Control method of semiconductor lamp, intelligent electric appliance and storage medium

By applying a reverse voltage during the extinguishing interval of the semiconductor lamp in the range hood, measuring the reverse current value, and adjusting the driving parameters, the lighting problem caused by lamp light decay is solved, improving the lighting effect and user experience during cooking.

CN121968403APending Publication Date: 2026-05-01NINGBO FOTILE KITCHEN WARE CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
NINGBO FOTILE KITCHEN WARE CO LTD
Filing Date
2026-02-02
Publication Date
2026-05-01

AI Technical Summary

Technical Problem

The semiconductor lights in existing range hoods gradually deteriorate in lighting effect over time, and there is a lack of effective light decay detection and compensation methods, which affects the brightness and color temperature changes during the cooking process.

Method used

By applying a reverse voltage during the extinction interval of the semiconductor lamp, measuring the reverse current value, and comparing it with the darkroom current value and the initial current value, the degree of lamp attenuation is determined, and the driving parameters are adjusted in real time to compensate for light decay.

Benefits of technology

It enables real-time light decay detection and compensation for semiconductor lamps, improving lighting effects and user experience during cooking, while avoiding additional sensor costs and aesthetic impact.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to a control method of a semiconductor lamp, an intelligent electric appliance and a storage medium, and is applied to the field of intelligent household electrical appliances, and the control method of the semiconductor lamp comprises the steps: applying a first reverse voltage to the semiconductor lamp in an extinguishing gap of the semiconductor lamp, and obtaining a reverse current value of the semiconductor lamp; determining the attenuation degree of the semiconductor lamp according to the reverse current value, the darkroom current value and the initial current value; a darkroom current value generated based on charge movement in the semiconductor lamp in a darkroom scene; the initial current value is generated based on charge movement in the semiconductor lamp under the preset initial brightness; and adjusting driving parameters of the semiconductor lamp based on the attenuation degree, and performing light attenuation compensation. According to the invention, the illumination problem caused by the light attenuation of the semiconductor lamp is solved, and better illumination experience is provided for a user.
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Description

Control methods for semiconductor lighting fixtures, smart appliances and storage media Technical Field

[0001] This application relates to the field of smart appliances, and in particular to a control method for a semiconductor lamp, a smart appliance, and a storage medium. Background Technology

[0002] With the improvement of people's living standards and the promotion and popularization of technologies such as the Internet, big data, artificial intelligence, and voice interaction, more and more traditional lifestyles are gradually changing, and the use of home appliances is gradually moving towards intelligence. While bringing more convenience to users, the functions of various home appliances are also becoming more diversified. Take range hoods as an example. Range hoods are essential appliances for people to remove cooking fumes every day. Nowadays, range hoods are generally equipped with semiconductor lamps, such as LED lamps. LED lamps serve as the light source for the cooking area, illuminating the user during the cooking process. Some range hoods can also provide users with multi-color temperature mixed lighting.

[0003] Because ordinary LED lights exhibit significant light decay, their output luminous power decreases with usage time and junction temperature changes, even with the same input power. Simultaneously, the color temperature shifts towards higher color temperatures as light decay intensifies. For range hoods, the brightness and color temperature changes caused by light decay in the LED lighting fixtures affect the user's perception of food color changes and their viewing experience during cooking. Traditional range hoods only focus on the functionality of their LED lighting fixtures, lacking intelligent methods for detecting LED light decay. Consequently, the lighting effect deteriorates with increasing usage time.

[0004] There is currently no effective solution to the problem that the lighting effect of electrical appliances that rely on semiconductor lighting fixtures deteriorates with the increase of the usage time of the lighting semiconductor lighting fixtures. Summary of the Invention

[0005] This embodiment provides a control method for semiconductor lighting fixtures, a smart appliance, and a storage medium to address the problem in related technologies that the lighting effect of appliances relying on semiconductor lighting fixtures deteriorates with increasing usage time.

[0006] In a first aspect, this embodiment provides a method for controlling a semiconductor lamp, the semiconductor lamp being installed in a smart range hood for illumination of the smart range hood, the method comprising:

[0007] During the extinguishing interval of the semiconductor lamp, a first reverse voltage is applied to the semiconductor lamp to obtain the reverse current value of the semiconductor lamp;

[0008] The attenuation level of the semiconductor lamp is determined based on the reverse current value, the darkroom current value, and the initial current value; the darkroom current value is generated based on the charge movement in the semiconductor lamp under darkroom conditions; the initial current value is generated based on the charge movement in the semiconductor lamp under a preset initial brightness.

