Optical system for image capturing and image capturing optical lens

Abstract

The invention provides an optical system for image capturing and an image capturing optical lens, and the optical system for image capturing sequentially comprises a first aspheric lens, a super lens, a second aspheric lens and a third aspheric lens from an object side to an image side along an optical axis, the focal power of the first aspheric lens is positive, the focal power of the super lens is negative, and the focal power of the second aspheric lens is positive. The object side surface and the image side surface of the first aspheric lens both protrude towards the object side; the focal power of the super lens is positive; the object side surface and the image side surface of the second aspheric lens are convex towards the image side; the paraxial region of the object side surface and the paraxial region of the image side surface of the third aspheric lens are both convex towards the object side. The optical system for image capturing provided by the invention is excellent in imaging quality and has relatively high definition. Moreover, the total optical length of the optical system used for image capturing is small, so that the optical system used for image capturing has a small size and can be widely installed in various electronic products to meet the light and thin requirements of the electronic products.

Description

Technical Field

[0001] The present application relates to the field of optical systems, and in particular to an optical system for imaging and an imaging optical lens. Background Art

[0002] To meet consumers' demand for portability, lightweight and thinning is an important development trend for electronic products such as smartphones, laptops, and tablets. However, the development of electronic devices towards lightweight and thinness will inevitably lead to a more cramped space inside electronic products, resulting in a very limited size reserved for various components of electronic products.

[0003] With the rise of social media and remote conferencing, imaging has become an important function of electronic products, and consumers expect the imaging functions of electronic products to become more and more powerful to obtain better picture quality.

[0004] In the prior art, an improvement in image quality usually means an increase in the size of the optical system that implements the imaging function, which may result in the optical system being unable to be installed in a lightweight electronic product. Summary of the Invention

[0005] In response to the above technical problems, the embodiments of the present application provide an optical system and an imaging optical lens for imaging, aiming to provide an optical system with a small size and excellent imaging quality.

[0006] According to one aspect of an embodiment of the present application, an optical system for capturing an image is disclosed. The optical system for capturing an image comprises, in order from the object side to the image side along the optical axis:

[0007] a first aspheric lens having positive optical power, wherein both the object-side surface and the image-side surface of the first aspheric lens are convex toward the object side;

[0008] A metalens, which has positive optical power;

[0009] a second aspheric lens, wherein both the object side surface and the image side surface thereof are convex toward the image side;

[0010] The third aspheric lens has a paraxial region on the object side and a paraxial region on the image side that are both convex toward the object side.

[0011] In some embodiments, the optical system for capturing images satisfies: Wherein, f1 is the focal length of the first aspheric lens, f2 is the focal length of the second aspheric lens, and f3 is the focal length of the third aspheric lens.

[0012] In some embodiments, the optical system for capturing images satisfies: Wherein, f is the effective focal length of the optical system for imaging, BFL is the optical back focus of the optical system for imaging, and TTL is the total optical length of the optical system for imaging.

[0013] In some embodiments, the optical system for capturing images satisfies: Among them, f m is the focal length of the metalens, f is the effective focal length of the optical system for imaging; x is the radial distance from any position on the metalens to the center of the metalens, is the phase of a position on the metalens at a radial distance x from the center of the metalens; n1 is the refractive index of the first aspheric lens, n2 is the refractive index of the second aspheric lens, and n3 is the refractive index of the third aspheric lens.

[0014] In some embodiments, the optical system for capturing images satisfies: Wherein, T1 is the center thickness of the first aspheric lens, T2 is the center thickness of the second aspheric lens, T3 is the center thickness of the third aspheric lens, L 1m is the thickness of the air gap between the first aspheric lens and the super lens on the optical axis, L m2 is the thickness of the air gap between the metalens and the second aspheric lens on the optical axis, L 23 is the thickness of the air space between the second aspheric lens and the third aspheric lens on the optical axis.

[0015] In some embodiments, the optical system for capturing images satisfies: Wherein, FOV is the maximum field angle of the optical system used for imaging, R 11 is the radius of curvature of the object side of the first aspheric lens, R 12 is the curvature radius of the image-side surface of the first aspheric lens, and T1 is the center thickness of the first aspheric lens.

[0016] In some embodiments, the optical system for capturing images satisfies: Among them, R 12 is the curvature radius of the image side surface of the first aspheric lens, L 1m is the thickness of the air gap between the first aspheric lens and the super lens on the optical axis, R 21 is the radius of curvature of the object side of the second aspheric lens, L m2 is the thickness of the air gap between the super lens and the second aspheric lens on the optical axis.

[0017] In some embodiments, the optical system for capturing images satisfies: Wherein, D2 is the maximum effective diameter of the second aspheric lens, D3 is the maximum effective diameter of the third aspheric lens, ImgH is half of the diagonal length of the imaging area of the optical system for imaging on the image plane, BFL is the optical back focus of the optical system for imaging, L 23 is the thickness of the air space between the second aspheric lens and the third aspheric lens on the optical axis.

[0018] In some embodiments, the optical system for capturing images satisfies: Wherein, f is the effective focal length of the optical system for imaging, and EPD is the entrance pupil diameter of the optical system for imaging.

[0019] A second aspect of an embodiment of the present application provides an imaging optical lens, which includes: an image sensor and an optical system for imaging as described in any one of the above items, wherein the image sensor is arranged on the image plane of the optical system for imaging.

[0020] The optical system for taking images provided by the present application includes, in order from the object side to the image side along the optical axis: a first aspheric lens, a super lens, a second aspheric lens and a third aspheric lens. The optical focal length of the first aspheric lens is positive, and both the object side and the image side of the first aspheric lens are convex toward the object side; the optical focal length of the super lens is positive; both the object side and the image side of the second aspheric lens are convex toward the image side; and both the paraxial region of the object side and the paraxial region of the image side of the third aspheric lens are convex toward the object side. The optical system for taking images provided by the present application has excellent imaging quality and high clarity. In addition, the total optical length of the optical system for taking images is small, so that the optical system for taking images has a small volume and can be widely installed in various electronic products to meet the demand for lightweight and thin electronic products. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The above and other objects, features and advantages of the present application will become more apparent by describing in detail example embodiments thereof with reference to the attached drawings.

[0022] Figure 1 A schematic diagram of the architectural layout of an optical system for imaging in one embodiment of the present application is shown.

