Coding method, decoding method, device, test system, equipment and medium based on scan chain data
By setting different encoding formats for the control characters and data characters in the scan chain test data, the problem of inefficient testing of large data volumes is solved, and data volume compression and test time are achieved.
CN119740533APending Publication Date: 2025-04-01WESTERN CHINA SCI CITY INNOVATION CENT OF INTELLIGENT & CONNECTED VEHICLES (CHONGQING) CO LTD
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Patent Information
- Application Number
- CN202411713196.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-27
- Publication Date
- 2025-04-01
AI Technical Summary
Technical Problem
Due to the large amount of test data, the time of the test process increases and the test efficiency is inefficient.
Method used
By setting different encoding formats for the control characters and data characters in the test data, encode control characters with lower frequency of change using the encoding format of the control characters, and encode data characters with higher frequency of change using the encoding format of the data character, thereby realizing the compression of the data amount of the test data.
Benefits of technology
While ensuring the integrity of the test data, the data volume of the test data is compressed, shortening the test time and improving the testing efficiency.
✦ Generated by Eureka AI based on patent content.
Abstract
The embodiment of the present invention discloses an encoding method, decoding method, device, test system, equipment and medium based on scan chain data, the encoding method includes: comparing the numerical values of control characters in the current line and the previous line of test data; if the numerical value of the control character in the current line of test data does not change relative to the numerical value of the control character in the previous line of test data, then encoding the data characters in the current line of test data according to a preset data character encoding format; if it changes, then encoding the control characters in the current line of test data according to the preset control character encoding format, and encoding the data characters in the current line of test data according to the preset data character encoding format; based on the first communication relationship between the control character and the decoding module, sending the encoding result of the control character to the decoding module, and sending the encoding result of the data character to the decoding module. By adopting the above scheme, the problem of low chip testing efficiency is overcome.
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