[0009] Based on the degree of attenuation, the driving parameters of the semiconductor lamp are adjusted to compensate for light decay.

[0010] In some embodiments, before applying a first reverse voltage to the semiconductor lamp to obtain the reverse current value of the semiconductor lamp, the method further includes:

[0011] In a darkroom setting, during the extinguishing interval of the semiconductor lamp, within a preset first time range, a second reverse voltage is applied to the semiconductor lamp to obtain the darkroom current value of the semiconductor lamp.

[0012] In some embodiments, before applying a first reverse voltage to the semiconductor lamp to obtain the reverse current value of the semiconductor lamp, the method further includes:

[0013] In a non-dark room setting, during the extinguishing interval of the semiconductor lamp, a third reverse voltage is applied to the semiconductor lamp within a preset second time range to obtain the initial current value of the semiconductor lamp.

[0014] In some embodiments, determining the attenuation level of the semiconductor lamp based on the reverse current value, the darkroom current value, and the initial current value includes:

[0015] Calculate the ratio of the reverse current value to the darkroom current value to obtain the first current ratio;

[0016] Determine whether the first current ratio exceeds a preset first threshold.

[0017] If the first current ratio is determined to exceed a preset first threshold, the attenuation level of the semiconductor lamp is determined based on the reverse current value and the initial current value.

[0018] In some embodiments, determining the attenuation level of the semiconductor lamp based on the reverse current value and the initial current value when the first current ratio exceeds a preset first threshold includes:

[0019] If the first current ratio is determined to exceed a preset first threshold, the ratio of the reverse current value to the initial current value is calculated to obtain a second current ratio.

[0020] If the second current ratio does not exceed a preset second threshold, the attenuation level of the semiconductor lamp is determined.

[0021] In some embodiments, the method further includes:

[0022] When the ambient light of the semiconductor lamp reaches a preset brightness, determine whether the current time is equal to the time since the last detection of the semiconductor lamp, and whether the preset detection time interval has been reached.

[0023] If the current time is within a preset detection time interval from the last detection time of the semiconductor lamp, the semiconductor lamp is controlled to enter an extinguishing gap.

[0024] In some embodiments, the method further includes:

[0025] If the first current ratio is determined to be less than or equal to a preset first threshold, the semiconductor lamp is turned on so that the ambient light of the environment in which the semiconductor lamp is located reaches a preset brightness.

[0026] In some embodiments, the method includes:

[0027] When the smart range hood is turned on, the semiconductor lamps in the smart range hood are initialized and tested.

[0028] Secondly, this embodiment provides a smart appliance that uses the semiconductor lamp control method described in the first aspect above. The smart appliance is one of a smart range hood, dishwasher, or refrigerator.

[0029] Thirdly, this embodiment provides a storage medium storing a computer program that, when executed by a processor, implements the control method for the semiconductor lamp described in the first aspect.

[0030] Compared with related technologies, the control method, smart appliance, and storage medium for a semiconductor lamp provided in this embodiment obtain the reverse current value of the semiconductor lamp by applying a reverse voltage to the semiconductor lamp based on the photovoltaic effect; and compare the reverse current value with the dark room current value in a dark room environment and the corresponding initial current value in the semiconductor lamp to determine the degree of attenuation of the semiconductor lamp. Then, the driving parameters of the semiconductor lamp are adjusted in real time according to the degree of attenuation to eliminate the lighting problem caused by the light decay of the semiconductor lamp and provide users with a better lighting experience.

[0031] Details of one or more embodiments of this application are set forth in the following drawings and description to make other features, objects and advantages of this application more readily apparent. Attached Figure Description

[0032] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:

[0033] Figure 1 is a hardware structure block diagram of the terminal of the semiconductor lamp control method provided in the embodiment of this application;

[0034] Figure 2 is a flowchart of a control method for a semiconductor lamp provided in an embodiment of this application;

[0035] Figure 3 is a schematic diagram of the installation structure of the smart range hood provided in this specific embodiment;

[0036] Figure 4 is an architecture diagram of the driver detection module provided in this specific embodiment;

[0037] Figure 5 is a flowchart of the auxiliary standard lighting method according to this specific embodiment;

[0038] Figure 6 is a flowchart of the LED lamp bead group testing process provided in this specific embodiment;

[0039] Figure 7 is a flowchart illustrating the online optical attenuation detection method provided in this specific embodiment. Detailed Implementation

[0040] To better understand the purpose, technical solution, and advantages of this application, the application is described and illustrated below in conjunction with the accompanying drawings and embodiments.