[0023] Figure 2 FIG. 1 shows a phase distribution diagram of a metalens of an optical system for imaging in one embodiment of the present application.

[0024] Figure 3 The figure shows an MTF field curve diagram of an optical system for imaging in one embodiment of the present application.

[0025] Figure 4A field curvature diagram of an optical system for imaging in one embodiment of the present application is shown.

[0026] Figure 5 A distortion diagram of an optical system for imaging in one embodiment of the present application is shown.

[0027] Figure 6 A schematic diagram of the architectural layout of an optical system for imaging in one embodiment of the present application is shown.

[0028] Figure 7 FIG. 1 shows a phase distribution diagram of a metalens of an optical system for imaging in one embodiment of the present application.

[0029] Figure 8 The figure shows an MTF field curve diagram of an optical system for imaging in one embodiment of the present application.

[0030] Figure 9 A field curvature diagram of an optical system for imaging in one embodiment of the present application is shown.

[0031] Figure 10 A distortion diagram of an optical system for imaging in one embodiment of the present application is shown.

[0032] Figure 11 A schematic diagram of the architectural layout of an optical system for imaging in one embodiment of the present application is shown.

[0033] Figure 12 FIG. 1 shows a phase distribution diagram of a metalens of an optical system for imaging in one embodiment of the present application.

[0034] Figure 13 The figure shows an MTF field curve diagram of an optical system for imaging in one embodiment of the present application.

[0035] Figure 14 A field curvature diagram of an optical system for imaging in one embodiment of the present application is shown.

[0036] Figure 15 A distortion diagram of an optical system for imaging in one embodiment of the present application is shown.

[0037] Reference numerals

[0038] 100. Optical system for imaging;

[0039] 10. First aspheric lens;

[0040] 20. Super lens; 210. Substrate; 220. Micro-nano structure;

[0041] 30. A second aspheric lens;

[0042] 40. The third aspheric lens;

[0043] 50, aperture; 60, color filter;

[0044] 70, object plane; 80, image plane; 90, optical axis. DETAILED DESCRIPTION

[0045] Example embodiments will now be described more fully with reference to the accompanying drawings. However, example embodiments can be implemented in a variety of forms and should not be construed as limited to the examples set forth herein; rather, these example embodiments are provided so that the description of this application will be more comprehensive and complete and will fully convey the concepts of the example embodiments to those skilled in the art. The accompanying drawings are merely schematic illustrations of the present application and are not necessarily drawn to scale. Identical reference numerals in the figures indicate identical or similar parts, and thus repeated descriptions thereof will be omitted.

[0046] In addition, the described features, structures or characteristics can be combined in one or more example embodiments in any suitable manner. In the following description, many specific details are provided to provide a full understanding of the example embodiments of the present application. However, those skilled in the art will appreciate that the technical solutions of the present application can be practiced while omitting one or more of the specific details, or other modules, components, etc. can be adopted. In other cases, known structures, methods, implementations or operations are not shown or described in detail to avoid obscuring the main content and making various aspects of the present application vague.

[0047] See also Figure 1 , Figure 1 A schematic diagram of the architectural layout of an optical system 100 for imaging according to one embodiment of the present application is shown. For ease of description, the surface of each optical element in the optical system 100 for imaging, which is close to the object side along the optical axis 90, is referred to as the object side surface of the optical element. For example, the surface of the metalens 20 close to the object side is referred to as the object side surface of the metalens 20. The object side is located to the left of the leftmost lens, with the object plane 70 located on the object side. The image formed by the optical system 100 for imaging is located to the right of the rightmost lens, i.e., the image side is located to the right of the rightmost lens, with the image plane 80 located on the image side. Therefore, the direction from the object plane 70 to the image plane 80 along the optical axis 90 is consistent with the direction from the object side to the image side along the optical axis 90.

[0048] Please refer again Figure 1 The optical system 100 for capturing images includes: a first aspheric lens 10, a super lens 20, a second aspheric lens 30 and a third aspheric lens 40. The first aspheric lens 10, the super lens 20, the second aspheric lens 30 and the third aspheric lens 40 are arranged in sequence from the object side to the image side along the optical axis 90.

[0049] The first aspheric lens 10 has positive refractive power, the object-side surface of the first aspheric lens 10 is convex toward the object side, and the image-side surface of the first aspheric lens 10 is convex toward the object side.

[0050] The optical power of the metalens 20 is positive. The metalens 20 includes a substrate 220 and a micro-nanostructure 210. The substrate 220 is used to provide support for the micro-nanostructure 210. The micro-nanostructure 210 is disposed on the object-side and / or image-side surfaces of the substrate 220. By configuring various parameters of the micro-nanostructure 210, the metalens 20 can achieve desired optical performance.

[0051] The positive and negative optical power of the second aspheric lens 30 varies in different embodiments. That is, in some embodiments, the optical power of the second aspheric lens 30 is positive, while in other embodiments, the optical power of the second aspheric lens 30 is negative. The object-side surface of the second aspheric lens 30 is convex toward the image side, and the image-side surface of the second aspheric lens 30 is convex toward the image side.

[0052] The positive and negative optical power of the third aspheric lens 40 varies in different embodiments. In other words, the optical power of the third aspheric lens 40 is positive in some embodiments and negative in others. The paraxial region of the object-side surface of the third aspheric lens 40 is convex toward the object side, while the paraxial region of the image-side surface of the third aspheric lens 40 is convex toward the object side. In this application, the paraxial region refers to a very narrow region near the optical axis 90 where light rays have a very small angle with the optical axis 90 during propagation.

[0053] The optical system 100 for imaging provided in this application has excellent imaging quality and high clarity. Furthermore, the optical system 100 for imaging has a short overall length, resulting in a compact size and being widely applicable to various electronic products, thereby meeting the demand for thinner and lighter electronic products.

[0054] It should be noted that the number of metalenses included in the optical system 100 for imaging is not limited to one. That is, two or more metalenses of other specifications (different from the metalenses 20 provided in this application) can be used to achieve the target phase gradient, so that the optical system 100 for imaging has the desired optical performance. The first aspheric lens 10, the second aspheric lens 30, and the third aspheric lens 40 are all refractive lenses, and the number of refractive lenses included in the optical system 100 for imaging is three.

[0055] In some embodiments, the image-side surface of the third aspheric lens 40 has an inflection point.

