Test apparatus and test method

Abstract

The test apparatus according to embodiments disclosed herein may include: a voltage application unit that applies a first voltage and a surge voltage to a relay of a battery; a voltage acquisition unit that acquires a second voltage applied across the relay in response to an input of the first voltage; a voltage detection unit that detects a transient segment indicating a transient state of the second voltage; and a controller that controls the voltage application unit to apply a surge voltage in the transient segment.

Description

Technical Field

[0001] Cross-references to related applications

[0002] This application claims priority to Korean Patent Application No. 10-2024-0016809, filed on February 2, 2024, with the Korean Intellectual Property Office, the disclosure of which is incorporated herein by reference. Technical Field

[0003] The embodiments disclosed herein relate to a test apparatus and a test method. Background Technology

[0004] In recent years, research and development of rechargeable batteries have been actively pursued. Here, rechargeable batteries are batteries capable of being recharged and discharged, and can be interpreted as encompassing conventional Ni / Cd batteries, Ni / MH batteries, and more recently, lithium-ion batteries. In recent years, lithium-ion batteries have expanded their applications to power electric vehicles, making batteries a promising next-generation energy storage medium.

[0005] In addition, secondary batteries are typically used as battery packs that include battery modules, in which multiple individual cells are connected in series and / or parallel. The state and operation of the battery pack are managed and controlled by a battery management system.

[0006] Because of the potential for fire accidents when using lithium-ion batteries, safety checks are necessary. These checks include overcharge testing, discharge testing, internal short-circuit testing, and electromagnetic compatibility testing.

[0007] Electromagnetic compatibility (EMC) testing is used to evaluate the immunity of a device under test (e.g., a battery) to electromagnetic interference. For example, EMC testing can be performed by applying a surge voltage to the device under test to test its immunity to surges. In this case, when configuring the circuitry for EMC testing, the test equipment is connected to a relay included in the device under test. In this situation, electrical noise, or chattering, occurs during the connection to the relay contacts. Summary of the Invention

[0008] Technical issues

[0009] The purpose of the embodiments disclosed herein is to provide a test device and test method capable of testing the surge immunity of a battery pack or battery cell.

[0010] The purpose of the embodiments disclosed herein is to provide a test apparatus and test method that can control the timing of the surge application depending on the state of the device under test during a surge test of a battery pack or battery cell.

[0011] The technical problems of the embodiments disclosed herein are not limited to those mentioned above, and other objectives not mentioned will be clearly understood by those skilled in the art from the following description.

[0012] Technical solution

[0013] The test apparatus according to embodiments disclosed herein includes: a voltage application unit that applies a first voltage and a surge voltage to a relay of a battery; a voltage acquisition unit that acquires a second voltage applied across the relay in response to an input of the first voltage; a voltage detection unit that detects a transient segment indicating a transient state of the second voltage; and a controller that controls the voltage application unit to apply a surge voltage in the transient segment.

[0014] According to this embodiment, the voltage detection unit can calculate the change in the second voltage per unit time and compare the change with a first threshold to detect transient segments.

[0015] According to this embodiment, the voltage detection unit can determine the segment where the change is greater than a first threshold as a transient segment.

[0016] According to this embodiment, the voltage detection unit can calculate a difference between a first voltage and a second voltage, and compare the difference with a second threshold to detect transient segments.

[0017] According to this embodiment, the voltage detection unit can identify the segment where the difference is greater than the second threshold as a transient segment.

[0018] According to this embodiment, the controller can control at least one of the surge voltage amplitude, the timing of the surge voltage application, and the number of surge voltage applications.

[0019] According to this embodiment, the first voltage can be a DC voltage.

[0020] The test method according to the embodiments disclosed herein includes: applying a first voltage to a relay of a battery; acquiring a second voltage applied across the relay in response to the input of the first voltage; detecting a transient segment indicating a transient state of the second voltage; and applying a surge voltage in the transient segment.

[0021] According to this embodiment, the detection of a transient segment may include calculating the change in a second voltage per unit time and comparing the change with a first threshold to detect the transient segment.

