Chip test equipment and test method

CN119768694AActive Publication Date: 2025-04-04CONTEMPORARY AMPEREX TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202380059273.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-01-20
Publication Date
2025-04-04
Estimated Expiration
2043-01-20

AI Technical Summary

Technical Problem

Existing chip testing technology relies on manual operation and has low intelligence, resulting in low testing efficiency. Especially in the hot-swapping test of complex chips, manual control of pin connection and disconnection is required, which wastes time and manpower.

Method used

By obtaining the pin connection control information of the target chip, the control processor intelligently controls the connection sequence between the chip's pins and the power supply module based on this information, and uses the switch matrix and discharge unit to implement automated testing, including multiple repeated tests to improve reliability. Reliability and accuracy.

Benefits of technology

It improves the efficiency and accuracy of chip testing, reduces the outflow of abnormal chips, reduces terminal application losses, and accelerates design implementation and the development of the new energy industry.

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Abstract

The embodiment of the invention provides chip testing equipment and a chip testing method. The test equipment comprises a processor used for obtaining pin connection control information of a target chip, and the pin connection control information is used for indicating a connection sequence of at least part of pins of the target chip and a power supply module; the processor is further used for controlling the at least part of the pins to be connected with the power supply module according to the connection sequence. According to the test equipment and the test method provided by the embodiment of the invention, the chip test efficiency can be improved.
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