Planetary reducer test bench

Abstract

The utility model discloses a planetary reducer test bench, which relates to the technical field of reducer test equipment and comprises a detection test mechanism used for detecting and testing a plurality of planetary reducers in sequence; the station circulating mechanism comprises an avoiding groove formed in the middle of the front face of the table plate and a rotating disc rotationally arranged on the outer side of the stand column in a sleeving mode through a bearing, the front end of the rotating disc is located over the avoiding groove, and a plurality of first positioning magnets are evenly and fixedly arranged at the top of the rotating disc in a penetrating mode; the station circulating mechanism further comprises a second positioning magnet which is fixedly arranged on the rear side of the top of the platen in a nested mode. According to the utility model, the planetary reducer can be taken down after detection and the planetary reducer which is not detected can be placed in the current detection test process of the planetary reducer, so that the time consumption of single detection is shortened, the detection efficiency is effectively improved, and the device is suitable for batch detection of a plurality of planetary reducers.

Description

Technical Field

[0001] This utility model relates to the technical field of speed reducer testing equipment, and in particular to a planetary speed reducer testing bench. Background Technology

[0002] Planetary reducers are mechanical transmission devices that achieve speed reduction and torque increase through planetary gear transmission. They are characterized by compact structure, high transmission efficiency, and strong load-bearing capacity. Planetary reducers need to undergo testing before leaving the factory to determine whether their manufacturing and assembly quality meets the usage requirements. Among these tests, backlash is one of the most important indicators of planetary reducers, as its size directly determines the precision of the planetary reducer.

[0003] A search revealed that utility model patent CN221593830U discloses a backlash detection device. By controlling a hydraulic cylinder to move the mounting block downwards, the two hinge rods are subjected to downward tension, which in turn drives the two moving blocks to move towards each other under the hinge action of the two hinge seats. This reduces the gap between the two arc-shaped clamping plates, thus enabling the positioning and clamping of larger planetary gear reducers.

[0004] Although the above-mentioned device can clamp and fix planetary reducers of different specifications within a certain range for subsequent backlash testing, during the backlash testing process, the staff can only wait for the planetary reducer to complete the test and cannot perform other operations. Only after the test is completed can the current planetary reducer be removed and the next planetary reducer be placed. This results in a long test time and less than ideal testing efficiency, making it unsuitable for batch testing of multiple planetary reducers.

[0005] Therefore, it is necessary to invent a planetary reducer test bench to solve the above problems. Utility Model Content

[0006] The purpose of this utility model is to provide a planetary reducer test bench that can remove planetary reducers after testing and place untested planetary reducers during the current planetary reducer testing process, thereby shortening the time of a single test and effectively improving testing efficiency. It is suitable for batch testing of multiple planetary reducers, thus solving the problem mentioned in the background art that during the backlash testing process, the operator can only wait for the planetary reducer to complete the test and cannot perform other operations. Only after the test is completed can the current planetary reducer be removed and the next planetary reducer be placed, resulting in a long time for a single test, unsatisfactory testing efficiency, and ineffective application to batch testing of multiple planetary reducers.

[0007] According to one aspect of this disclosure, the following technical solution is provided: a planetary reducer test bench, comprising:

[0008] A testing and inspection mechanism is used to sequentially test multiple planetary reducers.

[0009] A workstation circulation mechanism includes a clearance groove located in the center of the front of the worktable and a rotating disk rotatably mounted on the outside of a column via a bearing. The front end of the rotating disk is located directly above the clearance groove. Multiple first positioning magnets are uniformly and fixedly disposed through the top of the rotating disk. The workstation circulation mechanism also includes a second positioning magnet fixedly nested on the rear side of the top of the worktable, the second positioning magnet being magnetically attracted to adjacent first positioning magnets.

[0010] Multiple sets of clamping and fixing mechanisms are used to support and clamp multiple planetary reducers.