[0041] Unless otherwise defined, the technical or scientific terms used in this application shall have the general meaning understood by one of ordinary skill in the art to which this application pertains. Words such as “a,” “an,” “an,” “the,” “the,” and “these” used in this application do not indicate quantitative limitation and may be singular or plural. The terms “comprising,” “including,” “having,” and any variations thereof used in this application are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or device that comprises a series of steps or modules (units) is not limited to the listed steps or modules (units) but may include steps or modules (units) not listed, or may include other steps or modules (units) inherent to these processes, methods, products, or devices. Words such as “connected,” “linked,” and “coupled” used in this application are not limited to physical or mechanical connections but may include electrical connections, whether direct or indirect. “Multiple” used in this application refers to two or more. “And / or” describes the relationship between related objects, indicating that three relationships may exist; for example, “A and / or B” can represent: A alone, A and B simultaneously, and B alone. Normally, the character " / " indicates that the objects before and after it are in an "or" relationship. The terms "first," "second," "third," etc., used in this application are merely to distinguish similar objects and do not represent a specific order of objects.

[0042] The method embodiments provided in this example can be executed in a terminal, computer, or similar computing device. For example, when running on a terminal, Figure 1 is a hardware structure block diagram of the terminal for the semiconductor lighting control method provided in this application embodiment. As shown in Figure 1, the terminal may include one or more processors 102 (only one is shown in Figure 1) and a memory 104 for storing data, wherein the processor 102 may include, but is not limited to, a processing device such as a microprocessor MCU or a programmable logic device FPGA. The terminal may also include a transmission device 106 for communication functions and an input / output device 108. Those skilled in the art will understand that the structure shown in Figure 1 is only illustrative and does not limit the structure of the terminal. For example, the terminal may include more or fewer components than shown in Figure 1, or have a different configuration than shown in Figure 1.

[0043] The memory 104 can be used to store computer programs, such as application software programs and modules, like the computer program corresponding to the semiconductor lamp control method in this embodiment. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, thereby implementing the above-described method. The memory 104 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory remotely located relative to the processor 102, and these remote memories can be connected to the terminal via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0044] The transmission device 106 is used to receive or send data via a network. This network includes a wireless network provided by the terminal's communication provider. In one example, the transmission device 106 includes a Network Interface Controller (NIC), which can connect to other network devices via a base station to communicate with the Internet. In another example, the transmission device 106 can be a Radio Frequency (RF) module used for wireless communication with the Internet.

[0045] Because LED lights in household appliances generally exhibit light decay characteristics, the output light power at the same input power will decrease with usage time and changes in the actual operating temperature of the semiconductor. Simultaneously, the color temperature will shift towards higher color temperatures as light decay intensifies, leading to changes in the brightness and color temperature of the LED lights. To address these brightness and color temperature variations during use, this embodiment provides a method for online detection of light decay in LED lights. This method can detect the light decay and lifespan of lights in household appliances, such as range hood lights, during operation, and make pre-adjustments to provide a better cooking lighting experience for users.

[0046] Specifically, this embodiment provides a control method for a semiconductor lamp. Figure 2 is a flowchart of the control method for a semiconductor lamp provided in this embodiment. As shown in Figure 2, the process includes the following steps:

[0047] In step S210, during the extinguishing interval of the semiconductor lamp, a first reverse voltage is applied to the semiconductor lamp to obtain the reverse current value of the semiconductor lamp.

[0048] The semiconductor light fixture is installed in the smart range hood for illumination. When the smart range hood is turned on, the semiconductor light fixture undergoes initialization testing to determine if it is malfunctioning. Additionally, the semiconductor light fixture can also be installed in other smart appliances requiring lighting, such as smart refrigerators. The semiconductor light fixture can be an LED light fixture, an OLED light fixture, etc., and this document does not limit the specific type of semiconductor light fixture used.

[0049] Taking LED lighting fixtures as an example, the light-emitting diode (LED) emits light when forward-biased, but it can also receive light under reverse-biased conditions. In this case, changes in ambient light intensity can be detected based on the photovoltaic effect. The photovoltaic effect refers to the phenomenon where an object generates an electromotive force (EMF) due to the absorption of photons. It is an effect where the charge distribution within an object changes when it is illuminated, resulting in an EMF and current. Specifically, semiconductor lighting fixtures contain a PN junction. When light shines on this PN junction, a voltage is generated across it. Therefore, even when not emitting light, LED lighting fixtures can function as simple photodetectors to detect changes in ambient light intensity, thereby enabling functions such as automatic switching of lights on and off.

