A method and system for testing performance of a circuit breaker, and a photovoltaic circuit breaker

Abstract

This invention discloses a performance testing method, system, and photovoltaic circuit breaker for circuit breakers. The method includes: adjusting the test environment of a sample circuit breaker using temperature and humidity data; supplying power to the sample circuit breaker using a power supply load adjustment scheme; and recording the change curves of the test parameters of the sample circuit breaker. The method involves analyzing the change curves of the test parameters and establishing a circuit breaker failure rate database based on the failure rate database and historical usage data of the sample circuit breakers. A third simulated loss change curve of the circuit breaker under test is plotted based on the failure rate database and historical usage data of the sample circuit breakers, and the predicted lifespan data of the circuit breaker under test is calculated. The predicted lifespan data of the circuit breaker under test is compared with a preset rated lifespan range to determine the performance level of the circuit breaker under test. Finally, the method determines the performance test data of the same batch of circuit breakers based on the distribution ratio of each performance level of the sample circuit breakers. This invention can improve the accuracy of actual performance test data of photovoltaic circuit breakers under the influence of environmental factors.

Description

Technical Field

[0001] This application relates to the field of circuit breaker performance testing technology, and more specifically, to a circuit breaker performance testing method, system, and photovoltaic circuit breaker. Background Technology

[0002] With the widespread application of photovoltaic technology, photovoltaic circuit breakers, as crucial protective devices in photovoltaic systems, directly impact the safe and stable operation of the system. However, the actual performance of photovoltaic circuit breakers during use is affected by environmental factors (such as temperature and humidity), which may cause them to fail to achieve the expected performance and extend their service life. Traditional testing methods are often limited to performance testing under static or single operating conditions, failing to comprehensively reflect the performance of photovoltaic circuit breakers in complex and variable real-world working environments.

[0003] Therefore, the existing technology has defects and urgently needs improvement. Summary of the Invention

[0004] In view of the above problems, the purpose of this invention is to provide a performance testing method, system and photovoltaic circuit breaker for circuit breakers, so as to improve the accuracy of actual performance test data of photovoltaic circuit breakers under the influence of environmental factors.

[0005] The first aspect of this invention provides a performance testing method for a circuit breaker, comprising:

[0006] Based on a preset quantity threshold, multiple circuit breakers are randomly selected from the same batch of circuit breakers to be determined as sample circuit breakers;

[0007] Multiple sets of temperature and humidity data were generated based on the rated operating environment range of the sample circuit breakers, and the test environment for each sample circuit breaker was adjusted accordingly.

[0008] A power supply load adjustment scheme is generated by generating multiple sets of preset power supply loads, power is supplied to each sample circuit breaker, and the change curve of the detection parameters of each sample circuit breaker is recorded.

[0009] By analyzing the variation curves of the detection parameters, the failure rate of the sample circuit breaker at different preset power supply load corresponding detection stages was determined.

[0010] A circuit breaker failure rate database is established based on the failure rates of sample circuit breakers in different temperature and humidity environments and different preset power supply loads corresponding to the detection stages; the failure rate corresponding to the preset power supply loads includes the fluctuating failure rate during the switching process of the preset power supply loads corresponding to the detection stages and the stable failure rate during the continuous process of the preset power supply loads corresponding to the detection stages.

[0011] Based on the circuit breaker failure rate database and the historical usage data of the same batch of circuit breakers, the first simulated loss change curve and the second simulated loss change curve of the circuit breaker under test are plotted.

[0012] The first simulated loss change curve and the second simulated loss change curve are added together based on the power supply time to obtain the third simulated loss change curve;

[0013] The predicted lifespan data of the circuit breaker under test is calculated based on the third simulated loss variation curve.

[0014] The predicted lifespan data of the circuit breaker under test is compared with the preset rated lifespan range to determine the performance level of the circuit breaker under test. The performance levels of the circuit breaker under test include Level 1, Level 2, Level 3, and Level 4.

[0015] In this scheme, the generation of multiple sets of temperature and humidity data based on the rated operating environment range of the sample circuit breakers, and the subsequent adjustment of the test environment for each sample circuit breaker, includes:

[0016] Multiple sets of temperature data and multiple sets of humidity data are selected based on the rated operating environment range of the sample circuit breaker; the rated operating environment range includes at least the rated temperature range and the rated humidity range.

[0017] The multiple sets of temperature data and multiple sets of humidity data are randomly combined to obtain multiple sets of temperature and humidity data; the number of multiple sets of temperature and humidity data is determined according to the number of sample circuit breakers.

[0018] The test environment for the sample circuit breakers was adjusted based on the multiple sets of temperature and humidity data.

[0019] In this scheme, the step of generating a power supply load adjustment scheme through multiple sets of preset power supply loads, supplying power to each sample circuit breaker, and recording the change curve of the detection parameters of each sample circuit breaker includes:

[0020] Obtain multiple sets of preset power supply loads;

[0021] Based on a preset time interval, the multiple groups of preset power supply loads are randomly combined in sequence to obtain a power supply load adjustment scheme.

[0022] The sample circuit breaker was powered on according to the power supply load adjustment scheme. Various detection parameters of the sample circuit breaker were recorded from the start of power-on to the stable power-on condition, and the change curves of the detection parameters were plotted. The detection parameters include the internal temperature of the sample circuit breaker and the upper and lower section currents of the sample circuit breaker.

[0023] The power supply load of the sample circuit breaker is adjusted according to the power supply load adjustment scheme based on the preset time interval. Various test parameters of the sample circuit breaker are recorded and the change curves of the test parameters are plotted.

[0024] In this scheme, the step of determining the failure rate of the sample circuit breaker at different preset power supply loads by analyzing the change curves of the detection parameters includes:

[0025] The first damage value of the detection stage corresponding to the preset power supply load is determined by weighting the first data difference before and after the stage adjustment of each detection data in the detection stage corresponding to the preset power supply load and the second data difference between each detection data and the corresponding preset standard parameter. The first data difference of the detection data before and after the stage adjustment is the data difference between the detection data of the current detection stage at the preset time and the detection data at the end time of the previous detection stage.

