Hidden point reflection imaging method under thermal insulation tile based on waveform translation correction

By employing waveform translation correction and 3D data processing, the problem of waveform misalignment in terahertz imaging is solved, achieving high-quality image reconstruction and positioning accuracy. This method is suitable for imaging hidden points under thermal insulation tiles and has wide applications, especially in the inspection of aviation thermal insulation tiles.

CN122243886APending Publication Date: 2026-06-19CHONGQING UNIV OF POSTS & TELECOMM
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
CHONGQING UNIV OF POSTS & TELECOMM
Filing Date
2026-03-02
Publication Date
2026-06-19

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Abstract

This invention relates to a method for hidden point reflection imaging under thermal insulation tiles based on waveform translation correction, belonging to the field of terahertz imaging. It includes the following steps: First, a two-dimensional planar scan of the sample is performed, and the system acquires the complete terahertz time-domain pulse waveform within the time range of each point in the scan area. Then, the time of the skin signal is found, and the maximum amplitude of all terahertz waveforms obtained from the two-dimensional scan is aligned to this time. To reflect the contrast of all waveforms, all waveforms are normalized. A three-dimensional data matrix is ​​constructed using the length and width of the physical scan image and the length of the terahertz scan time. Median filtering is applied to this matrix to improve the signal-to-noise ratio. Finally, the desired imaging time slice is set for imaging.
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