current in the voltage measurement path, thereby avoiding the voltage drop.
Benefits of technology
Accurate testing of the chip is achieved, the accuracy of voltage measurement is ensured, the hardware cost is reduced, and the packaging limitation is exceeded.
✦ Generated by Eureka AI based on patent content.
Abstract
The invention discloses a test system, a test method, a chip and electronic equipment, and relates to the technical field of circuit, the test system comprises a test module, a chip, a connection module, a first Kelvin access and a second Kelvin access, firstly, the chip is respectively connected to the first Kelvin access and the second Kelvin access through the connection module; and controlling the test module to provide current excitation for the chip through the first Kelvin path and measure the output voltage of the chip through the second Kelvin path so as to test the chip. Compared with the prior art, a current excitation path and voltage measurement are separated by using the first Kelvin path and the second Kelvin path, so that a current signal and a voltage signal respectively pass through different paths, and the voltage measurement path can be ensured to have no current. The voltage of the connection point is not influenced by the line impedance, and the accuracy of the voltage is ensured.
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