[0026] The fluctuation damage rate during the switching process of the detection stage corresponding to the preset power supply load is determined based on the first damage value of the detection stage corresponding to the preset power supply load and the first ratio of the time difference between the preset time and the start time of the current detection stage.

[0027] The second damage value for the detection stage corresponding to the preset power supply load is determined by weighting the third data difference of each detection data during the stage's duration and the second data difference between each detection data and the corresponding preset standard parameter. The third data difference of the detection data during the stage's duration is the data difference between the detection data at the end time of the current detection stage and the detection data at the preset time.

[0028] The steady-state damage rate during the continuous process of the detection phase corresponding to the preset power supply load is determined based on the second ratio of the second damage value of the detection phase corresponding to the preset power supply load and the second ratio of the time difference between the current detection phase end time and the preset time.

[0029] In this scheme, the step of plotting the first simulated loss change curve and the second simulated loss change curve of the circuit breaker under test based on the circuit breaker failure rate database and the historical usage data of the same batch of circuit breakers includes:

[0030] Obtain historical usage data for the circuit breakers in the same batch;

[0031] Based on the historical usage data of the same batch of circuit breakers, the simulated load curve of the circuit where the circuit breaker under test is located and the simulated environmental parameter curve of the environment where the circuit breaker under test is located are determined.

[0032] The simulated load curve is divided into multiple first intervals according to a preset segmentation standard, and the simulated environmental parameter curve is divided into multiple second intervals.

[0033] Analyze the plurality of first intervals and the plurality of second intervals, and bind the first intervals and second intervals that have overlapping areas to each other;

[0034] The time interval corresponding to the overlapping region is defined as the overlapping time interval M. n ;

[0035] Based on the overlapping time interval M n Analyze the simulated load curves within the time frame to determine the overlapping time interval M. n Maximum load Q max Minimum load Q min and average load Q ave ;

[0036] Based on the overlapping time interval M n Analyze the simulated environmental parameter curves within the time frame to determine the overlapping time interval M. n Maximum environmental parameter P max Minimum environmental parameter P min and average environmental parameter P ave ;

[0037] By analyzing the overlapping time interval M n Maximum load Q max Minimum load Q min and average load Q ave Perform calculations to determine the first load Q1;

[0038]

[0039] By analyzing the maximum environmental parameter P within the overlapping time interval max Minimum environmental parameter P min and average environmental parameter P ave Perform calculations to determine the first environmental parameter P1;

[0040]

[0041] Based on the circuit breaker failure rate database, the steady-state failure rate corresponding to the sample circuit breakers under the first load and first environmental parameters is determined as the overlapping time interval M. n The first damage rate;

[0042] The first simulated loss variation curve is plotted based on the first damage rate across all overlapping time intervals.

[0043] This plan also includes:

[0044] Based on the overlapping time interval M n Overlapping time interval M n-1 Calculate the overlapping time interval M n The first load difference and the first environmental parameter difference;

[0045] Based on the circuit breaker failure rate database, according to the overlapping time interval M n The first load, first environmental parameters, first load difference, and first environmental parameter difference are analyzed, and the fluctuation damage rate corresponding to the detection stage of the preset power supply load is determined as the overlapping time interval M. n The second damage rate within a preset time interval;

[0046] The second simulated loss change curve is plotted based on the second damage rate within the preset time interval for all overlapping time intervals.

[0047] In this scheme, comparing the predicted lifespan data of the circuit breaker under test with the preset rated lifespan range to determine the performance level of the circuit breaker under test includes:

[0048] When the predicted lifespan data of the circuit breaker under test is less than the minimum value of the preset rated lifespan range, the performance level of the circuit breaker under test is determined to be the fourth level.

[0049] When the predicted lifespan data of the circuit breaker under test is greater than the maximum value of the preset rated lifespan range, the performance level of the circuit breaker under test is determined to be the first level.

[0050] When the predicted life data of the circuit breaker under test is within the preset rated life range, the performance level of the circuit breaker under test is determined according to the third ratio of the predicted life data of the circuit breaker under test and the maximum value of the preset rated life range.

[0051] If the third ratio is greater than the first preset ratio threshold, then the performance level of the circuit breaker under test is the first level.

[0052] If the third ratio is less than or equal to the first preset ratio threshold and greater than the second preset ratio threshold, then the performance level of the circuit breaker under test is the second level.

[0053] If the third ratio is less than or equal to the second preset ratio threshold, then the performance level of the circuit breaker under test is the third level.

[0054] A second aspect of the present invention provides a performance testing system for circuit breakers, comprising:

[0055] The circuit breaker testing module is used to randomly select multiple circuit breakers from the same batch based on a preset quantity threshold to determine them as sample circuit breakers; generate multiple sets of temperature and humidity data according to the rated operating environment range of the sample circuit breakers, and adjust the test environment of each sample circuit breaker in turn; generate a power supply load adjustment scheme through multiple preset power supply loads, supply power to each sample circuit breaker, and record the test parameter change curve of each sample circuit breaker; by analyzing the test parameter change curves, determine the failure rate of the sample circuit breakers at different test stages corresponding to different preset power supply loads;

[0056] The database establishment module is used to establish a circuit breaker failure rate database based on the failure rates of sample circuit breakers in different temperature and humidity environments and different preset power supply loads corresponding to the detection stages; the failure rate corresponding to the preset power supply loads includes the fluctuating failure rate during the switching process of the preset power supply loads corresponding to the detection stages and the stable failure rate during the continuous process of the preset power supply loads corresponding to the detection stages.

[0057] The first loss curve plotting module is used to plot the first simulated loss change curve and the second simulated loss change curve of the circuit breaker under test based on the circuit breaker failure rate database and the historical usage data of the same batch of circuit breakers.

[0058] The second loss curve plotting module is used to add the first simulated loss change curve and the second simulated loss change curve based on the power supply time to obtain the third simulated loss change curve.

[0059] The circuit breaker life prediction module is used to calculate the predicted life data of the circuit breaker under test based on the third simulated loss change curve.

[0060] The circuit breaker performance analysis module is used to compare the predicted lifespan data of the circuit breaker under test with the preset rated lifespan range to determine the performance level of the circuit breaker under test. The performance levels of the circuit breaker under test include Level 1, Level 2, Level 3, and Level 4.