[0022] According to this embodiment, the testing method may include identifying segments with changes greater than a first threshold as transient segments.

[0023] According to this embodiment, detecting a transient segment may include calculating a difference between a first voltage and a second voltage, and comparing the difference with a second threshold to detect the transient segment.

[0024] According to this embodiment, a testing method is performed. The testing method may include identifying segments with a difference greater than a second threshold as transient segments.

[0025] According to this embodiment, applying a surge voltage may include determining at least one of the following: the magnitude of the surge voltage, the timing of the surge voltage application, and the number of surge voltage applications.

[0026] According to this embodiment, the first voltage can be a DC voltage.

[0027] Beneficial effects

[0028] The test equipment and test methods disclosed in this document can be used to test the surge immunity of battery packs or battery cells.

[0029] The test equipment and test methods according to the embodiments disclosed herein can control the timing of the surge application depending on the state of the device under test during the surge test of the battery pack or battery cell.

[0030] In addition, various effects can be provided, either directly or indirectly, through this disclosure. Attached Figure Description

[0031] Figure 1 This is a block diagram illustrating a battery pack according to an embodiment disclosed herein.

[0032] Figure 2 It is a graph showing the battery voltage under operation according to the test equipment in the prior art.

[0033] Figure 3 This is a block diagram illustrating a test apparatus according to an embodiment disclosed herein.

[0034] Figure 4 This is a graph showing the first and second voltages according to embodiments disclosed herein.

[0035] Figure 5 This is a graph showing the surge voltage and the second voltage according to the embodiments disclosed herein.

[0036] Figure 6 This is a flowchart illustrating the operation of a test apparatus according to an embodiment disclosed herein.

[0037] Figure 7 This is a block diagram illustrating the hardware configuration of a computing system for performing test methods according to embodiments disclosed herein. Detailed Implementation

[0038] In the following description, various embodiments disclosed in the present invention will be described with reference to the accompanying drawings. However, this is not intended to limit the invention to the specific embodiments, and should be construed as including various modifications, equivalents, and / or substitutions to the embodiments of the invention.

[0039] It should be understood that the various embodiments of this disclosure and the terminology used therein are not intended to limit the technical features set forth herein to the particular embodiments, and include various changes, equivalents, or substitutions to the corresponding embodiments. Regarding the description of the drawings, similar or related reference numerals may be used to refer to similar or related elements. It should be understood that, unless the relevant context clearly indicates otherwise, the singular form of the noun corresponding to an item may include one or more things.

[0040] As used herein, each of the phrases such as “A or B,” “at least one of A and B,” “at least one of A or B,” “A, B or C,” “at least one of A, B and C,” and “at least one of A, B or C” may include any one or all possible combinations of the items listed together in the corresponding phrase within the phrase. Unless otherwise specifically stated, terms such as “first” and “second,” “first,” “second,” “A,” “B,” “(a),” or “(b)” may be used simply to distinguish a corresponding component from another component and do not otherwise limit the components (e.g., in terms of importance or order).

[0041] In this specification, it should be understood that if an element (e.g., a first element) is referred to as "connected to," "coupled to," or "in contact with" another element (e.g., a second element) with or without the terms "operably" or "communically," it means that the element can be connected to the other element directly (e.g., via wired or wireless) or via a third element.

[0042] According to embodiments, methods according to various embodiments disclosed herein can be included and provided in a computer program product. The computer program product can be a product transaction between a seller and a buyer. The computer program product can be distributed in the form of a machine-readable storage medium (e.g., an optical disc read-only memory and a CD-ROM), or distributed online via an app store (e.g., downloaded or uploaded), or directly between two user devices. If distributed online, at least a portion of the computer program product can be temporarily generated or at least temporarily stored in a machine-readable storage medium, such as the memory of a manufacturer's server, an app store's server, or a relay server.

