Calibration method and calibration device of open-loop Hall current sensor and computer readable storage medium

Abstract

The invention relates to a calibration method and calibration equipment of an open-loop Hall current sensor and a computer readable storage medium. The calibration method of the open-loop Hall current sensor comprises the following steps: S1, selecting a current measurement range of the open-loop Hall current sensor, and selecting a plurality of current measurement points in the current measurement range; s2, traversing all current measurement points in the current measurement range, and obtaining a plurality of hysteresis loops of the corresponding open-loop Hall current sensor; s3, generating a basic hysteresis loop of the open-loop Hall current sensor based on the plurality of hysteresis loops; and S4, calculating an error between each current measurement point in each hysteresis loop and the basic hysteresis loop, and compensating and fitting the error of each current measurement point in each hysteresis loop to generate a plurality of corresponding calibration parameters. The output precision of the open-loop Hall current sensor can be effectively improved.

Description

Technical Field

[0001] The present invention relates to the technical field of current sensor testing, and in particular to a calibration method, a calibration device and a computer-readable storage medium for an open-loop Hall current sensor. Background Art

[0002] Current sensors can be used to measure the current passing through the busbar, and they have many forms. Open-loop Hall current sensors are one of them. Open-loop Hall current sensors have a simple structure and relatively low cost. However, this type of sensor has an obvious disadvantage. Due to the inherent hysteresis curve of the internal magnetic ring, the current measurement of the product output will be wrong, which makes the measurement accuracy low.

[0003] Figure 1 The schematic diagram of the structure of the open-loop Hall current sensor in the prior art is shown. As shown in the figure, the current open-loop Hall current sensor products adopt the following working principle: the C-shaped magnetic ring 101 gathers the magnetic field generated by the current in the copper bus 102 into a field strength in a specific direction; the field strength forms a Hall voltage after passing through the Hall device 103; then, it is amplified and calibrated by the Hall chip integrated circuit 104, and finally outputs a voltage of a specific ratio, and outputs an analog voltage signal through the electrical interface 105.

[0004] During the operation of the sensor, the magnetic field strength H is proportional to the current I flowing through the copper bus 102, that is, H = I / L, where L is the average length of the magnetic ring, which is related to the magnetic ring itself. At the same time, the analog voltage Vout output by the product is proportional to the magnetic field B, that is, Vout = B*S, where S is the calibration parameter in the chip, which is related to the calibration parameter. However, the C-shaped magnetic ring 101 of the open-loop Hall current sensor uses ferromagnetic material. Due to the characteristics of the ferromagnetic material itself, hysteresis will occur, causing the change of the magnetic induction intensity B in the magnetic body to lag behind the change of the magnetic field intensity H. Figure 2 yes Figure 1 Schematic diagram of the change of magnetic induction intensity B of the open-loop Hall current sensor with magnetic field intensity H. As shown in the figure, there is a nonlinear relationship between magnetic induction intensity B and magnetic field intensity H, and as the magnetic field intensity H increases or decreases, the path of magnetic induction intensity B changes accordingly. This phenomenon causes a large nonlinearity between the analog voltage output by the product and the measured current, especially in the case of low current, the error will be greater. In addition, the current Hall chip has only one calibration parameter, so the final product accuracy can only reach 5% or even 10%. Summary of the invention

[0005] In view of the above problems in the prior art, the present invention proposes a calibration method, a calibration device and a computer-readable storage medium for an open-loop Hall current sensor, which can effectively improve the output accuracy of the open-loop Hall current sensor.

[0006] Specifically, the present invention proposes a calibration method for an open-loop Hall current sensor, comprising the following steps:

[0007] S1, selecting a current measurement range of the open-loop Hall current sensor, and selecting a plurality of current measurement points within the current range;

[0008] S2, traversing all current measurement points within the current measurement range to obtain a plurality of hysteresis loops of the corresponding open-loop Hall current sensor;

[0009] S3, generating a basic hysteresis loop of the open-loop Hall current sensor based on the multiple hysteresis loops;

[0010] S4, calculating the error between each current measurement point in each hysteresis loop and the basic hysteresis loop, and compensating and fitting the error of each current measurement point in each hysteresis loop to generate corresponding multiple calibration parameters.