[0050] Furthermore, when the LEDs in a semiconductor lamp are in a normal light-emitting state, their conversion efficiency is related to the photocurrent generated in the reverse state. That is, as the LEDs in the semiconductor lamp decay over time, their photoelectric conversion efficiency will gradually decrease, resulting in a smaller reverse photocurrent generated under the same conditions.

[0051] In this embodiment, a first reverse voltage is applied to the LEDs of the semiconductor lamp during the lamp-off interval and maintained for a certain period of time. During the application of the first reverse voltage, the reverse photocurrent value generated by the LEDs in the semiconductor lamp, i.e., the reverse current value of the semiconductor lamp, is collected by a current sensor.

[0052] Semiconductor lamps contain LEDs of various color temperatures, which are divided into multiple groups of LEDs. When the light in the semiconductor lamp enters the extinguishing interval, the processor controls the sequential application of a first reverse voltage to the LED groups of different color temperatures within a certain period of time, and then uses a current sensor to collect the current reverse current value generated by the LED groups.

[0053] Step S220: Determine the attenuation level of the semiconductor lamp based on the reverse current value, the darkroom current value, and the initial current value; the darkroom current value is generated based on the charge movement in the semiconductor lamp under darkroom conditions; the initial current value is generated based on the charge movement in the semiconductor lamp under a preset initial brightness.

[0054] The process involves collecting reverse current values ​​for LED groups of different color temperatures within a semiconductor lighting fixture. Based on these reverse current values ​​and the darkroom current, it determines whether the current LED group requires automatic illumination. Furthermore, it assesses light decay based on the reverse current and initial current values. If automatic illumination is required, the lighting fixture is activated to supplement the ambient light, thus mitigating attenuation misjudgments caused by ambient light. Finally, the photoelectric conversion capability of the LED group is determined based on the reverse current and initial current values, reflecting its attenuation status.

[0055] Step S230: Based on the degree of attenuation, adjust the driving parameters of the semiconductor lamp to perform light attenuation compensation.

[0056] In this process, after determining the attenuation level of the LED chip group in the current semiconductor lamp, if the attenuation level indicates that the currently detected LED chip group has attenuation, then it is necessary to adjust the driving parameters of the semiconductor lamp based on the light, such as the driving current and PWM (Pulse Width Modulation) duty cycle, in order to compensate for the light attenuation of the current semiconductor lamp; or remind the user to replace the LED chips of the semiconductor lamp.

[0057] If the attenuation level indicates that there is no attenuation in the currently detected LED group, then the current driving parameters are maintained.

[0058] Through the above steps, by applying a reverse voltage to the semiconductor lamp, the reverse current value of the semiconductor lamp is obtained based on the photovoltaic effect. Based on the reverse current value, it is compared with the dark room current value in a dark room environment and the corresponding initial current value in the semiconductor lamp to determine the degree of attenuation of the semiconductor lamp. Then, the driving parameters of the semiconductor lamp are adjusted in real time according to the degree of attenuation to eliminate the lighting problems caused by the light decay of the semiconductor lamp and provide users with a better lighting experience.

[0059] In some embodiments, before step S210 applies a first reverse voltage to the semiconductor lamp to obtain the reverse current value of the semiconductor lamp, the method further includes: in a darkroom scenario, during the extinguishing interval of the semiconductor lamp, applying a second reverse voltage to the semiconductor lamp within a preset first time range to obtain the darkroom current value of the semiconductor lamp.

[0060] In a non-dark room scenario, during the interval between the extinction of the semiconductor lamps, a third reverse voltage is applied to the semiconductor lamps within a preset second time range to obtain the initial current value of the semiconductor lamps.

[0061] To determine the current degradation level of the semiconductor luminaire, a darkroom calibration is first required. The darkroom current value obtained in the darkroom setting is used as a reference value to determine whether automatic lighting is needed. Specifically, in a completely dark room setting, a second reverse voltage is applied to the semiconductor luminaire during the intervals between light-off periods. The darkroom current value of the semiconductor luminaire is then obtained. Based on the ratio of the darkroom current value to the reverse current value, it is determined whether auxiliary standard lighting needs to be turned on to eliminate the influence of ambient brightness on the semiconductor luminaire and improve the accuracy of subsequent assessments of the semiconductor luminaire's degradation level.