[0043] According to various embodiments, each component (e.g., a module or program) of the above-described components may include a single entity or multiple entities, and some of the multiple entities may be set separately from the other components. According to various embodiments, one or more components or operations of the above-described components may be omitted, or one or more other components or operations may be added. Alternatively or additionally, multiple components (e.g., modules or programs) may be integrated into a single component. In this case, the integrated component can still perform one or more functions of each of the multiple components in the same or similar manner as those performed by the corresponding components of the multiple components prior to integration. According to various embodiments, operations performed by a module, program, or other component may be performed sequentially, in parallel, repeatedly, or heuristically, or one or more of the operations may be performed in a different order or omitted, or one or more other operations may be added.

[0044] Figure 1 This is a block diagram illustrating a battery pack according to an embodiment disclosed herein.

[0045] refer to Figure 1 The battery pack 1 may include battery cells 10, sensor units 14, switching units 16, and a battery management system (BMS) 20. In this case, the battery pack 1 may be equipped with multiple battery cells 10, sensor units 14, switching units 16, and battery management systems 20.

[0046] According to this embodiment, battery cell 10 can supply power to a target device (not shown). For this purpose, battery cell 10 can be electrically connected to the target device. Here, the target device can include electrical, electronic, or mechanical devices that operate by receiving power from battery pack 1. For example, the target device can be an electric vehicle (EV) or an energy storage system (ESS), but is not limited thereto.

[0047] According to this embodiment, the battery cell 10 may include at least one rechargeable battery cell 12. Here, the battery cell 12 may be a basic unit of a battery cell that can be used to charge and discharge using electrical energy. For example, the battery cell 12 may be a lithium-ion (Li-ion) battery, a lithium-ion (Li-ion) polymer battery, a nickel-cadmium (Ni-Cd) battery, a nickel-metal hydride (Ni-MH) battery, etc., but is not limited thereto.

[0048] According to this embodiment, multiple battery cells 10 can be connected in series or in parallel. For example, battery cell 10 can be a collection of battery modules, battery banks, or individual battery cells (cell-to-group structure).

[0049] According to this embodiment, sensor unit 14 can acquire information related to battery cell 10. According to this embodiment, sensor unit 14 can acquire values ​​(or information) related to the state of each battery cell 10. In this embodiment, the state-related values ​​may include one or more values ​​of the battery cell's voltage, current, resistance, state of charge (SOC), state of health (SOH), or temperature, or combinations thereof.

[0050] According to this embodiment, the sensor unit 14 can provide information about each of the plurality of battery cells 10 to the battery management system 20.

[0051] According to this embodiment, the switching unit 16 can switch the connection between the battery pack 1 and an external device (e.g., the test device 100). For example, the switching unit 16 can switch the electrical connection between the battery pack 1 and the external device (e.g., a port provided in the battery pack 1 (not shown)) to connect the test device 100 and other components included in the battery pack 1 (e.g., battery cell 10, battery unit 12, sensor unit 14, and BMS 20). Here, the port provided in the battery pack 1 may include a power port for applying power, a signal port for transmitting electrical signals, etc.

[0052] According to an embodiment, the switching unit 16 may include a device for controlling the flow of current for charging or discharging the battery cell 10. For example, the switching unit 16 may include at least one relay and / or magnetic contactor, depending on the specifications of the battery pack 1.

[0053] According to an embodiment, the battery management system (BMS) 20 can control or manage the battery pack 1 to prevent overcharging and over-discharging by monitoring the voltage, current, temperature, etc. of the battery pack 1. For example, the battery management system 20 may be an interface for receiving values ​​obtained by measuring the various parameters mentioned above, and may include multiple terminals, circuitry connected to the terminals to process the input values, etc. Additionally, the battery management system 20 can control the sensor unit 14 and / or the switching unit 16. For example, the battery management system 20 may be connected to multiple battery cells 10 to monitor the state of each of the multiple battery cells 10 and control the on / off state of relays, contactors, etc.

[0054] According to an embodiment, the operation of the battery management system 20 can be performed by the BMS (Battery Management System) in the vehicle and by various devices such as servers, cloud, chargers, or chargers / dischargers.

