A self-assembled micro-component testing system and testing method

By building a self-constructed microscopic component testing system, which adopts quick-release connection and multi-source optical path design, the problem of existing microscope testing systems being unable to quickly disassemble or replace components is solved. This enables flexible testing and efficient replacement of microscopic components, improving the flexibility and applicability of the testing system.

CN122194449APending Publication Date: 2026-06-12CHANGSHA LUBANG PHOTOELECTRIC TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
CHANGSHA LUBANG PHOTOELECTRIC TECH CO LTD
Filing Date
2026-04-07
Publication Date
2026-06-12

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Abstract

The application relates to a self-assembly microscopic component test system and a test method, which comprises a fuselage, a filter turntable, a top slice bread board assembly with a sliding block, an objective lens turntable and a stage; a target sample is arranged on the stage; the filter turntable comprises a fluorescence channel provided with a filter assembly and a bright field channel without the filter assembly; a dichroic mirror assembly is movably arranged in the top slice bread board assembly with the sliding block; light emitted by a first light source assembly is sequentially irradiated to the target sample through the bright field channel and the objective lens turntable; light emitted by a second light source assembly is sequentially irradiated to the target sample through the fluorescence channel and the objective lens turntable; light emitted by a third light source assembly is sequentially irradiated to the target sample through the dichroic mirror assembly and the objective lens turntable; and a camera. The application can realize the test requirements of different test components in a set of test systems, and significantly improves the comprehensiveness and convenience of the test.
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Description

Technical Field

[0001] This application relates to the field of microscope testing technology, and in particular to a self-assembled microscopic component testing system and testing method. Background Technology

[0002] Currently, in optical microscope systems, the assembly and positioning accuracy of core components such as objective stages, filter stages, and breadboard assemblies with sliders directly affect the final image quality. However, existing technologies lack a flexible testing system for assessing the accuracy of each component.

[0003] Currently, existing microscopic component testing systems mainly suffer from the following problems: Traditional microscope testing systems are mostly monolithic structures, with internal components such as objective stages, filter stages, and dichroic mirror assemblies fixedly mounted on the machine body, making them difficult to disassemble or replace quickly and challenging for testing individual components. Existing testing systems can only test single components, replacing internal microscopic components is cumbersome, and they are typically sold as complete systems, resulting in low flexibility and excessively high costs.

[0004] Therefore, there is a need for a self-assembled microscopic component testing system and method that can take into account the testing of core components such as objective stage, filter stage, and breadboard assembly with slider top, and can be flexibly adjusted according to the testing objectives. Summary of the Invention

[0005] Therefore, it is necessary to provide a self-assembled microscopic component testing system and testing method, the specific technical solution of which is as follows.

[0006] A self-assembled micro-component testing system, comprising: The camera body includes, from top to bottom, a filter turntable, a top breadboard assembly with a slider, an objective lens turntable, and a stage; a target sample is placed on the stage; the filter turntable includes a fluorescence channel with a filter assembly and a bright field channel without a filter assembly; a dichroic mirror assembly is movably installed inside the top breadboard assembly with a slider. The light source assembly includes a first light source assembly, a second light source assembly, and a third light source assembly; the light emitted by the first light source assembly passes through a bright field channel and an objective lens stage in sequence before illuminating the target sample; the light emitted by the second light source assembly passes through a fluorescence channel and an objective lens stage in sequence before illuminating the target sample; the light emitted by the third light source assembly passes through a dichroic mirror assembly and an objective lens stage in sequence before illuminating the target sample. A camera is used to capture test images formed when various light sources illuminate the target sample.

[0007] Furthermore, the first light source component emits a white point light source, illuminating a cross-shaped target sample; the second light source component emits a four-color LED light source, illuminating a fluorescent target sample; and the third light source component emits a laser light source, illuminating a fluorescent target sample.