[0062] In some embodiments, the attenuation level of the semiconductor lamp is determined based on the reverse current value, the darkroom current value, and the initial current value. This includes: calculating the ratio of the reverse current value to the darkroom current value to obtain a first current ratio; determining whether the first current ratio exceeds a preset first threshold; if the first current ratio exceeds the preset first threshold, determining the attenuation level of the semiconductor lamp based on the reverse current value and the initial current value. If the first current ratio does not exceed the preset first threshold, the semiconductor lamp is turned on to ensure that the ambient light level in the environment where the semiconductor lamp is located reaches a preset brightness.

[0063] Specifically, if the ratio of the darkroom current value to the reverse current value, i.e., the first current ratio, exceeds a preset first threshold, it indicates that the brightness of the environment in which the semiconductor lamp is located is suitable, and automatic lighting is not required. If the first current ratio does not exceed the preset first threshold, it indicates that the brightness of the environment in which the semiconductor lamp is located is low, and the lighting in the semiconductor lamp needs to be turned on so that the ratio of the darkroom current value to the reverse current value, i.e., the first current ratio, exceeds the preset first threshold.

[0064] Traditional range hoods typically require manual operation to turn on the lights. In recent years, some models have incorporated ambient light sensors to automatically turn on and off based on ambient brightness. However, this increases sensor costs, and many brightness sensors are mounted on the switch panel, requiring areas to remain transparent to allow light to pass through, which negatively impacts the overall aesthetics. Using the ratio of the darkroom current value to the reverse current value to determine whether to turn on the lighting in the semiconductor lamp is beneficial for automatically compensating for the drive current to maintain the target color temperature or brightness.

[0065] If the first current ratio exceeds a preset first threshold, a third reverse voltage is applied to the semiconductor lamp during the extinguishing interval of the semiconductor lamp within a preset second time range to obtain the initial current value of the semiconductor lamp.

[0066] In some embodiments, when it is determined that the first current ratio exceeds a preset first threshold, the attenuation degree of the semiconductor lamp is determined based on the reverse current value and the initial current value, including: when it is determined that the first current ratio exceeds the preset first threshold, calculating the ratio of the reverse current value and the initial current value to obtain a second current ratio; and when it is determined that the second current ratio does not exceed a preset second threshold, determining the attenuation degree of the semiconductor lamp.

[0067] Specifically, based on the second current ratio and the preset second threshold, it is determined whether the current semiconductor lamp is degrading; and if the semiconductor lamp is degrading, the degree of degradation of the current semiconductor lamp is determined based on the magnitude of the second current ratio.

[0068] Furthermore, the attenuation of LED groups with different color temperatures in the semiconductor lamp needs to be tested sequentially using the method described above. The driving parameters of the LED groups are then adjusted according to the attenuation degree of each LED group until the attenuation testing and adjustment of all LED groups in the semiconductor lamp are completed.

[0069] In some embodiments, the semiconductor lamp control method further includes: when the ambient light of the semiconductor lamp reaches a preset brightness, determining whether the current time is equal to the time since the last detection of the semiconductor lamp and whether a preset detection time interval has been reached; and if the current time is equal to the time since the last detection of the semiconductor lamp and the preset detection time interval has been reached, controlling the semiconductor lamp to enter an extinguishing gap.

[0070] By judging the detection time interval of semiconductor lamps, periodic detection of semiconductor lamps is realized.

[0071] This embodiment also provides a smart appliance that uses the above-mentioned control method for semiconductor lamps. The smart appliance is one of a smart range hood, dishwasher, or refrigerator.

[0072] Furthermore, the smart appliance is defined as any smart appliance with semiconductor lighting fixtures that has lighting requirements.

[0073] The present embodiment will be described and explained below through specific examples.

[0074] This specific embodiment provides a method and apparatus for online light decay detection, which can detect the light decay and lifespan of the range hood lamp online during operation and make pre-adjustments and supplements to provide a better cooking lighting experience and user cooking experience.