[0061] A third aspect of the present invention provides a photovoltaic circuit breaker, characterized in that the photovoltaic circuit breaker includes a performance testing system for the circuit breaker.

[0062] This invention discloses a performance testing method, system, and photovoltaic circuit breaker for circuit breakers. The method includes: adjusting the test environment of a sample circuit breaker using temperature and humidity data; supplying power to the sample circuit breaker using a power supply load adjustment scheme; and recording the change curves of the test parameters of the sample circuit breaker. The method involves analyzing the change curves of the test parameters and establishing a circuit breaker failure rate database based on the failure rate database and historical usage data of the sample circuit breakers. A third simulated loss change curve of the circuit breaker under test is plotted based on the failure rate database and historical usage data of the sample circuit breakers, and the predicted lifespan data of the circuit breaker under test is calculated. The predicted lifespan data of the circuit breaker under test is compared with a preset rated lifespan range to determine the performance level of the circuit breaker under test. Finally, the method determines the performance test data of the same batch of circuit breakers based on the distribution ratio of each performance level of the sample circuit breakers. This invention can improve the accuracy of actual performance test data of photovoltaic circuit breakers under the influence of environmental factors. Attached Figure Description

[0063] Figure 1 A flowchart of a performance testing method for a circuit breaker provided by the present invention is shown;

[0064] Figure 2 A flowchart of the method for plotting the change curve of detection parameters provided by the present invention is shown;

[0065] Figure 3 A flowchart of the method for determining the performance level of a circuit breaker under test provided by the present invention is shown;

[0066] Figure 4 A block diagram of a circuit breaker performance testing system provided by the present invention is shown. Detailed Implementation

[0067] To better understand the above-mentioned objectives, features, and advantages of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments can be combined with each other.

[0068] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and therefore the scope of protection of the invention is not limited to the specific embodiments disclosed below.

[0069] Figure 1 A flowchart of a performance testing method for a circuit breaker provided by the present invention is shown.

[0070] like Figure 1 As shown, this invention discloses a performance testing method for circuit breakers, comprising:

[0071] S102, Based on a preset quantity threshold, randomly select multiple circuit breakers from the same batch of circuit breakers to determine them as sample circuit breakers;

[0072] S104, generate multiple sets of temperature and humidity data based on the rated operating environment range of the sample circuit breakers, and adjust the test environment of each sample circuit breaker in turn;

[0073] S106: Generate a power supply load adjustment scheme through multiple sets of preset power supply loads, supply power to each sample circuit breaker, and record the change curve of the detection parameters of each sample circuit breaker.

[0074] S108, by analyzing the change curves of the detection parameters, the damage rate of the sample circuit breaker at different preset power supply load corresponding detection stages is determined;

[0075] S110, establish a circuit breaker failure rate database based on the failure rates of sample circuit breakers in different temperature and humidity environments and different preset power supply loads corresponding to the detection stages; the failure rate corresponding to the preset power supply loads includes the fluctuating failure rate during the switching process of the preset power supply loads corresponding to the detection stages and the stable failure rate during the continuous process of the preset power supply loads corresponding to the detection stages.

[0076] S112. Based on the circuit breaker failure rate database and historical usage data of the same batch of circuit breakers, plot the first simulated loss change curve and the second simulated loss change curve of the circuit breaker under test.

[0077] S114, Based on the power supply time, add the first simulated loss change curve and the second simulated loss change curve to obtain the third simulated loss change curve;

[0078] S116, Calculate the predicted lifespan data of the circuit breaker under test based on the third simulated loss change curve;

[0079] S118 compares the predicted lifespan data of the circuit breaker under test with the preset rated lifespan range to determine the performance level of the circuit breaker under test. The performance levels of the circuit breaker under test include Level 1, Level 2, Level 3, and Level 4.

[0080] According to an embodiment of the present invention, based on the model and production batch of the circuit breaker under test, multiple circuit breakers are selected as sample circuit breakers from the same batch (and of the same model). The number of selections is determined by a preset threshold number set by the system. Multiple sets of temperature data and multiple sets of humidity data are selected from the rated temperature range and rated humidity range of the sample circuit breakers, respectively, and randomly combined in pairs. Based on the number of sample circuit breakers, a corresponding number of temperature and humidity data are generated, and the test environment for each sample circuit breaker is adjusted accordingly. Multiple preset power supply loads are selected and randomly sorted and combined to generate a power supply load adjustment scheme. The sample circuit breaker is powered through the first preset power supply load in the power supply load adjustment scheme, and the preset power supply loads in the power supply load adjustment scheme are sequentially disconnected according to preset time intervals. During the power supply process, various detection parameters such as the internal temperature and upper and lower segment currents of the sample circuit breaker are recorded, and corresponding detection parameter change curves are plotted. By analyzing the preset standard parameters corresponding to each preset power supply load stage, the previous preset power supply load stage, and various test data, the failure rate of the sample circuit breaker in different preset power supply load test stages is obtained. A circuit breaker failure rate database is established by collecting the failure rates of the sample circuit breaker in different temperature and humidity environments and different preset power supply load test stages.

[0081] By analyzing historical usage data from circuit breakers of the same model and batch as the circuit breaker under test, the actual operating environment and connection circuit of the circuit breaker under test are simulated. The simulated load curve of the circuit where the circuit breaker under test is located and the simulated environmental parameter curve of the environment where the circuit breaker under test is located are determined. Based on the energizing time, the simulated load curve and simulated environmental parameter curve are analyzed, and each overlapping region is determined as an overlapping time interval. The first load and first environmental parameter of each overlapping time interval are calculated. A preset power supply load with the same power supply load and environmental parameters is selected from the circuit breaker failure rate database. The stable failure rate under this preset power supply load is determined as the first failure rate of each overlapping time interval. Based on each overlapping time interval and the first load and first environmental parameter of the corresponding previous overlapping time interval, the first load difference and the first environmental parameter difference are calculated. A preset power supply load with the same power supply load and environmental parameters and the same power supply load and environmental parameter changes as the previous power supply stage is selected from the circuit breaker failure rate database. The fluctuating failure rate under this preset power supply load is determined as the second failure rate of each overlapping time interval. Based on the power supply time, first and second simulated loss change curves are plotted using a first damage rate and a second damage rate, respectively. These curves are then summed to determine the third simulated loss change curve for the circuit breaker under test. The area formed by the third simulated loss change curve and the coordinate axis is calculated based on the power supply time. When the area meets the system's preset area, the power supply time at this point is determined as the end-of-life time of the circuit breaker under test, indicating that the circuit breaker cannot meet the expected performance. The time difference between the end-of-life time of the circuit breaker under test and the start-of-power time is determined as the predicted lifespan data for the circuit breaker under test.