[0008] Furthermore, the camera body also includes a frame; the objective stage is movably mounted on the frame and located above the stage; the top breadboard assembly with slider is detachably mounted on the top of the frame and located above the objective stage; the filter stage is detachably mounted above the top breadboard assembly with slider; a lens barrel assembly is mounted above the filter stage; and the camera is mounted above the lens barrel assembly.

[0009] Furthermore, the objective stage is movably connected to the frame via a mounting bracket; the frame is provided with a first guide rail, and the mounting bracket includes a slider and a first quick-release assembly; the slider includes a slide plate and limb plates respectively connected to both sides of the slide plate, one limb plate slidingly engaging with a first side of the first guide rail, and the other limb plate being connected to the first quick-release assembly; the first quick-release assembly slidingly engaging with a second side of the first guide rail, with the first side and the second side opposite to each other.

[0010] Furthermore, the first quick-release assembly includes a locking block, a screw, and a corrugated spring; the locking block is slidably engaged with the second side of the first guide rail; the screw is threadedly connected to the limb plate, and the screw is rotatably connected to the locking block; the corrugated spring is disposed between the locking block and the limb plate.

[0011] Furthermore, the top breadboard assembly with slider has a second guide rail and a first positioning groove and a second positioning groove arranged at intervals inside; the dichroic mirror assembly includes a frame, a dichroic lens, a connecting plate, a positioning roller, and a lever; the frame is movably mounted on the second guide rail, and the dichroic lens is fixedly mounted on the frame; the connecting plate is connected to the frame, and the positioning roller is rotatably connected to the connecting plate; the lever is connected to the frame and extends to the outside of the top breadboard assembly with slider; the first positioning groove or the second positioning groove is used to accommodate and position the roller.

[0012] Furthermore, the filter turntable is mounted on top of the top breadboard assembly with slider via a second quick-release assembly; the second quick-release assembly includes a boss, at least two clips, and a fastening screw; the boss is connected to the filter turntable and forms an annular groove; the clips are connected to the top breadboard assembly with slider and are engaged in the annular groove; the fastening screw is connected to the top breadboard assembly with slider and abuts against the boss.

[0013] Furthermore, the second quick-release assembly includes two clips, the distance between which is less than the diameter of the boss.

[0014] A testing method using any of the above-described testing systems includes the following steps: The optical path is switched according to the test piece: when the test piece is a measuring objective stage, the light emitted by the first light source assembly passes through the bright field channel and the objective stage in sequence before illuminating the target sample; when the test piece is a measuring filter stage, the light emitted by the second light source assembly passes through the fluorescence channel and the objective stage in sequence before illuminating the target sample; when the test piece is a measuring breadboard assembly with a slider at the top, the light emitted by the third light source assembly passes through the dichroic mirror assembly and the objective stage in sequence before illuminating the target sample. Collect test images; Obtain the center value of the target feature in the test image; By comparing the center values ​​of target features under different states.

[0015] Furthermore, when the test piece is an objective stage, the target sample is a cross-shaped target sample, and the center value of the target feature is the center value of the cross-shaped target; when the test piece is a filter stage or a breadboard assembly with a slider top, the target sample is a fluorescent target sample, and the center value of the target feature is the center value of the same fluorescent microbead.

[0016] Beneficial effects: By designing the instrument body with the filter turntable, the breadboard assembly with slider, the objective stage, and the stage arranged sequentially from top to bottom, and by employing quick-release connections between the filter turntable and the breadboard assembly with slider, and between the objective stage and the frame, core microscopic components such as the objective stage, filter turntable, and dichroic mirror assembly can be independently installed, disassembled, or replaced according to testing requirements. When testing a specific microscopic component of a different model or batch, only that component needs to be replaced, without replacing the entire instrument.

[0017] By selectively activating different light sources and cooperating with the fluorescent or bright field channels in the filter turntable, as well as the dichroic mirror assembly in the breadboard assembly with slider, the system can quickly switch between multiple optical path modes on a single device, thereby adapting to the testing requirements of different test components and significantly improving the comprehensiveness and convenience of testing. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of the overall structure of the test system; Figure 2 This is a schematic diagram showing the connection between the mounting bracket and the rack; Figure 3 This is a schematic diagram of the interior of the top breadboard assembly of the slider; Figure 4 This is a schematic diagram showing the separation of the second quick-release component; Figure 5 A schematic diagram of a test image of a cross-shaped target sample; Figure 6 This is a schematic diagram of a test image of a fluorescent target sample.