[0056] In some embodiments, the optical system 100 for capturing images satisfies Condition 1: Wherein, f1 is the focal length of the first aspheric lens 10, f2 is the focal length of the second aspheric lens 30, and f3 is the focal length of the third aspheric lens 40. f1, f2, and f3 have the same dimension, which is a length unit, such as millimeters.

[0057] The upper limit of Conditional Formula 1 can ensure that the optical system 100 for imaging can meet the chromatic aberration correction requirements. The lower limit of Conditional Formula 1 can ensure that the optical system 100 for imaging has a reasonable positive focal length to meet the requirements of the total optical length and F number.

[0058] In some embodiments, the optical system 100 for capturing images satisfies Conditional Equation 2: Where f is the effective focal length of the optical system 100 used for image capture, BFL (Backfocal length) is the optical back focus of the optical system 100 used for image capture, and TTL (Total Track Length) is the total optical length of the optical system 100 used for image capture. f, BFL, and TTL have the same dimension, i.e., millimeters.

[0059] The upper limit of conditional expression 2 can ensure that the thickness of each lens and the thickness of the air space between the lenses of the optical system 100 for imaging are reasonable to meet the processing and assembly requirements. The lower limit of conditional expression 2 can ensure that the optical system 100 for imaging meets the miniaturization requirements.

[0060] In some embodiments, the optical system 100 for capturing images satisfies Condition 3: Among them, f m is the focal length of the metalens 20, and f is the effective focal length of the optical system 100 for imaging. m and f have the same dimension, both in length units, such as millimeters. x is the radial distance from any position on the metalens 20 to the center of the metalens, is the phase of a position on the metalens 20 at a radial distance x from the center of the metalens 20, that is, x and This refers to the same position on the super lens 20 . is the phase gradient of the superlens 20 along the radial direction, is the maximum absolute value of the phase gradient of the metalens 20 along the radial direction, The unit is rad / mm. n1 is the refractive index of the first aspheric lens 10, n2 is the refractive index of the second aspheric lens 30, and n3 is the refractive index of the third aspheric lens 40.

[0061] The upper limit of Conditional Formula 3 prevents the chromatic aberration of the optical system 100 for imaging from being uncorrected due to an excessively large phase gradient of the metalens 20. That is, the upper limit of Conditional Formula 3 ensures that the chromatic aberration of the optical system 100 for imaging can be corrected. The lower limit of Conditional Formula 3 ensures that the metalens 20 has a reasonable optical power, thereby enabling the metalens 20 to function effectively and reducing the overall optical length of the optical system 100 for imaging.

[0062] In some embodiments, the optical system 100 for capturing images satisfies Condition 4: Wherein, T1 is the center thickness of the first aspheric lens 10, T2 is the center thickness of the second aspheric lens 30, T3 is the center thickness of the third aspheric lens 40, L 1m is the thickness of the air gap between the first aspheric lens 10 and the super lens 20 on the optical axis 90, L m2 is the thickness of the air gap between the metalens 20 and the second aspheric lens 30 on the optical axis 90, L 23 is the thickness of the air gap between the second aspheric lens 30 and the third aspheric lens 40 on the optical axis 90. 1m , L m2 , L 23 have the same dimension, both are units of length, such as millimeters.

[0063] The upper limit of conditional formula 4 can ensure that there is a reasonable air space thickness between each lens to meet the lens assembly requirements. The lower limit of conditional formula 4 can ensure that each lens has a reasonable thickness to meet the beam modulation requirements and processing requirements.

[0064] In some embodiments, the optical system 100 for capturing images satisfies Condition 5: Wherein, FOV (Field of View, referred to as FOV) is the maximum full field angle of the optical system 100 used for imaging, R 11 is the radius of curvature of the object side surface of the first aspheric lens 10, R 12 is the curvature radius of the image side surface of the first aspheric lens 10, T1 is the center thickness of the first aspheric lens 10. The unit of FOV is degree, R 11 、R 12 , T1 have the same dimension, both are length units, such as millimeters.

[0065] The upper limit of Conditional Formula 5 ensures that the first aspheric lens 10 has sufficient optical power to effectively deflect and focus the incident light. The lower limit of Conditional Formula 5 prevents the first aspheric lens 10 from having large aberrations due to excessive optical power. That is, the lower limit of Conditional Formula 5 ensures that the optical power of the first aspheric lens 10 is not too large.

[0066] In some embodiments, the optical system 100 for capturing images satisfies Condition 6: Among them, R 12 is the curvature radius of the image side surface of the first aspheric lens 10, L 1m is the thickness of the air gap between the first aspheric lens 10 and the super lens 20 on the optical axis 90, R 21 is the curvature radius of the object side surface of the second aspheric lens 30, L m2 R is the thickness of the air gap between the super lens 20 and the second aspheric lens 30 on the optical axis 90. 12 , L 1m 、R 21 , L m2 have the same dimension, both are units of length, such as millimeters.

[0067] The upper limit of conditional equation 6 is used to control the incident angle of the incident light on the lens surface, thereby reducing aberrations. The lower limit of conditional equation 6 ensures that the air space thickness at the edge of the lens meets the requirements.

[0068] In some embodiments, the optical system 100 for capturing images satisfies Condition 7: Wherein, D2 is the maximum effective diameter of the second aspheric lens 30, and D3 is the maximum effective diameter of the third aspheric lens 40. The maximum effective diameter of the lens in this application refers to the larger of the diameter of the maximum light-transmitting area on the object side of the lens and the diameter of the maximum light-transmitting area on the image side of the lens. For example, D2 is the larger of the diameter of the maximum light-transmitting area on the object side of the second aspheric lens 30 and the diameter of the maximum light-transmitting area on the image side of the second aspheric lens 30. ImgH is half of the diagonal length of the imaging area of the optical system 100 for imaging on the image plane 80, that is, ImgH is the image height of the optical system 100 for imaging. BFL is the optical back focus of the optical system 100 for imaging, L 23 is the thickness of the air gap between the second aspheric lens 30 and the third aspheric lens 40 on the optical axis 90. D2, D3, ImgH, BFL, L 23 have the same dimension, both are units of length, such as millimeters.

[0069] The upper limit of Conditional Formula 7 is used to control the incident angle of the light beam to the third aspherical lens 40, thereby controlling the aberration. The lower limit of Conditional Formula 7 can ensure that the requirements of the image sensor compatible with the optical system 100 for capturing images on the incident angle of the main light are met.