[0011] According to an embodiment of the present invention, in step S1, a current measurement range A of the open-loop Hall current sensor is selected, a measurement step C within the current measurement range is set, and according to the measurement step C, the number of current measurement points is determined.

[0012] According to an embodiment of the present invention, the current measurement range A is 110A, and the measurement step C is 10A.

[0013] According to one embodiment of the present invention, step S4 includes:

[0014] S41, measuring the magnetic field strength of one of the current measurement points;

[0015] S42, calculating a plurality of errors corresponding to the current measurement point and the basic hysteresis loop in the plurality of hysteresis loops;

[0016] S43, compensating and fitting the multiple errors to generate corresponding calibration parameters;

[0017] S44, repeating steps S41 to S43 to obtain multiple calibration parameters corresponding to the multiple current measurement points.

[0018] According to one embodiment of the present invention, assuming that the number of the multiple current measurement points is n, the number of hysteresis loops corresponding to all current measurement points is (n-1) / 2, and the number of corresponding calibration parameters obtained based on the n current measurement points is n(n+1) / 2;

[0019] Here, n is an odd number greater than or equal to 3.

[0020] According to one embodiment of the present invention, the calibration method further includes:

[0021] S5, writing the multiple calibration parameters into the chip of the open-loop Hall current sensor.

[0022] According to an embodiment of the present invention, the plurality of calibration parameters are written into the chip of the open-loop Hall current sensor by a programming method.

[0023] According to an embodiment of the present invention, the calibration method further comprises performing hysteresis compensation on the output results of the open-loop Hall current sensor at different temperatures according to the NTC inside the chip of the open-loop Hall current sensor.

[0024] The present invention also provides a calibration device for an open-loop Hall current sensor, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of any of the aforementioned calibration methods when executing the computer program.

[0025] The present invention also provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the calibration method as described in any one of the above items.

[0026] The present invention provides a calibration method, calibration equipment and computer-readable storage medium for an open-loop Hall current sensor, which selects multiple current measurement points to construct multiple hysteresis loops, calculates the error between the hysteresis loop and the basic hysteresis loop of each current measurement point, and generates corresponding multiple calibration parameters by compensating and fitting all errors, thereby effectively improving the output accuracy of the open-loop Hall current sensor.

[0027] It is to be understood that both the foregoing general description and the following detailed description of the present invention are exemplary and explanatory and are intended to provide further explanation of the invention as claimed. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The accompanying drawings are included to provide further explanation of the present invention, and are incorporated into and constitute a part of this application. The accompanying drawings illustrate embodiments of the present invention and together with the description serve to explain the principle of the present invention.

[0029] In the attached figure:

[0030] Figure 1 The schematic diagram shows the structure of an open-loop Hall current sensor in the prior art.

[0031] Figure 2 yes Figure 1 Schematic diagram of the change of magnetic induction intensity B of the open-loop Hall current sensor with the magnetic field intensity.

[0032] Figure 3 A flowchart of a calibration method for an open-loop Hall current sensor according to an embodiment of the present invention is shown.

[0033] Figure 4 A schematic diagram showing current measurement points according to an embodiment of the present invention is shown.

[0034] Figure 5 A schematic diagram showing multiple hysteresis loops according to an embodiment of the present invention.

[0035] Figure 6 A schematic diagram showing the error between each current measurement point in each hysteresis loop and the basic hysteresis loop according to an embodiment of the present invention.

[0036] Figure 7 A schematic diagram showing an error of an open-loop Hall current sensor according to an embodiment of the present invention when the calibration method of the present invention is not adopted.