[0020] Explanation of reference numerals in the attached drawings: 1. Filter turntable; 2. Breadboard assembly with slider top; 3. Objective stage; 4. Stage; 5. First light source assembly; 6. Second light source assembly; 7. Third light source assembly; 8. Frame; 9. Camera; 11. Boss; 12. Clip; 13. Fastening screw; 21. Second guide rail; 22. Frame; 23. Dichroic lens; 24. Connecting plate; 25. Positioning roller; 26. Pulse; 27. First positioning groove; 28. Second positioning groove; 31. Slider; 32. Locking block; 33. Screw; 34. Corrugated spring; 81. First guide rail. Detailed Implementation

[0021] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0022] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0023] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0024] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0025] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0026] It should be noted that when an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.

[0027] Example 1 Reference Figure 1-4 As shown, this embodiment provides a self-assembled microscopic component testing system, including a body, a light source assembly, and a camera.

[0028] The camera body includes, from top to bottom, a filter turntable 1, a breadboard assembly with a slider at the top, an objective lens turntable 3, and a stage 4. A target sample is placed on the stage 4. The filter turntable 1 includes a fluorescence channel with a filter assembly and a brightfield channel without a filter assembly. A dichroic mirror assembly is movably mounted within the breadboard assembly with a slider at the top.

[0029] The light source assembly includes a first light source assembly 5, a second light source assembly 6, and a third light source assembly 7. Light emitted from the first light source assembly 5 sequentially passes through the bright field channel of the filter turntable 1 and the objective lens turntable 3 before illuminating the target sample, forming a bright field illumination path. Light emitted from the second light source assembly 6 sequentially passes through the fluorescence channel of the filter turntable 1 and the objective lens turntable 3 before illuminating the target sample, forming a fluorescence illumination path. Light emitted from the third light source assembly 7 sequentially passes through the dichroic mirror assembly within the breadboard assembly 2 with a slider top and the objective lens turntable 3 before illuminating the target sample, forming a laser reflection illumination path.

[0030] The camera is mounted above the filter turntable 1 and is used to collect test images formed by the illumination of the target sample by various light sources.

[0031] By designing the body as a series of components arranged from top to bottom—a filter turntable 1, a breadboard assembly with a slider top, an objective turntable 3, and a stage 4—and integrating three light source components with different characteristics, the system can switch between brightfield, fluorescence, and laser reflection illumination modes on a single device, thus adapting to the testing needs of different microscopic components. Simultaneously, the filter turntable 1 houses both a fluorescence channel and a brightfield channel, which, together with the dichroic mirror assembly, provides the optical path foundation for subsequent modular testing.

[0032] It should be noted that when the test specimen is the objective stage 3, the system switches to the first light source assembly 5. The first light source assembly 5 emits a white point light source, such as a halogen lamp with a pinhole aperture, or a white LED with a pinhole aperture. The dichroic mirror assembly is moved away from the light path, and the filter stage 1 is rotated so that the bright field channel without a filter assembly is in the light path. Thus, the light emitted by the first light source assembly 5 passes sequentially through the bright field channel and the objective stage 3 before illuminating the target sample. At this time, the target sample is a cross-shaped target sample, and the resulting test image is as follows. Figure 5 As shown, the objective stage 3 is ring-mounted with multiple objectives, which is a bright-field imaging system. The crosshair of the target reflects the light source, creating a new black-and-white boundary image. Image processing can more quickly and accurately locate the coordinates of the crosshair center point. The crosshair target sample can be formed by coating the surrounding area with a black light-absorbing material and reserving the crosshair area in the middle.