[0070] In some embodiments, the optical system 100 for capturing images satisfies Conditional Equation 8: Wherein, f is the effective focal length of the optical system 100 for image capture, and EPD is the entrance pupil diameter of the optical system 100 for image capture. f and EPD have the same dimension, both being length units, such as millimeters.

[0071] Conditional Expression 8 represents the F-number range of the optical system 100 for imaging, thereby ensuring that the optical system 100 for imaging has sufficient light input.

[0072] The optical system 100 for imaging also includes an aperture 50, which is used to control the amount of light entering the far-infrared optical system, thereby ensuring that the optical system 100 for imaging can work effectively and generate high-quality images. The aperture 50 is arranged in the light path of the optical system 100 for imaging.

[0073] In some embodiments, the stop 50 is disposed on the object side of the first aspheric lens 10 , and the stop 50 is spaced apart from the first aspheric lens 10 .

[0074] See also Figure 1 、 Figure 6 and Figure 11 In some embodiments, the aperture 50 is disposed on the object side of the first aspheric lens 10 , and the aperture 50 is attached to the object side surface of the first aspheric lens 10 .

[0075] In some embodiments, the stop 50 is disposed on the image side of the first aspheric lens 10 , and the stop 50 is attached to the image side surface of the first aspheric lens 10 .

[0076] In some embodiments, the aperture 50 is disposed between the first aspheric lens 10 and the super lens 20 , and a preset interval is formed between the aperture 50 and the first aspheric lens 10 and the super lens 20 .

[0077] In some embodiments, the aperture 50 is disposed between the first aspheric lens 10 and the superlens 20 , and the aperture 50 is disposed in contact with the object-side surface of the superlens 20 .

[0078] In some embodiments, the aperture 50 is disposed between the metalens 20 and the second aspheric lens 30 , and the aperture 50 is disposed in contact with the image-side surface of the metalens 20 .

[0079] In some embodiments, the aperture 50 is disposed between the super lens 20 and the second aspheric lens 30 , and a predetermined interval is formed between the aperture 50 and the super lens 20 and the second aspheric lens 30 .

[0080] In some embodiments, the aperture 50 is disposed between the metalens 20 and the second aspheric lens 30 , and the aperture 50 is attached to the object-side surface of the second aspheric lens 30 .

[0081] In some embodiments, the aperture 50 is disposed between the second aspheric lens 30 and the third aspheric lens 40 , and the aperture 50 is attached to the image-side surface of the second aspheric lens 30 .

[0082] In some embodiments, the aperture 50 is disposed between the second aspheric lens 30 and the third aspheric lens 40 , and the aperture 50 is spaced apart from the second aspheric lens 30 and the third aspheric lens 40 .

[0083] In some embodiments, the aperture 50 is disposed between the second aspheric lens 30 and the third aspheric lens 40 , and the aperture 50 is attached to the object-side surface of the third aspheric lens 40 .

[0084] See also Figure 1 、 Figure 6 and Figure 11 In some embodiments, the imaging optical system 100 further includes a color filter 60 disposed between the third aspheric lens 40 and the image plane 80. The color filter 60 is configured to filter out light in wavelengths other than the visible light band. The material of the color filter 60 includes, but is not limited to, BK7, a borosilicate crown glass. This application does not impose any restrictions on the material of the color filter 60.

[0085] The optical system 100 for imaging provided in this application has the following benefits:

[0086] (1) F number ≤ 2.05, which can ensure that the optical system 100 used for imaging has a high clarity of imaging;

[0087] (2) TTL≤2.02mm, small size, can be widely used in various electronic products;

[0088] (3) The MTF (Modulation Transfer Function) at a frequency of 112 lp / mm with a field of view of 0.8 is greater than 0.5, indicating that the optical system 100 used for imaging has excellent imaging quality;

[0089] (4) The maximum optical distortion of the main wavelength (0.555 microns) is less than 3%, which can ensure that the imaging of the optical system 100 used for imaging has high authenticity.

[0090] The present application illustratively provides three optical systems 100 for imaging that meet usage requirements in three embodiments. Next, the optical systems 100 for imaging provided in each embodiment of the present application are introduced in detail.

[0091] Example 1

[0092] Figure 1The following is a schematic diagram illustrating the architectural layout of an optical system 100 for imaging provided in Example 1 of the present application. In Example 1, the optical system 100 for imaging includes, in order from the object side to the image side along the optical axis 90, a first aspheric lens 10, a metalens 20, a second aspheric lens 30, and a third aspheric lens 40. The micro-nanostructure 210 is disposed on the object side of the substrate 220. The second aspheric lens 30 has a positive optical power, and the third aspheric lens 40 has a negative optical power. Table 1-1 lists some parameters of the optical system 100 for imaging provided in Example 1.

[0093] Table 1-1. Partial parameters of the optical system 100 for imaging provided in Example 1

[0094]

[0095]

[0096] As can be seen from Table 1-1, the operating wavelength band of the optical system 100 for imaging provided in Example 1 is 470nm-650nm, which falls within the visible light band. The total optical length of the optical system 100 for imaging provided in Example 1 is 2.011mm. This relatively small total optical length ensures that the optical system 100 for imaging has a relatively small size, facilitating miniaturization of the optical system 100 for imaging. The optical system 100 for imaging provided in Example 1 has an F-number of 2.0, allowing a relatively large amount of light to enter the optical system 100, resulting in clear and bright imaging.

[0097] Starting from the object plane 70 and along the optical axis 90 from the object plane 70 to the image plane 80, each surface in the optical system 100 for imaging is numbered, and the parameters of each surface are summarized to obtain the following Table 1-2.

[0098] Table 1-2. Parameters of various surfaces in the optical system 100 for imaging provided in Example 1

[0099]

[0100] For each surface in Table 1-2, surface 0 is the object surface 70, surface 1 is the aperture 50, surface 2 is the object-side surface of the first aspheric lens 10, and surface 3 is the image-side surface of the first aspheric lens 10. Surface 4 is the object-side surface of the metalens 20. Since the micro-nanostructure 210 is provided on surface 4, surface 4 is referred to as the structure surface. Surface 5 is the image-side surface of the metalens 20. Surface 6 is the object-side surface of the second aspheric lens 30, and surface 7 is the image-side surface of the second aspheric lens 30. Surface 8 is the object-side surface of the third aspheric lens 40, and surface 9 is the image-side surface of the third aspheric lens 40. Surface 10 is the object-side surface of the color filter 60, and surface 11 is the image-side surface of the color filter 60. Surface 12 is the image surface 80.

