A filter wafer test matrix switch

The matrix switches, designed with a distributed layout and open environment, solve the problems of signal interference and heat accumulation, achieving stability and accuracy in signal transmission, improving the reliability of test results and the ease of equipment maintenance.

CN224456852UActive Publication Date: 2026-07-03SUZHOU BORUIDA SEMICONDUCTOR TECHNOLOGY CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SUZHOU BORUIDA SEMICONDUCTOR TECHNOLOGY CO LTD
Filing Date
2025-06-03
Publication Date
2026-07-03

AI Technical Summary

Technical Problem

Existing matrix switch designs suffer from signal interference and heat buildup, which affect the accuracy and stability of test results.

Method used

The distributed matrix switch design ensures that each matrix switch does not overlap in the horizontal, vertical and cabinet depth directions, and the cabinet and network analyzer are placed in an open environment to reduce signal interference and dissipate heat in a timely manner.

Benefits of technology

It improves the stability and accuracy of signal transmission, reduces signal interference, and ensures the reliability of test results and the convenience of equipment maintenance.

✦ Generated by Eureka AI based on patent content.

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Abstract

This utility model relates to the field of matrix switch technology, specifically to a filter wafer test matrix switch, comprising: a housing, on which multiple terminals are installed respectively for signal input and output; multiple matrix switches, which are installed in a distributed manner inside the housing, each matrix switch being electrically connected to its corresponding terminal via a cable for signal transmission; and a network analyzer, installed on the housing and electrically connected to the multiple matrix switches, for analyzing and testing the signals transmitted through the matrix switches. In this utility model, four matrix switches are arranged in a flat manner on the inner surface of the housing, and any adjacent matrix switches do not overlap in the horizontal, vertical, or housing depth directions, achieving mutual independence, effectively reducing mutual interference between matrix switches, and improving the stability and accuracy of signal transmission.
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Description

Technical Field

[0001] This utility model relates to the field of matrix switch technology, and in particular to a filter wafer test matrix switch. Background Technology

[0002] In the field of filter wafer testing, matrix switches play a crucial role as a key signal routing device. They can flexibly distribute test signals to different test channels, enabling accurate and efficient testing of multiple test points on the filter wafer. With the continuous development of filter technology and the increasing integration of wafers, the requirements for the accuracy, efficiency, and stability of filter wafer testing are also becoming increasingly stringent. This makes the performance and design of matrix switches a key factor affecting test quality.

[0003] Existing matrix switches typically consist of multiple switching modules, all housed within a single enclosure. While this design achieves a degree of equipment integration, facilitating overall transportation and installation, it introduces significant signal interference problems. The simultaneous operation of numerous switching modules generates complex electromagnetic fields, and the proximity of signal transmission lines between modules makes electromagnetic coupling highly likely. This interference introduces additional noise, reduces the signal-to-noise ratio, distorts test signals, and consequently affects the accuracy of test results. Furthermore, the centralized enclosure design of existing matrix switches makes disassembly and maintenance inconvenient.

[0004] Furthermore, existing matrix switches and network analyzers are typically placed in the same enclosed space. As the core measurement device for filter wafer testing, the network analyzer generates a significant amount of heat during operation. The enclosed space restricts heat dissipation, and as the testing time increases, the temperature within the space rises continuously, which can also affect the signal transmission of the matrix switch.

[0005] Therefore, this application develops a filter wafer test matrix switch to solve the problems existing in the prior art. Utility Model Content

[0006] The purpose of this invention is to provide a filter wafer test matrix switch to solve the problem of signal interference between matrix switches in the prior art.

[0007] The technical solution of this utility model is: a filter wafer test matrix switch, comprising:

[0008] The enclosure has multiple terminals installed on its side walls, which are used for signal input and output.

[0009] Multiple matrix switches are installed in the housing in a distributed manner, and each matrix switch is electrically connected to the corresponding terminal via a cable for signal transmission.

[0010] A network analyzer, mounted on the enclosure and electrically connected to multiple matrix switches, is used to analyze and test signals transmitted through the matrix switches.

[0011] Preferably, the plurality of matrix switches are arranged in a flat manner on the inner surface of the housing, and no two adjacent matrix switches overlap in any direction, including the horizontal direction, the vertical direction, and the depth direction of the housing, so that each matrix switch is spatially independent.

[0012] Preferably, the enclosure is provided with a partition plate, which divides the internal space of the enclosure into a first chamber and a second chamber that are independent of each other; a plurality of matrix switches are disposed in the first chamber, and a plurality of terminals are connected to the second chamber; the cables of the matrix switches pass through the pre-set through holes on the partition plate to complete the connection with the terminals.