[0033] When the test piece is in the filter stage 1, the system switches to the second light source assembly 6. The second light source assembly 6 emits a four-color LED light source, for example, an LED beam combiner module containing four wavelengths: 365nm, 488nm, 565nm, and 640nm. The filter stage is rotated so that the fluorescence channel with the filter assembly is in the optical path. Thus, the light emitted by the second light source assembly 6 passes sequentially through the fluorescence channel and the objective lens stage 3 before illuminating the target sample. At this time, the target sample is a fluorescent target sample, and the resulting test image is shown below. Figure 5 As shown. The filter turntable 1 is equipped with different wavelength filter groups for switching, so a four-color LED light source is required to switch between different wavelength light sources to excite the fluorescent microbeads. The fluorescent microbeads can be excited by the corresponding wavelength light to emit light and form a boundary with the dark background. Image processing can find the center of the emitting circle more quickly and accurately.

[0034] When the test piece is a top bread assembly with slider 31, the system switches to the third light source assembly 7. This third light source assembly 7 emits a laser light source, such as a 488nm or 640nm semiconductor laser. The dichroic mirror assembly is moved so that it is in the optical path, allowing the light emitted by the third light source assembly 7 to pass sequentially through the dichroic mirror assembly and the objective lens stage 3 before illuminating the target sample. At this point, the target sample is a fluorescent target sample. The dichroic mirror can reflect light of a specific wavelength, and the fluorescent microspheres can be excited by the corresponding wavelength of light to emit light, forming a boundary with the dark background. Image processing can then more quickly and accurately locate the center of the emitting circle.

[0035] Based on the characteristics of different test components such as objective stage 3, filter stage 1, and dichroic mirror slider 31, the most suitable light source type and target type are matched respectively. White light is used with cross targets for bright field, broadband LEDs are used with fluorescent microspheres for fluorescence, and monochromatic lasers are used with fluorescent microspheres for laser, thereby ensuring image contrast and measurement accuracy in various test scenarios.

[0036] In one embodiment, the camera body further includes a frame 8. The objective stage 3 is movably mounted on the frame 8 and located above the stage 4. The top breadboard assembly 2 with a slider is detachably mounted on the top of the frame 8 and located above the objective stage 3. The filter stage 1 is detachably mounted above the top breadboard assembly 2 with a slider. A lens barrel assembly is mounted above the filter stage 1, and the camera is mounted above the lens barrel assembly.

[0037] With the above-mentioned detachable design, the objective stage 3, the top breadboard assembly with slider 2, and the filter stage 1 can all be independently removed from the frame 8 and replaced with other models or batches of components to be tested, realizing multi-testing with one machine.

[0038] The multi-layered, detachable stacked structure allows each core microscopic component to be replaced independently and quickly without disassembling the entire system, greatly improving the flexibility and applicability of the testing system.

[0039] In one embodiment, reference Figure 2 As shown, the objective stage 3 is movably connected to the frame 8 via a mounting bracket. The frame 8 is provided with a first guide rail 81. The mounting bracket includes a slider 31 and a first quick-release assembly. The slider 31 includes a sliding plate and limb plates respectively connected to both sides of the sliding plate. One limb plate is slidably engaged with a first side of the first guide rail 81, and the other limb plate is connected to the first quick-release assembly. The first quick-release assembly is slidably engaged with a second side of the first guide rail 81, with the first side and the second side opposite each other.

[0040] With the above structure, the mounting bracket can slide up and down along the first guide rail 81, thereby adjusting the height of the objective stage 3. When it is necessary to replace the objective stage 3, simply loosen the first quick-release assembly to remove the entire mounting bracket along with the objective stage 3 from the guide rail. The double-sided clamping sliding fit structure ensures both the straightness and stability of the objective stage 3's movement along the guide rail, and also enables quick assembly and disassembly through the first quick-release assembly, facilitating individual testing or replacement of the objective stage 3.