[0037] Figure 8 A schematic diagram of the error of an open-loop Hall current sensor according to an embodiment of the present invention using the calibration method of the present invention is shown. DETAILED DESCRIPTION

[0038] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application may be combined with each other.

[0039] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present application and its application or use. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0040] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0041] Unless otherwise specifically stated, the relative arrangement, numerical expressions and numerical values ​​of the parts and steps set forth in these embodiments do not limit the scope of the application. Meanwhile, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to actual proportional relationships. The technology, methods and equipment known to those of ordinary skill in the relevant art may not be discussed in detail, but in appropriate cases, the technology, methods and equipment should be considered as a part of the specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, and therefore, once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0042] In the description of the present application, it should be understood that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present application and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction, and therefore cannot be understood as limiting the scope of protection of the present application; the directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.

[0043] In addition, it should be noted that the use of words such as "first" and "second" to define components is only for the convenience of distinguishing the corresponding components. If not otherwise stated, the above words have no special meaning and cannot be understood as limiting the scope of protection of this application. In addition, although the terms used in this application are selected from well-known and commonly used terms, some terms mentioned in the specification of this application may be selected by the applicant at his or her discretion, and their detailed meanings are explained in the relevant parts of the description of this article. In addition, it is required to understand this application not only by the actual terms used, but also by the meaning implied by each term.

[0044] Figure 3 A flow chart of a calibration method for an open-loop Hall current sensor according to an embodiment of the present invention is shown. As shown in the figure, a calibration method for an open-loop Hall current sensor includes the following steps:

[0045] S1, select the current measurement range of the open-loop Hall current sensor, and select multiple current measurement points within the current range. Specifically, the measurement range is determined based on the actual application scenario of the open-loop Hall current sensor. For example, if it is a battery management system for electric vehicles, it needs to monitor the charging and discharging current of the battery. Generally, the charging current may be around 0-100A, and the discharging current may be around 0-200A, then the current measurement range should cover this interval. Furthermore, if the current changes evenly throughout the range, the uniform distribution method can be used to select the current measurement points. If the current changes greatly in the key interval, more measurement points can be selected in this key interval.

[0046] In this example, the current measurement range is selected as 110A, the current measurement points are selected using the uniform distribution method, and the measurement step within the current measurement range is set to 10A. Figure 3 A schematic diagram of current measurement points of an embodiment of the present invention is shown. As shown in the figure, the specific current measurement points are 110A, 100A, ..., 0, 10A, ..., -100A, -110A, a total of 23 measurement points.

[0047] S2, traverse all current measurement points within the current measurement range, and obtain multiple hysteresis loops of the corresponding open-loop Hall current sensor. Figure 3 , taking the current measurement points 110A and -110A as an example. First, the reverse magnetization process is carried out, starting from 110A, and the current is reduced at a slow and steady rate (-10A) until it reaches -110A. In this process, the output magnetic field intensity H and the magnetic induction intensity B output by the sensor are collected. This step obtains the data of the reverse magnetization process, that is, the response data of the magnetic induction intensity B of the sensor when the magnetic field intensity H is reduced. Next, when the current reaches -110A, the current is increased at the same slow and steady rate (10A) until it returns to the maximum current 110A. Collect the output magnetic field intensity H and the magnetic induction intensity B output by the sensor. This step obtains the data of the forward magnetization process, that is, the response data of the magnetic induction intensity B of the sensor when the magnetic field intensity H increases. The magnetic field intensity H-magnetic induction intensity B data points collected in the reverse magnetization process and the forward magnetization process are plotted in the coordinate graph. Figure 4 The schematic diagram of multiple hysteresis loops of an embodiment of the present invention is shown. As shown in the figure, the magnetic field intensity H is the horizontal coordinate and the magnetic induction intensity B is the vertical coordinate. By connecting the data points of the reverse magnetization process in sequence, and then connecting the data points of the forward magnetization process in sequence, a hysteresis loop corresponding to the current measurement points 110A and -110A can be obtained. Figure 4Similarly, according to the measurement step of 10A, select the next set of current measurement points 100A and -100A for reverse magnetization and forward magnetization, and plot the magnetic field intensity H-magnetic induction intensity B data points collected in this process on the coordinate graph, and connect them to get another hysteresis loop. Traverse all current measurement points within the current measurement range, refer to Figure 4 , obtain all corresponding hysteresis loops.