[0101] As shown in Table 1-2, the distance between Surface 1 and Surface 2 is -0.125 mm, where the negative sign in "-0.125" indicates that the vertex of Surface 2 protrudes beyond Surface 1 toward the object side. Surface 2 is an aspheric surface with a radius of curvature of 0.692 mm. The distance between Surface 2 and Surface 3 on optical axis 90 is 0.226 mm. The material between Surface 2 and Surface 3 is plastic. Surface 3 is an aspheric surface with a radius of curvature of 1.391 mm. The distance between Surface 2 and Surface 3 on optical axis 90 is 0.136 mm. The material between Surface 2 and Surface 3 is air. The radius of curvature of Surface 4 is infinite, meaning that Surface 4 is a plane. The distance between Surface 4 and Surface 5 is 0.3 mm. The material between Surface 4 and Surface 5 is silicon dioxide. The radius of curvature of Surface 5 is infinite, meaning that Surface 5 is a plane. The distance between Surface 5 and Surface 6 is 0.187 mm. The material between Surface 5 and Surface 6 is air. Surface 6 is an aspheric surface with a radius of curvature of -1.410 mm. The distance between surfaces 6 and 7 on optical axis 90 is 0.278 mm. The material between surfaces 6 and 7 is plastic. Surface 7 is an aspheric surface with a radius of curvature of -0.604 mm. The distance between surfaces 7 and 8 on optical axis 90 is 0.148 mm. The material between surfaces 7 and 8 is air. Surface 8 is an aspheric surface with a radius of curvature of 2.431 mm. The distance between surfaces 8 and 9 on optical axis 90 is 0.184 mm. The material between surfaces 8 and 9 is plastic. Surface 9 is an aspheric surface with a radius of curvature of 0.608 mm. The distance between surfaces 9 and 10 on optical axis 90 is 0.107 mm. The material between surfaces 9 and 10 is air. The radius of curvature of surface 10 is infinite, that is, surface 10 is a plane, the distance between surface 10 and surface 11 on optical axis 90 is 0.145 mm, and the material between surface 10 and surface 11 is BK7. The radius of curvature of surface 11 is infinite, that is, surface 11 is a plane, the distance between surface 11 and surface 12 on optical axis 90 is 0.3 mm, and the material between surface 11 and surface 12 is air.

[0102] Surface 2, surface 3, surface 6, surface 7, surface 8 and surface 9 are even-order aspheric surfaces, and their surface shapes satisfy the following relationship:

[0103]

[0104] Where Z(r) is the distance from the aspheric vertex to the aspheric surface at a height of r along the optical axis 90 degrees; c is the aspheric surface curvature, c = 1 / R, where R is the radius of curvature; K is the conic coefficient; and A, B, C, D, etc. are the aspheric coefficients. The values of the aspheric coefficients K, A, B, C, D, etc. for Surfaces 2, 3, 6, 7, 8, and 9 can be found in Tables 1-3.

[0105] Table 1-3. Coefficients of the even-order aspheric surface in the optical system 100 for imaging provided in Example 1

[0106] Surface serial number 2 3 6 7 8 9 K 1.183 10.725 3.893 -0.695 -29.441 -5.653 A -2.56E-01 2.71E-01 1.33E+00 1.20E+00 -1.84E+00 -1.41E+00 B -4.22E-02 -1.47E+01 -2.03E+01 -7.21E+00 -1.16E+00 3.05E+00 C -1.68E+01 3.33E+02 1.42E+02 1.09E+01 2.23E+01 -4.43E+00 D 2.24E+02 -4.18E+03 -2.56E+02 9.81E+01 -6.11E+01 3.87E+00 E -2.19E+03 2.64E+04 -1.59E+03 -3.45E+02 7.98E+01 -1.73E+00 F 1.70E+04 -5.31E+04 9.64E+03 3.50E+02 -5.20E+01 4.86E-02 G -8.14E+04 -2.94E+04 -1.68E+04 -5.24E+01 1.40E+01 1.96E-01 H 5.72E+04 -1.51E+06 -1.95E+03 -3.41E+01 1.80E-01 3.85E-03 I 5.20E+05 8.56E+06 2.23E+04 5.69E+01 -3.34E-01 -1.91E-02

[0107] Referring to Table 1-3, for surface 2, K is 1.183, A is -2.56E-01, B is -4.22E-02, C is -1.68E+01, D is 2.24E+02, E is -2.19E+03, F is 1.70E+04, G is -8.14E+04, H is 5.72E+04, and I is 5.20E+05. The even aspheric coefficients of surfaces 3, 6, 7, 8, and 9 can be obtained from Table 1-3 and will not be detailed in this embodiment.

[0108] See also Figure 2 , Figure 2 : shows a phase distribution diagram of the metalens 20 of the optical system 100 for imaging provided in Example 1, Figure 2 The horizontal axis represents the distance from the center of the super lens 20. Figure 2 The vertical axis represents the phase. It is worth mentioning that Figure 2 The actual phase distribution of the metalens 20 in Example 1 is given. Since the phase is a periodic function about 2π, there is a relationship: (n is an integer), so it can be based on Figure 2 The phase of the superlens 20 is modulo 2π to achieve normalization processing to meet the needs of actual processing of the superlens 20.

[0109] See also Figure 3 , Figure 3 FIG. 1 shows an MTF field curve diagram of the optical system 100 for imaging provided in Example 1. Figure 3 The horizontal axis is the X-axis field of view, and its unit is degree; Figure 3 The vertical axis is the MTF value. Figure 3The figure lists the sagittal curve S1 and meridional curve T1 of the MTF with 56lp / mm spatial frequency as it changes with the field of view, the sagittal curve S2 and meridional curve T2 of the MTF with 112lp / mm spatial frequency as it changes with the field of view, and the sagittal curve S3 and meridional curve T3 of the MTF with 200lp / mm spatial frequency as it changes with the field of view. Figure 3 It can be seen that within the 0.9 field of view (40.41°), the MTF is greater than 0.22, and the imaging quality of the optical system 100 for capturing images is excellent.