[0055] The upper-level controller 2 can transmit control signals for the multiple battery cells 10 to the battery management system 20. Therefore, the operation of the battery management system 20 can be controlled based on the signals received from the upper-level controller 2.

[0056] According to an embodiment, the test equipment 100 can test the operation and / or state of the device under test. Here, the device under test may include a battery pack 1 or a battery cell 10. For example, the test equipment 100 may refer to a surge test device used to test the surge immunity of the device under test. Here, a surge may refer to a sudden change in voltage, and surges may occur when electronic equipment experiences conditions such as a blown fuse, lightning, the opening of a closed switch, noise, excessive electromagnetic load, etc.

[0057] The test apparatus 100 according to various embodiments may include the test apparatus specified in the international standard IEC 61000-4-5. For example, the test apparatus 100 may test the surge immunity of the device under test by applying a predetermined standard voltage and current to the device under test.

[0058] According to an embodiment, the test device 100 can be connected to a power port or a signal port of the device under test. For example, the test device 100 can apply a surge to a power port or a signal port provided in the battery pack 1.

[0059] Figure 2 It is a graph showing the battery voltage under operation according to the test equipment in the prior art.

[0060] refer to Figure 2 The test equipment 100 can apply a surge voltage S to the device under test. Here, the surge voltage S can refer to a sudden voltage fluctuation (e.g., a high voltage).

[0061] According to the embodiment, since there is no international standard specifying the timing and method for applying a surge to the device under test (e.g., battery pack 1 or battery cell 10), the tester typically applies a surge voltage S using a surge test device when the device under test is in a normal state. Here, a normal state can refer to a state where the voltage V of the device under test is in a stable state. For example, a normal state may include a first segment t1 to t2 and a second segment t3 to t4. Therefore, the test device 100 can apply a surge voltage S in at least one of the first segment t1 to t2 and the second segment t3 to t4, in which the voltage V of the device under test is in a normal state.

[0062] However, under the actual operating conditions of the device under test (DUT), surges may occur in abnormal states (e.g., transient states). In particular, surges occurring in transient states may have a greater impact on the DUT than surges occurring in normal states. Therefore, the test apparatus 100 according to the embodiment can apply surges to the DUT in a transient state to test the DUT in a more demanding test environment. In this way, the test apparatus 100 can increase the reliability of surge testing.

[0063] Figure 3This is a block diagram illustrating a test apparatus according to an embodiment disclosed herein. Figure 4 This is a graph showing the first and second voltages according to embodiments disclosed herein. Figure 5 This is a graph showing the surge voltage and the second voltage according to the embodiments disclosed herein.

[0064] refer to Figure 3 , Figure 4 and Figure 5 The test device 100 may include a voltage application unit 110, a voltage acquisition unit 120, a voltage detection unit 130, and a controller 140. However, the test device is not limited to this, and some components may be omitted from the test device 100, while other common components may be further included in the test device 100.

[0065] According to this embodiment, the voltage application unit 110 can apply voltage to the device under test. Here, the device under test may refer to a battery pack (1, see also...). Figure 1 ) or battery cell (10, see Figure 1 For ease of description, the device under test, battery pack 1, and battery cell 10 can be collectively referred to as a battery below.

[0066] According to this embodiment, the voltage application unit 110 can apply voltage to a relay of the battery. Here, the relay is a device that switches the electrical connection between the battery and the test equipment 100, and can refer to, for example... Figure 1 The switch unit 16 shown in the figure.

[0067] According to this embodiment, the voltage application unit 110 can apply at least one of a first voltage V1 and a surge voltage to the battery. Here, the first voltage V1 may refer to the voltage operating the battery, and the surge voltage S may refer to rapid voltage fluctuations (e.g., high voltage). For example, the surge voltage S may refer to a voltage having a surge waveform with the amplitude and phase specified in Ed 3.1 of the international standard IEC 61000-4-5.