[0075] Specifically, a reverse photovoltage mapping method is employed, utilizing the photovoltaic effect of LED chips. A reverse voltage is applied during the off-state interval to accurately measure the reverse photocurrent generated by chips of different color temperatures. Because the photoelectric conversion efficiency of chips with attenuation decreases, the reverse current value deviates. This method temporarily transforms the LED chips into sensors, eliminating the need for additional photoelectric probes and fundamentally avoiding optical pollution. Simultaneously, it can detect ambient light intensity, enabling adaptive lighting adjustment. It can monitor attenuation online without additional sensors, automatically compensate for drive current to maintain the target color temperature or brightness, and synchronously detect ambient light to achieve adaptive lighting, greatly improving the user experience and performance of range hood lighting and ambient lighting.

[0076] Figure 3 is a schematic diagram of the installation structure of the intelligent range hood provided in this specific embodiment. Referring to Figure 3, the range hood light is located below the range hood and above the cooking utensils, specifically at the bottom of the range hood near the front end. It is elongated and located at the lower edge of the smoke collection chamber, parallel to the air intake. The light is directed towards the stove area below, facilitating the illumination of the cooking countertop.

[0077] Ordinary range hood lights typically consist of a set of LED beads with the same color temperature. Some models allow for custom brightness adjustment, while high-end models sometimes feature multiple sets of LED beads with different color temperatures. This allows for the mixing of different currents to create cooking lighting effects with varying color temperatures, thus meeting users' needs for color temperature and brightness adjustment.

[0078] In this specific embodiment, attenuation compensation for the LED bead group is achieved by driving and detecting the LED bead group. Figure 4 is an architecture diagram of the drive and detection module provided in this specific embodiment. Referring to Figure 4, the LED bead group is connected to the drive and detection circuit. The drive and detection circuit applies a certain reverse voltage to the LED bead group. Through the current sampling resistor and ADC conversion, the corresponding reverse current value, darkroom current value, and initial current value are obtained and sent to the microcontroller. The microcontroller determines whether PWM compensation output is needed for the LED bead group, or whether to remind relevant personnel to replace the LED beads through the alarm / display module.

[0079] The detection principle for the corresponding LED light-emitting diode group is as follows: Ordinary light-emitting diodes (LEDs) emit light when forward-biased, but they can also receive light under reverse voltage Vr, exhibiting a certain photovoltaic effect (when light shines on the PN junction of the LED, a voltage is generated across the PN junction, which is the photovoltaic effect). Therefore, ordinary LEDs can also be used as simple photodetectors when not emitting light, such as detecting changes in ambient light intensity (compared to the reverse current Ip0 calibrated in the laboratory darkroom), and realizing functions such as automatic switching of lights.

[0080] When the LED is in normal light-emitting state, its conversion efficiency It is somewhat related to the photocurrent Ip in the reverse state.

[0081] In an ideal scenario, the reverse photogenerated current Ip can be expressed by the formula:

[0082] ;

[0083] Where Plight is the optical power of the incident light, and e is the elementary charge. This refers to the conversion efficiency of the LED chips.

[0084] However, in reality, as the LED chips degrade over time, their photoelectric conversion efficiency η gradually decreases, resulting in a smaller reverse photocurrent Ip generated under the same conditions.

[0085] Therefore, by periodically measuring and comparing the reverse photocurrent value (reverse current value) Ip of each LED with the initial reference value (initial current value) Ip1, it is possible to determine whether the LED has degraded and the degree of degrade. For example, if the ratio of the measured reverse photocurrent value Ip to Ip1 is less than the set second threshold k (e.g., k=0.8), it can be determined that the LED has undergone significant degrade.

[0086] Before judging the attenuation of the LED beads, a baseline value needs to be calibrated in a dark room. This can avoid the interference of different ambient light after installation at the user's home and solve the problem of misjudgment of power on / off and attenuation caused by ambient light interference.

[0087] Figure 5 is a flowchart of the auxiliary standard lighting method in this specific embodiment. As shown in Figure 5, the LED bead group undergoes darkroom reference value calibration before production. First, the darkroom calibration is initiated. During the interval when the LED bead group's light is off, a reverse voltage Vr is applied to the LED bead group, and the corresponding reverse current Ip0, i.e., the darkroom current value, is collected. Based on the value of Ip0, it is determined whether auxiliary standard lighting needs to be turned on so that the current ambient brightness reaches the preset brightness. Subsequently, the reverse current, i.e., the initial current value Ip1, is collected, and the parameters Ip0 and Ip1 are stored for subsequent light decay judgment of the LED bead group.