[0110] See also Figure 4 , Figure 4 A diagram showing the field curvature of the optical system 100 for imaging provided in Example 1 is shown. Figure 4 The horizontal axis is the field curvature, and its unit is millimeters; Figure 4 The vertical axis is the Y-axis field of view, and its unit is degree. Figure 4 In the figure, S1 is the field curvature in the sagittal direction of the light with a wavelength of 0.650 microns, and T1 is the field curvature in the meridional direction of the light with a wavelength of 0.650 microns; S2 is the field curvature in the sagittal direction of the light with a wavelength of 0.555 microns, and T2 is the field curvature in the meridional direction of the light with a wavelength of 0.555 microns; S3 is the field curvature in the sagittal direction of the light with a wavelength of 0.470 microns, and T3 is the field curvature in the meridional direction of the light with a wavelength of 0.470 microns. Figure 4 It can be seen that the maximum field curvature of the optical system 100 for imaging in the sagittal direction is 0.042 mm, and the maximum field curvature of the optical system 100 for imaging in the meridional direction is 0.097 mm, which are relatively small.

[0111] See also Figure 5 , Figure 5 The distortion diagram of the optical system 100 for imaging provided in Example 1 is shown. Figure 5 The horizontal axis is the field curvature, and its unit is millimeters; Figure 5 The vertical axis is the Y-axis field of view, and its unit is degree. Figure 5 In the figure, L1 is the distortion of light with a wavelength of 0.650 microns, L2 is the distortion of light with a wavelength of 0.555 microns, and L3 is the distortion of light with a wavelength of 0.470 microns. Figure 5 It can be seen that the maximum distortion of the main wavelength (0.555 μm) of the optical system 100 for imaging is 2.8%, which is relatively small.

[0112] Example 2

[0113] Figure 6A schematic diagram of the architectural layout of an optical system 100 for imaging provided in Example 2 of the present application is shown. In Example 2, the optical system 100 for imaging includes, in order from the object side to the image side along the optical axis 90, a first aspheric lens 10, a metalens 20, a second aspheric lens 30, and a third aspheric lens 40. The micro-nanostructure 210 is disposed on the object side of the substrate 220. The second aspheric lens 30 has a negative optical power, and the third aspheric lens 40 has a positive optical power. Table 2-1 shows some parameters of the optical system 100 for imaging provided in Example 2.

[0114] Table 2-1. Partial parameters of the optical system 100 for imaging provided in Example 2

[0115] parameter data Total optical length (TTL) 2.000mm Maximum field of view (2ω) 90.0° F-number 2.0 Effective focal length 1.48mm Working band 470nm-650nm

[0116] As can be seen from Table 2-1, the operating wavelength band of the optical system 100 for imaging provided in Example 2 is 470nm-650nm, which falls within the visible light band. The optical system 100 for imaging provided in Example 2 has a total optical length of 2.000mm. This relatively small total optical length ensures that the optical system 100 for imaging has a relatively small size, facilitating miniaturization of the optical system 100 for imaging. The optical system 100 for imaging provided in Example 2 has an F-number of 2.0, allowing for a relatively large amount of light to enter the optical system 100, resulting in clear and bright images.

[0117] Starting from the object plane 70 and along the optical axis 90 from the object plane 70 to the image plane 80, each surface in the optical system 100 used for imaging is numbered, and the parameters of each surface are summarized to obtain the following Table 2-2.

[0118] Table 2-2. Parameters of various surfaces in the optical system 100 for imaging provided in Example 2

[0119]

[0120] The analysis of each surface in Table 2-2 can refer to Example 1, and this example does not analyze each surface one by one.

[0121] Surface 2, surface 3, surface 6, surface 7, surface 8 and surface 9 are even-order aspheric surfaces, and their surface shapes satisfy the following relationship:

[0122]

[0123] Where Z(r) is the distance from the aspheric vertex to the aspheric surface at a height of r along the optical axis 90 degrees; c is the aspheric surface curvature, c = 1 / R, where R is the radius of curvature; K is the conic coefficient; and A, B, C, D, etc. are the aspheric coefficients. The values of the aspheric coefficients K, A, B, C, D, etc. for Surfaces 2, 3, 6, 7, 8, and 9 can be found in Table 2-3.

[0124] Table 2-3. Coefficients of the even-order aspheric surface in the optical system 100 for imaging provided in Example 2

[0125] Surface serial number 2 3 6 7 8 9 K -29.71 17.464 -93.41 -99 -6.35 -4.61 A 6.07E+00 -8.60E-02 -5.06E+00 -5.37E+00 -2.32E+00 -1.24E+00 B -6.54E+01 -1.57E+01 5.00E+01 3.33E+01 2.67E+00 1.78E+00 C 4.98E+02 1.91E+02 -4.20E+02 -1.50E+02 -2.01E-01 -1.57E+00 D -2.17E+03 -1.36E+03 1.72E+03 3.74E+02 -1.45E+00 6.37E-01 E 3.90E+03 3.86E+03 -2.58E+03 -3.55E+02 9.48E-01 -5.13E-02 F 4.05E+02 -1.42E+03 -1.96E+03 3.31E+01 -2.02E-01 -2.67E-02 G 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 H 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 I 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00

[0126] The coefficients of the even-order aspheric surfaces of surface 2, surface 3, surface 6, surface 7, surface 8 and surface 9 can be obtained from Table 2-3, and will not be described in detail in this embodiment.

[0127] See also Figure 7 , Figure 7 : shows a phase distribution diagram of the metalens 20 of the optical system 100 for imaging provided in Example 2, Figure 7 The horizontal axis represents the distance from the center of the super lens 20. Figure 7 The vertical axis represents the phase. It is worth mentioning that Figure 7 The actual phase distribution of the metalens 20 in Example 2 is given. Since the phase is a periodic function about 2π, there is a relationship: (n is an integer), so it can be based on Figure 7 The phase of the superlens 20 is modulo 2π to achieve normalization processing to meet the needs of actual processing of the superlens 20.

[0128] See also Figure 8 , Figure 8 FIG. 2 shows the MTF field curve of the optical system 100 for imaging provided in Example 2. Figure 8 The horizontal axis is the X-axis field of view, and its unit is degree; Figure 8 The vertical axis is the MTF value. Figure 8 The figure lists the sagittal curve S1 and meridional curve T1 of the MTF with 56lp / mm spatial frequency as it changes with the field of view, the sagittal curve S2 and meridional curve T2 of the MTF with 112lp / mm spatial frequency as it changes with the field of view, and the sagittal curve S3 and meridional curve T3 of the MTF with 200lp / mm spatial frequency as it changes with the field of view. Figure 8 It can be seen that within the 0.9 field of view (40.5°), the MTF is greater than 0.2, and the imaging quality of the optical system 100 for imaging is excellent.