[0011] According to at least one embodiment of the planetary reducer test bench of the present disclosure, the testing mechanism includes a platform, a support base is fixedly disposed at the bottom of the platform, and a column and a fixing frame are fixedly disposed at the top of the platform.

[0012] According to at least one embodiment of the planetary reducer test bench of the present disclosure, a testing device for detecting backlash in the planetary reducer is fixedly installed at the top front end of the fixed frame, a guide plate is fixedly installed at the bottom front of the fixed frame, and inclined surfaces are provided on both sides of the guide plate.

[0013] According to at least one embodiment of the planetary reducer test bench of this disclosure, any set of clamping and fixing mechanisms includes a U-shaped base fixedly disposed on the top of the rotating disk, and a fixed clamping plate is fixedly disposed on one end of the inner side of the U-shaped base.

[0014] According to at least one embodiment of the planetary reducer test bench of the present disclosure, a square sliding shaft is slidably disposed through the other end of the inner side of the U-shaped base, and a moving block is fixedly disposed at the outer end of the square sliding shaft.

[0015] According to at least one embodiment of the planetary reducer test bench of the present disclosure, the outer side of the moving block is provided with an arc-shaped surface, the inner end of the square sliding shaft is fixedly provided with a moving clamping plate, and the outer side of the square sliding shaft is sleeved with a return spring fixedly connected between the inner wall of the U-shaped base and the moving clamping plate.

[0016] The technical effects and advantages of this utility model are as follows:

[0017] This invention features a station circulation mechanism that allows operators to rotate a rotating disk after placing the planetary reducer on top of the U-shaped base adjacent to the clearance slot. The rotating disk drives multiple clamping and fixing mechanisms to rotate until they reach the testing station directly below the testing equipment. At this point, the testing equipment begins testing the planetary reducer below it. During this process, if a tested planetary reducer is present on top of the clamping and fixing mechanism adjacent to the clearance slot, the operator can remove it and place the planetary reducer to be tested. Compared to existing technologies, this invention allows for the removal of tested planetary reducers and the placement of untested planetary reducers during the current planetary reducer testing process, thereby shortening the testing time per cycle and effectively improving testing efficiency. It is suitable for batch testing of multiple planetary reducers. Attached Figure Description

[0018] The accompanying drawings illustrate exemplary embodiments of the present disclosure and, together with the description thereof, serve to explain the principles of the present disclosure. These drawings are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification.

[0019] Figure 1 This is a schematic diagram of the overall structure of a planetary reducer test bench according to one embodiment of the present disclosure;

[0020] Figure 2 This is a partial structural diagram of the testing mechanism and station circulation mechanism of a planetary reducer test bench according to one embodiment of the present disclosure;

[0021] Figure 3 This is a partial structural diagram of the station circulation mechanism and clamping and fixing mechanism of a planetary reducer test bench according to one embodiment of the present disclosure.

[0022] The specific labels in the attached figures are as follows:

[0023] 1. Testing and experimental mechanism; 11. Platform; 12. Support base; 13. Column; 14. Fixture; 15. Testing equipment; 16. Guide plate;

[0024] 2. Station circulation mechanism; 21. Clearance groove; 22. Rotary disk; 23. First positioning magnet; 24. Second positioning magnet;

[0025] 3. Clamping and fixing mechanism; 31. U-shaped base; 32. Fixed clamping plate; 33. Square sliding shaft; 34. Moving block; 35. Moving clamping plate; 36. Return spring. Detailed Implementation

[0026] For descriptive purposes, this disclosure may use spatial relative terms such as “below,” “under,” “below,” “down,” “above,” “above,” “higher,” and “side (e.g., as in a “sidewall”)” to describe the relationship between one component and another component as shown in the accompanying drawings. In addition to the orientations depicted in the drawings, the spatial relative terms are also intended to encompass different orientations of the device during use, operation, and / or manufacture. For example, if the device in the drawings is flipped, a component described as “below” or “under” other components or features would subsequently be positioned “above” said other components or features. Thus, the exemplary term “below” can encompass both “above” and “below” orientations. Furthermore, the device may be otherwise positioned (e.g., rotated 90 degrees or in other orientations), thus interpreting the spatial relative descriptive terms used herein accordingly.