[0068] According to this embodiment, the first voltage V1 can refer to a direct current (DC) voltage. When the first voltage V1 is an alternating current (AC) voltage, according to Ed 3.1 of international standard IEC 61000-4-5, the test device 100 can apply a surge voltage S at time points when the phase of the first voltage V1 is 0°, 90°, 180°, or 270°. However, if the first voltage V1 is a direct current (DC) voltage, the international standard may not specify the method and timing for applying the surge voltage S. Therefore, the test device 100 according to this embodiment can control the timing of applying the first voltage V1 and the surge voltage to the device under test when the first voltage V1 is a DC voltage, thereby optimizing the applicability and reliability of the test.

[0069] According to an embodiment, the voltage application unit 110 can apply voltages of different specifications depending on the port type of the device under test. Here, the port type of the device under test may include a power port for applying power and a signal port for transmitting electrical signals. For example, when the voltage application unit 110 is connected to the power port of the battery pack 1, the voltage application unit 110 can apply a first voltage V1 of the power specification to the battery pack 1. Additionally, when the voltage application unit 110 is connected to the signal port of the battery pack 1, the voltage application unit 110 can apply a first voltage V1 of the signal standard to the battery pack 1.

[0070] According to an embodiment, the voltage application unit 110 can be connected via the switching unit (16, see also) of the device under test. Figure 1 The switching unit 16 is electrically connected to the device under test (e.g., a battery). Here, the switching unit 16 may include elements such as electronic or mechanical switches, relays, and field-effect transistors (FETs).

[0071] According to an embodiment, the voltage application unit 110 may include a surge protection circuit. Here, the surge protection circuit can prevent damage to the test equipment 100 due to surge voltage S (or signal) and protect the voltage application unit 110. For example, the voltage application unit 110 may include a coupling circuit (coupling IC). In this way, the test equipment 100 can be protected from overvoltage or voltage fluctuations caused by surges.

[0072] According to an embodiment, the battery's relay can be short-circuited by a first voltage V1 applied by the voltage application unit 110. Here, when the first voltage V1 is applied to the battery, the relay included in the switching unit 16 can repeatedly short-circuit and open in microseconds (ms). On the other hand, when the first voltage V1 is applied to the battery, the relay may experience jitter or bounce. According to an embodiment, the segment in which the relay experiences jitter or bounce may include a transient segment in which the device under test (e.g., the battery) is in a transient state.

[0073] According to an embodiment, the voltage acquisition unit 120 can acquire the voltage of the device under test (e.g., a battery). Here, the voltage of the device under test (e.g., a battery) can refer to a second voltage V2 applied across a relay in response to the input of a first voltage V1. Therefore, the second voltage V2 can be different from the first voltage V1.

[0074] According to this embodiment, the second voltage V2 may include a transient section and a normal section. In the transient section, the device under test (e.g., a battery) is in a transient state, and in the normal section, the device under test (e.g., a battery) is in a normal state. Here, the transient section may refer to the section immediately following the application of the first voltage V1 to the battery. For example, in… Figure 4In the curve graph, the segment t2 to t3 between the time point t2 when the first voltage V1 is applied and the time point t3 when the second voltage V2 converges to the first voltage V1 can be referred to as the transient segment. This transient segment t2 to t3 can be accurately detected by the voltage detection unit 130 described below.

[0075] According to an embodiment, the voltage detection unit 130 can detect transient segments t2 to t3 that indicate the transient state of the second voltage V2. Here, the transient state can refer to the segment between a specific normal state t1 to t2 of the second voltage V2 and another normal state t3 to t4.

[0076] According to an embodiment, the voltage detection unit 130 can detect transient segments based on the change in the second voltage V2. For example, the voltage detection unit 130 can calculate the change in the second voltage V2 per unit time. Here, the change in the second voltage V2 per unit time can refer to the slope of the curve of the second voltage V2. In addition, the voltage detection unit 130 can compare the change in the second voltage V2 with a first threshold to detect transient segments.