[0041] In one embodiment, the first quick-release assembly includes a locking block 32, a screw 33, and a corrugated spring 34. The locking block 32 is slidably engaged with the second side of the first guide rail 81. The screw 33 is threadedly connected to the limb plate, and one end of the screw 33 is rotatably connected to the locking block 32. The corrugated spring 34 is disposed between the locking block 32 and the limb plate and is sleeved on the screw 33.

[0042] When screw 33 is tightened, it pulls the locking block 32 towards the limb plate, causing the locking block 32 to fit tightly against the second side of the first guide rail 81. Simultaneously, the limb plate fits tightly against the first side of the first guide rail 81, thus achieving locking. When screw 33 is loosened, the corrugated spring 34 pushes the locking block 32 away from the limb plate, creating a gap between the locking block 32 and the guide rail, allowing the mounting bracket to be easily removed.

[0043] The screw 33 and the corrugated spring 34 work together to achieve quick locking and releasing, making operation simple and locking reliable. The corrugated spring 34 provides preload to prevent the screw 33 from loosening, while also ensuring a smooth feel during assembly and disassembly.

[0044] In one embodiment, reference Figure 3As shown, the breadboard assembly 2 with slider has a second guide rail 21 and a first positioning groove 27 and a second positioning groove 28 arranged at intervals along the sliding direction. The dichroic mirror assembly includes a frame 22, a dichroic lens 23, a connecting plate 24, a positioning roller 25, and a lever 26. The frame 22 is movably mounted on the second guide rail 21 and can slide horizontally along the guide rail. The dichroic lens 23 is fixedly mounted on the frame 22, and the lens forms a 45° angle with the optical axis. The connecting plate 24 is fixedly connected to the frame 22, and the positioning roller 25 is rotatably connected to the connecting plate 24 via a rotating shaft. The lever 26 is connected to the frame 22 and extends to the outside of the breadboard assembly 2 with slider for the operator to push. The first positioning groove 27 or the second positioning groove 28 is used to accommodate and position the roller.

[0045] When the toggle 26 moves the frame 22 to the first positioning groove 27, the positioning roller 25 falls into the first positioning groove 27, producing a clear positioning feel. At this time, the dichroic lens 23 enters the optical path. When it slides to the second positioning groove 28, the roller falls into the second positioning groove 28, and the dichroic lens 23 moves out of the optical path.

[0046] In one embodiment, reference Figure 4 As shown, the filter turntable 1 is mounted on top of the breadboard assembly 2 with a slider via a second quick-release assembly. The second quick-release assembly includes a boss 11, at least two locking members 12, and a fastening screw 13. The boss 11 is fixedly connected to the bottom of the filter turntable 1, forming an annular groove. The locking members 12 are fixedly connected to the upper surface of the breadboard assembly 2 with a slider, and the heads of the locking members 12 are engaged in the annular groove. The fastening screw 13 is threaded onto the breadboard assembly 2 with a slider, and its end abuts against the side of the boss 11.

[0047] During installation, place the boss 11 of the filter turntable 1 into the space enclosed by the retaining piece 12, rotate the filter turntable 1 to make the retaining piece 12 enter the annular retaining groove, and then tighten the locking screw 13 to lock it. During disassembly, loosen the locking screw 13 and rotate the filter turntable 1 in the opposite direction to remove it.

[0048] The rotating engagement structure of the boss 11 and the clip 12, along with the fastening screw 13, enables the quick installation and disassembly of the filter turntable 1. The connection is reliable and without shaking, making it easy to replace the filter turntable 1 of different specifications for testing.

[0049] In one embodiment, the second quick-release assembly includes two clips 12, the distance between which is less than the diameter of the boss 11. During disassembly, simply loosening the fastening screw 13 allows the boss 11 to be moved laterally, separating it from the clips 12, thus facilitating both the disassembly and installation of the filter turntable 1.

[0050] Example 2 This embodiment provides a testing method using the testing system described in Embodiment 1, including the following steps: Step S1: Switch the optical path according to the test piece.

