High-precision chip three-temperature test sorting machine
By integrating a heating plate and coolant circulation components into the chip testing platform, combined with an air curtain door design and a multi-level vision positioning system, the problems of inaccurate positioning, unstable temperature, and condensation in the testing of small, high-precision chips by existing three-temperature testing and sorting machines have been solved, achieving efficient and accurate three-temperature testing.
Patent Information
- Application Number
- CN202610747614.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-28
- Publication Date
- 2026-07-17
AI Technical Summary
Existing three-temperature testing and sorting machines are unable to accurately pick up and place small, high-precision chips, have unstable temperature control, are prone to condensation, and lack testing efficiency and accuracy, making it difficult to meet the requirements of high precision and high reliability.
The chip testing station, which integrates heating plates and coolant circulation components, combined with an air curtain door design and a multi-level vision positioning system, achieves rapid temperature control and precise positioning. Through the cooperation of multiple independent testing stations and a dual-drive gantry mechanism, the motion path is decoupled to ensure testing stability and efficiency.
It enables rapid switching and precise positioning for high-temperature, low-temperature, and room-temperature testing, suppresses condensation, improves testing efficiency and temperature uniformity, and ensures accurate chip placement and stable test results.
Smart Images
Figure CN122421706A_ABST