System and method for analyzing impurities in high-purity disilane
By employing a five-valve, five-column, dual-detector configuration, the problems of long detection time and difficult separation of impurities in high-purity silane gas are solved, achieving efficient and accurate impurity analysis, avoiding interference from the main component, and improving analysis efficiency.
Patent Information
- Application Number
- CN202512056189.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-31
- Publication Date
- 2026-02-10
AI Technical Summary
Existing technologies for detecting impurities in high-purity silane gas suffer from problems such as long detection times, complex types of impurities that are difficult to separate, and, in particular, peaks of the main component that emerge affect the separation effect, resulting in low analytical efficiency.
The system employs a five-valve, five-column, dual-detector configuration. By controlling the working state and switching time of the multi-port valve, the sample gas can be separated and distributed in different chromatographic columns. Different detectors are used for impurity analysis to avoid interference from the main component.
Simultaneous analysis of impurities in high-purity silane is achieved, improving analytical efficiency and accuracy, reducing interference from the main component on the analytical results, and enabling the results of all impurity components to be obtained in a single analysis.