[0048] S3, generates a basic hysteresis loop of an open-loop Hall current sensor based on multiple hysteresis loops. The basic hysteresis loop is generated based on multiple hysteresis loops using an average method or an envelope method. Figure 4 , the line passing through the zero point is the basic hysteresis loop.

[0049] S4, calculate the error between each current measurement point in each hysteresis loop and the basic hysteresis loop, compensate and fit the error of each current measurement point in each hysteresis loop to generate corresponding multiple calibration parameters. Compared with the prior art which only has one calibration parameter, this method solves the accuracy problem by calibrating more calibration parameters in sections. Based on the fact that the analog voltage Vout output by the open-loop Hall current sensor is proportional to the magnetic induction intensity B, that is, Vout = B*S, multiple calibration parameters S can effectively correct the output result, thereby improving the output accuracy.

[0050] In some examples, as described above, a current measurement range A of the open-loop Hall current sensor is selected, a measurement step C within the current measurement range is set, and the number of current measurement points is determined according to the measurement step C.

[0051] In some examples, step S4 includes:

[0052] S41, measuring the magnetic field strength at a current measurement point.

[0053] S42, calculating a plurality of errors corresponding to the current measurement point in the plurality of hysteresis loops and the basic hysteresis loop. That is, for each hysteresis loop, at the current measurement point, the difference between its magnetic induction intensity and the magnetic induction intensity of the basic hysteresis loop under the same magnetic field intensity is calculated as the error value. Figure 5 The schematic diagram shows the error between each current measurement point in each hysteresis loop and the basic hysteresis loop according to an embodiment of the present invention. As shown in the figure, the horizontal axis represents the measured current and the vertical axis represents the error.

[0054] S43, compensating and fitting multiple errors to generate corresponding calibration parameters. A variety of mathematical methods can be used for compensation fitting, and based on the function relationship obtained by the selected compensation fitting method, relevant parameters are extracted as calibration parameters.

[0055] S44, repeat steps S41 to S43 to obtain multiple calibration parameters corresponding to multiple current measurement points. Since different current measurement points generate different numbers of errors in multiple hysteresis loops, the larger the current at the current measurement point, the less error needs to be compensated for the fitting, and the smaller the current measurement point, the more error needs to be compensated for the fitting. The number of current measurement points is different from that of calibration parameters. Appropriately selected current measurement points are used to obtain calibration parameters with appropriate segmented compensation for subsequent correction of the sensor output results.

[0056] Preferably, assuming that the number of the multiple current measurement points is n, the number of hysteresis loops corresponding to all current measurement points is (n-1) / 2, and the number of corresponding calibration parameters obtained based on the n current measurement points is n(n+1) / 2;

[0057] Here, n is an odd number greater than or equal to 3.

[0058] Take the above selection of 23 current measurement points as an example. The number of current measurement points is 23, and the number of corresponding hysteresis loops is (23-1) / 2=11, and the number of corresponding calibration parameters obtained based on the 23 current measurement points is 23(23+1) / 2=276.

[0059] In some examples, the calibration method further includes:

[0060] S5, write multiple calibration parameters into the chip of the open-loop Hall current sensor. Multiple calibration parameters are transmitted one by one to the corresponding storage area of ​​the chip in a pre-set order. During the transmission process, the data transmission status should be monitored by the writing tool to ensure that each calibration parameter can be sent to the chip end accurately. The output result of the calibrated open-loop Hall current sensor will be corrected by these calibration parameters to improve the test accuracy.