[0082] The first, second, and third levels represent circuit breakers that meet their expected operating requirements, while the fourth level represents circuit breakers that do not meet their expected operating requirements. The longer the predicted lifespan of the circuit breaker under test, the higher its performance level.

[0083] According to an embodiment of the present invention, multiple sets of temperature and humidity data are generated based on the rated operating environment range of the sample circuit breakers, and the test environment of each sample circuit breaker is adjusted sequentially, including:

[0084] Select multiple sets of temperature data and multiple sets of humidity data based on the rated operating environment range of the sample circuit breaker; the rated operating environment range should include at least the rated temperature range and the rated humidity range.

[0085] Multiple sets of temperature data and multiple sets of humidity data are randomly combined to obtain multiple sets of temperature and humidity data; the number of multiple sets of temperature and humidity data is determined according to the number of sample circuit breakers.

[0086] The test environment for the sample circuit breakers was adjusted based on multiple sets of temperature and humidity data.

[0087] It should be noted that the environment's impact on photovoltaic circuit breakers mainly manifests in ambient temperature, humidity, dust, and pollution. For example, excessively high temperatures can cause thermal expansion of the circuit breaker's components, increasing the distance between electrical contacts and potentially leading to poor contact or loosening of electrical connections, thus affecting the circuit breaker's normal operation. Simultaneously, the insulating materials in the circuit breaker (such as insulating bushings, plastic parts, and bakelite) are also prone to aging and damage, affecting the circuit breaker's service life. Excessive humidity can cause a decline in the performance of the circuit breaker's insulating materials, increasing the risk of short circuits. Furthermore, humidity can also cause corrosion of the internal metal components of the circuit breaker, affecting its conductivity and mechanical strength.

[0088] The rated operating environment range refers to the environmental data marked on the circuit breaker, including at least the recommended rated temperature range and the recommended rated humidity range. Multiple sets of temperature and humidity data are selected from the rated temperature and humidity ranges according to system preset rules (such as proportional selection or random selection). The total number of temperature and humidity data sets generated is determined based on the total number of sample circuit breakers. Some or all of the multiple sets of temperature and humidity data are randomly selected and combined. Each set of temperature and humidity data includes one set of temperature data and one set of humidity data. Finally, the test environment for each sample circuit breaker is adjusted according to the generated multiple sets of temperature and humidity data, with each sample circuit breaker's test environment corresponding to a different set of temperature and humidity data.

[0089] Figure 2 A flowchart of the method for plotting the change curve of detection parameters provided by the present invention is shown.

[0090] like Figure 2 As shown in the embodiment of the present invention, a power supply load adjustment scheme is generated by generating multiple sets of preset power supply loads, power is supplied to each sample circuit breaker, and the change curve of the detection parameters of each sample circuit breaker is recorded, including:

[0091] S202, obtain multiple preset power supply loads;

[0092] S204, Based on a preset time interval, multiple preset power supply loads are randomly combined in sequence to obtain a power supply load adjustment scheme;

[0093] S206. Power the sample circuit breaker according to the power supply load adjustment scheme, record the various test parameters of the sample circuit breaker from the start of power-on to the stable power-on condition, and plot the test parameter change curves; the test parameters include the internal temperature of the sample circuit breaker and the upper and lower section currents of the sample circuit breaker.

[0094] S208, adjust the power supply load of the sample circuit breaker according to the power supply load adjustment scheme based on the preset time interval, record the various test parameters of the sample circuit breaker and continue to draw the test parameter change curves.

[0095] It should be noted that the preset power supply load and preset time interval are set by those skilled in the art according to actual needs. The preset power supply load is set based on the rated load of the circuit breaker, such as 50%, 70%, 80%, 90%, 100%, 120% of the rated load, etc., and the preset time interval is the continuous power supply time for each preset power supply load. During the random sequential combination of multiple sets of preset power supply loads, each preset power supply load may appear once or multiple times. The first set of preset power supply loads in the power supply load adjustment scheme is used to power the sample circuit breaker. The power supply current is determined by the product of the preset power supply load and the rated current of the circuit breaker. Based on the preset time interval, the power supply parameters of the sample circuit breaker are adjusted sequentially according to the combination order of the preset power supply loads in the power supply load adjustment scheme. During the power supply process, multiple detection parameters, such as the internal temperature of the sample circuit breaker and the upper and lower segment currents of the sample circuit breaker, are recorded. Curves showing the changes in the internal temperature and the upper and lower segment currents of the sample circuit breaker, along with other detection parameters, are plotted according to the cumulative energizing time.

[0096] In addition, when there are multiple sample circuit breakers of the same model in the current test environment, each sample circuit breaker is powered by a different power supply load adjustment scheme, so as to observe the changes in the circuit breaker detection parameters under different load switching conditions in the same environment.

[0097] According to an embodiment of the present invention, the failure rate of the sample circuit breaker at different preset power supply loads is determined by analyzing the change curves of the detection parameters, including:

[0098] The first damage value of the detection data corresponding to the preset power supply load in the detection stage is determined by weighting the first data difference before and after the stage adjustment and the second data difference between each detection data and the corresponding preset standard parameter. The first data difference before and after the stage adjustment is the data difference between the detection data of the current detection stage at the preset time and the detection data at the end time of the previous detection stage.

[0099] The fluctuation damage rate during the switching process of the detection stage corresponding to the preset power supply load is determined based on the first damage value of the detection stage corresponding to the preset power supply load and the first ratio of the time difference between the preset time and the start time of the current detection stage.