[0077] According to an embodiment, the voltage detection unit 130 can define a transient segment as the region where the change in the second voltage V2 is greater than a first threshold. Here, the first threshold can refer to a reference value used to classify the change in the second voltage V2 as a normal state or a transient state. For example, the first threshold can be less than 0.1 [unit: V / ms]. According to an embodiment, the smaller the first threshold, the more accurately the voltage detection unit 130 can detect the transient segment. In this way, the voltage detection unit 130 can determine the transient state of the device under test based on the second voltage V2 measured across the relay.

[0078] According to an embodiment, the voltage detection unit 130 can detect transient segments based on a first voltage V1 and a second voltage V2. For example, the voltage detection unit 130 can calculate a difference between the first voltage V1 and the second voltage V2. Alternatively, the voltage detection unit 130 can compare the difference with a second threshold to detect transient segments. In this way, the voltage detection unit 130 can detect transient segments where the voltage applied to a relay (first voltage V1) of the device under test (e.g., a battery) and the voltage measured from the relay (second voltage V2) differ.

[0079] According to an embodiment, the voltage detection unit 130 can identify a transient segment where the difference between the first voltage V1 and the second voltage V2 is greater than a second threshold. Here, the second threshold can refer to a reference value used to classify the difference between the first voltage V1 and the second voltage V2 as a normal state or a transient state. For example, the second threshold can be less than 0.1 [unit: V]. According to an embodiment, the smaller the second threshold, the more accurately the voltage detection unit 130 can detect the transient segment.

[0080] According to an embodiment, the controller 140 can control the operation of the test equipment 100. For example, the controller 140 can control the operation of the voltage application unit 110, the voltage acquisition unit 120, and the voltage detection unit 130.

[0081] According to an embodiment, the controller 140 can control the voltage application unit 110 to control each of the time points when the first voltage V1 is applied to the device under test and when the surge voltage S is applied to the device under test. For example, the controller 140 can control the voltage application unit 110 to apply the surge voltage S during the normal segment t1 to t2 or t3 to t4 or the transient segment t2 to t3 of the second voltage V2.

[0082] according to Figure 5 In one embodiment, controller 140 can control voltage application unit 110 to apply surge voltage S during transient segments t2 to t3. In this case, compared to applying surge voltage S during normal segments t1 to t2 or t3 to t4, test equipment 100 can test the reliability of the device under test under more demanding test conditions. Therefore, test equipment 100 can test whether the device under test operates even under demanding test conditions and can increase the reliability of surge testing.

[0083] According to this embodiment, the controller 140 can vary the surge test conditions by controlling the voltage application unit 110. Here, the surge test conditions may include the amplitude of the surge voltage S, the time point at which the surge voltage S is applied, and the number of times the surge voltage S is applied. Here, the amplitude of the surge voltage S can refer to the magnitude of the surge voltage S, the time point at which the surge voltage S is applied can refer to whether the surge voltage S is applied in a transient or normal segment, and the number of times the surge voltage S is applied can refer to applying it N times (N is a natural number equal to or greater than 1). In this way, the controller 140 can test the device under test under various test conditions.

[0084] According to an embodiment, the test equipment 100, including the controller 140, can diagnose the state of the device under test by analyzing the voltage data of the device under test based on the applied surge voltage S. Furthermore, when the diagnostic results confirm that the device under test (e.g., a battery) is abnormal, the controller 140 can provide information about the abnormal battery to the user. For example, the controller 140 can provide information about the abnormal battery to a user terminal via a communication unit (not shown), and can also provide information about the abnormal battery via a display equipped in a vehicle, charger, etc.

[0085] According to an embodiment, the controller 140 can control the operation of the surge protection circuit included in the voltage application unit 110. According to an embodiment, the controller 140 can control the operation of the surge protection circuit based on the port type of the device under test. For example, when the voltage application unit 110 applies a first voltage V1 (e.g., a signal) to the signal port of the battery, the controller 140 can control the surge protection circuit to operate. Conversely, when the voltage application unit 110 applies the first voltage V1 (e.g., a power supply voltage) to the power supply port of the battery, the controller 140 can control the surge protection circuit not to operate. In this way, the controller 140 can prevent the surge voltage S applied to the signal port of the device under test (e.g., the battery) from flowing backward to the test equipment 100. Therefore, the controller 140 can protect the test equipment 100 from overvoltage or voltage fluctuations caused by surges.