[0061] In some examples, multiple calibration parameters are written into the chip of the open-loop Hall current sensor by a burn-in method. The burn-in method can accurately write the calibration parameters into the chip and ensure the integrity of the data. The calibration parameters written by the burn-in method are usually stored in the non-volatile memory of the chip (such as EEPROM or flash memory). These storage media have good stability. Under normal working conditions, even if the sensor is powered off, the stored calibration parameters will not be lost, thereby ensuring stable and reliable operation of the sensor.

[0062] In some examples, the calibration method also includes performing hysteresis compensation on the output results of the open-loop Hall current sensor at different temperatures based on the NTC inside the chip of the open-loop Hall current sensor. The output of the open-loop Hall current sensor will be affected by temperature changes. The NTC inside the chip can sense temperature changes, thereby achieving temperature-based hysteresis compensation. At different temperatures, the hysteresis characteristics of the open-loop Hall current sensor will be different. By monitoring the temperature in real time and performing compensation through NTC, the hysteresis error caused by temperature changes can be effectively reduced. In addition, hysteresis compensation through NTC can make the performance of the sensor more stable in different temperature environments.

[0063] Figure 7 A schematic diagram showing an error of an open-loop Hall current sensor according to an embodiment of the present invention when the calibration method of the present invention is not adopted. Figure 8 The error diagram of the open-loop Hall current sensor of an embodiment of the present invention using the calibration method of the present invention is shown. As shown in the figure, the measurement error results of different current measurement points under different hysteresis loops are measured respectively. Figure 7 It can be seen from the figure that the forward error before compensation is mostly distributed in the range of 50-150 mA, while the reverse voltage error is mostly distributed below 100 mA, with the largest error being around 150 mA. Figure 8 All errors are distributed below 40mA, and the largest error is around 60mA, indicating that the output accuracy of the open-loop Hall current sensor has been greatly improved.

[0064] The present invention also provides a calibration device for an open-loop Hall current sensor, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of any of the above-mentioned methods for calibrating an open-loop Hall current sensor are implemented.

[0065] The present invention also provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned methods for calibrating an open-loop Hall current sensor are implemented.

[0066] Among them, the specific implementation methods and technical effects of the calibration equipment and computer-readable storage medium of the open-loop Hall current sensor can all be referred to the embodiments of the detection method provided by the above-mentioned present invention, and will not be repeated here.

[0067] Those skilled in the art will further appreciate that the various illustrative logic blocks, modules, circuits, and algorithm steps described in conjunction with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or a combination of the two. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps are generally described above in terms of their functionality. Whether such functionality is implemented as hardware or software depends on the specific application and the design constraints imposed on the overall system. The technician may implement the described functionality in different ways for each specific application, but such implementation decisions should not be interpreted as resulting in a departure from the scope of the present invention.

[0068] The various illustrative logic modules and circuits described in conjunction with the embodiments disclosed herein may be implemented or executed with a general purpose processor, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination thereof designed to perform the functions described herein. A general purpose processor may be a microprocessor, but in the alternative, the processor may be any conventional processor, controller, microcontroller, or state machine. The processor may also be implemented as a combination of computing devices, such as a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in cooperation with a DSP core, or any other such configuration.

[0069] The steps of the method or algorithm described in conjunction with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. The software module may reside in a RAM memory, a flash memory, a ROM memory, an EPROM memory, an EEPROM memory, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art. An exemplary storage medium is coupled to a processor so that the processor can read and write information from / to the storage medium. In an alternative, a storage medium may be integrated into a processor. The processor and the storage medium may reside in an ASIC. The ASIC may reside in a user terminal. In an alternative, the processor and the storage medium may reside in a user terminal as discrete components.