[0088] When the light enters the off interval, the control board triggers the reverse voltage application and signal acquisition circuit module to sequentially apply a stable reverse voltage (denoted as Vr) to the LED groups of different color temperatures for a certain period of time t. During the application of the reverse voltage, the reverse photocurrent value Ip1 generated by each LED is collected using a current sensor, which can be used as an initial reference value. It should be noted that, in order to realize automatic lighting and light decay judgment, a set of current values ​​Ip0 is collected in a completely dark environment (there is still a certain basic current value even in the absence of light) for automatic lighting judgment, and a set of current values ​​Ip1 is collected under a specific brightness for automatic light decay judgment. Its physical significance lies in reflecting the photoelectric conversion capability of the LED under specific conditions. With the help of this signal, the health status of the LED can be indirectly reflected.

[0089] Figure 6 is a flowchart of the LED lamp bead group detection process provided in this specific embodiment. As shown in Figure 6, the detection process during the user use stage is as follows: First, ambient light detection is performed to determine whether the brightness of the current ambient light reaches the preset brightness. Then, if the brightness of the ambient light reaches the preset brightness, attenuation analysis is performed on the LED lamp bead group, and lighting decisions are determined based on the results of the attenuation analysis, thereby performing light decay compensation on the LED lamp bead group.

[0090] In one specific embodiment, an online light decay detection method is provided. Figure 7 is a flowchart illustrating the online light decay detection method provided in this specific embodiment. Referring to Figure 7, firstly, the smart appliance requiring illumination is turned on. After the smart appliance's system starts, an initialization test is performed on the smart appliance to determine whether a fault is detected. If a fault is detected in the smart appliance's lighting system, fault information is displayed and an alarm is triggered. If no fault is detected in the smart appliance's lighting system, a reverse voltage Vr is applied to a specific group of LED beads in the semiconductor lighting fixture, such as an LED lamp, for a duration t. Subsequently, the reverse photocurrent value Ip of this LED bead group is acquired, which is the reverse current value in the aforementioned embodiment.

[0091] After obtaining the reverse current value of the current LED, the ratio of the reverse current value Ip to the initial current value Ip0 is calculated to obtain the first current ratio in the aforementioned embodiment. When the first current ratio is greater than the preset first threshold K0, the ambient light is considered good and the light does not need to be turned on; when the first current ratio is not greater than the preset first threshold K0, the ambient light is determined to be weak and the lighting needs to be turned on.

[0092] Subsequently, it is necessary to check the time interval between the last test and the lighting fixture. If the time interval has not reached the test interval, then the current LED lighting fixture is kept working normally. If the time interval has reached the test interval, then it is necessary to control multiple groups of LED beads with different color temperatures in the LED lighting fixture to enter the extinguishing interval in turn so as to perform light decay test on the groups of LED beads in turn.

[0093] In the case of light decay detection, a reverse voltage Vr is applied to the LED group in the off state for a duration t. The reverse photocurrent value Ipi of the LED group is then collected, where i represents the group of different LED groups in the LED luminaire. After collecting the reverse photocurrent value Ipi, the ratio of Ipi to the corresponding initial current value Ipi1 is calculated to obtain the second current ratio in the aforementioned embodiment. If the second current ratio is less than a second threshold, the current LED is determined to be decaying, requiring the user to be reminded to replace the LED, or the lighting parameters, including the drive current and PWM duty cycle, are automatically adjusted. These lighting parameters are the drive parameters in the aforementioned embodiment. If the second current ratio is not less than the second threshold, the current LED is determined to be normal, and the current drive parameters are maintained, thus completing the detection of the current LED group.

[0094] After completing the test of the current LED group, it is necessary to further determine whether the test of all LED groups in the LED lamp has been completed. If it has, the lighting work is carried out according to the LED group after adjusting the driving parameters; if it has not been completed, the next LED group is switched, and during the off interval of the next LED group, a reverse voltage is applied to the LED group, and the above light decay detection steps are repeated.

[0095] The above method enables online attenuation detection of LED lamps, eliminating lighting problems caused by light decay of semiconductor lamps and providing users with a better lighting experience.

[0096] It should be noted that the steps shown in the above process or in the flowcharts in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions.

[0097] It should be noted that the specific examples in this embodiment can refer to the examples described in the above embodiments and optional implementations, and will not be repeated in this embodiment.

[0098] Furthermore, in conjunction with the semiconductor lamp control method provided in the above embodiments, this embodiment can also provide a storage medium for implementation. The storage medium stores a computer program; when executed by a processor, the computer program implements any of the semiconductor lamp control methods described in the above embodiments.

