Cloth defect detection system and method
By combining the alternating illumination of a line scan camera with ordinary light sources and a structured light generation unit, and combining two-dimensional and three-dimensional defect detection models, the problem that traditional systems have difficulty in identifying three-dimensional defects is solved, and efficient and low-cost cloth defect detection is achieved.
Patent Information
- Application Number
- CN202510840054.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-20
- Publication Date
- 2025-10-10
- Estimated Expiration
- 2045-06-20
AI Technical Summary
Existing cloth defect detection systems have difficulty accurately identifying three-dimensional defects such as ridges and dents, and traditional structured light detection methods are expensive and difficult to apply to production lines with high-frequency image acquisition.
A line scan camera combined with a normal light source and a structured light generation unit is used to alternately illuminate the fabric. Pre-trained two-dimensional and three-dimensional defect detection models are used to analyze images under normal light and structured light respectively. Combined with complementary labeled training samples, the three-dimensional defect recognition capability is improved.
It achieves accurate identification of two-dimensional and three-dimensional defects on the surface of cloth at high production rates, reduces hardware costs and improves the applicability and accuracy of the detection system.