[0051] When the test piece is the measuring objective stage 3: the light emitted from the first light source assembly 5 passes sequentially through the bright field channel of the filter stage 1 and the objective stage 3 before illuminating the target sample. At this time, the filter stage 1 should switch to the bright field channel, i.e., the empty space without the filter assembly or the neutral glass. The dichroic mirror assembly in the top breadboard assembly 2 with the slider should be moved out of the light path, and the positioning roller 25 should be located in the second positioning slot 28. At this time, the second light source assembly 6 and the third off-light source assembly are turned off.

[0052] When the test piece is the measurement filter turntable 1: the light emitted by the second light source assembly 6 passes sequentially through the fluorescence channel of the filter turntable 1 and the objective lens turntable 3 before illuminating the target sample. At this time, the filter turntable 1 should switch to the fluorescence channel to be tested, and the dichroic mirror assembly should be moved out of the light path.

[0053] When the test piece is the breadboard assembly 2 with a slider: the light emitted by the third light source assembly 7 passes sequentially through the dichroic mirror assembly and the objective lens stage 3 before illuminating the target sample. At this time, the filter stage 1 should be switched to the bright field channel, the dichroic mirror assembly should be pushed into the optical path by the toggle block 26, and the positioning roller 25 should be engaged in the first positioning slot 27.

[0054] Step S2: Collect test images.

[0055] Test images were captured using a camera under the aforementioned optical paths. For the test of objective stage 3, images of the crosshair target were captured; for the test of filter stage 1 or the breadboard assembly 2 with slider top, images of the fluorescent microspheres were captured.

[0056] Step S3: Obtain the center value of the target feature in the test image.

[0057] Image processing algorithms were used to extract the center coordinates of target features. For a cross-shaped target, the center coordinates of the cross intersection were extracted; for fluorescent microspheres, the center coordinates of a single microsphere were extracted.

[0058] Step S4: Evaluate the accuracy of the tested component by comparing the center values ​​of the target features under different states.

[0059] For objective stage 3: Test the cross center coordinates of objective stage 3 at different angular positions, calculate the offset of the center coordinates at each position, and thus obtain the positioning accuracy and repeatability of objective stage 3.

[0060] For filter turntable 1: Test the center coordinates of the same fluorescent microbead under different fluorescence channels, calculate the center offset between channels, and thus evaluate the positioning accuracy and repeatability of the filter assembly.

[0061] For the top breadboard assembly 2 with slider: test the center coordinates of the same fluorescent microbead when the dichroic mirror assembly is located in the first positioning groove 27 and the second positioning groove 28 respectively, calculate the difference between the two, and thus obtain the repeatability of the dichroic mirror assembly.

[0062] In one embodiment, when the test piece is the objective stage 3: the target sample is a cross-shaped target sample, and the center value of the target feature is the center intersection of the cross-shaped target.

[0063] When the test piece is a filter turntable 1 or a breadboard assembly with a slider top: the target sample is a fluorescent target sample, and the center value of the target feature is the center coordinate of the same fluorescent microbead.

[0064] With the above structure, the mounting bracket can slide up and down along the first guide rail 81, thereby adjusting the height of the objective lens stage 3. When it is necessary to replace the objective lens stage 3, simply loosen the first quick-release assembly to remove the entire mounting bracket along with the objective lens stage 3 from the guide rail.

[0065] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0066] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A self-assembled microscopic component testing system, characterized in that, include: The camera body includes, from top to bottom, a filter turntable, a top breadboard assembly with a slider, an objective lens turntable, and a stage; a target sample is placed on the stage; the filter turntable includes a fluorescence channel with a filter assembly and a bright field channel without a filter assembly; a dichroic mirror assembly is movably installed inside the top breadboard assembly with a slider. The light source assembly includes a first light source assembly, a second light source assembly, and a third light source assembly; the light emitted by the first light source assembly passes through a bright field channel and an objective lens stage in sequence before illuminating the target sample; the light emitted by the second light source assembly passes through a fluorescence channel and an objective lens stage in sequence before illuminating the target sample; the light emitted by the third light source assembly passes through a dichroic mirror assembly and an objective lens stage in sequence before illuminating the target sample. A camera is used to capture test images formed when various light sources illuminate the target sample.