[0027] Figure 1 This is a schematic diagram of the overall structure of a planetary reducer test bench according to one embodiment of the present disclosure.

[0028] Figure 2 This is a partial structural diagram of the testing mechanism 1 and the station circulation mechanism 2 of a planetary reducer test bench according to one embodiment of the present disclosure.

[0029] Figure 3 This is a partial structural diagram of the station circulation mechanism 2 and the clamping and fixing mechanism 3 of a planetary reducer test bench according to one embodiment of the present disclosure.

[0030] like Figures 1-3 As shown, the planetary reducer test bench disclosed herein may include components such as: a testing mechanism 1, a station circulation mechanism 2, and multiple clamping and fixing mechanisms 3.

[0031] like Figure 2 As shown in this disclosure, the testing mechanism 1 includes a platform 11, a support base 12 is fixedly installed at the bottom of the platform 11, a column 13 and a fixing frame 14 are fixedly installed at the top of the platform 11, a testing device 15 for back clearance testing of the planetary reducer is fixedly installed at the front end of the top of the fixing frame 14, a guide plate 16 is fixedly installed at the bottom front of the fixing frame 14, and inclined surfaces are provided on both sides of the guide plate 16.

[0032] It should be noted that the detection device 15 used for backlash detection of planetary reducers is a prior art that has been disclosed and is not a necessary technical feature for solving the technical problem of this application. Therefore, this application will not elaborate on its specific structure here.

[0033] like Figure 2 and Figure 3As shown, in a preferred embodiment, the workstation circulation mechanism 2 includes a clearance groove 21 opened in the middle of the front of the platform 11 and a rotating disk 22 rotatably sleeved on the outside of the column 13 via a bearing. The front end of the rotating disk 22 is located directly above the clearance groove 21. A plurality of first positioning magnets 23 are uniformly fixedly and through the top of the rotating disk 22. The workstation circulation mechanism 2 also includes a second positioning magnet 24 fixedly nested on the rear side of the top of the platform 11. The second positioning magnet 24 is magnetically attracted to the adjacent first positioning magnet 23.

[0034] Therefore, after the operator places the planetary reducer on top of the U-shaped base 31 adjacent to the clearance slot 21, the rotating disk 22 is rotated. The rotation of the rotating disk 22 drives multiple sets of clamping and fixing mechanisms 3 to rotate, thereby moving the clamping and fixing mechanism 3 with the planetary reducer placed closer to the testing equipment 15, while simultaneously moving the clamping and fixing mechanism 3 without the planetary reducer placed to a position adjacent to the clearance slot 21. This process is repeated until the clamping and fixing mechanism 3 with the planetary reducer placed moves to the testing station directly below the testing equipment 15. At this point, the second positioning magnet 24 and the adjacent first positioning magnet 23 attract each other to achieve positioning, ensuring the testing... The test accuracy is improved. At the same time, the clamping and fixing mechanism 3 completes the clamping and fixing of the planetary reducer above it under the action of the testing mechanism 1. Then the testing equipment 15 starts to test the planetary reducer below it. During this process, if there is a planetary reducer that has been tested on the top of the clamping and fixing mechanism 3 adjacent to the clearance groove 21, the operator can remove it and place the planetary reducer to be tested. Compared with the existing technology, the planetary reducer after testing can be removed and the untested planetary reducer can be placed during the current planetary reducer testing process, thereby shortening the time of a single test and effectively improving the testing efficiency. It is suitable for batch testing of multiple planetary reducers.