[0013] Preferably, the partition plate has mutually spaced channels on the side facing the second chamber, and each cable is respectively accommodated in the corresponding channel and extends through the channel to be connected to the corresponding terminal.

[0014] Preferably, the matrix switch has one signal input inlet and four signal output outlets, used to realize the routing switching of signals from the inlet to the four outlets.

[0015] Preferably, neither the enclosure nor the network analyzer mounted on the enclosure is in a closed, airtight environment that does not allow for air exchange with the outside.

[0016] Compared with the prior art, the advantages of this utility model are:

[0017] (1) Instead of the traditional layout of three groups of four vertically placed mounting plates, a matrix switch with one signal input inlet and four signal output outlets is selected. Only four matrix switches are used, which are laid out in a flat manner on the inner surface of the box. Any adjacent matrix switches do not overlap in the horizontal, vertical and box depth directions, so as to achieve mutual independence, effectively reduce mutual interference between matrix switches, and improve the stability and accuracy of signal transmission.

[0018] (2) Separate channels are set on the partition plate. The number, size and layout of the channels are planned according to the actual situation of the matrix switch lead-out cables to ensure that each cable has an independent channel, build a clear, standardized and interference-free signal transmission path, and improve the stability and maintainability of signal transmission.

[0019] (3) Placing the enclosure and network analyzer in an open environment is different from the traditional matrix switch and network analyzer being located in a relatively enclosed environment, which leads to heat accumulation. An open environment helps to dissipate the heat generated by the network analyzer during operation in a timely manner, avoiding adverse effects on the matrix switch signal transmission due to heat accumulation, and ensuring the accuracy and stability of the matrix switch signal transmission. Attached Figure Description

[0020] The present invention will be further described below with reference to the accompanying drawings and embodiments:

[0021] Figure 1 This is a cross-sectional view of a filter wafer test matrix switch according to the present invention;

[0022] Figure 2 This is a diagram showing the internal channel distribution of a filter wafer test matrix switch according to the present invention.

[0023] Figure 3 This is a schematic diagram showing the position distribution of the matrix switch described in this utility model;

[0024] Figure 4 This is a perspective view of a filter wafer test matrix switch according to the present invention.

[0025] The components are: 1. Cabinet; 11. Terminal block; 12. First chamber; 13. Second chamber; 2. Matrix switch; 3. Network analyzer; 4. Partition plate; 41. Through hole; 42. Channel. Detailed Implementation

[0026] The present invention will be further described in detail below with reference to specific embodiments:

[0027] like Figures 1-3As shown, a filter wafer test matrix switch includes a housing 1, multiple matrix switches 2, and a network analyzer 3. The housing 1 serves as the supporting structure for the entire device, with multiple terminals 11 mounted on its side walls. These terminals 11 are used for signal input and output, acting as the interface for signal interaction with external devices. The multiple matrix switches 2 are installed inside the housing 1 in a distributed layout. This distributed layout reduces mutual interference between the matrix switches 2, improving the stability and accuracy of signal transmission. Each matrix switch 2 is electrically connected to its corresponding terminal 11 via a cable, establishing a signal transmission path and enabling signal transmission between the matrix switch 2 and external devices. The network analyzer 3 is mounted on the housing 1 and electrically connected to the multiple matrix switches 2. Its main function is to analyze and test the signals transmitted through the matrix switches 2, such as measuring parameters like frequency, amplitude, and phase, to ensure that the signal quality and performance meet test requirements.

[0028] The traditional installation method for matrix switches 2 involves selecting a matrix switch 2 with one input terminal and two output terminals, mounting three matrix switches 2 together on a mounting plate, and then placing four mounting plates vertically in the housing 1. The housing 1 contains twelve matrix switches 2. This method increases the number of matrix switches 2 and reduces the space occupied by the matrix switches 2. However, in this method, there are many matrix switches 2, and they are close together, which causes interference between them and affects the stability of the signal.

[0029] In this application, such as Figure 3 As shown, a matrix switch 2 with one signal input and four signal outputs is used. Only four matrix switches 2 are selected and arranged in a flat manner on the inner surface of the housing 1. Furthermore, any two adjacent matrix switches 2 have no overlap in any direction, including the horizontal, vertical, and depth directions of the housing 1, ensuring that each matrix switch 2 is in an independent state within the housing 1, which helps to ensure the stability and accuracy of signal transmission.