2. The self-assembled microscopic component testing system according to claim 1, characterized in that, The first light source component emits a white point light source, illuminating a cross-shaped target sample; the second light source component emits a four-color LED light source, illuminating a fluorescent target sample; and the third light source component emits a laser light source, illuminating a fluorescent target sample.

3. The self-assembled microscopic component testing system according to claim 1, characterized in that, The camera body also includes a frame; the objective stage is movably mounted on the frame and located above the stage; the top breadboard assembly with slider is detachably mounted on the top of the frame and located above the objective stage; the filter stage is detachably mounted above the top breadboard assembly with slider; a lens barrel assembly is mounted above the filter stage; and the camera is mounted above the lens barrel assembly.

4. The self-assembled microscopic component testing system according to claim 3, characterized in that, The objective stage is movably connected to the frame via a mounting bracket; the frame is provided with a first guide rail; the mounting bracket includes a slider and a first quick-release assembly; the slider includes a slide plate and limb plates respectively connected to both sides of the slide plate, one limb plate is slidably engaged with a first side of the first guide rail, and the other limb plate is connected to the first quick-release assembly; the first quick-release assembly is slidably engaged with a second side of the first guide rail, and the first side and the second side are opposite to each other.

5. The self-assembled microscopic component testing system according to claim 4, characterized in that, The first quick-release assembly includes a locking block, a screw, and a corrugated spring; the locking block is slidably engaged with the second side of the first guide rail; the screw is threadedly connected to the limb plate and rotatably connected to the locking block; the corrugated spring is disposed between the locking block and the limb plate.

6. The self-assembled microscopic component testing system according to claim 1, characterized in that, The top breadboard assembly with slider has a second guide rail inside, as well as a first positioning groove and a second positioning groove arranged at intervals; the dichroic mirror assembly includes a frame, a dichroic lens, a connecting plate, a positioning roller, and a lever; the frame is movably mounted on the second guide rail, and the dichroic lens is fixedly mounted on the frame; the connecting plate is connected to the frame, and the positioning roller is rotatably connected to the connecting plate; the lever is connected to the frame and extends to the outside of the top breadboard assembly with slider; the first positioning groove or the second positioning groove is used to accommodate and position the roller.

7. The self-assembled microscopic component testing system according to claim 1, characterized in that, The filter turntable is mounted on top of the top breadboard assembly with slider via a second quick-release assembly; the second quick-release assembly includes a boss, at least two clips, and a fastening screw; the boss is connected to the filter turntable and forms an annular groove; the clips are connected to the top breadboard assembly with slider and are engaged in the annular groove; the fastening screw is connected to the top breadboard assembly with slider and abuts against the boss.

8. The self-assembled microscopic component testing system according to claim 7, characterized in that, The second quick-release assembly includes two clips, the distance between which is less than the diameter of the boss.

9. A test method using the test system according to any one of claims 1 to 8, characterized in that, Includes the following steps: The optical path is switched according to the test piece: when the test piece is a measuring objective stage, the light emitted by the first light source assembly passes through the bright field channel and the objective stage in sequence before illuminating the target sample; when the test piece is a measuring filter stage, the light emitted by the second light source assembly passes through the fluorescence channel and the objective stage in sequence before illuminating the target sample; when the test piece is a measuring breadboard assembly with a slider at the top, the light emitted by the third light source assembly passes through the dichroic mirror assembly and the objective stage in sequence before illuminating the target sample. Collect test images; Obtain the center value of the target feature in the test image; By comparing the center values ​​of target features under different states.

10. The test method according to claim 9, characterized in that, When the test piece is an objective stage, the target sample is a cross-shaped target sample, and the center value of the target feature is the center value of the cross-shaped target; when the test piece is a filter stage or a breadboard assembly with a slider top, the target sample is a fluorescent target sample, and the center value of the target feature is the center value of the same fluorescent microbead.