An anti-interference pulsed inductance intensity measuring device and measuring method
By employing an internal and external anti-interference architecture and a three-level spatial partitioning design in the pulse inductance measurement device, the problem of the pulse inductance measurement device being susceptible to interference is solved, achieving high-precision and high-repeatability inductance measurement, which is suitable for power electronics and new energy fields.
Patent Information
- Application Number
- CN202610493104.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2026-04-15
- Publication Date
- 2026-07-24
- Estimated Expiration
- 2046-04-15
AI Technical Summary
Existing pulse inductance measurement devices are susceptible to electromagnetic radiation, contact resistance fluctuations, lead wire inductive coupling, environmental vibration, and temperature drift during measurement, resulting in decreased measurement accuracy and poor repeatability. Furthermore, traditional anti-interference designs cannot fundamentally solve these problems, leading to devices that are bulky, heavy, and inconvenient to carry.
An anti-interference architecture with separate internal and external placement is adopted, physically isolating the high-precision current sensor and the high-precision voltage sensor in an independent measurement isolation chamber, while strong interference sources and signal processing modules are placed in the external chassis space. Combined with a three-layer composite shielding structure, thermal fin array, shock absorption components and dedicated shielded lead structure, a three-level spatial partition is formed to isolate and suppress interference.
This device enables high-precision, highly repeatable pulse inductance measurements without the need for an external anechoic chamber or harsh laboratory conditions. It features a simple structure, controllable cost, and strong environmental adaptability, ensuring the stability and reliability of measurements.