[0129] See also Figure 9 , Figure 9 A diagram showing the field curvature of the optical system 100 for imaging provided in Example 2 is shown. Figure 9 The horizontal axis is the field curvature, and its unit is millimeters; Figure 9 The vertical axis is the Y-axis field of view, and its unit is degree. Figure 9 In the figure, S1 is the field curvature in the sagittal direction of the light with a wavelength of 0.650 microns, and T1 is the field curvature in the meridional direction of the light with a wavelength of 0.650 microns; S2 is the field curvature in the sagittal direction of the light with a wavelength of 0.555 microns, and T2 is the field curvature in the meridional direction of the light with a wavelength of 0.555 microns; S3 is the field curvature in the sagittal direction of the light with a wavelength of 0.470 microns, and T3 is the field curvature in the meridional direction of the light with a wavelength of 0.470 microns. Figure 9 It can be seen that the maximum field curvature of the optical system 100 for imaging in the sagittal direction is 0.036 mm, and the maximum field curvature of the optical system 100 for imaging in the meridional direction is 0.082 mm, which are relatively small.

[0130] See also Figure 10 , Figure 10 The distortion diagram of the optical system 100 for imaging provided in Example 2 is shown. Figure 10 The horizontal axis is the field curvature, and its unit is millimeters; Figure 10 The vertical axis is the Y-axis field of view, and its unit is degree. Figure 10 In the figure, L1 is the distortion of light with a wavelength of 0.650 microns, L2 is the distortion of light with a wavelength of 0.555 microns, and L3 is the distortion of light with a wavelength of 0.470 microns. Figure 10 It can be seen that the maximum distortion of the main wavelength (0.555 μm) of the optical system 100 for imaging is 3.0%, which is relatively small.

[0131] Example 3

[0132] Figure 11 A schematic diagram of the architectural layout of an optical system 100 for imaging provided in Example 3 of the present application is shown. In Example 3, the optical system 100 for imaging includes, in order from the object side to the image side along the optical axis 90, a first aspheric lens 10, a metalens 20, a second aspheric lens 30, and a third aspheric lens 40. The micro-nanostructure 210 is disposed on the object side of the substrate 220. The second aspheric lens 30 has a positive optical power, and the third aspheric lens 40 has a negative optical power. Table 3-1 shows some parameters of the optical system 100 for imaging provided in Example 3.

[0133] Table 3-1. Partial parameters of the optical system 100 for imaging provided in Example 3

[0134] parameter data Total optical length (TTL) 1.911mm Maximum field of view (2ω) 91.5° F-number 2.0 Effective focal length 1.467mm Working band 470nm-650nm

[0135] As can be seen from Table 3-1, the operating wavelength band of the optical system 100 for imaging provided in Example 3 is 470nm-650nm, which falls within the visible light band. The total optical length of the optical system 100 for imaging provided in Example 3 is 1.911mm. This relatively small total optical length ensures that the optical system 100 for imaging has a relatively small size, facilitating miniaturization of the optical system 100 for imaging. The optical system 100 for imaging provided in Example 3 has an F-number of 2.0, allowing a relatively large amount of light to enter the optical system 100, resulting in clear and bright imaging.

[0136] Starting from the object plane 70 and along the optical axis 90 from the object plane 70 to the image plane 80, each surface in the optical system 100 used for imaging is numbered, and the parameters of each surface are summarized to obtain the following Table 3-2.

[0137] Table 3-2. Parameters of various surfaces in the optical system 100 for imaging provided in Example 3

[0138]

[0139] The analysis of each surface in Table 3-2 can refer to Example 1, and this example does not analyze each surface one by one.

[0140] Surface 2, surface 3, surface 6, surface 7, surface 8 and surface 9 are even-order aspheric surfaces, and their surface shapes satisfy the following relationship:

[0141]

[0142] Where Z(r) is the distance vector from the aspheric vertex at a height of r along the optical axis 90 degrees to the surface; c is the aspheric surface curvature, c = 1 / R, where R is the radius of curvature; K is the conic coefficient; and A, B, C, D, etc. are the aspheric coefficients. The values of the aspheric coefficients K, A, B, C, D, etc. for Surfaces 2, 3, 6, 7, 8, and 9 can be found in Table 3-3.

[0143] Table 3-3. Coefficients of the even-order aspheric surface in the optical system 100 for imaging provided in Example 3

[0144]

[0145]

[0146] The even-order aspheric coefficients of surface 2, surface 3, surface 6, surface 7, surface 8 and surface 9 can be obtained from Table 3-3, and will not be described in detail in this embodiment.

[0147] See also Figure 12 , Figure 12 : shows a phase distribution diagram of the metalens 20 of the optical system 100 for imaging provided in Example 3, Figure 12 The horizontal axis represents the distance from the center of the super lens 20. Figure 12 The vertical axis represents the phase. It is worth mentioning that Figure 12 The actual phase distribution of the metalens 20 in Example 3 is given. Since the phase is a periodic function about 2π, there is a relationship: (n is an integer), so it can be based on Figure 12 The phase of the superlens 20 is modulo 2π to achieve normalization processing to meet the needs of actual processing of the superlens 20.

[0148] See also Figure 13 , Figure 13 FIG. 1 shows an MTF field curve diagram of the optical system 100 for imaging provided in Example 1. Figure 13 The horizontal axis is the X-axis field of view, and its unit is degree; Figure 13 The vertical axis is the MTF value. Figure 13 The figure lists the sagittal curve S1 and meridional curve T1 of the MTF with 56lp / mm spatial frequency as it changes with the field of view, the sagittal curve S2 and meridional curve T2 of the MTF with 112lp / mm spatial frequency as it changes with the field of view, and the sagittal curve S3 and meridional curve T3 of the MTF with 200lp / mm spatial frequency as it changes with the field of view. Figure 13 It can be seen that within the 0.9 field of view (41.18°), the MTF is greater than 0.2, and the imaging quality of the optical system 100 for imaging is excellent.

