Automatic door opening test circuit and device for tramcar reliability test

Abstract

The utility model provides a kind of tramcar reliability test is used automatic switch door test circuit and device.The automatic switch door test circuit, including with the switch door signal control circuit, alarm circuit and detection circuit of single-chip microcomputer minimum system connection, the single-chip microcomputer minimum system is connected with the second diode by fifth resistance, the single-chip microcomputer minimum system is connected with the first diode by sixth resistance, the second diode and the other end of the first diode are parallelly connected with ground.The utility model has the beneficial effects: the utility model's circuit is aimed at the reliability detection of the automatic switch door of tramcar, and continuous switch door action can be realized after the start of one button by the setting of switch door signal control circuit, and overall better test time can be saved.Moreover, the safety during reliability detection can be improved and increased by test circuit.

Description

Technical Field

[0001] This utility model belongs to the field of tram technology, specifically relating to an automatic door opening and closing test circuit and device for tram reliability testing. Background Technology

[0002] Trams are a type of public transportation vehicle, a light urban rail transit vehicle powered by electricity and running on tracks. They are commonly referred to as streetcars or light rail and are characterized by their environmental friendliness and low noise levels. To improve the reliability of the tram's door system, multiple door opening and closing tests are required after train commissioning, acceptance, or major overhaul. This simulates the high-intensity operating conditions during mainline operation, proactively exposing potential faults in the door system for timely rectification and ultimately improving its reliability, ensuring smooth tram operation. Currently, doors typically undergo around 500 opening and closing operations. Manually testing the door control buttons requires approximately 4 hours of work per session, with two people working in shifts. This results in high labor costs, a large workload, high labor intensity, and low overall efficiency. Furthermore, the existing detection circuitry presents certain safety hazards. Utility Model Content

[0003] In view of the shortcomings of the prior art, the purpose of this utility model is to provide an automatic door opening and closing test circuit and device for tram reliability testing, which can safely and efficiently complete the tram door opening and closing test, providing a new solution for tram reliability testing.

[0004] The objective of this utility model is achieved through the following technical solution:

[0005] An automatic door opening and closing test circuit for reliability testing of trams includes a door opening and closing signal control circuit, an alarm circuit, and a detection circuit connected to a single-chip microcomputer minimum system. The single-chip microcomputer minimum system is connected to a second diode through a fifth resistor, and the single-chip microcomputer minimum system is connected to a first diode through a sixth resistor. The other ends of the second diode and the first diode are connected in parallel to ground.

[0006] Preferably, the detection circuit includes a third resistor connected to the microcontroller minimum system, the third resistor being connected to an optocoupler, the collector of the optocoupler being connected to a fourth resistor, and the other end of the fourth resistor being connected to a power supply terminal.

[0007] Preferably, the alarm circuit includes a first resistor connected to the microcontroller minimum system, the first resistor being connected to a transistor, the emitter of the transistor being connected to a buzzer, the collector of the transistor being connected to a power supply terminal, and the other end of the buzzer being connected to a grounded second resistor.

[0008] Preferably, the door opening / closing signal control circuit includes an integrated circuit bus, the SDA terminal of the integrated circuit bus is connected to the microcontroller minimum system, and the WP terminal of the integrated circuit bus is grounded.

[0009] Preferably, the minimum system of the microcontroller is an STC89C52 microcontroller.

[0010] Preferably, the microcontroller minimum system also includes a 5V power supply port.

[0011] Preferably, the automatic door opening and closing test device for tram reliability testing has any one of the above-mentioned automatic door opening and closing test circuits for tram reliability testing.

[0012] The beneficial effects of this invention are as follows: The circuit of this invention is designed for reliability testing of automatic door opening and closing on trams. Through the setting of the door opening and closing signal control circuit, continuous door opening and closing actions can be achieved after a single button press, thus saving overall testing time. Furthermore, the testing circuit can improve and increase safety during reliability testing. Attached Figure Description

[0013] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0014] Figure 1 This is a schematic diagram of the circuit connection of this utility model. Detailed Implementation

[0015] To make the objectives, technical solutions, and advantages of this utility model clearer, the following description is provided in conjunction with the appendix. Figure 1 The present invention will be further described in detail below with reference to embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present invention and are not intended to limit the present invention.