[0035] like Figure 3 As shown in this disclosure, any set of clamping and fixing mechanisms 3 includes a U-shaped base 31 fixedly installed on the top of the rotating disk 22. A fixed clamping plate 32 is fixedly installed at one end of the inner side of the U-shaped base 31, and a square sliding shaft 33 is slidably installed through the other end of the inner side of the U-shaped base 31. A moving block 34 is fixedly installed at the outer end of the square sliding shaft 33, and an arc-shaped surface is provided on the outer side of the moving block 34. A moving clamping plate 35 is fixedly installed at the inner end of the square sliding shaft 33, and a return spring 36 is sleeved on the outer side of the square sliding shaft 33 and fixedly connected between the inner wall of the U-shaped base 31 and the moving clamping plate 35.

[0036] Therefore, after the planetary reducer is placed on top of the U-shaped base 31, as the U-shaped base 31 moves, the planetary reducer moves synchronously and approaches the testing station until it reaches the testing station. During this process, the guide plate 16 pushes the moving block 34, which in turn causes the moving block 34 to move the moving clamp 35 inward until the moving clamp 35, together with the fixed clamp 32, clamps and fixes the planetary reducer under test to ensure the accuracy of the test. When the U-shaped base 31 moves from the testing station to the loading and unloading station, the guide plate 16 no longer presses the moving block 34. At this time, the stretched return spring 36 drives the moving clamp 35 to move outward and reset, thereby actively releasing the clamping and fixing of the planetary reducer, making it convenient to remove the planetary reducer later.

[0037] It should also be noted that any content not described in detail in this specification is prior art known to those skilled in the art.

[0038] Those skilled in the art should understand that the above embodiments are merely for illustrating the present disclosure and are not intended to limit the scope of the disclosure. Those skilled in the art can make other changes or modifications based on the above disclosure, and these changes or modifications still fall within the scope of the present disclosure.

Claims

1. A planetary reducer test bench, characterized in that, include: A testing and inspection mechanism is used to sequentially test multiple planetary reducers. The workstation circulation mechanism includes a clearance groove in the middle of the front of the platform and a rotating disk that is rotatably sleeved on the outside of the column through a bearing. The front end of the rotating disk is located directly above the clearance groove. A plurality of first positioning magnets are uniformly fixedly and through the top of the rotating disk. The workstation circulation mechanism also includes a second positioning magnet that is fixedly nested on the rear side of the top of the platform. The second positioning magnet is magnetically attracted to the adjacent first positioning magnet. as well as Multiple sets of clamping and fixing mechanisms are used to support and clamp multiple planetary reducers.

2. The planetary reducer test bench according to claim 1, characterized in that: The testing and experimental mechanism includes a platform, a support base is fixedly installed at the bottom of the platform, and a column and a fixing frame are fixedly installed at the top of the platform.

3. The planetary reducer test bench according to claim 2, characterized in that: The top front end of the fixed frame is fixedly equipped with a detection device for detecting the back clearance of the planetary reducer, and a guide plate is fixedly installed at the bottom front of the fixed frame, with inclined surfaces on both sides of the guide plate.

4. The planetary reducer test bench according to claim 3, characterized in that: Each of the clamping and fixing mechanisms includes a U-shaped base fixedly disposed on the top of the rotating disk, and a fixed clamping plate is fixedly disposed on one end of the inner side of the U-shaped base.

5. The planetary reducer test bench according to claim 4, characterized in that: A square sliding shaft is slidably provided through the other end of the inner side of the U-shaped base, and a moving block is fixedly provided at the outer end of the square sliding shaft.

6. The planetary reducer test bench according to claim 5, characterized in that: The outer side of the movable block is provided with an arc-shaped surface, the inner end of the square sliding shaft is fixedly provided with a movable clamping plate, and the outer side of the square sliding shaft is sleeved with a return spring fixedly connected between the inner wall of the U-shaped base and the movable clamping plate.

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