[0099] It should be understood that the specific embodiments described herein are merely illustrative of the application and not intended to limit it. All other embodiments derived by those skilled in the art based on the embodiments provided in this application without inventive effort are within the scope of protection of this application.

[0100] Obviously, the accompanying drawings are merely some examples or embodiments of this application. Those skilled in the art can apply this application to other similar situations based on these drawings without any creative effort. Furthermore, it is understood that although the work done in this development process may be complex and lengthy, for those skilled in the art, certain design, manufacturing, or production modifications made based on the technical content disclosed in this application are merely conventional technical means and should not be considered as insufficient disclosure of this application.

[0101] The term "embodiment" in this application refers to a specific feature, structure, or characteristic described in connection with an embodiment that may be included in at least one embodiment of this application. The appearance of this phrase in various places in the specification does not necessarily imply the same embodiment, nor does it imply that it is mutually exclusive with or independent of other embodiments. It will be clearly or implicitly understood by those skilled in the art that the embodiments described in this application may be combined with other embodiments without conflict.

[0102] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of patent protection. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the appended claims.

Claims

1. A method for controlling a semiconductor lighting fixture, characterized in that, The semiconductor lamp is installed in a smart range hood for illumination. The method includes: applying a first reverse voltage to the semiconductor lamp during its off-state interval to obtain a reverse current value; determining the attenuation degree of the semiconductor lamp based on the reverse current value, a darkroom current value, and an initial current value; the darkroom current value is generated based on charge movement in the semiconductor lamp under darkroom conditions; the initial current value is generated based on charge movement in the semiconductor lamp at a preset initial brightness; and adjusting the driving parameters of the semiconductor lamp based on the attenuation degree to compensate for light decay.

2. The control method for semiconductor lamps according to claim 1, characterized in that, Before applying a first reverse voltage to the semiconductor lamp to obtain the reverse current value of the semiconductor lamp, the method further includes: in a darkroom scenario, during the extinguishing interval of the semiconductor lamp, applying a second reverse voltage to the semiconductor lamp within a preset first time range to obtain the darkroom current value of the semiconductor lamp.

3. The control method for semiconductor lamps according to claim 1, characterized in that, Before applying a first reverse voltage to the semiconductor lamp to obtain the reverse current value of the semiconductor lamp, the method further includes: in a non-dark room scenario, during the extinguishing interval of the semiconductor lamp, applying a third reverse voltage to the semiconductor lamp within a preset second time range to obtain the initial current value of the semiconductor lamp.

4. The control method for semiconductor lamps according to claim 1, characterized in that, The step of determining the attenuation level of the semiconductor lamp based on the reverse current value, the darkroom current value, and the initial current value includes: calculating the ratio of the reverse current value to the darkroom current value to obtain a first current ratio; determining whether the first current ratio exceeds a preset first threshold; and if the first current ratio exceeds the preset first threshold, determining the attenuation level of the semiconductor lamp based on the reverse current value and the initial current value.

5. The control method for semiconductor lamps according to claim 4, characterized in that, The step of determining the attenuation level of the semiconductor lamp based on the reverse current value and the initial current value when the first current ratio exceeds a preset first threshold includes: calculating the ratio of the reverse current value to the initial current value to obtain a second current ratio when the first current ratio exceeds a preset first threshold; and determining the attenuation level of the semiconductor lamp when the second current ratio does not exceed a preset second threshold.

6. The control method for semiconductor lamps according to claim 4, characterized in that, The method further includes: when the ambient light of the semiconductor lamp reaches a preset brightness, determining whether the current time is equal to the time since the last detection of the semiconductor lamp and whether a preset detection time interval has been reached; if the current time is equal to the time since the last detection of the semiconductor lamp and the preset detection time interval has been reached, controlling the semiconductor lamp to enter an extinguishing gap.

7. The control method for semiconductor lamps according to claim 4, characterized in that, The method further includes: when it is determined that the first current ratio does not exceed a preset first threshold, controlling the semiconductor lamp to be turned on so that the ambient light of the environment where the semiconductor lamp is located reaches a preset brightness.

8. The control method for a semiconductor lamp according to any one of claims 1 to 7, characterized in that, The method includes: performing initialization detection on the semiconductor lamps in the smart range hood when the smart range hood is turned on.

9. A smart appliance, characterized in that, The control method for semiconductor lamps as described in any one of claims 1 to 8 is adopted, wherein the intelligent appliance is one of an intelligent range hood, dishwasher, and refrigerator.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the steps of the control method for the semiconductor lamps according to any one of claims 1 to 8.