[0016] This utility model discloses an automatic door opening and closing test circuit for reliability testing of trams, including a door opening and closing signal control circuit, an alarm circuit, and a detection circuit connected to a microcontroller minimum system. The microcontroller minimum system is an STC89C52 microcontroller, which features comprehensive modules, high performance, and low power consumption. The microcontroller minimum system also includes a 5V power supply port. The microcontroller minimum system is connected to a second diode D2 via a fifth resistor R5, and to a first diode D1 via a sixth resistor R6. The other ends of the second diode D2 and the first diode D1 are connected in parallel to ground. The door opening and closing signal control circuit includes an integrated circuit bus. The SDA terminal of the integrated circuit bus is connected to the microcontroller minimum system, and the WP terminal of the integrated circuit bus is grounded. In this embodiment, two integrated circuit buses are provided, and their SCL terminals are interconnected. The door opening and closing signal control circuit is connected to the door control button. When the door control button is activated, the circuit will automatically open and close the tram door.

[0017] The detection circuit includes a third resistor R3 connected to the microcontroller minimum system. The third resistor R3 is connected to an optocoupler. The collector of the optocoupler is connected to a fourth resistor R4. The other end of the fourth resistor R4 is connected to the power supply terminal.

[0018] The alarm circuit includes a first resistor R1 connected to the microcontroller minimum system. The first resistor R1 is connected to a transistor Q1. The emitter of the transistor Q1 is connected to a buzzer BUZ1, and the collector of the transistor Q1 is connected to the power supply terminal. The other end of the buzzer BUZ1 is connected to a grounded second resistor R2. When using the test circuit of this invention, one end of the third resistor R3 of the detection circuit is connected to the safety circuit on the tram. When the detection circuit detects that the safety circuit on the tram is open, i.e., a single door malfunctions, the alarm circuit will issue an alarm and send a pause command to the circuit to stop operation, thereby improving the safety of the test. The safety circuit refers to the series circuit corresponding to each door in the tram. When using the test circuit of this invention for testing, if a single door malfunctions, the series circuit will be broken. At this time, the device detects the voltage breakage and stops working.

[0019] This utility model also discloses a testing device with an automatic door opening and closing test circuit for tram reliability testing, as described above. The circuit is electrically connected to the interface of the door system. The test circuit in the testing device may further include a unit display circuit, which can output the corresponding number of door opening and closing tests in conjunction with the device's display screen.

[0020] The terms “up,” “down,” “left,” “right,” “horizontal,” “inner,” and “outer,” etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0021] There are many specific application examples of this utility model. The above description is only a preferred embodiment of this utility model. It should be noted that for those skilled in the art, several improvements can be made without departing from the principle of this utility model, and these improvements should also be considered within the protection scope of this utility model.

Claims

1. An automatic door opening and closing test circuit for tram reliability testing, characterized in that, It includes a door opening / closing signal control circuit, an alarm circuit, and a detection circuit connected to a single-chip microcomputer minimum system. The single-chip microcomputer minimum system is connected to a second diode through a fifth resistor. The single-chip microcomputer minimum system is connected to a first diode through a sixth resistor. The other ends of the second diode and the first diode are connected to ground in parallel.

2. The automatic door opening and closing test circuit for tram reliability testing according to claim 1, characterized in that, The detection circuit includes a third resistor connected to the microcontroller minimum system, the third resistor being connected to an optocoupler, the collector of the optocoupler being connected to a fourth resistor, and the other end of the fourth resistor being connected to a power supply terminal.

3. The automatic door opening and closing test circuit for tram reliability testing according to claim 2, characterized in that, The alarm circuit includes a first resistor connected to the microcontroller minimum system, the first resistor being connected to a transistor, the emitter of the transistor being connected to a buzzer, the collector of the transistor being connected to a power supply terminal, and the other end of the buzzer being connected to a grounded second resistor.

4. The automatic door opening and closing test circuit for tram reliability testing according to claim 2, characterized in that, The door opening / closing signal control circuit includes an integrated circuit bus. The SDA terminal of the integrated circuit bus is connected to the microcontroller minimum system, and the WP terminal of the integrated circuit bus is grounded.

5. The automatic door opening and closing test circuit for tram reliability testing according to claim 1, characterized in that, The minimum system of the microcontroller is the STC89C52 microcontroller.

6. The automatic door opening and closing test circuit for tram reliability testing according to claim 5, characterized in that, The microcontroller minimum system also includes a 5V power supply port.

7. An automatic door opening and closing test device for tram reliability testing, characterized in that, It has an automatic door opening and closing test circuit for tram reliability testing as described in any one of claims 1-6.

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