[0070] In one or more exemplary embodiments, the functions described may be implemented in hardware, software, firmware, or any combination thereof. If implemented as a computer program product in software, each function may be stored on or transmitted by a computer-readable medium as one or more instructions or codes. Computer-readable media include both computer storage media and communication media, including any medium that facilitates the transfer of a computer program from one place to another. Storage media may be any available medium that can be accessed by a computer. As an example and not limitation, such a computer-readable medium may include RAM, ROM, EEPROM, CD-ROM or other optical disk storage, disk storage or other magnetic storage device, or any other medium that can be used to carry or store the desired program code in the form of an instruction or data structure and can be accessed by a computer. Any connection is also properly referred to as a computer-readable medium. For example, if the software is transmitted from a website, a server, or other remote source using a coaxial cable, a fiber optic cable, a twisted pair, a digital subscriber line (DSL), or wireless technologies such as infrared, radio, and microwaves, the coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwaves are included in the definition of the medium. Disk and disc as used herein include compact disc (CD), laser disc, optical disc, digital versatile disc (DVD), floppy disk and Blu-ray disc, wherein disk often reproduces data magnetically, while disc reproduces data optically with lasers. Combinations of the above should also be included within the scope of computer-readable media.

[0071] It will be apparent to those skilled in the art that various modifications and variations may be made to the above exemplary embodiments of the present invention without departing from the spirit and scope of the present invention. Therefore, it is intended that the present invention covers modifications and variations of the present invention that fall within the scope of the appended claims and their equivalent technical solutions.

Claims

1. A calibration method for an open-loop Hall current sensor, comprising the following steps: S1, selecting a current measurement range of the open-loop Hall current sensor, and selecting a plurality of current measurement points within the current range; S2, traversing all current measurement points within the current measurement range to obtain a plurality of hysteresis loops of the corresponding open-loop Hall current sensor; S3, generating a basic hysteresis loop of the open-loop Hall current sensor based on the multiple hysteresis loops; S4, calculating the error between each current measurement point in each hysteresis loop and the basic hysteresis loop, and compensating and fitting the error of each current measurement point in each hysteresis loop to generate corresponding multiple calibration parameters.

2. The calibration method according to claim 1, characterized in that: In step S1 , a current measurement range A of the open-loop Hall current sensor is selected, a measurement step length C within the current measurement range is set, and according to the measurement step length C, the number of current measurement points is determined.

3. The calibration method according to claim 2, characterized in that: The current measurement range A is 110A, and the measurement step C is 10A.

4. The calibration method according to claim 1, characterized in that: Step S4 includes: S41, measuring the magnetic field strength of one of the current measurement points; S42, calculating a plurality of errors corresponding to the current measurement point and the basic hysteresis loop in the plurality of hysteresis loops; S43, compensating and fitting the multiple errors to generate corresponding calibration parameters; S44, repeating steps S41 to S43 to obtain multiple calibration parameters corresponding to the multiple current measurement points.

5. The calibration method according to claim 1, characterized in that: Assuming that the number of the multiple current measurement points is n, the number of hysteresis loops corresponding to all current measurement points is (n-1) / 2, and the number of corresponding calibration parameters obtained based on the n current measurement points is n(n+1) / 2; Here, n is an odd number greater than or equal to 3.

6. The calibration method according to claim 1, characterized in that: Also includes: S5, writing the multiple calibration parameters into the chip of the open-loop Hall current sensor.

7. The calibration method according to claim 6, characterized in that: The multiple calibration parameters are written into the chip of the open-loop Hall current sensor by a burn-in method.

8. The calibration method according to claim 1, characterized in that: The method also includes performing hysteresis compensation on the output results of the open-loop Hall current sensor at different temperatures according to the NTC inside the chip of the open-loop Hall current sensor.

9. A calibration device for an open-loop Hall current sensor, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the calibration method according to any one of claims 1 to 5 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the calibration method according to any one of claims 1 to 5 are implemented.

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