[0086] Figure 6 This is a flowchart illustrating the operation of a test apparatus according to an embodiment disclosed herein.

[0087] Figure 6 The operations shown in the diagram can be performed through Figure 3 The test equipment 100 is used to perform the operation. Each operation in the following embodiments can be performed sequentially, but does not have to be performed sequentially. For example, the order of the operations can be varied, and at least two operations can be performed in parallel. In addition, depending on the embodiment, at least one of the following operations can be omitted.

[0088] refer to Figure 6 The test equipment can use a relay with a first voltage applied to the battery (S101), acquire a second voltage applied across the relay in response to the input of the first voltage (S102), detect a transient segment indicating the transient state of the second voltage (S103), and apply a surge voltage in the transient segment (S104).

[0089] In operation S101, the voltage application unit 110 of the test device 100 can apply a first voltage to the relay of the battery (S101).

[0090] In operation S102, the voltage acquisition unit 120 of the test device 100 can acquire the second voltage applied across the relay in response to the input of the first voltage (S102).

[0091] In operation S103, the voltage detection unit 130 of the test device 100 can detect transient segments indicating the transient state of the second voltage (S103). According to this embodiment, the voltage detection unit 130 can calculate the change in the second voltage per unit time and detect segments where the change is greater than a first threshold as transient segments. Additionally, the voltage detection unit 130 can calculate the difference between the first voltage and the second voltage and determine segments where the difference is greater than a second threshold as transient segments.

[0092] In operation S104, the controller 140 of the test device 100 can control the voltage application unit 110 to apply a surge voltage in the detected transient segment (S104).

[0093] Figure 7 This is a block diagram illustrating the hardware configuration of a computing system for performing test methods according to embodiments disclosed herein.

[0094] refer to Figure 7 The computing system 200 according to the embodiments disclosed herein may include a microcontroller unit (MCU) 210, a memory 220, an input / output interface (I / F) 230, and a communication I / F 240.

[0095] MCU 210 can be a processor that executes various programs (e.g., battery data collection program, data analysis program, data processing program, etc.) stored in memory 220, processes various information including battery data through the programs, and executes the aforementioned... Figures 1 to 6 The function of the test device 100 shown.

[0096] The memory 220 can store various programs, such as battery data collection programs, data analysis programs, and data processing programs.

[0097] Multiple memories 220 can be provided as needed. Memory 220 can be volatile or non-volatile memory. As volatile memory, memory 220 can be random access memory (RAM), dynamic RAM (DRAM), static RAM (SRAM), etc. For memory 220 as non-volatile memory, read-only memory (ROM), programmable ROM (PROM), electrically modifiable ROM (EAROM), erasable programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), flash memory, etc., can be used. The examples of memory 220 listed above are merely exemplary, and the computing system is not limited to these examples.

[0098] The input / output I / F 230 can provide an interface that enables the transmission and reception of data by connecting input devices (not shown) such as a keyboard, mouse, or touch panel and output devices (not shown) such as a display and MCU 210.

[0099] The communication I / F 240 is a component capable of transmitting and receiving various types of data to and from a server, and can be any device that supports wired or wireless communication. For example, the test device 100 can transmit and receive various types of information, including battery data, to and from a separately provided external server via the communication I / F 240.

[0100] By being recorded in memory 220 in this manner and processed by MCU 210, a computer program according to the embodiments disclosed herein can be implemented, for example, to execute... Figure 2 The modules for each function are shown.

[0101] Although all components constituting the embodiments disclosed herein have been described as being combined as one or as a single operation, the embodiments disclosed herein are not necessarily limited to these embodiments. That is, within the scope of the purposes of the embodiments disclosed herein, all components may be selectively combined and operated once or multiple times.