[0100] The third data difference of each test data in the test stage corresponding to the preset power supply load during the duration of the stage and the second data difference of each test data with the corresponding preset standard parameter are weighted and calculated to determine the second damage value of the test stage corresponding to the preset power supply load; the third data difference of the test data during the duration of the stage is the data difference between the test data at the end time of the current test stage and the test data at the preset time.

[0101] The steady-state failure rate during the continuous process of the detection phase corresponding to the preset power supply load is determined by the second ratio of the second damage value of the detection phase corresponding to the preset power supply load and the time difference between the current detection phase end time and the preset time.

[0102] It should be noted that the first data difference is the difference between the detection time of the center time of the current detection stage and the detection data of the center time of the previous detection stage, and the second data difference is the difference between the center detection time of the current detection stage and the corresponding preset standard parameter.

[0103] The weighted calculation of the first data difference before and after stage adjustment and the second data difference between each test data and the corresponding preset standard parameter for each test data in the test stage corresponding to the preset power supply load is as follows: The first and second data differences of each test data are multiplied by their corresponding first influence weights, and the calculation results are accumulated to determine the first influence score of each test data. The first influence scores of all test data are then accumulated to determine the first damage value for the test stage corresponding to the preset power supply load. The sum of all first influence weights is 1.

[0104] The weighted calculation of the third data difference and the second data difference between each test data point and the corresponding preset standard parameter during the testing phase corresponding to the preset power supply load is as follows: The third data difference and the second data difference of each test data point are multiplied by their corresponding second influence weights, and the results are summed to determine the second influence score for each test data point. The second influence scores of all test data points are then summed to determine the second damage value for the testing phase corresponding to the preset power supply load. The sum of all second influence weights is 1.

[0105] The preset standard parameters are the theoretical values ​​of the test data of the sample circuit breaker under the current environment and power supply load.

[0106] According to an embodiment of the present invention, a first simulated loss variation curve and a second simulated loss variation curve of the circuit breaker under test are plotted based on a circuit breaker failure rate database and historical usage data of circuit breakers from the same batch, including:

[0107] Obtain historical usage data for circuit breakers from the same batch;

[0108] Based on the historical usage data of the same batch of circuit breakers, the simulated load curve of the circuit where the circuit breaker under test is located and the simulated environmental parameter curve of the environment where the circuit breaker under test is located are determined.

[0109] The simulated load curve is divided into multiple first intervals according to the preset segmentation criteria, and the simulated environmental parameter curve is divided into multiple second intervals.

[0110] Analyze multiple first intervals and multiple second intervals, and bind the first intervals and second intervals with overlapping areas to each other;

[0111] The time interval corresponding to the overlapping region is defined as the overlapping time interval M. n ;

[0112] Based on the overlapping time interval M n Analyze the simulated load curves within the time frame to determine the overlapping time interval M. n Maximum load Q max Minimum load Q min and average load Q ave ;

[0113] Based on the overlapping time interval M n Analyze the simulated environmental parameter curves within the time frame to determine the overlapping time interval M. n Maximum environmental parameter P max Minimum environmental parameter P min and average environmental parameter P ave ;

[0114] By analyzing the overlapping time intervals M n Maximum load Q max Minimum load Q min and average load Q ave Perform calculations to determine the first load Q1;

[0115]

[0116] By analyzing the maximum environmental parameter P within the overlapping time interval max Minimum environmental parameter P min and average environmental parameter P ave Perform calculations to determine the first environmental parameter P1;

[0117]

[0118] Based on the circuit breaker failure rate database, the steady-state failure rate of the sample circuit breakers under the first load and first environmental parameters is determined as the overlapping time interval M. n The first damage rate;

[0119] The first simulated loss variation curve is plotted based on the first damage rate across all overlapping time intervals.

[0120] It should be noted that the historical usage data of circuit breakers from the same batch includes the power supply load and environmental parameters recorded during actual use of circuit breakers of the same model and batch as the sample circuit breakers. The historical usage data of the same batch of circuit breakers is used to analyze the actual installation circuit and location of the circuit breaker under test. The operating process of the circuit breaker under test is simulated by changes in load and operating environment parameters, and simulated load curves for the circuit and simulated environmental parameter curves for the environment in which the circuit breaker under test is located are plotted. The preset segmentation criteria are determined based on the data fluctuation amplitude and time interval. The system sets different data fluctuation amplitudes and time intervals for the simulated load curve and simulated environmental parameter curve. When the simulated load curve meets any one of the preset data fluctuation amplitudes and time intervals, the simulated load curve is segmented once, and the preset segmentation criteria are reset until all simulated load curves are analyzed, dividing the simulated load curve into multiple first intervals. Similarly, the simulated environmental parameter curve is divided into multiple second intervals according to the same segmentation method as the simulated load curve. The multiple first intervals and multiple second intervals are analyzed in chronological order, and the first intervals and second intervals with overlapping areas are bound together. During the interval binding process, each first interval and second interval can be bound multiple times.

[0121] When the overlapping time intervals M n After determining the first load Q1 and the first environmental parameter P1, the circuit breaker failure rate database is used for filtering. The stable failure rate under the same power supply load and temperature and humidity environmental parameters as the first load Q1 and the first environmental parameter P1 is determined as the overlapping time interval M. n The first damage rate.

[0122] According to an embodiment of the present invention, it further includes:

[0123] Based on the overlapping time interval M n Overlapping time interval M n-1 Calculate the overlapping time interval M n The first load difference and the first environmental parameter difference;

[0124] Based on the circuit breaker failure rate database, according to the overlapping time interval M n The first load, first environmental parameters, first load difference, and first environmental parameter difference are analyzed, and the fluctuation damage rate corresponding to the detection stage of the preset power supply load is determined as the overlapping time interval M. n The second damage rate within a preset time interval;

[0125] The second simulated loss change curve is plotted based on the second damage rate within the preset time interval for all overlapping time intervals.

