Static reactive generator fault recording method, device and computer equipment
By using a three-phase independent bitmap scanning and bitmap-address mapping mechanism for the static var generator (SVA), fault modules can be quickly located and recorded, solving the problems of slow start-up and excessive data in SVA recording. This achieves millisecond-level recording processing and reduces the amount of data.
CN122193735APending Publication Date: 2026-06-12TBEA SUNOASIS +1
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TBEA SUNOASIS
- Filing Date
- 2025-11-27
- Publication Date
- 2026-06-12
Smart Images
Figure CN122193735A_ABST
Abstract
The application relates to a static reactive generator fault recording method, device and computer equipment. The method comprises the following steps: scanning three-phase independent bitmaps of a static reactive generator to obtain scanning results of each binary bit in each-phase independent bitmap; wherein each binary bit in each-phase independent bitmap represents the running state of a power module in the static reactive generator; determining a first fault module according to the scanning results; the first fault module is a power module corresponding to a target binary bit, and the scanning result of the target binary bit is a threshold fault value; determining the fault module address of the first fault module according to the bitmap difference between the target binary bit and the bitmap corresponding to the first fault module; and performing recording wave processing on the first fault module according to the fault module address of the first fault module. The method can quickly locate the fault module to start recording wave within milliseconds.
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