[0102] Unless otherwise stated, terms such as “comprising,” “including,” or “having” imply the presence of corresponding components, and therefore should be understood as potentially including, rather than excluding, other components. Unless otherwise defined, all terms including technical or scientific terms have the same meaning as commonly understood by one of ordinary skill in the art to which the embodiments disclosed herein pertain. Commonly used terms, such as those defined in dictionaries, should be interpreted as having the meaning consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly defined herein.

[0103] The foregoing disclosure outlines features of several embodiments, enabling those skilled in the art to better understand various aspects of this disclosure. Those skilled in the art will understand that this disclosure can readily serve as the basis for designing or modifying other structures for performing the same purpose or achieving the same advantages of the embodiments described herein. Furthermore, those skilled in the art will recognize that such equivalent configurations do not depart from the scope of this disclosure, and that various changes, substitutions, and modifications can be made herein without departing from the scope of this disclosure.

[0104] (List of reference numerals in the attached image)

[0105] 1: Battery pack

[0106] 2: Upper-level controller

[0107] 10: Battery Unit

[0108] 12: Battery cell

[0109] 14: Sensor Unit

[0110] 16: Switching Unit

[0111] 20: Battery Management System (BMS)

[0112] 100: Testing equipment

[0113] 110: Voltage application unit

[0114] 120: Voltage Acquisition Unit

[0115] 130: Voltage detection unit

[0116] 140: Controller

[0117] 200: Computing System

[0118] 210: MCU

[0119] 220: Memory

[0120] 230: Input / Output I / F

[0121] 240: Communication I / F

Claims

1. A testing device, comprising: A voltage application unit that applies a first voltage and a surge voltage to a relay in the battery; A voltage acquisition unit, which acquires a second voltage applied across the relay in response to the input of the first voltage; A voltage detection unit that detects transient segments indicating the transient state of the second voltage; as well as A controller that controls the voltage application unit to apply the surge voltage in the transient section.

2. The testing equipment according to claim 1, wherein, The voltage detection unit Calculate the change in the second voltage per unit time, and The change is compared with a first threshold to detect the transient segment.

3. The testing equipment according to claim 2, wherein, The voltage detection unit identifies the segment where the change is greater than the first threshold as the transient segment.

4. The testing equipment according to claim 1, wherein, The voltage detection unit Calculate the difference, which is the difference between the first voltage and the second voltage, and The difference is compared with a second threshold to detect the transient segment.

5. The testing equipment according to claim 4, wherein, The voltage detection unit identifies the segment where the difference is greater than the second threshold as the transient segment.

6. The testing equipment according to claim 1, wherein, The controller controls at least one of the following: the magnitude of the surge voltage, the timing of the surge voltage application, and the number of times the surge voltage is applied.

7. The testing equipment according to claim 1, wherein, The first voltage is a direct current (DC) voltage.

8. A testing method, comprising: A relay that applies the first voltage to the battery; A second voltage applied across the relay is obtained in response to the input of the first voltage; The transient segment indicating the transient state of the second voltage is detected; and A surge voltage is applied in the transient section.

9. The test method according to claim 8, wherein, Detecting the transient segment includes: Calculate the change in the second voltage per unit time; and The change is compared with a first threshold to detect the transient segment.

10. The testing method according to claim 9, further comprising determining the segment in which the change is greater than the first threshold as the transient segment.

11. The test method according to claim 8, wherein, Detecting the transient segment includes: Calculate the difference, which is the difference between the first voltage and the second voltage; and The difference is compared with a second threshold to detect the transient segment.

12. The testing method according to claim 11, further comprising determining the segment in which the difference is greater than the second threshold as the transient segment.

13. The test method according to claim 8, wherein, Applying the surge voltage includes determining at least one of the following: the magnitude of the surge voltage, the timing of the surge voltage application, and the number of times the surge voltage is applied.

14. The test method according to claim 8, wherein, The first voltage is a DC voltage.

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