[0126] It should be noted that the overlapping time interval M n The first load difference is the overlapping time interval M n The first load and the previous overlapping time interval M n-1 The load difference of the first load, the overlapping time interval M n The difference in the first environmental parameter is the overlapping time interval M. n The first environmental parameter and the previous overlapping time interval M n-1 The difference between the first environmental parameter and the environmental parameter. When the overlapping time interval M is determined. n After determining the first load difference and the first environmental parameter difference, the circuit breaker failure rate database is used for screening to identify preset power supply load stages with the same power supply load and temperature and humidity environmental parameters as the first load Q1 and the first environmental parameter P1. These preset power supply load stages are then subjected to secondary screening. The power supply load difference and environmental change difference between this preset power supply load stage and the previous preset load power supply stage are compared with the overlapping time interval M. n The fluctuation damage rate corresponding to the preset power supply load stage where the first load difference and the first environmental parameter difference are the same is determined as the overlapping time interval M. n The second damage rate within a preset time interval.

[0127] The preset time interval is the period during which the circuit breaker's detection data changes from fluctuation to stability due to fluctuations in power supply load or environmental parameters. The specific value of the preset time interval can be set by those skilled in the art according to actual needs.

[0128] Figure 3 A flowchart of the method for determining the performance level of a circuit breaker under test provided by the present invention is shown.

[0129] like Figure 3 As shown, according to an embodiment of the present invention, the predicted lifespan data of the circuit breaker under test is compared with a preset rated lifespan range to determine the performance level of the circuit breaker under test, including:

[0130] S302, when the predicted life data of the circuit breaker under test is less than the minimum value of the preset rated life range, the performance level of the circuit breaker under test is determined to be the fourth level.

[0131] S304, when the predicted life data of the circuit breaker under test is greater than the maximum value of the preset rated life range, the performance level of the circuit breaker under test is determined to be the first level.

[0132] S306, When the predicted life data of the circuit breaker under test is within the preset rated life range, the performance level of the circuit breaker under test is determined according to the third ratio of the predicted life data of the circuit breaker under test and the maximum value of the preset rated life range.

[0133] S308, if the third ratio is greater than the first preset ratio threshold, the performance level of the circuit breaker under test is the first level;

[0134] S310, if the third ratio is less than or equal to the first preset ratio threshold and greater than the second preset ratio threshold, then the performance level of the circuit breaker under test is the second level;

[0135] S312, if the third ratio is less than or equal to the second preset ratio threshold, then the performance level of the circuit breaker under test is the third level.

[0136] It should be noted that the preset rated life range is the theoretical service life range of the circuit breaker under test (TBT) under recommended operating conditions, given after factory testing. Comparing the predicted life data of the TBT with the preset rated life range allows determination of the TBT's actual performance under environmental and power supply load conditions. Specifically, TBTs with performance levels one, two, and three can meet the expected performance and service life; however, TBTs with performance level four cannot achieve the expected performance, and their expected service life does not meet the theoretical minimum service life specified in the factory test. Environmental factors and power supply load have a significant impact on the TBT.

[0137] The first preset ratio threshold and the second preset ratio threshold are both set by those skilled in the art according to actual needs, and the first preset ratio threshold is greater than the second preset ratio threshold. When the predicted life data of the circuit breaker under test is within the preset rated life range, the performance level of the circuit breaker under test is determined by the first preset ratio threshold and the second preset ratio threshold.

[0138] Figure 4 A block diagram of a circuit breaker performance testing system provided by the present invention is shown.

[0139] like Figure 4 As shown, a second aspect of the present invention provides a performance testing system for circuit breakers, comprising:

[0140] The circuit breaker testing module is used to randomly select multiple circuit breakers from the same batch based on a preset quantity threshold to determine them as sample circuit breakers; generate multiple sets of temperature and humidity data according to the rated operating environment range of the sample circuit breakers, and adjust the test environment of each sample circuit breaker in turn; generate a power supply load adjustment scheme through multiple preset power supply loads, supply power to each sample circuit breaker, and record the test parameter change curve of each sample circuit breaker; by analyzing the test parameter change curve, determine the failure rate of the sample circuit breaker at the corresponding test stage under different preset power supply loads;

[0141] The database establishment module is used to establish a circuit breaker failure rate database based on the failure rates of sample circuit breakers in different temperature and humidity environments and different preset power supply loads corresponding to the detection stages. The failure rate corresponding to the preset power supply loads includes the fluctuating failure rate during the switching process of the preset power supply loads corresponding to the detection stages and the stable failure rate during the continuous process of the preset power supply loads corresponding to the detection stages.

[0142] The first loss curve plotting module is used to plot the first simulated loss change curve and the second simulated loss change curve of the circuit breaker under test based on the circuit breaker failure rate database and historical usage data of the same batch of circuit breakers.

[0143] The second loss curve plotting module is used to add the first simulated loss change curve and the second simulated loss change curve based on the power supply time to obtain the third simulated loss change curve.

[0144] The circuit breaker life prediction module is used to calculate the predicted life data of the circuit breaker under test based on the third simulated loss change curve.

[0145] The circuit breaker performance analysis module compares the predicted lifespan data of the circuit breaker under test with the preset rated lifespan range to determine the performance level of the circuit breaker under test. The performance levels of the circuit breaker under test include Level 1, Level 2, Level 3, and Level 4.

[0146] A third aspect of the present invention provides a photovoltaic circuit breaker, characterized in that the photovoltaic circuit breaker includes a performance testing system for the circuit breaker.

[0147] All information (including but not limited to user equipment information, user personal information, etc.), data (including but not limited to data used for analysis, stored data, displayed data, etc.), and signals (including but not limited to signals transmitted between user terminals and other devices) involved in this application have been authorized by the user or fully authorized by all parties, and the collection, use, and processing of related data must comply with the relevant laws, regulations, and standards of the relevant countries and regions. For example, the "rated operating environment range of the sample circuit breaker" and "historical usage data of the sample circuit breaker" involved in this disclosure were obtained with full authorization.