[0030] Specifically, such as Figure 1As shown, a partition plate 4 is added inside the housing 1, dividing the internal space of the housing 1 into two independent chambers: a first chamber 12 and a second chamber 13. The matrix switch 2 is uniformly installed in the first chamber 12. Meanwhile, multiple terminals 11 on the side wall of the housing 1 are connected to the second chamber 13. The terminals 11 serve as signal input / output interfaces for connecting to external devices. To achieve signal transmission between the matrix switch 2 and the terminals 11, through holes 41 are provided on the partition plate 4. The cable of the matrix switch 2 passes through the through holes 41, passes through the partition plate 4, extends from the first chamber 12 to the second chamber 13, and then reliably connects to the corresponding terminal 11, ensuring accurate signal transmission between the matrix switch 2 and external devices.

[0031] Furthermore, such as Figure 2 As shown, to optimize cable layout and improve signal transmission stability and maintainability, the partition plate 4 has mutually spaced channels 42 on the side facing the second chamber 13. The number, size, and layout of these channels 42 are planned according to the actual situation of the cables leading out from the matrix switch 2, ensuring that each cable has a corresponding independent channel 42. During actual installation, each cable is properly accommodated in its corresponding channel 42, extends orderly along the channel 42, and finally connects precisely to the corresponding terminal 11 in the second chamber 13, thereby constructing a clear, standardized, and interference-free signal transmission path.

[0032] To reduce the continuous generation and accumulation of heat during network analyzer 3 operation, which may adversely affect the signal transmission of matrix switch 2, such as causing signal interference and reducing signal quality, both the enclosure 1 and network analyzer 3 are placed in an open environment. This helps to dissipate the heat generated by network analyzer 3 in a timely manner, rather than the traditional method where matrix switch 2 and network analyzer 3 are placed in a relatively closed environment, which prevents heat from dissipating in time and causes heat accumulation that affects the signal transmission of matrix switch 2. The open environment setting of this application can ensure the accuracy and stability of the signal transmission of matrix switch 2.

[0033] The above embodiments are only for illustrating the technical concept and features of this utility model, and are intended to enable those skilled in the art to understand the content of this utility model and implement it accordingly. They should not be construed as limiting the scope of protection of this utility model. It is obvious to those skilled in the art that this utility model is not limited to the details of the above exemplary embodiments, and that it can be implemented in other specific forms without departing from the spirit or basic characteristics of this utility model. Therefore, the embodiments should be considered exemplary and non-limiting in all respects. The scope of this utility model is defined by the appended claims rather than the foregoing description, and therefore, all changes falling within the meaning and scope of the equivalents of the claims are intended to be included within this utility model.

Claims

1. A filter wafer test matrix switch, comprising: include: The enclosure (1) has multiple terminals (11) installed on its side walls, which are used for signal input and output. Multiple matrix switches (2) are installed in the housing (1) in a distributed manner. Each matrix switch (2) is electrically connected to the corresponding terminal (11) via a cable for signal transmission. A network analyzer (3) is installed on the enclosure (1) and electrically connected to a plurality of matrix switches (2) for analyzing and testing signals transmitted through the matrix switches (2).

2. The filter wafer test matrix switch of claim 1, wherein: Multiple matrix switches (2) are arranged in a flat manner on the inner surface of the housing (1), and no two adjacent matrix switches (2) overlap in any direction, including the horizontal direction, the vertical direction, and the depth direction of the housing (1), so that each matrix switch (2) is spatially independent.

3. The filter wafer test matrix switch of claim 1, wherein: The enclosure (1) is provided with a partition plate (4), which divides the internal space of the enclosure (1) into a first chamber (12) and a second chamber (13) that are independent of each other; a plurality of matrix switches (2) are provided in the first chamber (12), and a plurality of terminals (11) are connected to the second chamber (13); the cables of the matrix switches (2) pass through the pre-set through holes (41) on the partition plate (4) to complete the connection with the terminals (11).

4. The filter wafer test matrix switch of claim 3, wherein: The partition plate (4) has a channel (42) that is separated from each other on the side facing the second chamber (13). Each cable is accommodated in the corresponding channel (42) and extends through the channel (42) to be connected to the corresponding terminal (11).

5. The filter wafer test matrix switch of claim 1, wherein: The matrix switch (2) has one signal input inlet and four signal output outlets, which are used to realize the routing switching of signals from the inlet to the four outlets.

6. The filter wafer test matrix switch of claim 1, wherein: The enclosure (1) and the network analyzer (3) installed on the enclosure (1) are not in a closed space environment that does not exchange air with the outside.