[0149] See also Figure 14 , Figure 14 A diagram showing the field curvature of the optical system 100 for imaging provided in Example 3 is shown. Figure 14 The horizontal axis is the field curvature, and its unit is millimeters; Figure 14 The vertical axis is the Y-axis field of view, and its unit is degree. Figure 14 In the figure, S1 is the field curvature in the sagittal direction of the light with a wavelength of 0.650 microns, and T1 is the field curvature in the meridional direction of the light with a wavelength of 0.650 microns; S2 is the field curvature in the sagittal direction of the light with a wavelength of 0.555 microns, and T2 is the field curvature in the meridional direction of the light with a wavelength of 0.555 microns; S3 is the field curvature in the sagittal direction of the light with a wavelength of 0.450 microns, and T3 is the field curvature in the meridional direction of the light with a wavelength of 0.450 microns. Figure 14 It can be seen that the maximum field curvature of the optical system 100 for imaging in the sagittal direction is 0.029 mm, and the maximum field curvature of the optical system 100 for imaging in the meridional direction is 0.117 mm, which are relatively small.

[0150] See also Figure 15 , Figure 15 The distortion diagram of the optical system 100 for imaging provided in Example 3 is shown. Figure 15 The horizontal axis is the field curvature, and its unit is millimeters; Figure 15 The vertical axis is the Y-axis field of view, and its unit is degree. Figure 15 In the figure, L1 is the distortion of light with a wavelength of 0.650 microns, L2 is the distortion of light with a wavelength of 0.555 microns, and L3 is the distortion of light with a wavelength of 0.450 microns. Figure 15 It can be seen that the maximum distortion of the main wavelength (0.555 μm) of the optical system 100 for imaging is 2.02%, which is relatively small.

[0151] After summarizing the various parameters of the optical system 100 for imaging provided in the above three embodiments, the following Table 4 is obtained. Table 4 is mainly used to illustrate that the various conditions satisfied by the optical system 100 for imaging provided in this application are all verified and supported by experiments.

[0152]

[0153]

[0154] The present application also provides an imaging optical lens (not shown), which includes an image sensor (not shown) and the aforementioned optical system 100 for imaging. The structure of the imaging optical lens can be found above and will not be described in detail herein. Image sensors include, but are not limited to, CMOS (Complementary Metal Oxide Semiconductor) and CCD (Charge Coupled Device).

[0155] The imaging optical lens provided in this application can be installed in electronic devices to enable the electronic devices to have imaging functions. Electronic devices suitable for the imaging optical lens include but are not limited to mobile phones, tablet computers, and laptop computers.

[0156] Those skilled in the art will readily appreciate other embodiments of the present invention after considering the specification and practicing the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the present invention that follow the general principles of the present invention and include common knowledge or customary techniques in the art not disclosed herein. The description and examples are to be considered merely as exemplary, and the true scope and spirit of the present application are indicated by the appended claims.

Claims

1. An optical system for imaging, characterized in that: The optical system for capturing images includes, in order from the object side to the image side along the optical axis: a first aspheric lens having positive optical power, wherein both the object-side surface and the image-side surface of the first aspheric lens are convex toward the object side; Metalenses, whose optical power is positive; a second aspheric lens, wherein both the object side surface and the image side surface thereof are convex toward the image side; The third aspheric lens has a paraxial region on the object side and a paraxial region on the image side that are both convex toward the object side.

2. The optical system for imaging according to claim 1, wherein: The optical system for imaging satisfies: Wherein, f1 is the focal length of the first aspheric lens, f2 is the focal length of the second aspheric lens, and f3 is the focal length of the third aspheric lens.

3. The optical system for imaging according to claim 1, wherein: The optical system for imaging satisfies: Wherein, f is the effective focal length of the optical system for imaging, BFL is the optical back focus of the optical system for imaging, and TTL is the total optical length of the optical system for imaging.

4. The optical system for imaging according to claim 1, wherein: The optical system for imaging satisfies: Among them, f m is the focal length of the metalens, f is the effective focal length of the optical system for imaging; x is the radial distance from any position on the metalens to the center of the metalens, is the phase of a position on the metalens at a radial distance x from the center of the metalens; n1 is the refractive index of the first aspheric lens, n2 is the refractive index of the second aspheric lens, and n3 is the refractive index of the third aspheric lens.

5. The optical system for imaging according to claim 1, wherein: The optical system for imaging satisfies: Wherein, T1 is the center thickness of the first aspheric lens, T2 is the center thickness of the second aspheric lens, T3 is the center thickness of the third aspheric lens, L 1m is the thickness of the air gap between the first aspheric lens and the super lens on the optical axis, L m2 is the thickness of the air gap between the metalens and the second aspheric lens on the optical axis, L 23 is the thickness of the air space between the second aspheric lens and the third aspheric lens on the optical axis.

6. The optical system for imaging according to claim 1, wherein: The optical system for imaging satisfies: Wherein, FOV is the maximum field angle of the optical system used for imaging, R 11 is the radius of curvature of the object side of the first aspheric lens, R 12 is the curvature radius of the image-side surface of the first aspheric lens, and T1 is the center thickness of the first aspheric lens.

7. The optical system for imaging according to claim 1, wherein: The optical system for imaging satisfies: Among them, R 12 is the curvature radius of the image side surface of the first aspheric lens, L 1m is the thickness of the air gap between the first aspheric lens and the super lens on the optical axis, R 21 is the radius of curvature of the object side of the second aspheric lens, L m2 is the thickness of the air gap between the super lens and the second aspheric lens on the optical axis.

8. The optical system for imaging according to claim 1, wherein: The optical system for imaging satisfies: Wherein, D2 is the maximum effective diameter of the second aspheric lens, D3 is the maximum effective diameter of the third aspheric lens, ImgH is half of the diagonal length of the imaging area of the optical system for imaging on the image plane, BFL is the optical back focus of the optical system for imaging, L 23 is the thickness of the air space between the second aspheric lens and the third aspheric lens on the optical axis.

9. The optical system for imaging according to claim 1, wherein: The optical system for imaging satisfies: Wherein, f is the effective focal length of the optical system for imaging, and EPD is the entrance pupil diameter of the optical system for imaging.

10. An imaging optical lens, characterized in that: include: An image sensor and an optical system for imaging according to any one of claims 1 to 9, wherein the image sensor is arranged on an image plane of the optical system for imaging.

Images