[0148] This invention discloses a performance testing method, system, and photovoltaic circuit breaker for circuit breakers. The method includes: adjusting the test environment of a sample circuit breaker using temperature and humidity data; supplying power to the sample circuit breaker using a power supply load adjustment scheme; and recording the change curves of the test parameters of the sample circuit breaker. The method involves analyzing the change curves of the test parameters and establishing a circuit breaker failure rate database based on the failure rate database and historical usage data of the sample circuit breakers. A third simulated loss change curve of the circuit breaker under test is plotted based on the failure rate database and historical usage data of the sample circuit breakers, and the predicted lifespan data of the circuit breaker under test is calculated. The predicted lifespan data of the circuit breaker under test is compared with a preset rated lifespan range to determine the performance level of the circuit breaker under test. Finally, the method determines the performance test data of the same batch of circuit breakers based on the distribution ratio of each performance level of the sample circuit breakers. This invention can improve the accuracy of actual performance test data of photovoltaic circuit breakers under the influence of environmental factors.

[0149] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components can be combined, or integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed can be through some interfaces, and the indirect coupling or communication connection between devices or units can be electrical, mechanical, or other forms.

[0150] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units. They may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0151] In addition, in the various embodiments of the present invention, each functional unit can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be implemented in hardware or in the form of hardware plus software functional units.

[0152] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0153] Alternatively, if the integrated units of this invention are implemented as software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the embodiments of this invention, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROM, RAM, magnetic disks, or optical disks.

Claims

1. A performance testing method for a circuit breaker, characterized in that, include: Based on a preset quantity threshold, multiple circuit breakers are randomly selected from the same batch of circuit breakers to be determined as sample circuit breakers; Multiple sets of temperature and humidity data were generated based on the rated operating environment range of the sample circuit breakers, and the test environment for each sample circuit breaker was adjusted accordingly. A power supply load adjustment scheme is generated by generating multiple sets of preset power supply loads, power is supplied to each sample circuit breaker, and the change curve of the detection parameters of each sample circuit breaker is recorded. By analyzing the variation curves of the detection parameters, the failure rate of the sample circuit breaker at different preset power supply load corresponding detection stages was determined. A circuit breaker failure rate database was established based on the failure rates of sample circuit breakers in different temperature and humidity environments and different preset power supply loads during the corresponding testing stages. The damage rate corresponding to the preset power supply load detection stage includes the fluctuating damage rate during the switching process of the preset power supply load detection stage and the stable damage rate during the continuous process of the preset power supply load detection stage. Based on the circuit breaker failure rate database and the historical usage data of the same batch of circuit breakers, the first simulated loss change curve and the second simulated loss change curve of the circuit breaker under test are plotted. The first simulated loss change curve and the second simulated loss change curve are added together based on the power supply time to obtain the third simulated loss change curve; The predicted lifespan data of the circuit breaker under test is calculated based on the third simulated loss variation curve. The predicted lifespan data of the circuit breaker under test is compared with the preset rated lifespan range to determine the performance level of the circuit breaker under test; the performance level of the circuit breaker under test includes level 1, level 2, level 3 and level 4.

2. The performance testing method for a circuit breaker according to claim 1, characterized in that, The process involves generating multiple sets of temperature and humidity data based on the rated operating environment range of the sample circuit breakers, and then adjusting the test environment for each sample circuit breaker in sequence, including: Multiple sets of temperature data and multiple sets of humidity data are selected based on the rated operating environment range of the sample circuit breaker; the rated operating environment range includes at least the rated temperature range and the rated humidity range. The multiple sets of temperature data and multiple sets of humidity data are randomly combined to obtain multiple sets of temperature and humidity data; the number of multiple sets of temperature and humidity data is determined according to the number of sample circuit breakers. The test environment for the sample circuit breakers was adjusted based on the multiple sets of temperature and humidity data.

3. The performance testing method for a circuit breaker according to claim 1, characterized in that, The process involves generating a power supply load adjustment scheme using multiple preset power supply loads, supplying power to each sample circuit breaker, and recording the change curve of the detection parameters for each sample circuit breaker, including: Obtain multiple sets of preset power supply loads; Based on a preset time interval, the multiple groups of preset power supply loads are randomly combined in sequence to obtain a power supply load adjustment scheme. The sample circuit breaker was powered on according to the power supply load adjustment scheme. Various detection parameters of the sample circuit breaker were recorded from the start of power-on to the stable power-on condition, and the change curves of the detection parameters were plotted. The detection parameters include the internal temperature of the sample circuit breaker and the current of the upper and lower sections of the sample circuit breaker. The power supply load of the sample circuit breaker is adjusted according to the power supply load adjustment scheme based on the preset time interval. Various test parameters of the sample circuit breaker are recorded and the change curves of the test parameters are plotted.

4. The performance testing method for a circuit breaker according to claim 3, characterized in that, The step of analyzing the variation curves of the detection parameters to determine the failure rate of the sample circuit breaker at different preset power supply loads during the detection phase includes: The first damage value of the detection stage corresponding to the preset power supply load is determined by weighting the first data difference before and after the stage adjustment of each detection data in the detection stage corresponding to the preset power supply load and the second data difference between each detection data and the corresponding preset standard parameter. The first data difference of the detection data before and after the stage adjustment is the data difference between the detection data of the current detection stage at the preset time and the detection data at the end time of the previous detection stage. The fluctuation damage rate during the switching process of the detection stage corresponding to the preset power supply load is determined based on the first damage value of the detection stage corresponding to the preset power supply load and the first ratio of the time difference between the preset time and the start time of the current detection stage. The second damage value for the detection stage corresponding to the preset power supply load is determined by weighting the third data difference of each detection data during the stage's duration and the second data difference between each detection data and the corresponding preset standard parameter. The third data difference of the detection data during the stage's duration is the data difference between the detection data at the end time of the current detection stage and the detection data at the preset time. The steady-state damage rate during the continuous process of the detection phase corresponding to the preset power supply load is determined based on the second ratio of the second damage value of the detection phase corresponding to the preset power supply load and the second ratio of the time difference between the current detection phase end time and the preset time.

5. The performance testing method for a circuit breaker according to claim 1, characterized in that, The step of plotting the first simulated loss variation curve and the second simulated loss variation curve of the circuit breaker under test based on the circuit breaker failure rate database and the historical usage data of the same batch of circuit breakers includes: Obtain historical usage data for the circuit breakers in the same batch; Based on the historical usage data of the same batch of circuit breakers, the simulated load curve of the circuit where the circuit breaker under test is located and the simulated environmental parameter curve of the environment where the circuit breaker under test is located are determined. The simulated load curve is divided into multiple first intervals according to a preset segmentation standard, and the simulated environmental parameter curve is divided into multiple second intervals. Analyze the plurality of first intervals and the plurality of second intervals, and bind the first intervals and second intervals that have overlapping areas to each other; determining the time interval corresponding to the overlapping region as an overlapping time interval M n ; According to the overlapping time interval M n , the maximum load Q n , the minimum load Q max , the average load Q min and the load curve within the overlapping time interval M ave are determined. According to the simulation environment parameter curve within the overlapping time interval M n , the maximum environment parameter P max , the minimum environment parameter P min , and the average environment parameter P ave of the overlapping time interval M n are determined. The first load Q1 is determined by calculating the maximum load Q n , the minimum load Q max , and the average load Q min of the overlapping time interval M ave . ； By analyzing the maximum environmental parameter P within the overlapping time interval max Minimum environmental parameter P min and average environmental parameter P ave Perform calculations to determine the first environmental parameter P1; ； Based on the circuit breaker failure rate database, the steady-state failure rate corresponding to the sample circuit breakers under the first load and first environmental parameters is determined as the overlapping time interval M. n The first damage rate; The first simulated loss variation curve is plotted based on the first damage rate across all overlapping time intervals.

6. The performance testing method for a circuit breaker according to claim 5, characterized in that, Also includes: Based on the overlapping time interval M n Overlapping time interval M n-1 Calculate the overlapping time interval M n The first load difference and the first environmental parameter difference; Based on the circuit breaker failure rate database, according to the overlapping time interval M n The first load, first environmental parameters, first load difference, and first environmental parameter difference are analyzed, and the fluctuation damage rate corresponding to the detection stage of the preset power supply load is determined as the overlapping time interval M. n The second damage rate within a preset time interval; The second simulated loss change curve is plotted based on the second damage rate within the preset time interval for all overlapping time intervals.

7. The performance testing method for a circuit breaker according to claim 1, characterized in that, The step of comparing the predicted lifespan data of the circuit breaker under test with the preset rated lifespan range to determine the performance level of the circuit breaker under test includes: When the predicted lifespan data of the circuit breaker under test is less than the minimum value of the preset rated lifespan range, the performance level of the circuit breaker under test is determined to be the fourth level. When the predicted lifespan data of the circuit breaker under test is greater than the maximum value of the preset rated lifespan range, the performance level of the circuit breaker under test is determined to be the first level. When the predicted life data of the circuit breaker under test is within the preset rated life range, the performance level of the circuit breaker under test is determined according to the third ratio of the predicted life data of the circuit breaker under test and the maximum value of the preset rated life range. If the third ratio is greater than the first preset ratio threshold, then the performance level of the circuit breaker under test is the first level. If the third ratio is less than or equal to the first preset ratio threshold and greater than the second preset ratio threshold, then the performance level of the circuit breaker under test is the second level. If the third ratio is less than or equal to the second preset ratio threshold, then the performance level of the circuit breaker under test is the third level.

8. A performance testing system for a circuit breaker, used to implement the performance testing method for a circuit breaker as described in any one of claims 1-7, characterized in that, include: The circuit breaker testing module is used to randomly select multiple circuit breakers from the same batch of circuit breakers based on a preset quantity threshold to determine them as sample circuit breakers. Multiple sets of temperature and humidity data are generated based on the rated operating environment range of the sample circuit breakers, and the test environment of each sample circuit breaker is adjusted sequentially. A power supply load adjustment scheme is generated through multiple sets of preset power supply loads, and power is supplied to each sample circuit breaker. The change curve of the test parameters of each sample circuit breaker is recorded. By analyzing the change curve of the test parameters, the failure rate of the sample circuit breaker at the corresponding test stage under different preset power supply loads is determined. The database establishment module is used to establish a circuit breaker failure rate database based on the failure rates of sample circuit breakers in different temperature and humidity environments and different preset power supply loads corresponding to the detection stages; the failure rate corresponding to the preset power supply loads includes the fluctuating failure rate during the switching process of the preset power supply loads corresponding to the detection stages and the stable failure rate during the continuous process of the preset power supply loads corresponding to the detection stages. The first loss curve plotting module is used to plot the first simulated loss change curve and the second simulated loss change curve of the circuit breaker under test based on the circuit breaker failure rate database and the historical usage data of the same batch of circuit breakers. The second loss curve plotting module is used to add the first simulated loss change curve and the second simulated loss change curve based on the power supply time to obtain the third simulated loss change curve. The circuit breaker life prediction module is used to calculate the predicted life data of the circuit breaker under test based on the third simulated loss change curve. The circuit breaker performance analysis module is used to compare the predicted life data of the circuit breaker under test with the preset rated life range to determine the performance level of the circuit breaker under test; the performance level of the circuit breaker under test includes the first level, the second level, the third level and the fourth level.

9. The performance testing system for a circuit breaker according to claim 8, characterized in that, The process involves generating a power supply load adjustment scheme using multiple preset power supply loads, supplying power to each sample circuit breaker, and recording the change curve of the detection parameters for each sample circuit breaker, including: Obtain multiple sets of preset power supply loads; Based on a preset time interval, the multiple groups of preset power supply loads are randomly combined in sequence to obtain a power supply load adjustment scheme. The sample circuit breaker was powered on according to the power supply load adjustment scheme. Various detection parameters of the sample circuit breaker were recorded from the start of power-on to the stable power-on condition, and the change curves of the detection parameters were plotted. The detection parameters include the internal temperature of the sample circuit breaker and the current of the upper and lower sections of the sample circuit breaker. The power supply load of the sample circuit breaker is adjusted according to the power supply load adjustment scheme based on the preset time interval. Various test parameters of the sample circuit breaker are recorded and the change curves of the test parameters are plotted.

10. A photovoltaic circuit breaker, characterized in that, The photovoltaic circuit breaker includes the performance testing system of the circuit breaker as described in claim 8.

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